JPWO2023042721A1 - - Google Patents

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Publication number
JPWO2023042721A1
JPWO2023042721A1 JP2023548428A JP2023548428A JPWO2023042721A1 JP WO2023042721 A1 JPWO2023042721 A1 JP WO2023042721A1 JP 2023548428 A JP2023548428 A JP 2023548428A JP 2023548428 A JP2023548428 A JP 2023548428A JP WO2023042721 A1 JPWO2023042721 A1 JP WO2023042721A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2023548428A
Other languages
Japanese (ja)
Other versions
JPWO2023042721A5 (https=
JP7752690B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2023042721A1 publication Critical patent/JPWO2023042721A1/ja
Publication of JPWO2023042721A5 publication Critical patent/JPWO2023042721A5/ja
Application granted granted Critical
Publication of JP7752690B2 publication Critical patent/JP7752690B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G01N35/00623—Quality control of instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00693—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/0099—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor comprising robots or similar manipulators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N2035/00178—Special arrangements of analysers
    • G01N2035/00326—Analysers with modular structure
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G01N2035/00891—Displaying information to the operator
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/046—General conveyor features
    • G01N2035/0465—Loading or unloading the conveyor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/0474—Details of actuating means for conveyors or pipettes
    • G01N2035/0489—Self-propelled units
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification

Landscapes

  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Robotics (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
JP2023548428A 2021-09-15 2022-09-07 自動分析システム Active JP7752690B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021150085 2021-09-15
JP2021150085 2021-09-15
PCT/JP2022/033515 WO2023042721A1 (ja) 2021-09-15 2022-09-07 自動分析装置および自動分析システム

Publications (3)

Publication Number Publication Date
JPWO2023042721A1 true JPWO2023042721A1 (https=) 2023-03-23
JPWO2023042721A5 JPWO2023042721A5 (https=) 2024-06-28
JP7752690B2 JP7752690B2 (ja) 2025-10-10

Family

ID=85602187

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023548428A Active JP7752690B2 (ja) 2021-09-15 2022-09-07 自動分析システム

Country Status (5)

Country Link
US (1) US20240345109A1 (https=)
EP (1) EP4403919A4 (https=)
JP (1) JP7752690B2 (https=)
CN (1) CN117795345A (https=)
WO (1) WO2023042721A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7068463B2 (ja) * 2018-07-27 2022-05-16 株式会社日立ハイテク 自動分析システム

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02163660A (ja) * 1988-12-19 1990-06-22 Olympus Optical Co Ltd 自動分析装置
JP2005300357A (ja) * 2004-04-12 2005-10-27 Ids:Kk 自走車を使用した検体搬送システム
JP2008076267A (ja) * 2006-09-22 2008-04-03 Sysmex Corp 精度管理システム、分析装置および精度管理方法
JP2009008558A (ja) * 2007-06-28 2009-01-15 A & T Corp 分注装置、検体検査システム、分注方法、検体検査方法、分注プログラム、検体検査プログラム
JP2013185975A (ja) * 2012-03-08 2013-09-19 Hitachi High-Technologies Corp 自動分析装置
JP2015135282A (ja) * 2014-01-17 2015-07-27 株式会社日立ハイテクノロジーズ 自動分析装置
JP2019521359A (ja) * 2016-07-21 2019-07-25 シーメンス・ヘルスケア・ダイアグノスティックス・インコーポレーテッドＳｉｅｍｅｎｓ Ｈｅａｌｔｈｃａｒｅ Ｄｉａｇｎｏｓｔｉｃｓ Ｉｎｃ． 自動臨床分析器システム及び方法
WO2020021837A1 (ja) * 2018-07-27 2020-01-30 株式会社日立ハイテクノロジーズ 自動分析システム
WO2021153028A1 (ja) * 2020-01-30 2021-08-05 株式会社日立ハイテク 自動分析システム

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE60226385D1 (de) * 2001-09-12 2008-06-19 Olympus Co Automatische Analysevorrichtung
JP5912320B2 (ja) 2011-07-20 2016-04-27 株式会社日立ハイテクノロジーズ 自動分析装置

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02163660A (ja) * 1988-12-19 1990-06-22 Olympus Optical Co Ltd 自動分析装置
JP2005300357A (ja) * 2004-04-12 2005-10-27 Ids:Kk 自走車を使用した検体搬送システム
JP2008076267A (ja) * 2006-09-22 2008-04-03 Sysmex Corp 精度管理システム、分析装置および精度管理方法
JP2009008558A (ja) * 2007-06-28 2009-01-15 A & T Corp 分注装置、検体検査システム、分注方法、検体検査方法、分注プログラム、検体検査プログラム
JP2013185975A (ja) * 2012-03-08 2013-09-19 Hitachi High-Technologies Corp 自動分析装置
JP2015135282A (ja) * 2014-01-17 2015-07-27 株式会社日立ハイテクノロジーズ 自動分析装置
JP2019521359A (ja) * 2016-07-21 2019-07-25 シーメンス・ヘルスケア・ダイアグノスティックス・インコーポレーテッドＳｉｅｍｅｎｓ Ｈｅａｌｔｈｃａｒｅ Ｄｉａｇｎｏｓｔｉｃｓ Ｉｎｃ． 自動臨床分析器システム及び方法
WO2020021837A1 (ja) * 2018-07-27 2020-01-30 株式会社日立ハイテクノロジーズ 自動分析システム
WO2021153028A1 (ja) * 2020-01-30 2021-08-05 株式会社日立ハイテク 自動分析システム

Also Published As

Publication number Publication date
EP4403919A4 (en) 2025-09-03
US20240345109A1 (en) 2024-10-17
WO2023042721A1 (ja) 2023-03-23
CN117795345A (zh) 2024-03-29
JP7752690B2 (ja) 2025-10-10
EP4403919A1 (en) 2024-07-24

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