CN117795345A - 自动分析装置和自动分析系统 - Google Patents

自动分析装置和自动分析系统 Download PDF

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Publication number
CN117795345A
CN117795345A CN202280054834.3A CN202280054834A CN117795345A CN 117795345 A CN117795345 A CN 117795345A CN 202280054834 A CN202280054834 A CN 202280054834A CN 117795345 A CN117795345 A CN 117795345A
Authority
CN
China
Prior art keywords
sample
unit
automatic
discharge
analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202280054834.3A
Other languages
English (en)
Chinese (zh)
Inventor
竹内美和
今井健太
板垣游人
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi High Technologies Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Technologies Corp filed Critical Hitachi High Technologies Corp
Publication of CN117795345A publication Critical patent/CN117795345A/zh
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G01N35/00623—Quality control of instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00693—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/0099—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor comprising robots or similar manipulators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N2035/00178—Special arrangements of analysers
    • G01N2035/00326—Analysers with modular structure
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G01N2035/00891—Displaying information to the operator
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/046—General conveyor features
    • G01N2035/0465—Loading or unloading the conveyor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/0474—Details of actuating means for conveyors or pipettes
    • G01N2035/0489—Self-propelled units
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification

Landscapes

  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Robotics (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
CN202280054834.3A 2021-09-15 2022-09-07 自动分析装置和自动分析系统 Pending CN117795345A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021-150085 2021-09-15
JP2021150085 2021-09-15
PCT/JP2022/033515 WO2023042721A1 (ja) 2021-09-15 2022-09-07 自動分析装置および自動分析システム

Publications (1)

Publication Number Publication Date
CN117795345A true CN117795345A (zh) 2024-03-29

Family

ID=85602187

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202280054834.3A Pending CN117795345A (zh) 2021-09-15 2022-09-07 自动分析装置和自动分析系统

Country Status (5)

Country Link
US (1) US20240345109A1 (https=)
EP (1) EP4403919A4 (https=)
JP (1) JP7752690B2 (https=)
CN (1) CN117795345A (https=)
WO (1) WO2023042721A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7068463B2 (ja) * 2018-07-27 2022-05-16 株式会社日立ハイテク 自動分析システム

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02163660A (ja) * 1988-12-19 1990-06-22 Olympus Optical Co Ltd 自動分析装置
DE60226385D1 (de) * 2001-09-12 2008-06-19 Olympus Co Automatische Analysevorrichtung
JP3819917B2 (ja) 2004-04-12 2006-09-13 株式会社アイディエス 自走車を使用した検体搬送システム
JP4817251B2 (ja) 2006-09-22 2011-11-16 シスメックス株式会社 精度管理システム
JP2009008558A (ja) 2007-06-28 2009-01-15 A & T Corp 分注装置、検体検査システム、分注方法、検体検査方法、分注プログラム、検体検査プログラム
JP5912320B2 (ja) 2011-07-20 2016-04-27 株式会社日立ハイテクノロジーズ 自動分析装置
JP5951292B2 (ja) 2012-03-08 2016-07-13 株式会社日立ハイテクノロジーズ 自動分析装置
JP2015135282A (ja) * 2014-01-17 2015-07-27 株式会社日立ハイテクノロジーズ 自動分析装置
JP7002529B2 (ja) 2016-07-21 2022-02-10 シーメンス・ヘルスケア・ダイアグノスティックス・インコーポレーテッド 自動臨床分析器システム及び方法
JP7068463B2 (ja) * 2018-07-27 2022-05-16 株式会社日立ハイテク 自動分析システム
EP4099019A4 (en) 2020-01-30 2024-03-06 Hitachi High-Tech Corporation AUTOMATIC ANALYSIS SYSTEM

Also Published As

Publication number Publication date
EP4403919A4 (en) 2025-09-03
US20240345109A1 (en) 2024-10-17
WO2023042721A1 (ja) 2023-03-23
JPWO2023042721A1 (https=) 2023-03-23
JP7752690B2 (ja) 2025-10-10
EP4403919A1 (en) 2024-07-24

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