JP7658512B2 - ホルダおよびそれを備える分析装置、ならびに電池の分析方法 - Google Patents

ホルダおよびそれを備える分析装置、ならびに電池の分析方法 Download PDF

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JP7658512B2
JP7658512B2 JP2024514924A JP2024514924A JP7658512B2 JP 7658512 B2 JP7658512 B2 JP 7658512B2 JP 2024514924 A JP2024514924 A JP 2024514924A JP 2024514924 A JP2024514924 A JP 2024514924A JP 7658512 B2 JP7658512 B2 JP 7658512B2
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battery
holder
positive electrode
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resin member
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JPWO2023199833A1 (https=
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崇史 大森
賢治 佐藤
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Shimadzu Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2209—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using wavelength dispersive spectroscopy [WDS]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M10/00—Secondary cells; Manufacture thereof
    • H01M10/42—Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
    • H01M10/4285—Testing apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M10/00—Secondary cells; Manufacture thereof
    • H01M10/42—Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
    • H01M10/48—Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/309—Accessories, mechanical or electrical features support of sample holder
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10—Energy storage using batteries

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  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Chemical & Material Sciences (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Manufacturing & Machinery (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2024514924A 2022-04-13 2023-04-06 ホルダおよびそれを備える分析装置、ならびに電池の分析方法 Active JP7658512B2 (ja)

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JP2022066355 2022-04-13
JP2022066355 2022-04-13
PCT/JP2023/014181 WO2023199833A1 (ja) 2022-04-13 2023-04-06 ホルダおよびそれを備える分析装置、ならびに電池の分析方法

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JPWO2023199833A1 JPWO2023199833A1 (https=) 2023-10-19
JP7658512B2 true JP7658512B2 (ja) 2025-04-08

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Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD1120783S1 (en) * 2024-06-25 2026-03-31 Rigaku Corporation Measuring device for x-ray emission spectrochemical analysis
JP1784615S (ja) * 2024-06-25 2024-11-14 エックス線分析機

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001289802A (ja) 2000-04-10 2001-10-19 Rigaku Industrial Co 蛍光ｘ線分析装置及びそれに使用するｘ線検出器
JP2005024299A (ja) 2003-06-30 2005-01-27 Tanaka Scientific Ltd Ｘ線分析機器用窓材
JP2005024300A (ja) 2003-06-30 2005-01-27 Tanaka Scientific Ltd 蛍光ｘ線分析装置のフローセル
JP2010038539A (ja) 2006-11-30 2010-02-18 Sumitomo Metal Mining Co Ltd 汚染土壌の重金属濃度測定装置及び測定方法。
JP2013160614A (ja) 2012-02-03 2013-08-19 Horiba Ltd Ｘ線検出装置
US20140093052A1 (en) 2012-09-28 2014-04-03 Uchicago Argonne, Llc Transmission-geometry electrochemical cell for in-situ scattering and spectroscopy investigations
WO2021038943A1 (ja) 2019-08-27 2021-03-04 株式会社リガク 電池分析用構造体およびｘ線回折装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5318157B2 (https=) * 1972-04-24 1978-06-13
JPS55143557U (https=) * 1979-03-30 1980-10-15
JPS6039803Y2 (ja) * 1979-08-31 1985-11-29 株式会社島津製作所 けい光ｘ線分析用液体試料容器
US7022290B2 (en) * 2001-06-19 2006-04-04 Rutgers, The State University System structure for in situ x-ray study of electrochemical cell component performance
KR102390689B1 (ko) * 2018-02-21 2022-04-26 가부시키가이샤 시마즈세이사쿠쇼 전지 재료의 화학 상태 분석 장치 및 방법
JP2021189088A (ja) * 2020-06-02 2021-12-13 株式会社島津製作所 分析装置および分析方法

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001289802A (ja) 2000-04-10 2001-10-19 Rigaku Industrial Co 蛍光ｘ線分析装置及びそれに使用するｘ線検出器
JP2005024299A (ja) 2003-06-30 2005-01-27 Tanaka Scientific Ltd Ｘ線分析機器用窓材
JP2005024300A (ja) 2003-06-30 2005-01-27 Tanaka Scientific Ltd 蛍光ｘ線分析装置のフローセル
JP2010038539A (ja) 2006-11-30 2010-02-18 Sumitomo Metal Mining Co Ltd 汚染土壌の重金属濃度測定装置及び測定方法。
JP2013160614A (ja) 2012-02-03 2013-08-19 Horiba Ltd Ｘ線検出装置
US20140093052A1 (en) 2012-09-28 2014-04-03 Uchicago Argonne, Llc Transmission-geometry electrochemical cell for in-situ scattering and spectroscopy investigations
WO2021038943A1 (ja) 2019-08-27 2021-03-04 株式会社リガク 電池分析用構造体およびｘ線回折装置

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
ＢＬ２０ＸＵ 医学・イメージングＩＩ，ＳＰｒｉｎｇ８・ＳＡＣＬＡ 年報 ２０１３年度［オンライン］，日本，2014年12月，pp. 58-59，<URL:http://www.spring8.or.jp/pdf/ja/ann_rep/13/058.pdf>

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WO2023199833A1 (ja) 2023-10-19
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