JP7542068B2 - Ｘ線散乱装置 - Google Patents

Ｘ線散乱装置 Download PDF

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JP7542068B2
JP7542068B2 JP2022539650A JP2022539650A JP7542068B2 JP 7542068 B2 JP7542068 B2 JP 7542068B2 JP 2022539650 A JP2022539650 A JP 2022539650A JP 2022539650 A JP2022539650 A JP 2022539650A JP 7542068 B2 JP7542068 B2 JP 7542068B2
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JP2023512899A (ja
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ピーター ウグホイ，
ブロンディン ランツ，
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ゼノックス ソシエテ パー アクシオン サンプリフィエ
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    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/041—Phase-contrast imaging, e.g. using grating interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/201—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring small-angle scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/054—Investigating materials by wave or particle radiation by diffraction, scatter or reflection small angle scatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/067—Construction details

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  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2022539650A 2019-12-30 2020-12-29 Ｘ線散乱装置 Active JP7542068B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
EP19290126.2 2019-12-30
EP19290126.2A EP3845891B1 (en) 2019-12-30 2019-12-30 X-ray scattering apparatus
EP20197189.2 2020-09-21
EP20197189.2A EP3845892B1 (en) 2019-12-30 2020-09-21 X-ray scattering apparatus
PCT/EP2020/087969 WO2021136774A1 (en) 2019-12-30 2020-12-29 X-ray scattering apparatus

Publications (3)

Publication Number Publication Date
JP2023512899A JP2023512899A (ja) 2023-03-30
JP2023512899A5 JP2023512899A5 (https=) 2023-12-20
JP7542068B2 true JP7542068B2 (ja) 2024-08-29

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JP2022539650A Active JP7542068B2 (ja) 2019-12-30 2020-12-29 Ｘ線散乱装置
JP2022539408A Active JP7635239B2 (ja) 2019-12-30 2020-12-29 Ｘ線散乱装置

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US (2) US11796485B2 (https=)
EP (2) EP3845891B1 (https=)
JP (2) JP7542068B2 (https=)
CN (2) CN114222916B (https=)
WO (2) WO2021136771A1 (https=)

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EP4095522B1 (en) * 2021-05-25 2023-08-16 Xenocs SAS X-ray scattering apparatus and x-ray scattering method
US12436115B2 (en) * 2022-02-25 2025-10-07 Proto Patents Ltd. Transmission X-ray diffraction apparatus and related method
CN116008322A (zh) * 2022-12-27 2023-04-25 中国科学院高能物理研究所 一种广角/小角/超小角x射线散射无缝联用装置
CN117054457A (zh) * 2023-07-03 2023-11-14 深圳综合粒子设施研究院 相机系统及小角x射线散射仪
US20250035691A1 (en) * 2023-07-27 2025-01-30 International Business Machines Corporation Emc scattering apparatus
EP4589288A1 (en) 2024-01-16 2025-07-23 Chemovator GmbH Sample holder, in particular for a sample analyzed by x-ray diffraction
FR3160771B1 (fr) * 2024-03-26 2026-03-20 Letsee Imaging Système d’imagerie à rayons X de type Hartmann
CN119510465A (zh) * 2024-09-25 2025-02-25 中国科学院高能物理研究所 一种x射线散射衍射实验入射光斑实时监测的方法和装置
CN120948519B (zh) * 2025-10-20 2026-01-27 中科先进技术温州研究院 一种多几何构型衍射引导装置及x射线衍射设备

Citations (2)

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JP2006091017A (ja) 2004-09-21 2006-04-06 Jordan Valley Applied Radiation Ltd 組み合わされたｘ線反射率計及び回折計
JP2017524926A (ja) 2014-06-30 2017-08-31 コミサリヤ・ア・レネルジ・アトミク・エ・オ・エネルジ・アルテルナテイブ 透過スペクトル次いで散乱スペクトルを使用して２つのステージで物体を解析する方法

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JP3271426B2 (ja) * 1994-05-09 2002-04-02 石川島播磨重工業株式会社 放射光ビームライン装置
JPH08145916A (ja) * 1994-11-18 1996-06-07 Hitachi Ltd 小角散乱ｘ線装置
JP3697246B2 (ja) * 2003-03-26 2005-09-21 株式会社リガク Ｘ線回折装置
JP5031215B2 (ja) * 2004-09-21 2012-09-19 ジョルダン バレー アプライド ラディエイション リミテッド 多機能ｘ線分析システム
US7076024B2 (en) * 2004-12-01 2006-07-11 Jordan Valley Applied Radiation, Ltd. X-ray apparatus with dual monochromators
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JP4860418B2 (ja) * 2006-10-10 2012-01-25 株式会社リガク Ｘ線光学系
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JP5116014B2 (ja) * 2007-06-21 2013-01-09 株式会社リガク 小角広角ｘ線測定装置
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FR2955391B1 (fr) * 2010-01-18 2012-03-16 Xenocs Systeme compact d'analyse par rayons-x
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JP2006091017A (ja) 2004-09-21 2006-04-06 Jordan Valley Applied Radiation Ltd 組み合わされたｘ線反射率計及び回折計
JP2017524926A (ja) 2014-06-30 2017-08-31 コミサリヤ・ア・レネルジ・アトミク・エ・オ・エネルジ・アルテルナテイブ 透過スペクトル次いで散乱スペクトルを使用して２つのステージで物体を解析する方法

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CN114222916A (zh) 2022-03-22
CN115053125B (zh) 2026-03-17
EP3845891B1 (en) 2022-02-09
US20230012833A1 (en) 2023-01-19
EP3845891A1 (en) 2021-07-07
WO2021136774A1 (en) 2021-07-08
CN114222916B (zh) 2025-07-18
JP2023512424A (ja) 2023-03-27
JP7635239B2 (ja) 2025-02-25
EP3845892B1 (en) 2022-01-05
WO2021136771A1 (en) 2021-07-08
JP2023512899A (ja) 2023-03-30
US11796485B2 (en) 2023-10-24
US11835474B2 (en) 2023-12-05
US20220326166A1 (en) 2022-10-13
CN115053125A (zh) 2022-09-13
EP3845892A1 (en) 2021-07-07

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