JP7527247B2 - 撮像装置 - Google Patents

撮像装置 Download PDF

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Publication number
JP7527247B2
JP7527247B2 JP2021100184A JP2021100184A JP7527247B2 JP 7527247 B2 JP7527247 B2 JP 7527247B2 JP 2021100184 A JP2021100184 A JP 2021100184A JP 2021100184 A JP2021100184 A JP 2021100184A JP 7527247 B2 JP7527247 B2 JP 7527247B2
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JP
Japan
Prior art keywords
nozzle
mirror
imaging device
tip
camera
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2021100184A
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English (en)
Japanese (ja)
Other versions
JP2022191753A5 (enExample
JP2022191753A (ja
Inventor
学 越智
陽介 堀江
高志 三枝
鉄士 川原
洋一郎 鈴木
健士郎 坂田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi High Tech Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Tech Corp filed Critical Hitachi High Tech Corp
Priority to JP2021100184A priority Critical patent/JP7527247B2/ja
Priority to US18/560,723 priority patent/US12401876B2/en
Priority to EP22822848.2A priority patent/EP4357028A4/en
Priority to PCT/JP2022/019476 priority patent/WO2022264704A1/ja
Priority to CN202280035060.XA priority patent/CN117321424A/zh
Publication of JP2022191753A publication Critical patent/JP2022191753A/ja
Publication of JP2022191753A5 publication Critical patent/JP2022191753A5/ja
Application granted granted Critical
Publication of JP7527247B2 publication Critical patent/JP7527247B2/ja
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Anticipated expiration legal-status Critical

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1009—Characterised by arrangements for controlling the aspiration or dispense of liquids
    • G01N35/1011—Control of the position or alignment of the transfer device
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/50—Constructional details
    • H04N23/55—Optical parts specially adapted for electronic image sensors; Mounting thereof
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L3/00—Containers or dishes for laboratory use, e.g. laboratory glassware; Droppers
    • B01L3/02—Burettes; Pipettes
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L3/00—Containers or dishes for laboratory use, e.g. laboratory glassware; Droppers
    • B01L3/02—Burettes; Pipettes
    • B01L3/021—Pipettes, i.e. with only one conduit for withdrawing and redistributing liquids
    • B01L3/0213—Accessories for glass pipettes; Gun-type pipettes, e.g. safety devices, pumps
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B17/00—Details of cameras or camera bodies; Accessories therefor
    • G03B17/02—Bodies
    • G03B17/17—Bodies with reflectors arranged in beam forming the photographic image, e.g. for reducing dimensions of camera
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/50—Constructional details
    • H04N23/53—Constructional details of electronic viewfinders, e.g. rotatable or detachable
    • H04N23/531—Constructional details of electronic viewfinders, e.g. rotatable or detachable being rotatable or detachable
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N2035/1027—General features of the devices
    • G01N2035/103—General features of the devices using disposable tips

Landscapes

  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Signal Processing (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Clinical Laboratory Science (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Coating Apparatus (AREA)
JP2021100184A 2021-06-16 2021-06-16 撮像装置 Active JP7527247B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2021100184A JP7527247B2 (ja) 2021-06-16 2021-06-16 撮像装置
US18/560,723 US12401876B2 (en) 2021-06-16 2022-05-02 Imaging device
EP22822848.2A EP4357028A4 (en) 2021-06-16 2022-05-02 Imaging device
PCT/JP2022/019476 WO2022264704A1 (ja) 2021-06-16 2022-05-02 撮像装置
CN202280035060.XA CN117321424A (zh) 2021-06-16 2022-05-02 摄像装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2021100184A JP7527247B2 (ja) 2021-06-16 2021-06-16 撮像装置

Publications (3)

Publication Number Publication Date
JP2022191753A JP2022191753A (ja) 2022-12-28
JP2022191753A5 JP2022191753A5 (enExample) 2024-03-04
JP7527247B2 true JP7527247B2 (ja) 2024-08-02

Family

ID=84527365

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021100184A Active JP7527247B2 (ja) 2021-06-16 2021-06-16 撮像装置

Country Status (5)

Country Link
US (1) US12401876B2 (enExample)
EP (1) EP4357028A4 (enExample)
JP (1) JP7527247B2 (enExample)
CN (1) CN117321424A (enExample)
WO (1) WO2022264704A1 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2024147118A (ja) * 2023-04-03 2024-10-16 株式会社日立ハイテク プローブ位置検出装置及び自動分析装置
CN117664046B (zh) * 2023-12-01 2024-12-03 苏州巨帧图远科技有限公司 一种Tip头圆跳动的检测算法
WO2025126515A1 (ja) * 2023-12-11 2025-06-19 株式会社島津製作所 液体採取注入装置

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007309888A (ja) 2006-05-22 2007-11-29 Olympus Corp 分注装置
JP2008175791A (ja) 2007-01-22 2008-07-31 Juki Corp 分注装置
JP2010175420A (ja) 2009-01-30 2010-08-12 Hitachi High-Technologies Corp 試料分析装置
JP2010175417A (ja) 2009-01-30 2010-08-12 Hitachi High-Technologies Corp 自動分析装置
JP2015172509A (ja) 2014-03-11 2015-10-01 株式会社東芝 臨床検査装置
JP2017151002A (ja) 2016-02-25 2017-08-31 株式会社日立ハイテクノロジーズ 自動分析装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2872765B2 (ja) 1990-07-04 1999-03-24 松下電器産業株式会社 チップ部品の装着装置
US6435808B1 (en) 1993-10-06 2002-08-20 Tdk Corporation Chip-type circuit element mounting apparatus
US6359694B1 (en) * 1997-11-10 2002-03-19 Siemens Aktiengesellschaft Method and device for identifying the position of an electrical component or terminals thereof, and equipping head employing same
JP4033468B2 (ja) 2003-07-28 2008-01-16 株式会社スギノマシン ノズル先端位置計測装置とそれを用いたスポッティング装置
US9103782B2 (en) * 2008-12-02 2015-08-11 Malvern Instruments Incorporated Automatic isothermal titration microcalorimeter apparatus and method of use
JP5781281B2 (ja) 2010-07-30 2015-09-16 シスメックス株式会社 検体処理装置
JP6554793B2 (ja) * 2015-01-05 2019-08-07 株式会社島津製作所 自動試料採取装置
DE112015005746B4 (de) * 2015-01-26 2022-12-22 Hitachi High-Tech Corporation Optische Analysenvorrichtung
EP3514518A4 (en) * 2016-09-16 2020-09-02 On-chip Biotechnologies Co., Ltd. FINE PARTICLE DISTRIBUTION DEVICE, FINE PARTICLE ANALYSIS DEVICE, REACTION DETECTION DEVICE AND PROCESS USING SAID DEVICES
CN112585478B (zh) * 2018-08-28 2024-03-29 株式会社日立高新技术 自动分析装置

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007309888A (ja) 2006-05-22 2007-11-29 Olympus Corp 分注装置
JP2008175791A (ja) 2007-01-22 2008-07-31 Juki Corp 分注装置
JP2010175420A (ja) 2009-01-30 2010-08-12 Hitachi High-Technologies Corp 試料分析装置
JP2010175417A (ja) 2009-01-30 2010-08-12 Hitachi High-Technologies Corp 自動分析装置
JP2015172509A (ja) 2014-03-11 2015-10-01 株式会社東芝 臨床検査装置
JP2017151002A (ja) 2016-02-25 2017-08-31 株式会社日立ハイテクノロジーズ 自動分析装置

Also Published As

Publication number Publication date
WO2022264704A1 (ja) 2022-12-22
EP4357028A4 (en) 2025-05-14
US12401876B2 (en) 2025-08-26
CN117321424A (zh) 2023-12-29
EP4357028A1 (en) 2024-04-24
JP2022191753A (ja) 2022-12-28
US20240284027A1 (en) 2024-08-22

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