JP7402597B2 - タッチスクリーンを有する試験測定プローブ - Google Patents
タッチスクリーンを有する試験測定プローブ Download PDFInfo
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- JP7402597B2 JP7402597B2 JP2020569094A JP2020569094A JP7402597B2 JP 7402597 B2 JP7402597 B2 JP 7402597B2 JP 2020569094 A JP2020569094 A JP 2020569094A JP 2020569094 A JP2020569094 A JP 2020569094A JP 7402597 B2 JP7402597 B2 JP 7402597B2
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- 238000012360 testing method Methods 0.000 title claims description 198
- 238000005259 measurement Methods 0.000 title claims description 187
- 239000000523 sample Substances 0.000 title claims description 166
- 238000000034 method Methods 0.000 claims description 22
- 230000008569 process Effects 0.000 claims description 9
- 230000008878 coupling Effects 0.000 claims description 5
- 238000010168 coupling process Methods 0.000 claims description 5
- 238000005859 coupling reaction Methods 0.000 claims description 5
- 238000003032 molecular docking Methods 0.000 description 19
- 238000010586 diagram Methods 0.000 description 13
- 238000005516 engineering process Methods 0.000 description 11
- 238000004891 communication Methods 0.000 description 7
- 230000015654 memory Effects 0.000 description 7
- 238000013461 design Methods 0.000 description 6
- 230000008901 benefit Effects 0.000 description 5
- 230000008859 change Effects 0.000 description 5
- 230000006870 function Effects 0.000 description 5
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- 230000003190 augmentative effect Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 2
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06788—Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/025—General constructional details concerning dedicated user interfaces, e.g. GUI, or dedicated keyboards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06766—Input circuits therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/12—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will
- G01R15/125—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will for digital multimeters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2844—Fault-finding or characterising using test interfaces, e.g. adapters, test boxes, switches, PIN drivers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/3025—Wireless interface with the DUT
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Human Computer Interaction (AREA)
- Computer Networks & Wireless Communication (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
[実施例]
Claims (8)
- 被試験デバイスからの信号を取得するように構成されたプローブ・ヘッドと、
ユーザに試験測定情報を視覚的に伝えると共に、ユーザのタッチ入力を受け入れるように構成されたタッチスクリーン・ユーザ・インタフェースと、
該タッチスクリーン・ユーザ・インタフェースが着脱可能に接続される補償ボックスと
を具える試験測定測定装置用の試験測定プローブ。 - コントローラを更に具え、
上記タッチスクリーン・ユーザ・インタフェースが上記コントローラに結合される請求項1の試験測定プローブ。 - 上記コントローラが上記補償ボックスに収納される請求項2の試験測定プローブ。
- 試験測定装置と、
該試験測定装置と結合された試験測定プローブと
を具え、
該試験測定プローブが、
被試験デバイスからの信号を取得するように構成されたプローブ・ヘッドと、
ユーザに試験測定情報を視覚的に伝えると共に、ユーザのタッチ入力を受けるように構成されたタッチスクリーン・ユーザ・インタフェースと、
該タッチスクリーン・ユーザ・インタフェースが着脱可能に接続される補償ボックスと
を有する試験測定システム。 - 上記試験測定プローブが、機械的及び電気的に上記試験測定プローブを上記試験測定装置に接続するように構成された上記試験測定プローブから上記試験測定装置へのインタフェースを介して上記試験測定装置に結合される請求項4の試験測定システム。
- 上記試験測定プローブがコントローラを更に有し、上記タッチスクリーン・ユーザ・インタフェースが、上記コントローラに結合される請求項4の試験測定システム。
- 上記コントローラが上記補償ボックスに収納される請求項6の試験測定システム。
- ユーザに試験測定情報を視覚的に伝えると共にユーザのタッチ入力を受けるように構成されるタッチスクリーン・ユーザ・インタフェースを、被試験デバイスから信号を取得するように構成される試験測定プローブに結合する処理と、
上記タッチスクリーン・ユーザ・インタフェースへのタッチ入力をユーザに促すグラフィカル機能を含む試験測定情報を上記タッチスクリーン・ユーザ・インタフェースに表示する処理と、
上記タッチスクリーン・ユーザ・インタフェースにおいてユーザのタッチ入力を受ける処理と
を具え、
上記タッチスクリーン・ユーザ・インタフェースが上記試験測定プローブの補償ボックスに着脱可能に接続される試験測定プローブの動作方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201862683611P | 2018-06-11 | 2018-06-11 | |
US62/683,611 | 2018-06-11 | ||
PCT/US2019/036596 WO2019241280A1 (en) | 2018-06-11 | 2019-06-11 | Test-and-measurement probe having a touchscreen |
Publications (2)
Publication Number | Publication Date |
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JP2021527215A JP2021527215A (ja) | 2021-10-11 |
JP7402597B2 true JP7402597B2 (ja) | 2023-12-21 |
Family
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JP2020569094A Active JP7402597B2 (ja) | 2018-06-11 | 2019-06-11 | タッチスクリーンを有する試験測定プローブ |
Country Status (5)
Country | Link |
---|---|
US (1) | US11719721B2 (ja) |
JP (1) | JP7402597B2 (ja) |
CN (1) | CN112534275A (ja) |
DE (1) | DE112019002946T5 (ja) |
WO (1) | WO2019241280A1 (ja) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
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US11674978B2 (en) * | 2020-05-01 | 2023-06-13 | Rohde & Schwarz Gmbh & Co. Kg | Measurement system and method for operating a measurement system |
CN111413527B (zh) * | 2020-05-13 | 2022-08-16 | 深圳市鼎阳科技股份有限公司 | 一种用于示波器的单端有源探头以及信号检测系统 |
CN111289786B (zh) * | 2020-05-13 | 2020-08-11 | 深圳市鼎阳科技股份有限公司 | 一种用于示波器的探头的探头接口电路和探头适配电路 |
CN112684234B (zh) * | 2021-03-19 | 2021-06-22 | 深圳市鼎阳科技股份有限公司 | 示波器的探头识别方法和示波器 |
KR102660442B1 (ko) * | 2023-09-20 | 2024-04-25 | 김강열 | 회수 칩 데이터 복구장치 |
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2019
- 2019-06-11 CN CN201980053622.1A patent/CN112534275A/zh active Pending
- 2019-06-11 US US17/251,179 patent/US11719721B2/en active Active
- 2019-06-11 DE DE112019002946.0T patent/DE112019002946T5/de active Pending
- 2019-06-11 WO PCT/US2019/036596 patent/WO2019241280A1/en active Application Filing
- 2019-06-11 JP JP2020569094A patent/JP7402597B2/ja active Active
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JP2003344452A (ja) | 2002-04-29 | 2003-12-03 | Tektronix Inc | 測定機器用電圧管理装置 |
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DE112019002946T5 (de) | 2021-03-04 |
US20210263074A1 (en) | 2021-08-26 |
WO2019241280A1 (en) | 2019-12-19 |
CN112534275A (zh) | 2021-03-19 |
JP2021527215A (ja) | 2021-10-11 |
US11719721B2 (en) | 2023-08-08 |
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