JP7387725B2 - アドレス障害を検出するためのシステム、方法、及び装置 - Google Patents

アドレス障害を検出するためのシステム、方法、及び装置 Download PDF

Info

Publication number
JP7387725B2
JP7387725B2 JP2021518728A JP2021518728A JP7387725B2 JP 7387725 B2 JP7387725 B2 JP 7387725B2 JP 2021518728 A JP2021518728 A JP 2021518728A JP 2021518728 A JP2021518728 A JP 2021518728A JP 7387725 B2 JP7387725 B2 JP 7387725B2
Authority
JP
Japan
Prior art keywords
parity
address
address information
data
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2021518728A
Other languages
English (en)
Japanese (ja)
Other versions
JP2022504328A5 (enExample
JP2022504328A (ja
Inventor
ピーター フォレイ デビッド
Original Assignee
日本テキサス・インスツルメンツ合同会社
テキサス インスツルメンツ インコーポレイテッド
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本テキサス・インスツルメンツ合同会社, テキサス インスツルメンツ インコーポレイテッド filed Critical 日本テキサス・インスツルメンツ合同会社
Publication of JP2022504328A publication Critical patent/JP2022504328A/ja
Publication of JP2022504328A5 publication Critical patent/JP2022504328A5/ja
Application granted granted Critical
Publication of JP7387725B2 publication Critical patent/JP7387725B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1044—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices with specific ECC/EDC distribution
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1012—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using codes or arrangements adapted for a specific type of error
    • G06F11/1016—Error in accessing a memory location, i.e. addressing error
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0706—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment
    • G06F11/0721—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment within a central processing unit [CPU]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0751—Error or fault detection not based on redundancy
    • G06F11/0763—Error or fault detection not based on redundancy by bit configuration check, e.g. of formats or tags
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1076—Parity data used in redundant arrays of independent storages, e.g. in RAID systems
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/024—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in decoders
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/38—Response verification devices
    • G11C29/42—Response verification devices using error correcting codes [ECC] or parity check

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Detection And Correction Of Errors (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Debugging And Monitoring (AREA)
  • Memory System (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP2021518728A 2018-10-05 2019-10-04 アドレス障害を検出するためのシステム、方法、及び装置 Active JP7387725B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US16/153,546 2018-10-05
US16/153,546 US11055172B2 (en) 2018-10-05 2018-10-05 Systems, methods, and apparatus to detect address faults
PCT/US2019/054784 WO2020072952A1 (en) 2018-10-05 2019-10-04 Systems, methods, and apparatus to detect address faults

Publications (3)

Publication Number Publication Date
JP2022504328A JP2022504328A (ja) 2022-01-13
JP2022504328A5 JP2022504328A5 (enExample) 2022-10-06
JP7387725B2 true JP7387725B2 (ja) 2023-11-28

Family

ID=70051106

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021518728A Active JP7387725B2 (ja) 2018-10-05 2019-10-04 アドレス障害を検出するためのシステム、方法、及び装置

Country Status (6)

Country Link
US (1) US11055172B2 (enExample)
EP (1) EP3861446B1 (enExample)
JP (1) JP7387725B2 (enExample)
KR (1) KR102950577B1 (enExample)
CN (1) CN112867992A (enExample)
WO (1) WO2020072952A1 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2548407A (en) * 2016-03-18 2017-09-20 Memoscale As Coding technique
US12321236B2 (en) 2020-05-11 2025-06-03 Samsung Electronics Co., Ltd. Systems, methods, and devices for fault resilient storage
US12298853B2 (en) 2020-05-11 2025-05-13 Samsung Electronics Co., Ltd. Systems, methods, and devices for data recovery with spare storage device and fault resilient storage device
US12306717B2 (en) * 2020-05-11 2025-05-20 Samsung Electronics Co., Ltd. Systems, methods, and devices for data recovery using parity space as recovery space
JP2022043635A (ja) * 2020-09-04 2022-03-16 キオクシア株式会社 メモリシステム
KR102317788B1 (ko) 2021-05-14 2021-10-26 삼성전자주식회사 스토리지 장치 및 스토리지 컨트롤러의 동작 방법
US11769567B2 (en) * 2021-07-19 2023-09-26 Nxp Usa, Inc. Devices and methods for preventing errors and detecting faults within a memory device
US11606099B1 (en) * 2021-09-23 2023-03-14 Texas Instruments Incorporated Fault detection within an analog-to-digital converter
US11853157B2 (en) * 2021-11-17 2023-12-26 Nxp B.V. Address fault detection system
WO2023091172A1 (en) * 2021-11-22 2023-05-25 Silicon Storage Technology, Inc. Address fault detection in a memory system
US11928021B2 (en) * 2022-03-31 2024-03-12 Micron Technology, Inc. Systems and methods for address fault detection
US12562213B2 (en) * 2023-07-24 2026-02-24 Taiwan Semiconductor Manufacturing Company, Ltd. Memory devices configured with adaptive word line pulse adjustment and methods for operating the same

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120030531A1 (en) 2010-07-30 2012-02-02 Infineon Technologies Ag Safe Memory Storage By Internal Operation Verification
JP2013073653A (ja) 2011-09-28 2013-04-22 Elpida Memory Inc 半導体装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5392302A (en) * 1991-03-13 1995-02-21 Quantum Corp. Address error detection technique for increasing the reliability of a storage subsystem
US5345582A (en) 1991-12-20 1994-09-06 Unisys Corporation Failure detection for instruction processor associative cache memories
JPH05225797A (ja) * 1992-02-14 1993-09-03 Hitachi Ltd 半導体メモリ回路
US5537425A (en) * 1992-09-29 1996-07-16 International Business Machines Corporation Parity-based error detection in a memory controller
US5453999A (en) * 1994-04-26 1995-09-26 Unisys Corporation Address verification system using parity for transmitting and receiving circuits
GB0322597D0 (en) * 2003-09-26 2003-10-29 Texas Instruments Ltd Soft error correction
DE102010029345A1 (de) * 2010-05-27 2011-12-08 Robert Bosch Gmbh Verfahren zum Erkennen eines Fehlers in einem AD-Wandler durch Paritätsvorhersagen
US9075741B2 (en) * 2011-12-16 2015-07-07 Intel Corporation Dynamic error handling using parity and redundant rows
US8806316B2 (en) * 2012-01-11 2014-08-12 Micron Technology, Inc. Circuits, integrated circuits, and methods for interleaved parity computation
US10541044B2 (en) * 2016-10-31 2020-01-21 Qualcomm Incorporated Providing efficient handling of memory array failures in processor-based systems
KR102766341B1 (ko) * 2016-11-30 2025-02-12 삼성전자주식회사 메모리 모듈, 이를 포함하는 메모리 시스템 및 메모리 시스템의 동작 방법

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120030531A1 (en) 2010-07-30 2012-02-02 Infineon Technologies Ag Safe Memory Storage By Internal Operation Verification
JP2013073653A (ja) 2011-09-28 2013-04-22 Elpida Memory Inc 半導体装置

Also Published As

Publication number Publication date
US20200110659A1 (en) 2020-04-09
EP3861446B1 (en) 2025-05-14
US11055172B2 (en) 2021-07-06
KR102950577B1 (ko) 2026-04-10
KR20210058982A (ko) 2021-05-24
EP3861446A4 (en) 2021-12-15
EP3861446A1 (en) 2021-08-11
WO2020072952A1 (en) 2020-04-09
CN112867992A (zh) 2021-05-28
JP2022504328A (ja) 2022-01-13

Similar Documents

Publication Publication Date Title
JP7387725B2 (ja) アドレス障害を検出するためのシステム、方法、及び装置
US8990657B2 (en) Selective masking for error correction
US9703622B2 (en) Detection of data corruption in a data processing device
TW201929441A (zh) 用於針對糾錯碼功能的連線功能測試的系統和方法
US8566672B2 (en) Selective checkbit modification for error correction
CN111078459B (zh) 半导体芯片的测试方法、装置及系统
US11934263B2 (en) Parity protected memory blocks merged with error correction code (ECC) protected blocks in a codeword for increased memory utilization
JP2018511888A (ja) ハードウェア検証用のランタイムｅｃｃエラー注入方式
JP2007300619A (ja) 異なるデータ保護方法間で切換えにおいてデータの完全性を維持する方法、装置及びプログラム
WO2014203031A1 (en) Device and method for executing a program, and method for storing a program
JP2019012919A (ja) 衝突検出システムおよび衝突検出方法
US9208027B2 (en) Address error detection
JPH07325764A (ja) エラー訂正可能なメモリ・デバイス
US9037948B2 (en) Error correction for memory systems
KR102892059B1 (ko) 메모리 시스템 및 메모리 시스템의 동작 방법
JP2014010712A (ja) 電子装置、電子装置制御方法及び電子装置制御プログラム
US11086796B2 (en) Address-coded access towards memory
US12499245B2 (en) Methods and apparatus for selective encryption of execute in place (XIP) data
US20250094275A1 (en) Efficient security metadata encoding in error correcting code (ecc) memory without dedicated ecc bits
CN112148308A (zh) 防止漏烧的数据烧写方法及其装置、数据烧写设备
US12385975B1 (en) Integrated circuits including error protection of fields in transferred information and field-based error signals and related methods
JP5381151B2 (ja) 情報処理装置、バス制御回路、バス制御方法及びバス制御プログラム
TW202109545A (zh) 記憶體裝置及其資料存取方法
CN112148310A (zh) 防止漏烧的数据烧写方法及其装置、数据烧写设备
CN112148309A (zh) 用于生产电控总成的方法及其装置、生产设备

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A821

Effective date: 20210405

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20211208

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20220928

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20220928

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20230621

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20230802

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20230802

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20231114

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20231115

R150 Certificate of patent or registration of utility model

Ref document number: 7387725

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150