JP7328667B2 - 検査装置 - Google Patents
検査装置 Download PDFInfo
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- JP7328667B2 JP7328667B2 JP2019051638A JP2019051638A JP7328667B2 JP 7328667 B2 JP7328667 B2 JP 7328667B2 JP 2019051638 A JP2019051638 A JP 2019051638A JP 2019051638 A JP2019051638 A JP 2019051638A JP 7328667 B2 JP7328667 B2 JP 7328667B2
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- 238000007689 inspection Methods 0.000 title claims description 72
- 230000005540 biological transmission Effects 0.000 claims description 67
- 238000006243 chemical reaction Methods 0.000 claims description 56
- 238000001514 detection method Methods 0.000 claims description 29
- 230000032258 transport Effects 0.000 claims description 19
- 230000006870 function Effects 0.000 description 49
- 230000035945 sensitivity Effects 0.000 description 13
- 238000010586 diagram Methods 0.000 description 4
- 230000009977 dual effect Effects 0.000 description 3
- 238000011109 contamination Methods 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 230000007547 defect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
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- 230000004048 modification Effects 0.000 description 1
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V13/00—Manufacturing, calibrating, cleaning, or repairing instruments or devices covered by groups G01V1/00 – G01V11/00
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V3/00—Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation
- G01V3/12—Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation operating with electromagnetic waves
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1016—X-ray
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10116—X-ray image
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30168—Image quality inspection
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- Manufacturing & Machinery (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Description
Claims (3)
- 対象物を搬送する搬送部と、
前記対象物に電磁波を照射する照射部と、
前記対象物を透過した第1エネルギー帯の電磁波を検知する複数の第1素子又は複数の前記第1素子で構成される複数の第1素子群を含む第1検知部、及び、前記対象物を透過した第2エネルギー帯の電磁波を検知する複数の第2素子又は複数の前記第2素子で構成される複数の第2素子群を含むと共に前記第1検知部と上下方向において対向して配置、又は、前記第1検知部と前記搬送部の搬送方向において対向して配置されている第2検知部を有する検知ユニットと、
各前記第1素子によって検知された前記電磁波に基づいて第1透過画像を生成すると共に、各前記第2素子によって検知された前記電磁波に基づいて第2透過画像を生成する生成部と、
前記第1透過画像に基づく前記第1素子の第1出力値と、当該第1素子と対向して配置されている前記第2素子における前記第2透過画像に基づく前記第2素子の第2出力値とを一致又は近似させる輝度変換関数を、複数の前記第1素子及び複数の前記第2素子のそれぞれについて算出、又は、前記第1透過画像に基づく複数の前記第1素子で構成される前記第1素子群の第1出力値と、当該第1素子群と対向して配置されている前記第2素子で構成されている前記第2素子群における前記第2透過画像に基づく前記第2素子群の第2出力値とを一致又は近似させる輝度変換関数を、複数の前記第1素子群及び複数の前記第2素子群のそれぞれについて算出する算出部と、
前記算出部によって算出された前記輝度変換関数に基づいて、前記第1素子又は前記第1素子群の前記第1出力値、及び、当該第1素子と対向して配置されている前記第2素子又は当該第1素子群と対向して配置されている前記第2素子群の前記第2出力値の少なくとも一方を補正する補正部と、を備える、検査装置。 - 前記生成部は、複数の異なる前記対象物、及び、前記搬送部上での位置が異なる前記対象物の少なくとも一方ついて、前記第1透過画像及び前記第2透過画像を複数生成し、
前記算出部は、複数の前記第1透過画像及び複数の前記第2透過画像に基づいて、前記輝度変換関数を算出する、請求項1に記載の検査装置。 - 前記補正部は、
前記対象物を含まない前記第1透過画像に基づいて、全ての前記第1素子のそれぞれの前記第1出力値が一致又は近似する第1輝度変換関数を算出し、
前記対象物を含まない前記2透過画像に基づいて、全ての前記第2素子のそれぞれの前記第2出力値が一致又は近似する第2輝度変換関数を算出し、
前記補正部は、前記算出部によって算出された前記第1輝度変換関数及び前記第2輝度変換関数に基づいて、各前記第1素子の前記第1出力値及び各前記第2素子の前記第2出力値を補正する、請求項1に記載の検査装置。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019051638A JP7328667B2 (ja) | 2019-03-19 | 2019-03-19 | 検査装置 |
US16/815,889 US11138716B2 (en) | 2019-03-19 | 2020-03-11 | Inspection apparatus |
KR1020200030625A KR102398211B1 (ko) | 2019-03-19 | 2020-03-12 | 검사장치 |
EP20163279.1A EP3719483A1 (en) | 2019-03-19 | 2020-03-16 | Inspection apparatus |
CN202010191627.5A CN111796336B (zh) | 2019-03-19 | 2020-03-18 | 检查装置 |
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JP2019051638A JP7328667B2 (ja) | 2019-03-19 | 2019-03-19 | 検査装置 |
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JP2020153777A JP2020153777A (ja) | 2020-09-24 |
JP7328667B2 true JP7328667B2 (ja) | 2023-08-17 |
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US (1) | US11138716B2 (ja) |
EP (1) | EP3719483A1 (ja) |
JP (1) | JP7328667B2 (ja) |
KR (1) | KR102398211B1 (ja) |
CN (1) | CN111796336B (ja) |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007127611A (ja) | 2005-11-07 | 2007-05-24 | Mitsubishi Heavy Ind Ltd | 異物検出装置 |
JP2012073056A (ja) | 2010-09-28 | 2012-04-12 | Ishida Co Ltd | X線検査装置 |
JP2013101041A (ja) | 2011-11-08 | 2013-05-23 | Hamamatsu Photonics Kk | 非破壊検査装置及び当該装置での位置ずれ検出方法 |
JP2016038364A (ja) | 2014-08-11 | 2016-03-22 | 株式会社イシダ | X線検査装置 |
JP2018155544A (ja) | 2017-03-16 | 2018-10-04 | 株式会社イシダ | X線検査装置 |
JP2019015577A (ja) | 2017-07-05 | 2019-01-31 | 株式会社イシダ | X線検査装置 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5049748A (en) * | 1989-10-19 | 1991-09-17 | Fuji Photo Film Co. Ltd. | Method and apparatus for forming energy subtraction images |
JP4074204B2 (ja) * | 2003-02-18 | 2008-04-09 | 名古屋電機工業株式会社 | X線検査装置、x線検査方法およびx線検査装置の制御プログラム |
JP3982817B2 (ja) * | 2003-03-07 | 2007-09-26 | 株式会社東芝 | 画像処理装置および画像処理方法 |
JP2007192574A (ja) * | 2006-01-17 | 2007-08-02 | Toshiba Corp | X線検査装置 |
JP5041751B2 (ja) | 2006-07-24 | 2012-10-03 | 株式会社イシダ | X線検査装置およびx線検査プログラム |
EP2778662B1 (en) * | 2011-11-09 | 2015-09-23 | Yamaha Hatsudoki Kabushiki Kaisha | X-ray inspection method and device |
WO2015041259A1 (ja) * | 2013-09-18 | 2015-03-26 | 株式会社イシダ | 検査装置 |
JP6274938B2 (ja) * | 2014-03-26 | 2018-02-07 | アンリツインフィビス株式会社 | X線検査装置 |
JP6654397B2 (ja) * | 2015-10-09 | 2020-02-26 | 株式会社イシダ | X線検査装置 |
JP6663374B2 (ja) * | 2017-02-28 | 2020-03-11 | アンリツインフィビス株式会社 | X線検査装置 |
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2019
- 2019-03-19 JP JP2019051638A patent/JP7328667B2/ja active Active
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2020
- 2020-03-11 US US16/815,889 patent/US11138716B2/en active Active
- 2020-03-12 KR KR1020200030625A patent/KR102398211B1/ko active IP Right Grant
- 2020-03-16 EP EP20163279.1A patent/EP3719483A1/en active Pending
- 2020-03-18 CN CN202010191627.5A patent/CN111796336B/zh active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007127611A (ja) | 2005-11-07 | 2007-05-24 | Mitsubishi Heavy Ind Ltd | 異物検出装置 |
JP2012073056A (ja) | 2010-09-28 | 2012-04-12 | Ishida Co Ltd | X線検査装置 |
JP2013101041A (ja) | 2011-11-08 | 2013-05-23 | Hamamatsu Photonics Kk | 非破壊検査装置及び当該装置での位置ずれ検出方法 |
JP2016038364A (ja) | 2014-08-11 | 2016-03-22 | 株式会社イシダ | X線検査装置 |
JP2018155544A (ja) | 2017-03-16 | 2018-10-04 | 株式会社イシダ | X線検査装置 |
JP2019015577A (ja) | 2017-07-05 | 2019-01-31 | 株式会社イシダ | X線検査装置 |
Also Published As
Publication number | Publication date |
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US20200302590A1 (en) | 2020-09-24 |
KR20200111630A (ko) | 2020-09-29 |
CN111796336A (zh) | 2020-10-20 |
EP3719483A1 (en) | 2020-10-07 |
JP2020153777A (ja) | 2020-09-24 |
CN111796336B (zh) | 2023-12-05 |
KR102398211B1 (ko) | 2022-05-13 |
US11138716B2 (en) | 2021-10-05 |
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