JP7245843B2 - 遮光膜、遮光膜の製造方法、光学素子、固体撮像素子、ヘッドライトユニット - Google Patents
遮光膜、遮光膜の製造方法、光学素子、固体撮像素子、ヘッドライトユニット Download PDFInfo
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Images
Classifications
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- F21S41/00—Illuminating devices specially adapted for vehicle exteriors, e.g. headlamps
- F21S41/40—Illuminating devices specially adapted for vehicle exteriors, e.g. headlamps characterised by screens, non-reflecting members, light-shielding members or fixed shades
- F21S41/43—Illuminating devices specially adapted for vehicle exteriors, e.g. headlamps characterised by screens, non-reflecting members, light-shielding members or fixed shades characterised by the shape thereof
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
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- F21S45/00—Arrangements within vehicle lighting devices specially adapted for vehicle exteriors, for purposes other than emission or distribution of light
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- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/105—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers having substances, e.g. indicators, for forming visible images
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/40—Treatment after imagewise removal, e.g. baking
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/1462—Coatings
- H01L27/14623—Optical shielding
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Optics & Photonics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Power Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Architecture (AREA)
- Structural Engineering (AREA)
- Inorganic Chemistry (AREA)
- Optical Filters (AREA)
- Materials For Photolithography (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Optical Elements Other Than Lenses (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
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JP2018177855 | 2018-09-21 | ||
JP2018177855 | 2018-09-21 | ||
PCT/JP2019/032377 WO2020059382A1 (fr) | 2018-09-21 | 2019-08-20 | Film de protection contre la lumière, procédé de fabrication d'un film de protection contre la lumière, élément optique, élément d'imagerie à semi-conducteurs et unité de phare |
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JPWO2020059382A1 JPWO2020059382A1 (ja) | 2021-09-24 |
JP7245843B2 true JP7245843B2 (ja) | 2023-03-24 |
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JP2020548151A Active JP7245843B2 (ja) | 2018-09-21 | 2019-08-20 | 遮光膜、遮光膜の製造方法、光学素子、固体撮像素子、ヘッドライトユニット |
Country Status (5)
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JP (1) | JP7245843B2 (fr) |
KR (1) | KR102660236B1 (fr) |
CN (1) | CN112513692A (fr) |
TW (2) | TW202422228A (fr) |
WO (1) | WO2020059382A1 (fr) |
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CN116323716A (zh) * | 2020-09-28 | 2023-06-23 | 三菱化学株式会社 | 感光性着色组合物、固化物、有机电致发光元件和图像显示装置 |
CN116997858A (zh) * | 2021-03-23 | 2023-11-03 | 东丽株式会社 | 负型感光性树脂组合物、负型感光性树脂组合物膜、固化物、固化物的制造方法、中空结构体、及电子部件 |
CN113001325B (zh) * | 2021-03-25 | 2022-11-22 | 中国科学院国家天文台南京天文光学技术研究所 | 一种基于主动压力调制的阵列研磨方法 |
CN113867101B (zh) * | 2021-10-09 | 2023-10-24 | 杭州福斯特电子材料有限公司 | 用于led的白色感光覆盖膜组合物、覆盖膜及其制备方法 |
WO2024004793A1 (fr) * | 2022-06-30 | 2024-01-04 | 富士フイルム株式会社 | Composé, composition, film, procédé de production de composition colorée, et procédé de production de stratifié pour élément d'affichage |
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JP2001051104A (ja) | 1999-08-12 | 2001-02-23 | Seiko Epson Corp | マイクロレンズ基板、液晶パネル用対向基板、液晶パネルおよび投射型表示装置 |
JP2003177211A (ja) | 2001-12-11 | 2003-06-27 | Seiko Epson Corp | マイクロレンズ基板、液晶パネル用対向基板、液晶パネル、投射型表示装置 |
JP2013517206A (ja) | 2010-01-16 | 2013-05-16 | 日本板硝子株式会社 | 高品質放射制御コーティング、放射制御ガラスおよび製造方法 |
JP2014052436A (ja) | 2012-09-05 | 2014-03-20 | Dainippon Printing Co Ltd | カラーフィルタおよび表示装置 |
JP2015110691A (ja) | 2013-12-06 | 2015-06-18 | 大日精化工業株式会社 | 近赤外線透過性黒色アゾ顔料、近赤外線透過性黒色アゾ顔料の製造方法、これらの黒色アゾ顔料を用いた着色組成物、物品の着色方法および着色物品 |
WO2017159876A1 (fr) | 2016-03-18 | 2017-09-21 | 東レ株式会社 | Composition de résine photosensible de type négatif, film durci, dispositif d'affichage ayant un film durci, et procédé de production s'y rapportant |
WO2018066296A1 (fr) | 2016-10-04 | 2018-04-12 | 富士フイルム株式会社 | Composition de dispersion, composition durcissable, film durci, filtre coloré, élément d'imagerie à semi-conducteurs, dispositif d'imagerie à semi-conducteurs, capteur de rayons infrarouges, procédé de production d'une composition de dispersion, procédé de production d'une composition durcissable, et procédé de production d'un film durci |
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JP4699249B2 (ja) * | 2006-03-17 | 2011-06-08 | 大日本印刷株式会社 | 有機エレクトロルミネッセンス素子用カラーフィルタ基板 |
JP2011248197A (ja) | 2010-05-28 | 2011-12-08 | Fujifilm Corp | カラーフィルタの製造方法、カラーフィルタ、ならびにそれを用いる液晶ディスプレイおよび画像表示デバイス |
WO2014192797A1 (fr) * | 2013-05-29 | 2014-12-04 | テイ・エス テック株式会社 | Partie d'émission de lumière pour véhicule |
JP6331314B2 (ja) * | 2013-10-03 | 2018-05-30 | 東レ株式会社 | フレキシブルカラーフィルター、その製造方法ならびにそれを用いたフレキシブル発光デバイス |
-
2019
- 2019-08-20 KR KR1020217001039A patent/KR102660236B1/ko active IP Right Grant
- 2019-08-20 WO PCT/JP2019/032377 patent/WO2020059382A1/fr active Application Filing
- 2019-08-20 CN CN201980050527.6A patent/CN112513692A/zh active Pending
- 2019-08-20 JP JP2020548151A patent/JP7245843B2/ja active Active
- 2019-08-22 TW TW112140588A patent/TW202422228A/zh unknown
- 2019-08-22 TW TW108129954A patent/TW202022498A/zh unknown
Patent Citations (7)
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JP2001051104A (ja) | 1999-08-12 | 2001-02-23 | Seiko Epson Corp | マイクロレンズ基板、液晶パネル用対向基板、液晶パネルおよび投射型表示装置 |
JP2003177211A (ja) | 2001-12-11 | 2003-06-27 | Seiko Epson Corp | マイクロレンズ基板、液晶パネル用対向基板、液晶パネル、投射型表示装置 |
JP2013517206A (ja) | 2010-01-16 | 2013-05-16 | 日本板硝子株式会社 | 高品質放射制御コーティング、放射制御ガラスおよび製造方法 |
JP2014052436A (ja) | 2012-09-05 | 2014-03-20 | Dainippon Printing Co Ltd | カラーフィルタおよび表示装置 |
JP2015110691A (ja) | 2013-12-06 | 2015-06-18 | 大日精化工業株式会社 | 近赤外線透過性黒色アゾ顔料、近赤外線透過性黒色アゾ顔料の製造方法、これらの黒色アゾ顔料を用いた着色組成物、物品の着色方法および着色物品 |
WO2017159876A1 (fr) | 2016-03-18 | 2017-09-21 | 東レ株式会社 | Composition de résine photosensible de type négatif, film durci, dispositif d'affichage ayant un film durci, et procédé de production s'y rapportant |
WO2018066296A1 (fr) | 2016-10-04 | 2018-04-12 | 富士フイルム株式会社 | Composition de dispersion, composition durcissable, film durci, filtre coloré, élément d'imagerie à semi-conducteurs, dispositif d'imagerie à semi-conducteurs, capteur de rayons infrarouges, procédé de production d'une composition de dispersion, procédé de production d'une composition durcissable, et procédé de production d'un film durci |
Also Published As
Publication number | Publication date |
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TW202422228A (zh) | 2024-06-01 |
WO2020059382A1 (fr) | 2020-03-26 |
JPWO2020059382A1 (ja) | 2021-09-24 |
TW202022498A (zh) | 2020-06-16 |
CN112513692A (zh) | 2021-03-16 |
KR20210021527A (ko) | 2021-02-26 |
KR102660236B1 (ko) | 2024-04-25 |
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