JP7236922B2 - 熱処理装置、熱処理方法及び成膜方法 - Google Patents
熱処理装置、熱処理方法及び成膜方法 Download PDFInfo
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- JP7236922B2 JP7236922B2 JP2019086436A JP2019086436A JP7236922B2 JP 7236922 B2 JP7236922 B2 JP 7236922B2 JP 2019086436 A JP2019086436 A JP 2019086436A JP 2019086436 A JP2019086436 A JP 2019086436A JP 7236922 B2 JP7236922 B2 JP 7236922B2
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
- H10P72/0602—Temperature monitoring
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- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0431—Apparatus for thermal treatment
- H10P72/0432—Apparatus for thermal treatment mainly by conduction
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/34—Nitrides
- C23C16/345—Silicon nitride
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
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- C—CHEMISTRY; METALLURGY
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45527—Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45544—Atomic layer deposition [ALD] characterized by the apparatus
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45578—Elongated nozzles, tubes with holes
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- C—CHEMISTRY; METALLURGY
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/46—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for heating the substrate
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/52—Controlling or regulating the coating process
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- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
- H10P14/6326—Deposition processes
- H10P14/6328—Deposition from the gas or vapour phase
- H10P14/6332—Deposition from the gas or vapour phase using thermal evaporation
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- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
- H10P14/6326—Deposition processes
- H10P14/6328—Deposition from the gas or vapour phase
- H10P14/6334—Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
- H10P14/6339—Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition deposition by cyclic CVD, e.g. ALD, ALE or pulsed CVD
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- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/69—Inorganic materials
- H10P14/692—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses
- H10P14/6921—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon
- H10P14/69215—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon the material being a silicon oxide, e.g. SiO2
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- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/69—Inorganic materials
- H10P14/692—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses
- H10P14/6938—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses the material containing at least one metal element, e.g. metal oxides, metal oxynitrides or metal oxycarbides
- H10P14/6939—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses the material containing at least one metal element, e.g. metal oxides, metal oxynitrides or metal oxycarbides characterised by the metal
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- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/69—Inorganic materials
- H10P14/694—Inorganic materials composed of nitrides
- H10P14/6943—Inorganic materials composed of nitrides containing silicon
- H10P14/69433—Inorganic materials composed of nitrides containing silicon the material being a silicon nitride not containing oxygen, e.g. SixNy or SixByNz
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- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
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- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0431—Apparatus for thermal treatment
- H10P72/0434—Apparatus for thermal treatment mainly by convection
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- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/10—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
- H10P72/12—Vertical boat type carrier whereby the substrates are horizontally supported, e.g. comprising rod-shaped elements
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- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
- Formation Of Insulating Films (AREA)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019086436A JP7236922B2 (ja) | 2019-04-26 | 2019-04-26 | 熱処理装置、熱処理方法及び成膜方法 |
| KR1020200046613A KR102626685B1 (ko) | 2019-04-26 | 2020-04-17 | 열처리 장치, 열처리 방법 및 성막 방법 |
| US16/852,475 US11784070B2 (en) | 2019-04-26 | 2020-04-18 | Heat treatment apparatus, heat treatment method, and film forming method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019086436A JP7236922B2 (ja) | 2019-04-26 | 2019-04-26 | 熱処理装置、熱処理方法及び成膜方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2020184553A JP2020184553A (ja) | 2020-11-12 |
| JP2020184553A5 JP2020184553A5 (https=) | 2021-11-25 |
| JP7236922B2 true JP7236922B2 (ja) | 2023-03-10 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2019086436A Active JP7236922B2 (ja) | 2019-04-26 | 2019-04-26 | 熱処理装置、熱処理方法及び成膜方法 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US11784070B2 (https=) |
| JP (1) | JP7236922B2 (https=) |
| KR (1) | KR102626685B1 (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20200340116A1 (en) * | 2019-04-26 | 2020-10-29 | Tokyo Electron Limited | Heat treatment apparatus, heat treatment method, and film forming method |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7055075B2 (ja) * | 2018-07-20 | 2022-04-15 | 東京エレクトロン株式会社 | 熱処理装置及び熱処理方法 |
| CN112998935B (zh) * | 2021-02-23 | 2022-03-18 | 连云港天才照明电器有限公司 | 一种颈椎治疗仪用碳纤维加热管 |
| KR102736768B1 (ko) * | 2022-08-31 | 2024-12-03 | 주식회사 유진테크 | 배치식 기판처리장치 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008016742A (ja) | 2006-07-07 | 2008-01-24 | Toshiba Corp | 成膜装置、熱緩衝部材及び成膜方法 |
| JP2014067877A (ja) | 2012-09-26 | 2014-04-17 | Hitachi Kokusai Electric Inc | 半導体装置の製造方法、基板処理方法、基板処理装置、プログラムおよび半導体装置 |
| JP2014236129A (ja) | 2013-06-03 | 2014-12-15 | 株式会社日立国際電気 | 基板処理装置、半導体装置の製造方法およびプログラム |
| JP2015010247A (ja) | 2013-06-27 | 2015-01-19 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置及び基板処理プログラム |
| JP2018166142A (ja) | 2017-03-28 | 2018-10-25 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置およびプログラム |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4516838B2 (ja) | 2004-12-27 | 2010-08-04 | 株式会社日立国際電気 | 基板処理装置および半導体装置の製造方法 |
| JP5545061B2 (ja) * | 2010-06-18 | 2014-07-09 | 東京エレクトロン株式会社 | 処理装置及び成膜方法 |
| US20150370245A1 (en) * | 2012-12-07 | 2015-12-24 | Hitachi Kokusai Electric Inc. | Substrate processing apparatus, substrate processing method, semiconductor device manufacturing method, and control program |
| JP6253214B2 (ja) * | 2015-01-26 | 2017-12-27 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置および記録媒体 |
| JP6987016B2 (ja) * | 2018-04-27 | 2021-12-22 | 東京エレクトロン株式会社 | 半導体製造装置の組立装置 |
| JP6909762B2 (ja) * | 2018-07-23 | 2021-07-28 | 株式会社Kokusai Electric | 半導体装置の製造方法、基板処理方法、基板処理装置、およびプログラム |
| WO2020026445A1 (ja) * | 2018-08-03 | 2020-02-06 | 株式会社Kokusai Electric | 基板処理装置およびデバイス製造方法 |
| JP7122907B2 (ja) * | 2018-08-24 | 2022-08-22 | 東京エレクトロン株式会社 | 昇降装置、半導体製造装置の組立装置、半導体製造装置の組立方法 |
| KR102630574B1 (ko) * | 2018-10-31 | 2024-01-30 | 가부시키가이샤 코쿠사이 엘렉트릭 | 기판 처리 방법, 반도체 장치의 제조 방법, 기판 처리 장치 및 프로그램 |
| TWI725717B (zh) * | 2019-03-28 | 2021-04-21 | 日商國際電氣股份有限公司 | 半導體裝置之製造方法、基板處理裝置及記錄媒體 |
| JP7241597B2 (ja) * | 2019-04-23 | 2023-03-17 | 東京エレクトロン株式会社 | 制御方法、計測方法、制御装置及び熱処理装置 |
| JP7236922B2 (ja) * | 2019-04-26 | 2023-03-10 | 東京エレクトロン株式会社 | 熱処理装置、熱処理方法及び成膜方法 |
| JP7407521B2 (ja) * | 2019-04-26 | 2024-01-04 | 東京エレクトロン株式会社 | 成膜方法及び成膜装置 |
| JP7101204B2 (ja) * | 2020-01-31 | 2022-07-14 | 株式会社Kokusai Electric | 半導体装置の製造方法、プログラム、基板処理装置及び基板処理方法 |
| JP7315607B2 (ja) * | 2021-03-16 | 2023-07-26 | 株式会社Kokusai Electric | 基板処理装置、基板処理方法及び半導体装置の製造方法 |
| JP7290684B2 (ja) * | 2021-03-26 | 2023-06-13 | 株式会社Kokusai Electric | 反応管、処理装置、および半導体装置の製造方法 |
| JP7740821B2 (ja) * | 2021-06-29 | 2025-09-17 | 東京エレクトロン株式会社 | 成膜装置 |
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2019
- 2019-04-26 JP JP2019086436A patent/JP7236922B2/ja active Active
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2020
- 2020-04-17 KR KR1020200046613A patent/KR102626685B1/ko active Active
- 2020-04-18 US US16/852,475 patent/US11784070B2/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
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| JP2008016742A (ja) | 2006-07-07 | 2008-01-24 | Toshiba Corp | 成膜装置、熱緩衝部材及び成膜方法 |
| JP2014067877A (ja) | 2012-09-26 | 2014-04-17 | Hitachi Kokusai Electric Inc | 半導体装置の製造方法、基板処理方法、基板処理装置、プログラムおよび半導体装置 |
| JP2014236129A (ja) | 2013-06-03 | 2014-12-15 | 株式会社日立国際電気 | 基板処理装置、半導体装置の製造方法およびプログラム |
| JP2015010247A (ja) | 2013-06-27 | 2015-01-19 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置及び基板処理プログラム |
| JP2018166142A (ja) | 2017-03-28 | 2018-10-25 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置およびプログラム |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20200340116A1 (en) * | 2019-04-26 | 2020-10-29 | Tokyo Electron Limited | Heat treatment apparatus, heat treatment method, and film forming method |
| US11784070B2 (en) * | 2019-04-26 | 2023-10-10 | Tokyo Electron Limited | Heat treatment apparatus, heat treatment method, and film forming method |
Also Published As
| Publication number | Publication date |
|---|---|
| KR102626685B1 (ko) | 2024-01-17 |
| US20200340116A1 (en) | 2020-10-29 |
| KR20200125464A (ko) | 2020-11-04 |
| US11784070B2 (en) | 2023-10-10 |
| JP2020184553A (ja) | 2020-11-12 |
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