JP7197357B2 - 炭化水素中のアルキル-インジウム化合物の溶液を使用した有機金属気相堆積法 - Google Patents
炭化水素中のアルキル-インジウム化合物の溶液を使用した有機金属気相堆積法 Download PDFInfo
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- 238000007740 vapor deposition Methods 0.000 title claims description 21
- 229930195733 hydrocarbon Natural products 0.000 title description 21
- 150000002430 hydrocarbons Chemical class 0.000 title description 21
- 125000002524 organometallic group Chemical group 0.000 title description 5
- 238000000034 method Methods 0.000 claims description 94
- 239000007789 gas Substances 0.000 claims description 58
- 229910052738 indium Inorganic materials 0.000 claims description 55
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims description 53
- 238000006243 chemical reaction Methods 0.000 claims description 44
- IBEFSUTVZWZJEL-UHFFFAOYSA-N trimethylindium Chemical compound C[In](C)C IBEFSUTVZWZJEL-UHFFFAOYSA-N 0.000 claims description 44
- 239000002243 precursor Substances 0.000 claims description 42
- 150000001875 compounds Chemical class 0.000 claims description 41
- 239000007788 liquid Substances 0.000 claims description 36
- 239000012159 carrier gas Substances 0.000 claims description 28
- 238000002156 mixing Methods 0.000 claims description 26
- 125000004432 carbon atom Chemical group C* 0.000 claims description 17
- 239000000758 substrate Substances 0.000 claims description 17
- 229910052799 carbon Inorganic materials 0.000 claims description 14
- 125000003118 aryl group Chemical group 0.000 claims description 9
- 238000004519 manufacturing process Methods 0.000 claims description 8
- 239000000126 substance Substances 0.000 claims description 6
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 claims description 4
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 claims description 4
- 150000002471 indium Chemical class 0.000 claims description 2
- 239000000243 solution Substances 0.000 description 58
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- -1 amine compound Chemical class 0.000 description 7
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 7
- 238000002488 metal-organic chemical vapour deposition Methods 0.000 description 7
- 239000001301 oxygen Substances 0.000 description 7
- 229910052760 oxygen Inorganic materials 0.000 description 7
- 239000004065 semiconductor Substances 0.000 description 7
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 6
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 6
- 239000004215 Carbon black (E152) Substances 0.000 description 6
- IMNFDUFMRHMDMM-UHFFFAOYSA-N N-Heptane Chemical compound CCCCCCC IMNFDUFMRHMDMM-UHFFFAOYSA-N 0.000 description 6
- 238000000354 decomposition reaction Methods 0.000 description 6
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- 239000000047 product Substances 0.000 description 6
- 150000003254 radicals Chemical class 0.000 description 6
- 238000005229 chemical vapour deposition Methods 0.000 description 5
- 239000001257 hydrogen Substances 0.000 description 5
- 229910052739 hydrogen Inorganic materials 0.000 description 5
- 239000012535 impurity Substances 0.000 description 5
- 230000010354 integration Effects 0.000 description 5
- 239000000725 suspension Substances 0.000 description 5
- HNRMPXKDFBEGFZ-UHFFFAOYSA-N 2,2-dimethylbutane Chemical compound CCC(C)(C)C HNRMPXKDFBEGFZ-UHFFFAOYSA-N 0.000 description 4
- 238000010438 heat treatment Methods 0.000 description 4
- 230000008018 melting Effects 0.000 description 4
- 238000002844 melting Methods 0.000 description 4
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- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 3
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- 150000002472 indium compounds Chemical class 0.000 description 3
- 229910052757 nitrogen Inorganic materials 0.000 description 3
- TVMXDCGIABBOFY-UHFFFAOYSA-N octane Chemical compound CCCCCCCC TVMXDCGIABBOFY-UHFFFAOYSA-N 0.000 description 3
- 238000000103 photoluminescence spectrum Methods 0.000 description 3
- PFEOZHBOMNWTJB-UHFFFAOYSA-N 3-methylpentane Chemical compound CCC(C)CC PFEOZHBOMNWTJB-UHFFFAOYSA-N 0.000 description 2
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 2
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 2
- ATUOYWHBWRKTHZ-UHFFFAOYSA-N Propane Chemical compound CCC ATUOYWHBWRKTHZ-UHFFFAOYSA-N 0.000 description 2
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 2
- 230000002411 adverse Effects 0.000 description 2
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- QWTDNUCVQCZILF-UHFFFAOYSA-N isopentane Chemical compound CCC(C)C QWTDNUCVQCZILF-UHFFFAOYSA-N 0.000 description 2
- 239000000463 material Substances 0.000 description 2
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- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 2
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- OTMSDBZUPAUEDD-UHFFFAOYSA-N Ethane Chemical compound CC OTMSDBZUPAUEDD-UHFFFAOYSA-N 0.000 description 1
- 101150054880 NASP gene Proteins 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 125000002015 acyclic group Chemical group 0.000 description 1
- 239000003570 air Substances 0.000 description 1
- CSDREXVUYHZDNP-UHFFFAOYSA-N alumanylidynesilicon Chemical compound [Al].[Si] CSDREXVUYHZDNP-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 239000012080 ambient air Substances 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 1
- 150000001555 benzenes Chemical group 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
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- JMMJWXHSCXIWRF-UHFFFAOYSA-N ethyl(dimethyl)indigane Chemical compound CC[In](C)C JMMJWXHSCXIWRF-UHFFFAOYSA-N 0.000 description 1
- 230000005496 eutectics Effects 0.000 description 1
- 238000010348 incorporation Methods 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
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- YWFWDNVOPHGWMX-UHFFFAOYSA-N n,n-dimethyldodecan-1-amine Chemical compound CCCCCCCCCCCCN(C)C YWFWDNVOPHGWMX-UHFFFAOYSA-N 0.000 description 1
- IJDNQMDRQITEOD-UHFFFAOYSA-N n-butane Chemical compound CCCC IJDNQMDRQITEOD-UHFFFAOYSA-N 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000004886 process control Methods 0.000 description 1
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- 239000001294 propane Substances 0.000 description 1
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- 238000013268 sustained release Methods 0.000 description 1
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- ZGNPLWZYVAFUNZ-UHFFFAOYSA-N tert-butylphosphane Chemical compound CC(C)(C)P ZGNPLWZYVAFUNZ-UHFFFAOYSA-N 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- OTRPZROOJRIMKW-UHFFFAOYSA-N triethylindigane Chemical compound CC[In](CC)CC OTRPZROOJRIMKW-UHFFFAOYSA-N 0.000 description 1
- JLTRXTDYQLMHGR-UHFFFAOYSA-N trimethylaluminium Chemical compound C[Al](C)C JLTRXTDYQLMHGR-UHFFFAOYSA-N 0.000 description 1
- XCZXGTMEAKBVPV-UHFFFAOYSA-N trimethylgallium Chemical compound C[Ga](C)C XCZXGTMEAKBVPV-UHFFFAOYSA-N 0.000 description 1
- 238000005019 vapor deposition process Methods 0.000 description 1
- 238000001947 vapour-phase growth Methods 0.000 description 1
- 239000012855 volatile organic compound Substances 0.000 description 1
- 239000011787 zinc oxide Substances 0.000 description 1
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
- C23C16/407—Oxides of zinc, germanium, cadmium, indium, tin, thallium or bismuth
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/301—AIII BV compounds, where A is Al, Ga, In or Tl and B is N, P, As, Sb or Bi
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
- C23C16/4481—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by evaporation using carrier gas in contact with the source material
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- C30B29/02—Elements
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- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
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- C30B35/00—Apparatus not otherwise provided for, specially adapted for the growth, production or after-treatment of single crystals or of a homogeneous polycrystalline material with defined structure
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Description
全体として、上述した欠点を克服する、有機金属気相堆積法によるインジウム含有層の、改良された生成方法が必要とされている。
本発明の主題は、有機金属気相堆積法によりインジウム含有層を生成するための方法であり、ここでインジウム含有層が反応室内で基材上に生成され、インジウム含有層が式InR3を有するインジウム含有前駆体化合物の形態でプロセスへと送達され、互いに独立したラジカルRが1~6個の炭素原子を有するアルキルラジカルから選択され、溶媒を含有する溶液内でインジウム含有前駆体化合物の送達が生じることを特徴とし、またインジウム含有前駆体化合物がその中に溶解し、溶媒が1~8個の炭素原子を有する少なくとも1つの炭化水素を有する。
(a)5~60重量%-特に、15~55重量%-の、式InR3の化合物であって、Rが1~6個の炭素原子を有するアルキルラジカルから互い独立して選択され、好ましくはトリメチルインジウムである化合物、及び
(b)40~95重量%-特に45~85重量%-の、1~8個の炭素原子を有する少なくとも1つの炭化水素、からなる溶液である。
(A)溶液を送達するための液体供給ラインと、
(B)溶液を計測するための液体流量調整器と、
(C)不活性キャリアガスを送達するための手段と、
(D)キャリアガスを計測するためのガス流量調整器と、
(E)溶液を蒸発させるための加熱装置及びキャリアガスを混合するための混合室を備えた直接蒸発器と、
(F)基材上にインジウム含有層を生成させるための反応室、及び
(G)気相を反応室内へと送達するためのガス供給ラインと、を具備する装置である。
Aixtron AIX 200-GFR反応器系にて、堆積を実施した。6800mL/分の流速を有する水素(H2)を、キャリアガスとして使用した。50mbarにて堆積を実施した。アルミニウム-シリコン共融混合物の融点(融点577℃)との比較に基づいて、温度を較正した。
1)((AI0.3Ga0.7)0.5In0.5)P成長率1.53μm/hを有する二重異構造。III族前駆体に対するV族の比は96であった。堆積温度は685℃であった。このように堆積した層を、フォトルミネッセンス測定のために使用した。
2)((AI0.7Ga0.3)0.5In0.5)P SIMS測定のための多層構造。この関係において、III族前駆体に対するV族の比と同様に、異なる温度特性を調査した:V/III=25、50及び100、T=625、655、670、685℃。このように堆積した層を、SIMS測定(二次イオン質量分析)のために使用した。
それらのフォトルミネッセンスに関して、Nd-YAGレーザを用いた刺激手段により、層を調査した。基準としてNAsP社で使用されている2つの試料が、比較としての役割を果たした。それらのフォト特性は上限及び下限として機能し、また試料の適格性を評価するために使用される。測定の構成を、図2に示す。
二次イオン質量分析は、どれくらい多くの不純物が試料中に存在するか、という情報を提供する。
1 溶液入口
2 直接蒸発器
3 弁
4 反応室
5 液体流量調整器
6 液体供給ライン
8 加熱装置
9 混合室
11 キャリアガス供給
12 ガス流量調整器
13 弁
16,18 ガス導入口ライン
17 ガス放出口ライン
Claims (9)
- 有機金属気相堆積法によってインジウム含有層を生成させるための方法であって、前記インジウム含有層が多層状であり、前記インジウム含有層が反応室(4)内で基材上に生成され、式InR3を有するインジウム含有前駆体化合物の形態で前記インジウムがプロセスへと送達され、互いに独立した前記ラジカルRがメチル及び/又はエチルから選択され、
少なくとも1つの追加の反応性物質が、前記反応室(4)へと送達され、
前記インジウム含有前駆体化合物が、15~60重量%のインジウム含有前駆体化合物及び40~85重量%の6~8個の炭素原子を有する芳香族からなる溶液中で送達されることを特徴とする、方法。 - 前記有機金属気相堆積法が有機金属気相成長法である、請求項1に記載の方法。
- 前記インジウム含有前駆体化合物がトリメチルインジウムである、請求項1~2のいずれか一項以上に記載の方法。
- 前記反応室(4)内へと導入する前に直接蒸発器(2)を使用して、前記溶液を気相へと転化させる、請求項1~3のいずれか一項以上に記載の方法。
- 前記直接蒸発器(2)が0℃~100℃の温度-好ましくは、10℃~50℃の温度-及び/又は50mbar~1200mbarの圧力を有する、請求項4に記載の方法。
- 前記反応室(4)内へと導入する前に、前記溶液を前記気相へと転化させる、請求項4又は5の少なくともいずれか一項に記載の方法。
- 前記直接蒸発器(2)が、前記気相とキャリアガスとが混合される混合室(2)を有する、請求項6に記載の方法。
- 前記直接蒸発器(2)が液体流量調整器(5)、ガス流量調整器(12)、混合室(2)、及び混合弁を有し、前記気相とキャリアガスとが前記混合室(2)で混合され、前記液体流量調整器(5)及び前記ガス流量調整器(12)が前記混合室(2)の前に接続され、前記混合弁が前記液体流量調整器(5)又は前記ガス流量調整器(12)及び前記混合室(2)の間に配置される、請求項4~7の少なくともいずれか一項に記載の方法。
- 有機金属気相堆積法によってインジウム含有層を生成させるための、
(a)5~60重量%の、式InR3の化合物であって、Rがメチル及び/又はエチルから互いに独立して選択される化合物、及び
(b)40~95重量%の、6~8個の炭素原子を有する芳香族、からなる溶液の使用であって、
前記インジウム含有層が多層状である、使用。
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