JP7183473B2 - 劣化診断方法および劣化診断装置 - Google Patents

劣化診断方法および劣化診断装置 Download PDF

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Publication number
JP7183473B2
JP7183473B2 JP2022501458A JP2022501458A JP7183473B2 JP 7183473 B2 JP7183473 B2 JP 7183473B2 JP 2022501458 A JP2022501458 A JP 2022501458A JP 2022501458 A JP2022501458 A JP 2022501458A JP 7183473 B2 JP7183473 B2 JP 7183473B2
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Prior art keywords
thin film
metal thin
insulator
film wiring
voltage electrical
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Japanese (ja)
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JPWO2021166095A1 (fr
Inventor
宗一郎 藤原
伸介 三木
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Mitsubishi Electric Corp
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Mitsubishi Electric Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP2022501458A 2020-02-19 2020-02-19 劣化診断方法および劣化診断装置 Active JP7183473B2 (ja)

Applications Claiming Priority (1)

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PCT/JP2020/006415 WO2021166095A1 (fr) 2020-02-19 2020-02-19 Procédé de diagnostic de détérioration et dispositif de diagnostic de détérioration

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JPWO2021166095A1 JPWO2021166095A1 (fr) 2021-08-26
JP7183473B2 true JP7183473B2 (ja) 2022-12-05

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JP (1) JP7183473B2 (fr)
WO (1) WO2021166095A1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023248299A1 (fr) * 2022-06-20 2023-12-28 三菱電機株式会社 Procédé de diagnostic de dégradation et dispositif de diagnostic de dégradation

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5332961A (en) 1986-11-06 1994-07-26 Ford Motor Company Resistive oil quality sensor
JP2012231633A (ja) 2011-04-27 2012-11-22 Mitsubishi Electric Corp 受配電機器の余寿命診断方法および余寿命診断装置
JP2017198547A (ja) 2016-04-27 2017-11-02 株式会社東芝 絶縁劣化試験装置および絶縁劣化試験方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4045776B2 (ja) * 2001-04-17 2008-02-13 三菱電機株式会社 受配電設備の寿命診断方法
JP4121430B2 (ja) * 2003-08-08 2008-07-23 三菱電機株式会社 電気機器の絶縁診断方法
JP5944773B2 (ja) * 2012-07-24 2016-07-05 株式会社日立製作所 受変電設備における絶縁物の余寿命診断方法
JP6045444B2 (ja) * 2013-06-14 2016-12-14 三菱電機株式会社 受配電機器の余寿命診断方法および余寿命診断装置
JP7241476B2 (ja) * 2018-06-27 2023-03-17 三菱電機株式会社 受配電機器の短絡余寿命診断方法および短絡余寿命診断システム

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5332961A (en) 1986-11-06 1994-07-26 Ford Motor Company Resistive oil quality sensor
JP2012231633A (ja) 2011-04-27 2012-11-22 Mitsubishi Electric Corp 受配電機器の余寿命診断方法および余寿命診断装置
JP2017198547A (ja) 2016-04-27 2017-11-02 株式会社東芝 絶縁劣化試験装置および絶縁劣化試験方法

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WO2021166095A1 (fr) 2021-08-26
JPWO2021166095A1 (fr) 2021-08-26

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