JP7129647B2 - 測定端末、測定システム、測定方法およびプログラム - Google Patents

測定端末、測定システム、測定方法およびプログラム Download PDF

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Publication number
JP7129647B2
JP7129647B2 JP2018121556A JP2018121556A JP7129647B2 JP 7129647 B2 JP7129647 B2 JP 7129647B2 JP 2018121556 A JP2018121556 A JP 2018121556A JP 2018121556 A JP2018121556 A JP 2018121556A JP 7129647 B2 JP7129647 B2 JP 7129647B2
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Prior art keywords
inspection object
sound data
abnormality
inspection
sound
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JP2020003282A5 (enExample
JP2020003282A (ja
Inventor
亮太 藤井
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Panasonic Intellectual Property Management Co Ltd
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Panasonic Intellectual Property Management Co Ltd
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Priority to JP2018121556A priority Critical patent/JP7129647B2/ja
Priority to CN201980056209.0A priority patent/CN112639420B/zh
Priority to US17/255,279 priority patent/US11629993B2/en
Priority to PCT/JP2019/010422 priority patent/WO2020003635A1/ja
Publication of JP2020003282A publication Critical patent/JP2020003282A/ja
Publication of JP2020003282A5 publication Critical patent/JP2020003282A5/ja
Priority to JP2022127946A priority patent/JP7442102B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H9/00—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by using radiation-sensitive means, e.g. optical means
    • G01H9/002—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by using radiation-sensitive means, e.g. optical means for representing acoustic field distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H3/00—Measuring characteristics of vibrations by using a detector in a fluid
    • G01H3/04—Frequency
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H11/00—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by detecting changes in electric or magnetic properties
    • G01H11/06—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by detecting changes in electric or magnetic properties by electric means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H3/00—Measuring characteristics of vibrations by using a detector in a fluid
    • G01H3/005—Testing or calibrating of detectors covered by the subgroups of G01H3/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M99/00—Subject matter not provided for in other groups of this subclass

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
JP2018121556A 2018-06-27 2018-06-27 測定端末、測定システム、測定方法およびプログラム Active JP7129647B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2018121556A JP7129647B2 (ja) 2018-06-27 2018-06-27 測定端末、測定システム、測定方法およびプログラム
CN201980056209.0A CN112639420B (zh) 2018-06-27 2019-03-13 测定终端、测定系统、测定方法以及程序
US17/255,279 US11629993B2 (en) 2018-06-27 2019-03-13 Measurement terminal, measurement system, measurement method, and program
PCT/JP2019/010422 WO2020003635A1 (ja) 2018-06-27 2019-03-13 測定端末、測定システム、測定方法およびプログラム
JP2022127946A JP7442102B2 (ja) 2018-06-27 2022-08-10 測定端末、測定システム、測定方法およびプログラム

Applications Claiming Priority (1)

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JP2018121556A JP7129647B2 (ja) 2018-06-27 2018-06-27 測定端末、測定システム、測定方法およびプログラム

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JP2020003282A JP2020003282A (ja) 2020-01-09
JP2020003282A5 JP2020003282A5 (enExample) 2021-07-26
JP7129647B2 true JP7129647B2 (ja) 2022-09-02

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JP2022127946A Active JP7442102B2 (ja) 2018-06-27 2022-08-10 測定端末、測定システム、測定方法およびプログラム

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US (1) US11629993B2 (enExample)
JP (2) JP7129647B2 (enExample)
CN (1) CN112639420B (enExample)
WO (1) WO2020003635A1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7129647B2 (ja) * 2018-06-27 2022-09-02 パナソニックＩｐマネジメント株式会社 測定端末、測定システム、測定方法およびプログラム
JP2022019028A (ja) * 2020-07-17 2022-01-27 オンキヨー株式会社 システム、及び、方法
JP7555814B2 (ja) * 2020-12-22 2024-09-25 株式会社クボタ 情報処理装置、水処理システム、指標値算出方法および指標値算出プログラム
CN114964466A (zh) * 2021-05-31 2022-08-30 重庆海尔热水器有限公司 设备检测方法及终端设备
JP7767101B2 (ja) * 2021-10-19 2025-11-11 日産自動車株式会社 機器の異常音検知装置、異常音検知方法、及び異常音検知プログラム
US20230145781A1 (en) * 2021-11-05 2023-05-11 Nec Laboratories America, Inc Telecommunications remote terminal field device monitoring using distributed fiber optic sensing
CN115099125B (zh) * 2022-05-23 2025-09-02 中国农业大学 一种基于激振音频的果树冠层叶密度估测系统与方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002181038A (ja) 2000-12-18 2002-06-26 Mitsubishi Heavy Ind Ltd 異常診断装置
JP2004361286A (ja) 2003-06-05 2004-12-24 Nittetsu Yahata Eng Kk 回転機械の劣化診断方法
JP2012078288A (ja) 2010-10-05 2012-04-19 Asahi Kasei Engineering Kk 転がり軸受の診断方法
JP2015114214A (ja) 2013-12-12 2015-06-22 Ntn株式会社 回転機械部品の携帯端末利用検査システムおよび検査方法

Family Cites Families (14)

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JPS5850397B2 (ja) * 1976-04-23 1983-11-10 三菱電機株式会社 異常信号等を判定する信号判定装置
JPS58108419A (ja) * 1981-12-23 1983-06-28 Toshiba Corp 異常検査装置
JP3075564B2 (ja) * 1990-04-06 2000-08-14 株式会社日立製作所 配管減肉管理評価システム
JP3450061B2 (ja) * 1994-10-25 2003-09-22 光洋精工株式会社 軸受の異常診断装置
JP3484665B2 (ja) 1997-12-15 2004-01-06 オムロン株式会社 異常判定方法および装置
JPH11326035A (ja) * 1998-05-19 1999-11-26 Ono Sokki Co Ltd 振動コンパレータ
JP4078671B2 (ja) 2003-12-17 2008-04-23 株式会社日立製作所 プラント保全管理方法
JP2008232934A (ja) 2007-03-22 2008-10-02 Jfe Advantech Co Ltd 設備診断システム
JP2009180648A (ja) 2008-01-31 2009-08-13 Hitachi-Ge Nuclear Energy Ltd センサノード、センサネットワークシステム及び振動測定方法
CN101614583B (zh) 2009-04-30 2011-06-22 上海电力学院 一种基于声音识别的堵料检测预警装置及方法
JP5460160B2 (ja) 2009-07-22 2014-04-02 Ｊｆｅメカニカル株式会社 設備機器の診断装置
CN102243143B (zh) 2011-04-20 2014-04-30 上海斐赛轴承科技有限公司 轴承异常声检测控制方法以及轴承振动测量仪
WO2015087732A1 (ja) 2013-12-12 2015-06-18 Ntn株式会社 回転機械部品の携帯端末利用検査システムおよび検査方法
JP7129647B2 (ja) 2018-06-27 2022-09-02 パナソニックＩｐマネジメント株式会社 測定端末、測定システム、測定方法およびプログラム

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002181038A (ja) 2000-12-18 2002-06-26 Mitsubishi Heavy Ind Ltd 異常診断装置
JP2004361286A (ja) 2003-06-05 2004-12-24 Nittetsu Yahata Eng Kk 回転機械の劣化診断方法
JP2012078288A (ja) 2010-10-05 2012-04-19 Asahi Kasei Engineering Kk 転がり軸受の診断方法
JP2015114214A (ja) 2013-12-12 2015-06-22 Ntn株式会社 回転機械部品の携帯端末利用検査システムおよび検査方法

Also Published As

Publication number Publication date
CN112639420B (zh) 2023-10-03
US11629993B2 (en) 2023-04-18
JP2020003282A (ja) 2020-01-09
JP7442102B2 (ja) 2024-03-04
WO2020003635A1 (ja) 2020-01-02
JP2022160658A (ja) 2022-10-19
US20210262853A1 (en) 2021-08-26
CN112639420A (zh) 2021-04-09

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