JP7128733B2 - 吸光分析装置 - Google Patents
吸光分析装置 Download PDFInfo
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- JP7128733B2 JP7128733B2 JP2018227888A JP2018227888A JP7128733B2 JP 7128733 B2 JP7128733 B2 JP 7128733B2 JP 2018227888 A JP2018227888 A JP 2018227888A JP 2018227888 A JP2018227888 A JP 2018227888A JP 7128733 B2 JP7128733 B2 JP 7128733B2
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- G—PHYSICS
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N21/0303—Optical path conditioning in cuvettes, e.g. windows; adapted optical elements or systems; path modifying or adjustment
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/15—Preventing contamination of the components of the optical system or obstruction of the light path
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/3103—Atomic absorption analysis
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/85—Investigating moving fluids or granular solids
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67126—Apparatus for sealing, encapsulating, glassing, decapsulating or the like
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N2021/0389—Windows
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/85—Investigating moving fluids or granular solids
- G01N2021/8578—Gaseous flow
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/02—Mechanical
- G01N2201/022—Casings
- G01N2201/0227—Sealable enclosure
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/02—Mechanical
- G01N2201/023—Controlling conditions in casing
- G01N2201/0238—Moisture monitoring or controlling
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- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Optical Measuring Cells (AREA)
Description
4 ・・・ベースフランジ
6 ・・・第2シール部材
7 ・・・窓材
71 ・・・内側面
72 ・・・外側面
8 ・・・押圧体
81 ・・・固定面
82 ・・・傾斜面
Claims (10)
- 分析対象ガスが流入又は発生する容器の第1開口を塞ぐように取り付けられ、前記容器内に光を射出する光射出モジュールと、
前記光射出モジュールから射出され、前記容器内を通過した光を検出する光検出モジュールと、を備え、
前記光射出モジュールが、
前記容器の外面において前記第1開口の周囲に取り付けられるベースフランジと、
前記容器内と接する内側面に対して外側面が所定角度傾斜した窓材と、
前記ベースフランジと前記窓材の内側面との間に挟まれるシール部材と、
前記ベースフランジに対して固定される固定面、及び、前記窓材の外側面を前記ベースフランジ側へ押圧する傾斜面を具備する押圧体と、を具備したことを特徴とする吸光分析装置。 - 前記押圧体の固定面が前記ベースフランジに固定された状態において、前記窓材が前記シール部材を押し潰すとともに前記窓材の内側面が前記ベースフランジからは離間している請求項1記載の吸光分析装置。
- 前記ベースフランジが、
前記窓材及び前記押圧体の一部が内部に配置される貫通穴と、
前記貫通穴の内周面から内側へ突出し、前記シール部材が支持される支持部と、
前記押圧体の固定面が取り付けられる取付面と、を備え、
前記押圧体の固定面が前記ベースフランジの取付面に固定された状態において、前記窓材が前記貫通穴の内周面及び前記支持部から離間している請求項2記載の吸光分析装置。 - 前記光射出モジュールが、
前記窓材の側面に設けられたシートヒータをさらに具備する請求項1乃至3いずれかに記載の吸光分析装置。 - 前記光射出モジュールが、
前記窓材の温度を測定する温度センサをさらに具備し、
前記温度センサで測定される測定温度と、設定温度に基づいて前記シートヒータを制御する温度制御器をさらに備えた請求項4記載の吸光分析装置。 - 前記ベースフランジが金属製であり、
前記押圧体が樹脂製である請求項1乃至5いずれかに記載の吸光分析装置。 - 前記押圧体がポリフェニレンサルファイド(PPS)で形成されている請求項6記載の吸光分析装置。
- 前記光検出モジュールが、前記容器の第1開口と対向させて形成された第2開口を塞ぐように取り付けられた請求項1乃至7いずれかに記載の吸光分析装置。
- 前記光検出モジュールの出力に基づいて、分析対象ガスの濃度を算出する濃度算出部をさらに備えた請求項1乃至8いずれかに記載の吸光分析装置。
- 分析対象ガスが流入又は発生する容器の第1開口を塞ぐように取り付けられ、前記容器内に光を射出する光射出モジュールと、
前記光射出モジュールから射出され、前記容器内を通過した光を検出する光検出モジュールと、を備え、
前記光射出モジュールが、
前記容器内と接する内側面に対して外側面が所定角度傾斜した窓材と、
前記容器の外側面において前記第1開口の周囲と前記窓材の内側面との間に挟まれるシール部材と、
前記容器の外側面に固定される固定面、及び、前記窓材の外側面を前記容器側へ押圧する傾斜面を具備する押圧体と、を具備したことを特徴とする吸光分析装置。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018227888A JP7128733B2 (ja) | 2018-12-05 | 2018-12-05 | 吸光分析装置 |
US16/689,455 US11513060B2 (en) | 2018-12-05 | 2019-11-20 | Absorption analyzer |
KR1020190151229A KR20200068578A (ko) | 2018-12-05 | 2019-11-22 | 흡광 분석 장치 |
CN201911155732.7A CN111272655A (zh) | 2018-12-05 | 2019-11-22 | 吸光分析装置 |
TW108142711A TWI837225B (zh) | 2018-12-05 | 2019-11-25 | 吸光分析裝置 |
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JP2018227888A JP7128733B2 (ja) | 2018-12-05 | 2018-12-05 | 吸光分析装置 |
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JP2020091168A JP2020091168A (ja) | 2020-06-11 |
JP7128733B2 true JP7128733B2 (ja) | 2022-08-31 |
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US (1) | US11513060B2 (ja) |
JP (1) | JP7128733B2 (ja) |
KR (1) | KR20200068578A (ja) |
CN (1) | CN111272655A (ja) |
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CN111351763B (zh) * | 2020-03-26 | 2021-11-05 | 安荣信科技(北京)有限公司 | 一种能避免窗口片污染的气态污染物测量装置 |
Citations (5)
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JP2007285826A (ja) | 2006-04-14 | 2007-11-01 | Toyota Motor Corp | 排ガス分析装置 |
JP2013127414A (ja) | 2011-12-19 | 2013-06-27 | Fuji Electric Co Ltd | 多成分用レーザ式ガス分析計 |
JP2016001135A (ja) | 2014-06-11 | 2016-01-07 | 株式会社堀場製作所 | 光学測定セル及び光学分析計 |
JP2016180728A (ja) | 2015-03-25 | 2016-10-13 | 株式会社島津製作所 | フローセル |
CN112703388A (zh) | 2018-09-25 | 2021-04-23 | 株式会社富士金 | 浓度测定装置 |
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- 2018-12-05 JP JP2018227888A patent/JP7128733B2/ja active Active
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2019
- 2019-11-20 US US16/689,455 patent/US11513060B2/en active Active
- 2019-11-22 KR KR1020190151229A patent/KR20200068578A/ko active IP Right Grant
- 2019-11-22 CN CN201911155732.7A patent/CN111272655A/zh active Pending
Patent Citations (5)
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JP2007285826A (ja) | 2006-04-14 | 2007-11-01 | Toyota Motor Corp | 排ガス分析装置 |
JP2013127414A (ja) | 2011-12-19 | 2013-06-27 | Fuji Electric Co Ltd | 多成分用レーザ式ガス分析計 |
JP2016001135A (ja) | 2014-06-11 | 2016-01-07 | 株式会社堀場製作所 | 光学測定セル及び光学分析計 |
JP2016180728A (ja) | 2015-03-25 | 2016-10-13 | 株式会社島津製作所 | フローセル |
CN112703388A (zh) | 2018-09-25 | 2021-04-23 | 株式会社富士金 | 浓度测定装置 |
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KR20200068578A (ko) | 2020-06-15 |
TW202043735A (zh) | 2020-12-01 |
CN111272655A (zh) | 2020-06-12 |
US20200182776A1 (en) | 2020-06-11 |
US11513060B2 (en) | 2022-11-29 |
JP2020091168A (ja) | 2020-06-11 |
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