JP7119286B2 - Ｏｃｔ装置 - Google Patents

Ｏｃｔ装置 Download PDF

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Publication number
JP7119286B2
JP7119286B2 JP2017070039A JP2017070039A JP7119286B2 JP 7119286 B2 JP7119286 B2 JP 7119286B2 JP 2017070039 A JP2017070039 A JP 2017070039A JP 2017070039 A JP2017070039 A JP 2017070039A JP 7119286 B2 JP7119286 B2 JP 7119286B2
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JP
Japan
Prior art keywords
light
optical path
fpn
detector
oct data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
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JP2017070039A
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English (en)
Japanese (ja)
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JP2018173301A5 (enExample
JP2018173301A (ja
Inventor
佳史 村田
悠祐 安藤
献 立花
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Nidek Co Ltd
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Nidek Co Ltd
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Priority to JP2017070039A priority Critical patent/JP7119286B2/ja
Priority to US15/941,902 priority patent/US10674905B2/en
Publication of JP2018173301A publication Critical patent/JP2018173301A/ja
Publication of JP2018173301A5 publication Critical patent/JP2018173301A5/ja
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  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Eye Examination Apparatus (AREA)
JP2017070039A 2017-03-31 2017-03-31 Ｏｃｔ装置 Expired - Fee Related JP7119286B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2017070039A JP7119286B2 (ja) 2017-03-31 2017-03-31 Ｏｃｔ装置
US15/941,902 US10674905B2 (en) 2017-03-31 2018-03-30 OCT apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017070039A JP7119286B2 (ja) 2017-03-31 2017-03-31 Ｏｃｔ装置

Publications (3)

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JP2018173301A JP2018173301A (ja) 2018-11-08
JP2018173301A5 JP2018173301A5 (enExample) 2020-04-30
JP7119286B2 true JP7119286B2 (ja) 2022-08-17

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JP2017070039A Expired - Fee Related JP7119286B2 (ja) 2017-03-31 2017-03-31 Ｏｃｔ装置

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JP (1) JP7119286B2 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7323148B2 (ja) * 2018-09-28 2023-08-08 株式会社トーメーコーポレーション 眼科装置
JP7167998B2 (ja) * 2018-11-12 2022-11-09 日本電気株式会社 光干渉断層撮像装置、撮像方法、及び、撮像プログラム

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004325286A (ja) 2003-04-25 2004-11-18 Mtex Matsumura Co 光干渉断層画像化装置における画像信号同期機構
JP2010220774A (ja) 2009-03-23 2010-10-07 Nidek Co Ltd 眼科撮影装置、及び眼科撮影装置のキャリブレーション方法
JP2010261858A (ja) 2009-05-08 2010-11-18 Canon Inc 光干渉断層撮像装置
JP2011214969A (ja) 2010-03-31 2011-10-27 Canon Inc 撮像装置及び撮像方法
JP2013160699A (ja) 2012-02-08 2013-08-19 Hitachi High-Technologies Corp 光断層画像測定装置
JP2015068775A (ja) 2013-09-30 2015-04-13 株式会社ニデック 光コヒーレンストモグラフィー装置
JP2016032609A (ja) 2014-07-31 2016-03-10 株式会社ニデック 眼科装置
JP2016077666A (ja) 2014-10-20 2016-05-16 株式会社トプコン データ処理方法及びｏｃｔ装置
JP2016144503A (ja) 2015-02-06 2016-08-12 キヤノン株式会社 光学調整機構、該光学調整機構を有する断層画像撮像装置、及び光学調整方法

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004325286A (ja) 2003-04-25 2004-11-18 Mtex Matsumura Co 光干渉断層画像化装置における画像信号同期機構
JP2010220774A (ja) 2009-03-23 2010-10-07 Nidek Co Ltd 眼科撮影装置、及び眼科撮影装置のキャリブレーション方法
JP2010261858A (ja) 2009-05-08 2010-11-18 Canon Inc 光干渉断層撮像装置
JP2011214969A (ja) 2010-03-31 2011-10-27 Canon Inc 撮像装置及び撮像方法
JP2013160699A (ja) 2012-02-08 2013-08-19 Hitachi High-Technologies Corp 光断層画像測定装置
JP2015068775A (ja) 2013-09-30 2015-04-13 株式会社ニデック 光コヒーレンストモグラフィー装置
JP2016032609A (ja) 2014-07-31 2016-03-10 株式会社ニデック 眼科装置
JP2016077666A (ja) 2014-10-20 2016-05-16 株式会社トプコン データ処理方法及びｏｃｔ装置
JP2016144503A (ja) 2015-02-06 2016-08-12 キヤノン株式会社 光学調整機構、該光学調整機構を有する断層画像撮像装置、及び光学調整方法

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