JP7115387B2 - 光測定用光源装置、分光測定装置及び分光測定方法 - Google Patents
光測定用光源装置、分光測定装置及び分光測定方法 Download PDFInfo
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- JP7115387B2 JP7115387B2 JP2019062000A JP2019062000A JP7115387B2 JP 7115387 B2 JP7115387 B2 JP 7115387B2 JP 2019062000 A JP2019062000 A JP 2019062000A JP 2019062000 A JP2019062000 A JP 2019062000A JP 7115387 B2 JP7115387 B2 JP 7115387B2
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- light
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Classifications
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/35—Non-linear optics
- G02F1/365—Non-linear optics in an optical waveguide structure
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0218—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using optical fibers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/14—Generating the spectrum; Monochromators using refracting elements, e.g. prisms
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
- G01J3/1895—Generating the spectrum; Monochromators using diffraction elements, e.g. grating using fiber Bragg gratings or gratings integrated in a waveguide
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
- G01J3/32—Investigating bands of a spectrum in sequence by a single detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/359—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using near infrared light
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2201/00—Constructional arrangements not provided for in groups G02F1/00 - G02F7/00
- G02F2201/30—Constructional arrangements not provided for in groups G02F1/00 - G02F7/00 grating
- G02F2201/305—Constructional arrangements not provided for in groups G02F1/00 - G02F7/00 grating diffraction grating
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Optics & Photonics (AREA)
- Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
- Spectrometry And Color Measurement (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019062000A JP7115387B2 (ja) | 2019-03-27 | 2019-03-27 | 光測定用光源装置、分光測定装置及び分光測定方法 |
| EP20779848.9A EP3951335A4 (en) | 2019-03-27 | 2020-03-25 | LIGHT SOURCE DEVICE FOR OPTICAL MEASUREMENT, SPECTROSCOPIC MEASUREMENT DEVICE AND SPECTROSCOPIC MEASUREMENT METHOD |
| US17/598,770 US12117340B2 (en) | 2019-03-27 | 2020-03-25 | Light source apparatus for light measurement |
| CN202080018895.5A CN113544480B (zh) | 2019-03-27 | 2020-03-25 | 光测定用光源装置、分光测定装置及分光测定方法 |
| PCT/JP2020/013498 WO2020196689A1 (ja) | 2019-03-27 | 2020-03-25 | 光測定用光源装置、分光測定装置及び分光測定方法 |
| JP2022042986A JP7723631B2 (ja) | 2019-03-27 | 2022-03-17 | 光測定用光源装置、分光測定装置及び分光測定方法 |
| JP2022042987A JP7405175B2 (ja) | 2019-03-27 | 2022-03-17 | 光測定用光源装置、分光測定装置及び分光測定方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019062000A JP7115387B2 (ja) | 2019-03-27 | 2019-03-27 | 光測定用光源装置、分光測定装置及び分光測定方法 |
Related Child Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022042987A Division JP7405175B2 (ja) | 2019-03-27 | 2022-03-17 | 光測定用光源装置、分光測定装置及び分光測定方法 |
| JP2022042986A Division JP7723631B2 (ja) | 2019-03-27 | 2022-03-17 | 光測定用光源装置、分光測定装置及び分光測定方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2020159973A JP2020159973A (ja) | 2020-10-01 |
| JP2020159973A5 JP2020159973A5 (enExample) | 2021-03-11 |
| JP7115387B2 true JP7115387B2 (ja) | 2022-08-09 |
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Family Applications (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2019062000A Active JP7115387B2 (ja) | 2019-03-27 | 2019-03-27 | 光測定用光源装置、分光測定装置及び分光測定方法 |
| JP2022042986A Active JP7723631B2 (ja) | 2019-03-27 | 2022-03-17 | 光測定用光源装置、分光測定装置及び分光測定方法 |
| JP2022042987A Active JP7405175B2 (ja) | 2019-03-27 | 2022-03-17 | 光測定用光源装置、分光測定装置及び分光測定方法 |
Family Applications After (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022042986A Active JP7723631B2 (ja) | 2019-03-27 | 2022-03-17 | 光測定用光源装置、分光測定装置及び分光測定方法 |
| JP2022042987A Active JP7405175B2 (ja) | 2019-03-27 | 2022-03-17 | 光測定用光源装置、分光測定装置及び分光測定方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US12117340B2 (enExample) |
| EP (1) | EP3951335A4 (enExample) |
| JP (3) | JP7115387B2 (enExample) |
| CN (1) | CN113544480B (enExample) |
| WO (1) | WO2020196689A1 (enExample) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7679605B2 (ja) * | 2020-09-02 | 2025-05-20 | ウシオ電機株式会社 | パルス分光装置及びマルチファイバ用照射ユニット |
| JP7753632B2 (ja) * | 2020-09-17 | 2025-10-15 | ウシオ電機株式会社 | 分光測定方法、分光測定装置、製品検査方法、製品検査装置及び製品選別装置 |
| JP2022054350A (ja) * | 2020-09-25 | 2022-04-06 | ウシオ電機株式会社 | アレイ導波路回折格子、広帯域光源装置及び分光測定装置 |
| WO2022085568A1 (ja) * | 2020-10-21 | 2022-04-28 | ウシオ電機株式会社 | パルス分光装置 |
| WO2022176208A1 (ja) | 2021-02-22 | 2022-08-25 | 株式会社 ジャパンセル | 所定光生成方法、所定光利用方法、所定光を利用したサービス提供方法、測定/イメージング方法、光学特性変換素子、光源部、計測部、測定装置、所定光利用装置およびサービス提供システム |
| JP7694121B2 (ja) | 2021-04-07 | 2025-06-18 | ウシオ電機株式会社 | 光測定装置 |
| JP7707619B2 (ja) * | 2021-04-07 | 2025-07-15 | ウシオ電機株式会社 | 光測定装置および光測定方法 |
| JP2023069314A (ja) | 2021-11-05 | 2023-05-18 | ウシオ電機株式会社 | 光測定方法および光測定装置 |
| JP2023138018A (ja) * | 2022-03-18 | 2023-09-29 | 日本電気株式会社 | 光源装置、光源装置の制御方法および光源装置の制御プログラム |
| JP2023142557A (ja) * | 2022-03-25 | 2023-10-05 | ウシオ電機株式会社 | 光源装置および光測定装置 |
| JP2023179208A (ja) | 2022-06-07 | 2023-12-19 | ウシオ電機株式会社 | 光測定装置 |
| JP2025022205A (ja) * | 2023-08-02 | 2025-02-14 | ウシオ電機株式会社 | 光源装置および光測定装置 |
| CN120958299A (zh) * | 2023-08-10 | 2025-11-14 | 优志旺电机株式会社 | 光源装置 |
Citations (8)
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| JP2001091357A (ja) | 1999-08-11 | 2001-04-06 | Wavetek Wandel & Goltermann Eningen Gmbh & Co | 多重光スペクトルの同時分析方法 |
| JP2002162345A (ja) | 2000-11-22 | 2002-06-07 | Nippon Telegr & Teleph Corp <Ntt> | 分光機能を持った光導波路型spr現象計測チップ及びspr現象測定装置 |
| JP2003279480A (ja) | 2002-03-22 | 2003-10-02 | Japan Science & Technology Corp | 広帯域スーパーコンティニューム極短光パルスを用いたシングルショット過渡吸収計測方法およびシングルショット過渡吸収計測システム |
| JP2004233341A (ja) | 2003-01-08 | 2004-08-19 | Nikon Corp | 光学装置および逆分散型二重分光器 |
| JP2007501414A (ja) | 2003-05-07 | 2007-01-25 | ダコタ テクノロジーズ、インコーポレイテッド | 混合物の迅速かつ高度に鋭敏に定量分析するための多次元蛍光装置及び方法 |
| WO2017065257A1 (ja) | 2015-10-14 | 2017-04-20 | 国立大学法人東京大学 | 撮像装置、フローサイトメータ及び撮像方法 |
| US20170122806A1 (en) | 2015-10-01 | 2017-05-04 | National Security Technologies, Llc | Long-pulse-width variable-wavelength chirped pulse generator and method |
| JP2019045271A (ja) | 2017-08-31 | 2019-03-22 | 学校法人 総持学園 鶴見大学 | 光干渉断層画像撮像装置 |
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-
2019
- 2019-03-27 JP JP2019062000A patent/JP7115387B2/ja active Active
-
2020
- 2020-03-25 EP EP20779848.9A patent/EP3951335A4/en active Pending
- 2020-03-25 US US17/598,770 patent/US12117340B2/en active Active
- 2020-03-25 WO PCT/JP2020/013498 patent/WO2020196689A1/ja not_active Ceased
- 2020-03-25 CN CN202080018895.5A patent/CN113544480B/zh active Active
-
2022
- 2022-03-17 JP JP2022042986A patent/JP7723631B2/ja active Active
- 2022-03-17 JP JP2022042987A patent/JP7405175B2/ja active Active
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| JP2001091357A (ja) | 1999-08-11 | 2001-04-06 | Wavetek Wandel & Goltermann Eningen Gmbh & Co | 多重光スペクトルの同時分析方法 |
| JP2002162345A (ja) | 2000-11-22 | 2002-06-07 | Nippon Telegr & Teleph Corp <Ntt> | 分光機能を持った光導波路型spr現象計測チップ及びspr現象測定装置 |
| JP2003279480A (ja) | 2002-03-22 | 2003-10-02 | Japan Science & Technology Corp | 広帯域スーパーコンティニューム極短光パルスを用いたシングルショット過渡吸収計測方法およびシングルショット過渡吸収計測システム |
| JP2004233341A (ja) | 2003-01-08 | 2004-08-19 | Nikon Corp | 光学装置および逆分散型二重分光器 |
| JP2007501414A (ja) | 2003-05-07 | 2007-01-25 | ダコタ テクノロジーズ、インコーポレイテッド | 混合物の迅速かつ高度に鋭敏に定量分析するための多次元蛍光装置及び方法 |
| US20170122806A1 (en) | 2015-10-01 | 2017-05-04 | National Security Technologies, Llc | Long-pulse-width variable-wavelength chirped pulse generator and method |
| WO2017065257A1 (ja) | 2015-10-14 | 2017-04-20 | 国立大学法人東京大学 | 撮像装置、フローサイトメータ及び撮像方法 |
| JP2019045271A (ja) | 2017-08-31 | 2019-03-22 | 学校法人 総持学園 鶴見大学 | 光干渉断層画像撮像装置 |
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Also Published As
| Publication number | Publication date |
|---|---|
| US12117340B2 (en) | 2024-10-15 |
| JP7723631B2 (ja) | 2025-08-14 |
| US20220170791A1 (en) | 2022-06-02 |
| CN113544480B (zh) | 2024-06-11 |
| JP2022089199A (ja) | 2022-06-15 |
| WO2020196689A1 (ja) | 2020-10-01 |
| EP3951335A4 (en) | 2023-01-11 |
| CN113544480A (zh) | 2021-10-22 |
| JP2020159973A (ja) | 2020-10-01 |
| JP2022069677A (ja) | 2022-05-11 |
| JP7405175B2 (ja) | 2023-12-26 |
| EP3951335A1 (en) | 2022-02-09 |
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