JP7053366B2 - 検査装置及び検査方法 - Google Patents
検査装置及び検査方法 Download PDFInfo
- Publication number
- JP7053366B2 JP7053366B2 JP2018091086A JP2018091086A JP7053366B2 JP 7053366 B2 JP7053366 B2 JP 7053366B2 JP 2018091086 A JP2018091086 A JP 2018091086A JP 2018091086 A JP2018091086 A JP 2018091086A JP 7053366 B2 JP7053366 B2 JP 7053366B2
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- JP
- Japan
- Prior art keywords
- inspection
- inspection object
- image
- defect
- learning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
- G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Chemical & Material Sciences (AREA)
- Theoretical Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Optics & Photonics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Image Analysis (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018091086A JP7053366B2 (ja) | 2018-05-10 | 2018-05-10 | 検査装置及び検査方法 |
PCT/JP2019/018467 WO2019216362A1 (ja) | 2018-05-10 | 2019-05-09 | 検査装置及び検査方法 |
CN201980030680.2A CN112088304A (zh) | 2018-05-10 | 2019-05-09 | 检查装置及检查方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018091086A JP7053366B2 (ja) | 2018-05-10 | 2018-05-10 | 検査装置及び検査方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2019196985A JP2019196985A (ja) | 2019-11-14 |
JP7053366B2 true JP7053366B2 (ja) | 2022-04-12 |
Family
ID=68466993
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2018091086A Active JP7053366B2 (ja) | 2018-05-10 | 2018-05-10 | 検査装置及び検査方法 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP7053366B2 (zh) |
CN (1) | CN112088304A (zh) |
WO (1) | WO2019216362A1 (zh) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115210035B (zh) * | 2020-03-05 | 2024-06-25 | 松下知识产权经营株式会社 | 焊道外观检查装置、焊道外观检查方法、程序和焊道外观检查系统 |
JP7555042B2 (ja) | 2020-03-05 | 2024-09-24 | パナソニックIpマネジメント株式会社 | ビード外観検査装置、ビード外観検査方法、プログラムおよびビード外観検査システム |
JPWO2021177361A1 (zh) * | 2020-03-05 | 2021-09-10 | ||
KR102237374B1 (ko) * | 2020-09-09 | 2021-04-07 | 정구봉 | 3d 프린팅을 이용한 부품 및 부품 검사 지그 제조 방법 및 시스템 |
KR102512873B1 (ko) * | 2020-11-06 | 2023-03-23 | 한국생산기술연구원 | 인공 지능을 이용한 모아레 간섭계 측정 시스템 및 모아레 간섭계 측정 방법 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6191850B1 (en) | 1999-10-15 | 2001-02-20 | Cognex Corporation | System and method for inspecting an object using structured illumination |
JP5164696B2 (ja) | 2008-07-01 | 2013-03-21 | 昭和電工株式会社 | アルミニウム合金製引抜材 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01219505A (ja) * | 1988-02-26 | 1989-09-01 | Toyota Motor Corp | 塗膜平滑度自動検査装置 |
JP2795013B2 (ja) * | 1991-12-11 | 1998-09-10 | 日産自動車株式会社 | 塗装面評価装置 |
JP3201217B2 (ja) * | 1995-04-17 | 2001-08-20 | 日産自動車株式会社 | 表面欠陥検査装置 |
JPH1023203A (ja) * | 1996-07-01 | 1998-01-23 | Ricoh Co Ltd | 紙分類装置 |
JP3493979B2 (ja) * | 1997-10-20 | 2004-02-03 | 日産自動車株式会社 | 被検査面の欠陥検査方法およびその装置 |
JP3732757B2 (ja) * | 2001-06-08 | 2006-01-11 | 株式会社東芝 | 画像認識方法および画像認識装置 |
JP5818341B2 (ja) * | 2010-12-13 | 2015-11-18 | 国立大学法人 和歌山大学 | 形状計測装置および形状計測方法 |
JP6507653B2 (ja) * | 2015-01-13 | 2019-05-08 | オムロン株式会社 | 検査装置及び検査装置の制御方法 |
JP6795993B2 (ja) * | 2016-02-18 | 2020-12-02 | 株式会社ミツトヨ | 形状測定システム、形状測定装置及び形状測定方法 |
JP6333871B2 (ja) * | 2016-02-25 | 2018-05-30 | ファナック株式会社 | 入力画像から検出した対象物を表示する画像処理装置 |
JP6832650B2 (ja) * | 2016-08-18 | 2021-02-24 | 株式会社Screenホールディングス | 検査装置および検査方法 |
US10586318B2 (en) * | 2016-10-07 | 2020-03-10 | Raytheon Company | Automated model-based inspection system for screening electronic components |
-
2018
- 2018-05-10 JP JP2018091086A patent/JP7053366B2/ja active Active
-
2019
- 2019-05-09 WO PCT/JP2019/018467 patent/WO2019216362A1/ja active Application Filing
- 2019-05-09 CN CN201980030680.2A patent/CN112088304A/zh active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6191850B1 (en) | 1999-10-15 | 2001-02-20 | Cognex Corporation | System and method for inspecting an object using structured illumination |
JP5164696B2 (ja) | 2008-07-01 | 2013-03-21 | 昭和電工株式会社 | アルミニウム合金製引抜材 |
Also Published As
Publication number | Publication date |
---|---|
CN112088304A (zh) | 2020-12-15 |
WO2019216362A1 (ja) | 2019-11-14 |
JP2019196985A (ja) | 2019-11-14 |
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