JP7025527B2 - X線回折測定のために平坦な試料を挟み込んで温度調節するためのデバイス - Google Patents
X線回折測定のために平坦な試料を挟み込んで温度調節するためのデバイス Download PDFInfo
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- JP7025527B2 JP7025527B2 JP2020504184A JP2020504184A JP7025527B2 JP 7025527 B2 JP7025527 B2 JP 7025527B2 JP 2020504184 A JP2020504184 A JP 2020504184A JP 2020504184 A JP2020504184 A JP 2020504184A JP 7025527 B2 JP7025527 B2 JP 7025527B2
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M10/00—Secondary cells; Manufacture thereof
- H01M10/05—Accumulators with non-aqueous electrolyte
- H01M10/052—Li-accumulators
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20025—Sample holders or supports therefor
- G01N23/20033—Sample holders or supports therefor provided with temperature control or heating means
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M10/00—Secondary cells; Manufacture thereof
- H01M10/05—Accumulators with non-aqueous electrolyte
- H01M10/052—Li-accumulators
- H01M10/0525—Rocking-chair batteries, i.e. batteries with lithium insertion or intercalation in both electrodes; Lithium-ion batteries
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M10/00—Secondary cells; Manufacture thereof
- H01M10/42—Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
- H01M10/4285—Testing apparatus
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M10/00—Secondary cells; Manufacture thereof
- H01M10/42—Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
- H01M10/48—Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M10/00—Secondary cells; Manufacture thereof
- H01M10/60—Heating or cooling; Temperature control
- H01M10/61—Types of temperature control
- H01M10/613—Cooling or keeping cold
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M10/00—Secondary cells; Manufacture thereof
- H01M10/60—Heating or cooling; Temperature control
- H01M10/61—Types of temperature control
- H01M10/615—Heating or keeping warm
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M10/00—Secondary cells; Manufacture thereof
- H01M10/60—Heating or cooling; Temperature control
- H01M10/63—Control systems
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M10/00—Secondary cells; Manufacture thereof
- H01M10/60—Heating or cooling; Temperature control
- H01M10/64—Heating or cooling; Temperature control characterised by the shape of the cells
- H01M10/647—Prismatic or flat cells, e.g. pouch cells
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M10/00—Secondary cells; Manufacture thereof
- H01M10/60—Heating or cooling; Temperature control
- H01M10/65—Means for temperature control structurally associated with the cells
- H01M10/655—Solid structures for heat exchange or heat conduction
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M10/00—Secondary cells; Manufacture thereof
- H01M10/60—Heating or cooling; Temperature control
- H01M10/65—Means for temperature control structurally associated with the cells
- H01M10/658—Means for temperature control structurally associated with the cells by thermal insulation or shielding
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/31—Accessories, mechanical or electrical features temperature control
- G01N2223/3103—Accessories, mechanical or electrical features temperature control cooling, cryostats
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/31—Accessories, mechanical or electrical features temperature control
- G01N2223/3106—Accessories, mechanical or electrical features temperature control heating, furnaces
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/611—Specific applications or type of materials patterned objects; electronic devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M10/00—Secondary cells; Manufacture thereof
- H01M10/60—Heating or cooling; Temperature control
- H01M10/65—Means for temperature control structurally associated with the cells
- H01M10/657—Means for temperature control structurally associated with the cells by electric or electromagnetic means
- H01M10/6572—Peltier elements or thermoelectric devices
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/10—Energy storage using batteries
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- General Chemical & Material Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Automation & Control Theory (AREA)
- Electromagnetism (AREA)
- Materials Engineering (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP17192263.6A EP3460893B1 (de) | 2017-09-21 | 2017-09-21 | Vorrichtung zum einspannen und temperieren von flachen proben für die röntgendiffraktometrie |
EP17192263.6 | 2017-09-21 | ||
PCT/EP2018/073727 WO2019057484A1 (de) | 2017-09-21 | 2018-09-04 | Vorrichtung zum einspannen und temperieren von flachen proben für die röntgendiffraktometrie |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2020534512A JP2020534512A (ja) | 2020-11-26 |
JP2020534512A5 JP2020534512A5 (zh) | 2021-07-29 |
JP7025527B2 true JP7025527B2 (ja) | 2022-02-24 |
Family
ID=59923361
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2020504184A Active JP7025527B2 (ja) | 2017-09-21 | 2018-09-04 | X線回折測定のために平坦な試料を挟み込んで温度調節するためのデバイス |
Country Status (6)
Country | Link |
---|---|
US (1) | US10948433B2 (zh) |
EP (1) | EP3460893B1 (zh) |
JP (1) | JP7025527B2 (zh) |
KR (1) | KR102339537B1 (zh) |
CN (1) | CN111279536B (zh) |
WO (1) | WO2019057484A1 (zh) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102395889B1 (ko) * | 2019-04-30 | 2022-05-09 | 주식회사 엘지에너지솔루션 | X 선 이용 전지 측정 장치 |
KR102470128B1 (ko) * | 2019-05-15 | 2022-11-22 | 주식회사 엘지화학 | 전지의 xrd 측정용 스테이지 장치 |
KR20220011319A (ko) * | 2020-07-21 | 2022-01-28 | 주식회사 엘지에너지솔루션 | 전지셀 용량 측정 장치 및 전지셀 용량 측정 방법 |
EP3982117A1 (en) * | 2020-10-09 | 2022-04-13 | Merck Patent GmbH | Flexible sample holder |
CN112255255B (zh) * | 2020-10-14 | 2023-07-07 | 中国工程物理研究院电子工程研究所 | 一种基于中子衍射的原位电池测试装置及测试方法 |
KR102430551B1 (ko) * | 2020-11-04 | 2022-08-09 | 서울대학교산학협력단 | 펠티어 타입 온도 조절 유닛을 포함하는 인시츄 x선 회절 분석 장치 및 이를 사용한 분석 방법 |
JP7249989B2 (ja) * | 2020-12-16 | 2023-03-31 | 日本電子株式会社 | 荷電粒子線装置 |
US20230341340A1 (en) * | 2022-04-20 | 2023-10-26 | Arion Diagnostics, Inc. | Diffractive analyzer of patient tissue |
WO2024081978A1 (de) * | 2022-10-21 | 2024-04-25 | Coren Federico | Testvorrichtung zur ermittlung elektrischer eigenschaften einer batterie sowie verfahren hierzu |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005221363A (ja) | 2004-02-05 | 2005-08-18 | Rigaku Corp | X線分析用試料支持装置及びx線分析装置 |
US20150071409A1 (en) | 2013-09-11 | 2015-03-12 | Anton Paar Gmbh | Temperature Control Chamber for Compact X-Ray Machine |
JP2016170093A (ja) | 2015-03-13 | 2016-09-23 | 住友金属鉱山株式会社 | 試料ホルダーおよびx線分析方法 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06102208A (ja) * | 1992-09-08 | 1994-04-15 | Rigaku Corp | X線回折測定のための試料加熱装置 |
JPH06118039A (ja) * | 1992-10-02 | 1994-04-28 | Seiko Instr Inc | 熱分析装置 |
US7842247B2 (en) * | 2005-08-19 | 2010-11-30 | Canadian Blood Services | Sample holder for dynamic light scattering |
KR20090036668A (ko) * | 2007-10-10 | 2009-04-15 | (주)쎄트렉아이 | 방사선 검출 장치 및 그 온도 제어 유닛 |
MX337334B (es) * | 2011-08-24 | 2016-02-26 | Delta Instr B V | Celda de espectrometria infrarroja con medios de control de tempertarura. |
WO2014147037A1 (de) * | 2013-03-20 | 2014-09-25 | Basf Se | Temperierelement |
DE102014211901B3 (de) | 2014-06-20 | 2015-03-19 | Karlsruher Institut für Technologie | Batterieträger |
KR101606472B1 (ko) * | 2014-07-23 | 2016-03-25 | 티에스 주식회사 | 공냉식 냉각 기반의 밀폐형 배터리팩 모니터링 방법을 구현하기 위한 밀폐형 배터리팩 |
KR101750745B1 (ko) * | 2016-01-22 | 2017-06-27 | 한국과학기술연구원 | 투과형 엑스선 회절 분석장치용 퍼니스 및 이를 이용한 투과형 엑스선 회절 분석장치 |
CN106290426B (zh) * | 2016-10-27 | 2019-01-18 | 中国科学院上海应用物理研究所 | 用于小角x射线散射实验的原位装置 |
KR101971158B1 (ko) * | 2017-09-07 | 2019-08-27 | 한국과학기술연구원 | 온도 조절이 가능한 투과형 엑스선 회절분석용 인시추 코인셀 지지장치 |
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2017
- 2017-09-21 EP EP17192263.6A patent/EP3460893B1/de active Active
-
2018
- 2018-09-04 WO PCT/EP2018/073727 patent/WO2019057484A1/de active Application Filing
- 2018-09-04 US US16/630,879 patent/US10948433B2/en active Active
- 2018-09-04 JP JP2020504184A patent/JP7025527B2/ja active Active
- 2018-09-04 CN CN201880058301.6A patent/CN111279536B/zh active Active
- 2018-09-04 KR KR1020207001493A patent/KR102339537B1/ko active IP Right Grant
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005221363A (ja) | 2004-02-05 | 2005-08-18 | Rigaku Corp | X線分析用試料支持装置及びx線分析装置 |
US20150071409A1 (en) | 2013-09-11 | 2015-03-12 | Anton Paar Gmbh | Temperature Control Chamber for Compact X-Ray Machine |
JP2016170093A (ja) | 2015-03-13 | 2016-09-23 | 住友金属鉱山株式会社 | 試料ホルダーおよびx線分析方法 |
Also Published As
Publication number | Publication date |
---|---|
EP3460893A1 (de) | 2019-03-27 |
US20200150061A1 (en) | 2020-05-14 |
KR102339537B1 (ko) | 2021-12-16 |
JP2020534512A (ja) | 2020-11-26 |
CN111279536B (zh) | 2023-06-20 |
CN111279536A (zh) | 2020-06-12 |
EP3460893B1 (de) | 2020-01-08 |
KR20200056377A (ko) | 2020-05-22 |
WO2019057484A1 (de) | 2019-03-28 |
US10948433B2 (en) | 2021-03-16 |
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