JP6994037B2 - SiH非含有ビニルジシラン - Google Patents
SiH非含有ビニルジシラン Download PDFInfo
- Publication number
- JP6994037B2 JP6994037B2 JP2019535225A JP2019535225A JP6994037B2 JP 6994037 B2 JP6994037 B2 JP 6994037B2 JP 2019535225 A JP2019535225 A JP 2019535225A JP 2019535225 A JP2019535225 A JP 2019535225A JP 6994037 B2 JP6994037 B2 JP 6994037B2
- Authority
- JP
- Japan
- Prior art keywords
- silicon
- bonded
- sih
- vinyl
- compound
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F7/00—Compounds containing elements of Groups 4 or 14 of the Periodic Table
- C07F7/02—Silicon compounds
- C07F7/08—Compounds having one or more C—Si linkages
- C07F7/12—Organo silicon halides
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B33/00—Silicon; Compounds thereof
- C01B33/08—Compounds containing halogen
- C01B33/107—Halogenated silanes
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B21/00—Nitrogen; Compounds thereof
- C01B21/082—Compounds containing nitrogen and non-metals and optionally metals
- C01B21/087—Compounds containing nitrogen and non-metals and optionally metals containing one or more hydrogen atoms
- C01B21/088—Compounds containing nitrogen and non-metals and optionally metals containing one or more hydrogen atoms containing also one or more halogen atoms
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F7/00—Compounds containing elements of Groups 4 or 14 of the Periodic Table
- C07F7/02—Silicon compounds
- C07F7/08—Compounds having one or more C—Si linkages
- C07F7/0803—Compounds with Si-C or Si-Si linkages
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/34—Nitrides
- C23C16/345—Silicon nitride
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45527—Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations
- C23C16/45536—Use of plasma, radiation or electromagnetic fields
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45553—Atomic layer deposition [ALD] characterized by the use of precursors specially adapted for ALD
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2006/00—Physical properties of inorganic compounds
- C01P2006/40—Electric properties
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Metallurgy (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Electromagnetism (AREA)
- Chemical Vapour Deposition (AREA)
- Formation Of Insulating Films (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201662398174P | 2016-09-22 | 2016-09-22 | |
| US62/398,174 | 2016-09-22 | ||
| PCT/US2017/051710 WO2018057411A1 (en) | 2016-09-22 | 2017-09-15 | SiH-FREE VINYLDISILANES |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2019529542A JP2019529542A (ja) | 2019-10-17 |
| JP2019529542A5 JP2019529542A5 (enExample) | 2020-09-24 |
| JP6994037B2 true JP6994037B2 (ja) | 2022-01-14 |
Family
ID=60138914
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2019535225A Expired - Fee Related JP6994037B2 (ja) | 2016-09-22 | 2017-09-15 | SiH非含有ビニルジシラン |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US11485642B2 (enExample) |
| EP (1) | EP3515864B1 (enExample) |
| JP (1) | JP6994037B2 (enExample) |
| KR (1) | KR102228807B1 (enExample) |
| CN (1) | CN109689569B (enExample) |
| TW (1) | TWI749067B (enExample) |
| WO (1) | WO2018057411A1 (enExample) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114940687A (zh) * | 2022-05-30 | 2022-08-26 | 杭州瀛拓科技有限公司 | 一种多取代乙烯基硅(氧)烷的连续流合成方法 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007191797A (ja) | 2007-03-16 | 2007-08-02 | Semiconductor Energy Lab Co Ltd | 被膜形成装置及び被膜形成方法 |
| JP2009021567A (ja) | 2007-06-15 | 2009-01-29 | Semiconductor Energy Lab Co Ltd | 半導体装置製造用基板及びその作製方法 |
| JP2009532395A (ja) | 2006-04-03 | 2009-09-10 | レール・リキード−ソシエテ・アノニム・プール・レテュード・エ・レクスプロワタシオン・デ・プロセデ・ジョルジュ・クロード | ペンタキス(ジメチルアミノ)ジシラン前駆体含有化合物及びその調製方法 |
| WO2013035558A1 (ja) | 2011-09-05 | 2013-03-14 | 東ソー株式会社 | 成膜材料、それを用いた封止膜、及びその用途 |
| WO2015184214A1 (en) | 2014-05-30 | 2015-12-03 | Dow Corning Corporation | Process of synthesizing diisopropylaminw-disilanes |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60151278A (ja) * | 1984-01-13 | 1985-08-09 | 信越化学工業株式会社 | 窒化けい素の製造方法 |
| JPS61207391A (ja) * | 1985-03-09 | 1986-09-13 | Shin Etsu Chem Co Ltd | トリシリルエタン誘導体化合物の製法 |
| JPS61207389A (ja) | 1985-03-09 | 1986-09-13 | Shin Etsu Chem Co Ltd | 新規ジシラシクロペンタン化合物の製法 |
| JPS61207390A (ja) * | 1985-03-09 | 1986-09-13 | Shin Etsu Chem Co Ltd | 2−ビニルテトラアルキルジシラニル基含有化合物の再分配反応を起す方法 |
| JPH02145590A (ja) * | 1988-11-26 | 1990-06-05 | Shin Etsu Chem Co Ltd | 新規ジシラシクロヘキサン化合物及びその製造方法 |
| US5310583A (en) | 1992-11-02 | 1994-05-10 | Dow Corning Corporation | Vapor phase deposition of hydrogen silsesquioxane resin in the presence of nitrous oxide |
| JP2907061B2 (ja) * | 1995-04-05 | 1999-06-21 | 信越化学工業株式会社 | 有機けい素化合物の製造方法 |
| US5606088A (en) * | 1996-03-28 | 1997-02-25 | Dow Corning Corporation | Process for preparation of organodisilanes |
| CN101602918A (zh) | 2009-07-23 | 2009-12-16 | 河海大学 | 水工结构物脱空填充硅酮胶及其制备方法 |
-
2017
- 2017-09-15 EP EP17787057.3A patent/EP3515864B1/en active Active
- 2017-09-15 CN CN201780056462.7A patent/CN109689569B/zh not_active Expired - Fee Related
- 2017-09-15 WO PCT/US2017/051710 patent/WO2018057411A1/en not_active Ceased
- 2017-09-15 KR KR1020197009152A patent/KR102228807B1/ko not_active Expired - Fee Related
- 2017-09-15 US US16/331,161 patent/US11485642B2/en active Active
- 2017-09-15 JP JP2019535225A patent/JP6994037B2/ja not_active Expired - Fee Related
- 2017-09-19 TW TW106132149A patent/TWI749067B/zh not_active IP Right Cessation
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009532395A (ja) | 2006-04-03 | 2009-09-10 | レール・リキード−ソシエテ・アノニム・プール・レテュード・エ・レクスプロワタシオン・デ・プロセデ・ジョルジュ・クロード | ペンタキス(ジメチルアミノ)ジシラン前駆体含有化合物及びその調製方法 |
| JP2007191797A (ja) | 2007-03-16 | 2007-08-02 | Semiconductor Energy Lab Co Ltd | 被膜形成装置及び被膜形成方法 |
| JP2009021567A (ja) | 2007-06-15 | 2009-01-29 | Semiconductor Energy Lab Co Ltd | 半導体装置製造用基板及びその作製方法 |
| WO2013035558A1 (ja) | 2011-09-05 | 2013-03-14 | 東ソー株式会社 | 成膜材料、それを用いた封止膜、及びその用途 |
| WO2015184214A1 (en) | 2014-05-30 | 2015-12-03 | Dow Corning Corporation | Process of synthesizing diisopropylaminw-disilanes |
Also Published As
| Publication number | Publication date |
|---|---|
| KR102228807B1 (ko) | 2021-03-16 |
| EP3515864B1 (en) | 2021-10-20 |
| US20190284055A1 (en) | 2019-09-19 |
| KR20190049777A (ko) | 2019-05-09 |
| TW201829305A (zh) | 2018-08-16 |
| CN109689569B (zh) | 2022-05-27 |
| JP2019529542A (ja) | 2019-10-17 |
| CN109689569A (zh) | 2019-04-26 |
| TWI749067B (zh) | 2021-12-11 |
| US11485642B2 (en) | 2022-11-01 |
| WO2018057411A1 (en) | 2018-03-29 |
| EP3515864A1 (en) | 2019-07-31 |
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| TWI746554B (zh) | 胺基氯氫二矽烷 |
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