JP6991721B2 - マーキング装置、欠陥検査システム及びフィルム製造方法 - Google Patents

マーキング装置、欠陥検査システム及びフィルム製造方法 Download PDF

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Publication number
JP6991721B2
JP6991721B2 JP2017040930A JP2017040930A JP6991721B2 JP 6991721 B2 JP6991721 B2 JP 6991721B2 JP 2017040930 A JP2017040930 A JP 2017040930A JP 2017040930 A JP2017040930 A JP 2017040930A JP 6991721 B2 JP6991721 B2 JP 6991721B2
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Japan
Prior art keywords
optical film
injection
droplet
ejection
shielding plate
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JP2017040930A
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English (en)
Japanese (ja)
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JP2018146362A (ja
Inventor
圭太 井村
哲史 越野
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Sumitomo Chemical Co Ltd
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Sumitomo Chemical Co Ltd
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Application filed by Sumitomo Chemical Co Ltd filed Critical Sumitomo Chemical Co Ltd
Priority to JP2017040930A priority Critical patent/JP6991721B2/ja
Priority to KR1020180023834A priority patent/KR102447149B1/ko
Priority to CN201810170417.0A priority patent/CN108535275A/zh
Priority to TW107106821A priority patent/TWI811207B/zh
Publication of JP2018146362A publication Critical patent/JP2018146362A/ja
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Publication of JP6991721B2 publication Critical patent/JP6991721B2/ja
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B41PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41JTYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
    • B41J2/00Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
    • B41J2/005Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
    • B41J2/01Ink jet

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  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Golf Clubs (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Making Paper Articles (AREA)
JP2017040930A 2017-03-03 2017-03-03 マーキング装置、欠陥検査システム及びフィルム製造方法 Active JP6991721B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2017040930A JP6991721B2 (ja) 2017-03-03 2017-03-03 マーキング装置、欠陥検査システム及びフィルム製造方法
KR1020180023834A KR102447149B1 (ko) 2017-03-03 2018-02-27 마킹 장치, 결함 검사 시스템 및 필름 제조 방법
CN201810170417.0A CN108535275A (zh) 2017-03-03 2018-02-28 标注装置、缺陷检查系统以及膜制造方法
TW107106821A TWI811207B (zh) 2017-03-03 2018-03-01 標記裝置、缺陷檢查系統及膜製造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017040930A JP6991721B2 (ja) 2017-03-03 2017-03-03 マーキング装置、欠陥検査システム及びフィルム製造方法

Publications (2)

Publication Number Publication Date
JP2018146362A JP2018146362A (ja) 2018-09-20
JP6991721B2 true JP6991721B2 (ja) 2022-01-12

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Family Applications (1)

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JP2017040930A Active JP6991721B2 (ja) 2017-03-03 2017-03-03 マーキング装置、欠陥検査システム及びフィルム製造方法

Country Status (4)

Country Link
JP (1) JP6991721B2 (ko)
KR (1) KR102447149B1 (ko)
CN (1) CN108535275A (ko)
TW (1) TWI811207B (ko)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114953764B (zh) * 2021-02-18 2023-08-22 恒美光电股份有限公司 一种偏光膜缺点汇整标记系统

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005119024A (ja) 2003-10-14 2005-05-12 Olympus Corp 画像記録装置
US20060109454A1 (en) 2004-11-24 2006-05-25 The Boeing Company In-process vision detection of flaw and fod characteristics
JP2008175940A (ja) 2007-01-17 2008-07-31 Sekisui Chem Co Ltd 光学フィルムの欠陥のマーキング方法
JP2010099997A (ja) 2008-10-27 2010-05-06 Seiko Epson Corp 液体噴射ヘッド、液体吐出方法、およびメンテナンス方法
JP2010099996A (ja) 2008-10-27 2010-05-06 Seiko Epson Corp 液体噴射ヘッド、およびプリンタ
JP2011178089A (ja) 2010-03-02 2011-09-15 Seiko Epson Corp 液体噴射ヘッド、液体噴射ヘッドユニット及び液体噴射装置
JP2014195881A (ja) 2013-03-29 2014-10-16 セイコーエプソン株式会社 液体吐出装置
JP2014240816A (ja) 2013-06-12 2014-12-25 住友化学株式会社 欠陥検査システム

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000062166A (ja) * 1998-08-18 2000-02-29 Dainippon Screen Mfg Co Ltd 描画ヘッド装置
JP4343456B2 (ja) 2001-04-03 2009-10-14 大日本印刷株式会社 シート状製品の欠陥マーキング方法および装置
JP2008093849A (ja) * 2006-10-06 2008-04-24 Canon Inc 液滴吐出ヘッド及び液滴吐出装置
JP2011065184A (ja) 2009-04-10 2011-03-31 Nitto Denko Corp 光学フィルムロール原反、およびそれを用いた画像表示装置の製造方法
JP2012232450A (ja) * 2011-04-28 2012-11-29 Panasonic Corp 液体吐出ヘッド及び液体吐出装置
JP2012232552A (ja) * 2011-05-09 2012-11-29 Riso Kagaku Corp インクジェットヘッド
JP2016137588A (ja) * 2015-01-26 2016-08-04 セイコーエプソン株式会社 ヘッドユニット及び記録装置

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005119024A (ja) 2003-10-14 2005-05-12 Olympus Corp 画像記録装置
US20060109454A1 (en) 2004-11-24 2006-05-25 The Boeing Company In-process vision detection of flaw and fod characteristics
JP2008175940A (ja) 2007-01-17 2008-07-31 Sekisui Chem Co Ltd 光学フィルムの欠陥のマーキング方法
JP2010099997A (ja) 2008-10-27 2010-05-06 Seiko Epson Corp 液体噴射ヘッド、液体吐出方法、およびメンテナンス方法
JP2010099996A (ja) 2008-10-27 2010-05-06 Seiko Epson Corp 液体噴射ヘッド、およびプリンタ
JP2011178089A (ja) 2010-03-02 2011-09-15 Seiko Epson Corp 液体噴射ヘッド、液体噴射ヘッドユニット及び液体噴射装置
JP2014195881A (ja) 2013-03-29 2014-10-16 セイコーエプソン株式会社 液体吐出装置
JP2014240816A (ja) 2013-06-12 2014-12-25 住友化学株式会社 欠陥検査システム

Also Published As

Publication number Publication date
KR102447149B1 (ko) 2022-09-23
JP2018146362A (ja) 2018-09-20
CN108535275A (zh) 2018-09-14
TWI811207B (zh) 2023-08-11
KR20180101209A (ko) 2018-09-12
TW201843436A (zh) 2018-12-16

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