JP6901145B2 - 成分組成計測システム及び成分組成計測方法 - Google Patents

成分組成計測システム及び成分組成計測方法 Download PDF

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JP6901145B2
JP6901145B2 JP2018518282A JP2018518282A JP6901145B2 JP 6901145 B2 JP6901145 B2 JP 6901145B2 JP 2018518282 A JP2018518282 A JP 2018518282A JP 2018518282 A JP2018518282 A JP 2018518282A JP 6901145 B2 JP6901145 B2 JP 6901145B2
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laser beam
measurement target
irradiation
measurement
laser
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JPWO2017199904A1 (ja
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出口　祥啓
祥啓 出口
シュウ・ファン−ジュン
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University of Tokushima
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University of Tokushima
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/72—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using flame burners
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06113—Coherent sources; lasers

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  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2018518282A 2016-05-17 2017-05-15 成分組成計測システム及び成分組成計測方法 Active JP6901145B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2016099035 2016-05-17
JP2016099035 2016-05-17
PCT/JP2017/018180 WO2017199904A1 (ja) 2016-05-17 2017-05-15 成分組成計測システム及び成分組成計測方法

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JPWO2017199904A1 JPWO2017199904A1 (ja) 2019-03-14
JP6901145B2 true JP6901145B2 (ja) 2021-07-14

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JP (1) JP6901145B2 (zh)
KR (1) KR102298835B1 (zh)
CN (1) CN109154567B (zh)
WO (1) WO2017199904A1 (zh)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021043041A (ja) * 2019-09-10 2021-03-18 トヨタ自動車株式会社 元素組成分析方法
CN112044807A (zh) * 2020-07-17 2020-12-08 江汉大学 一种锂电池电极分拣回收装置
CN115436330B (zh) * 2022-08-08 2024-01-12 哈尔滨工业大学 一种双脉冲激光诱导解吸附光谱测量系统及其测量托卡马克共沉积层中氘分布的方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007010371A (ja) 2005-06-28 2007-01-18 Kenji Yasuda 有害物検出システム、有害木材の検出方法及び廃棄木材処理システム
US8125627B2 (en) 2007-04-27 2012-02-28 Alakai Defense Systems, Inc. Laser spectroscopy system
JP5483408B2 (ja) * 2009-06-26 2014-05-07 四国電力株式会社 連続式濃度測定装置および方法
CN201575971U (zh) * 2009-12-23 2010-09-08 中国科学院沈阳自动化研究所 一种用于熔融金属的激光诱导击穿光谱装置
US8619255B2 (en) * 2011-04-15 2013-12-31 Rhm Technologies, Inc. Laser induced breakdown spectroscopy
US20120314214A1 (en) * 2011-06-07 2012-12-13 Alexander Dennis R Laser Induced Breakdown Spectroscopy Having Enhanced Signal-to-Noise Ratio
JP6022210B2 (ja) * 2012-02-15 2016-11-09 一般財団法人電力中央研究所 金属表面付着成分の濃度計測方法および装置
US9267895B2 (en) * 2012-09-13 2016-02-23 The University Of Tokyo Chemical analysis device
JP6425351B2 (ja) * 2013-09-10 2018-11-21 株式会社Ihi 物質特定システムおよび物質特定方法
JP6307903B2 (ja) * 2014-02-04 2018-04-11 株式会社Ihi 物質特定方法および物質特定システム
JP6378931B2 (ja) * 2014-05-21 2018-08-22 浜松ホトニクス株式会社 顕微鏡装置及び画像取得方法
CN104142316B (zh) * 2014-08-15 2017-01-25 中国科学院上海技术物理研究所 结合预烧蚀和再加热的三脉冲libs探测系统

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Publication number Publication date
KR20190008231A (ko) 2019-01-23
CN109154567A (zh) 2019-01-04
WO2017199904A1 (ja) 2017-11-23
KR102298835B1 (ko) 2021-09-07
JPWO2017199904A1 (ja) 2019-03-14
CN109154567B (zh) 2021-06-01

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