JP6746730B2 - 冷却された真空閉じ込め容器を備えるホットウォールリアクタ - Google Patents
冷却された真空閉じ込め容器を備えるホットウォールリアクタ Download PDFInfo
- Publication number
- JP6746730B2 JP6746730B2 JP2019007664A JP2019007664A JP6746730B2 JP 6746730 B2 JP6746730 B2 JP 6746730B2 JP 2019007664 A JP2019007664 A JP 2019007664A JP 2019007664 A JP2019007664 A JP 2019007664A JP 6746730 B2 JP6746730 B2 JP 6746730B2
- Authority
- JP
- Japan
- Prior art keywords
- chamber
- wall
- sleeve
- floor
- duct
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000012545 processing Methods 0.000 claims description 38
- 239000000758 substrate Substances 0.000 claims description 38
- 238000007789 sealing Methods 0.000 claims description 35
- 238000000034 method Methods 0.000 claims description 29
- 230000008569 process Effects 0.000 claims description 26
- 238000005086 pumping Methods 0.000 claims description 22
- 238000010926 purge Methods 0.000 claims description 10
- 238000004891 communication Methods 0.000 claims description 7
- 239000012530 fluid Substances 0.000 claims description 7
- 238000006073 displacement reaction Methods 0.000 claims description 6
- 239000007789 gas Substances 0.000 description 23
- 239000006227 byproduct Substances 0.000 description 5
- 230000007246 mechanism Effects 0.000 description 5
- 238000012546 transfer Methods 0.000 description 5
- 230000015572 biosynthetic process Effects 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 229910001220 stainless steel Inorganic materials 0.000 description 3
- 239000010935 stainless steel Substances 0.000 description 3
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 238000000231 atomic layer deposition Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 230000008439 repair process Effects 0.000 description 2
- 239000004215 Carbon black (E152) Substances 0.000 description 1
- 229920002449 FKM Polymers 0.000 description 1
- 229920006169 Perfluoroelastomer Polymers 0.000 description 1
- WYEMLYFITZORAB-UHFFFAOYSA-N boscalid Chemical compound C1=CC(Cl)=CC=C1C1=CC=CC=C1NC(=O)C1=CC=CN=C1Cl WYEMLYFITZORAB-UHFFFAOYSA-N 0.000 description 1
- 238000005219 brazing Methods 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 239000013013 elastic material Substances 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 229920001973 fluoroelastomer Polymers 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 229930195733 hydrocarbon Natural products 0.000 description 1
- 150000002430 hydrocarbons Chemical class 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 230000035699 permeability Effects 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 230000007723 transport mechanism Effects 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32458—Vessel
- H01J37/32522—Temperature
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32458—Vessel
- H01J37/32477—Vessel characterised by the means for protecting vessels or internal parts, e.g. coatings
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
- C23C16/4408—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber by purging residual gases from the reaction chamber or gas lines
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
- C23C16/4409—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber characterised by sealing means
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45519—Inert gas curtains
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45519—Inert gas curtains
- C23C16/45521—Inert gas curtains the gas, other than thermal contact gas, being introduced the rear of the substrate to flow around its periphery
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/46—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for heating the substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32458—Vessel
- H01J37/32513—Sealing means, e.g. sealing between different parts of the vessel
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32715—Workpiece holder
- H01J37/32724—Temperature
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
- Drying Of Semiconductors (AREA)
- Physical Or Chemical Processes And Apparatus (AREA)
Description
Claims (14)
- 基板を処理する装置であって、
処理容積を取り囲むチャンバ本体であり、チャンバ床、前記チャンバ床に結合されたチャンバ壁および前記チャンバ壁に取外し可能に結合されたチャンバリッドを備え、前記チャンバ床、前記チャンバ壁および前記チャンバリッドのうちの少なくとも1つが、熱制御媒体の流れのための通路を備えるチャンバ本体と、
前記チャンバ床に隣接して、前記チャンバ床から間隔を置いて配置されたヒータプレートと、
前記チャンバ壁に隣接して、前記チャンバ壁から間隔を置いて配置されたスリーブであり、前記ヒータプレートによって支持されたスリーブであって、前記スリーブが、内壁、外壁、上壁および下壁を境界とする下ダクトを備えるチャンバライナと、ウエブによって接合された上フランジおよび下フランジを備えるポンピングリングとを備え、前記ポンピングリング、外壁の上部および前記上壁が上ダクトの境界を形成するような態様で、前記上フランジが前記外壁の上端に接しており、前記下フランジが前記内壁の上端によって支持された、スリーブと、
前記チャンバ壁と前記チャンバリッドの間の第1の境界面に配置された第1のシーリング要素と
を備える装置。 - 前記ヒータプレートが、第1の間隙によって前記チャンバ床から間隔を置いて配置されており、前記スリーブが、第2の間隙によって前記チャンバ壁から間隔を置いて配置されており、前記第1の間隙と前記第2の間隙が流体連通している、請求項1に記載の装置。
- 前記第1の間隙と前記第2の間隙のうちの少なくとも一方の間隙にパージガスを供給するために前記チャンバ本体内に配置されたパージガスポートをさらに備える、請求項2に記載の装置。
- 前記下ダクトに流体結合された排気システムをさらに備える、請求項1に記載の装置。
- 前記ウエブが、前記処理容積と前記上ダクトの間の流体連通を提供する複数の開口を含む、請求項1に記載の装置。
- 前記上ダクトと前記下ダクトとが流体結合された、請求項1に記載の装置。
- 前記スリーブが、前記チャンバ本体から取外し可能である、請求項1から3までのいずれか1項に記載の装置。
- 前記チャンバ壁と前記チャンバ床の間の第2の境界面に配置された第2のシーリング要素をさらに備える、請求項1から3までのいずれか1項に記載の装置。
- 前記処理容積内に配置された基板支持体であり、垂直変位と回転変位のうちの少なくとも一方の変位のために支持された基板支持体をさらに備える、請求項1から3までのいずれか1項に記載の装置。
- 前記チャンバ壁の内面に、前記チャンバ床から外側へのテーパが付けられており、前記スリーブの外面に、前記ヒータプレートから外側へのテーパが付けられている、請求項1から3までのいずれか1項に記載の装置。
- 前記チャンバ壁の内面に、垂直から約1度〜約2度の角度の前記チャンバ床から外側へのテーパが付けられており、前記スリーブの外面に、約1度〜2度の間の角度の前記ヒータプレートから外側へのテーパが付けられている、請求項10に記載の装置。
- 基板プロセスチャンバ内で使用するスリーブであり、
内壁、外壁、上壁および下壁を境界とする下ダクトを備えるチャンバライナと、
ウエブによって接合された上フランジおよび下フランジを備え、前記ウエブが複数の開口を備えるポンピングリングと
を備え、
前記ポンピングリング、外壁の上部および前記上壁が上ダクトの境界を形成するような態様で、前記上フランジが前記外壁の上端に接しており、前記下フランジが前記内壁の上端によって支持された
スリーブ。 - 前記外壁に、下壁から外側へのテーパが付けられた、請求項12に記載のスリーブ。
- 前記テーパが約1.0度〜約2.0度である、請求項13に記載のスリーブ。
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201361872282P | 2013-08-30 | 2013-08-30 | |
US61/872,282 | 2013-08-30 | ||
US14/332,775 US9837250B2 (en) | 2013-08-30 | 2014-07-16 | Hot wall reactor with cooled vacuum containment |
US14/332,775 | 2014-07-16 |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2016538921A Division JP6471164B2 (ja) | 2013-08-30 | 2014-07-18 | 冷却された真空閉じ込め容器を備えるホットウォールリアクタ |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2019068105A JP2019068105A (ja) | 2019-04-25 |
JP6746730B2 true JP6746730B2 (ja) | 2020-08-26 |
Family
ID=52581488
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2016538921A Expired - Fee Related JP6471164B2 (ja) | 2013-08-30 | 2014-07-18 | 冷却された真空閉じ込め容器を備えるホットウォールリアクタ |
JP2019007664A Expired - Fee Related JP6746730B2 (ja) | 2013-08-30 | 2019-01-21 | 冷却された真空閉じ込め容器を備えるホットウォールリアクタ |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2016538921A Expired - Fee Related JP6471164B2 (ja) | 2013-08-30 | 2014-07-18 | 冷却された真空閉じ込め容器を備えるホットウォールリアクタ |
Country Status (7)
Country | Link |
---|---|
US (1) | US9837250B2 (ja) |
JP (2) | JP6471164B2 (ja) |
KR (1) | KR102179965B1 (ja) |
CN (2) | CN105493230B (ja) |
SG (1) | SG11201600810TA (ja) |
TW (1) | TWI684672B (ja) |
WO (1) | WO2015030947A1 (ja) |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9837250B2 (en) * | 2013-08-30 | 2017-12-05 | Applied Materials, Inc. | Hot wall reactor with cooled vacuum containment |
US10559451B2 (en) * | 2017-02-15 | 2020-02-11 | Applied Materials, Inc. | Apparatus with concentric pumping for multiple pressure regimes |
US20180254203A1 (en) * | 2017-03-02 | 2018-09-06 | Applied Materials, Inc. | Apparatus and method to reduce particle formation on substrates in post selective etch process |
DE102017116650A1 (de) * | 2017-07-24 | 2019-01-24 | VON ARDENNE Asset GmbH & Co. KG | Prozessieranordnung und Verfahren zum Konditionieren einer Prozessieranordnung |
JP6890085B2 (ja) * | 2017-11-30 | 2021-06-18 | 東京エレクトロン株式会社 | 基板処理装置 |
US11239060B2 (en) * | 2018-05-29 | 2022-02-01 | Taiwan Semiconductor Manufacturing Company, Ltd. | Ion beam etching chamber with etching by-product redistributor |
JP6575641B1 (ja) * | 2018-06-28 | 2019-09-18 | 株式会社明電舎 | シャワーヘッドおよび処理装置 |
US10923327B2 (en) * | 2018-08-01 | 2021-02-16 | Applied Materials, Inc. | Chamber liner |
WO2020033097A1 (en) | 2018-08-06 | 2020-02-13 | Applied Materials, Inc. | Liner for processing chamber |
JP7240958B2 (ja) * | 2018-09-06 | 2023-03-16 | 東京エレクトロン株式会社 | プラズマ処理装置 |
KR20240033107A (ko) * | 2018-09-24 | 2024-03-12 | 어플라이드 머티어리얼스, 인코포레이티드 | 세정 및 표면 처리를 위한 원자 산소 및 오존 디바이스 |
US11078568B2 (en) * | 2019-01-08 | 2021-08-03 | Applied Materials, Inc. | Pumping apparatus and method for substrate processing chambers |
JP7274347B2 (ja) * | 2019-05-21 | 2023-05-16 | 東京エレクトロン株式会社 | プラズマ処理装置 |
TWI833954B (zh) * | 2019-05-28 | 2024-03-01 | 美商應用材料股份有限公司 | 用於改善處理腔室中的流動控制的設備 |
CN110079786A (zh) * | 2019-06-03 | 2019-08-02 | 杭州睿清环保科技有限公司 | 用于制备大面积金刚石薄膜的热壁热丝cvd的装置 |
JP2022064042A (ja) * | 2020-10-13 | 2022-04-25 | 株式会社Kelk | 基板処理装置 |
WO2022116339A1 (zh) * | 2020-12-03 | 2022-06-09 | 无锡邑文电子科技有限公司 | 一种ald加工设备以及加工方法 |
CN112481604B (zh) * | 2020-12-03 | 2023-09-08 | 无锡邑文电子科技有限公司 | 一种ald加工设备以及加工方法 |
US20230073150A1 (en) * | 2021-09-09 | 2023-03-09 | Applied Materials, Inc. | Heated lid for a process chamber |
CN115354300B (zh) * | 2022-08-25 | 2023-11-21 | 拓荆科技(上海)有限公司 | 薄膜沉积设备 |
CN115354303B (zh) * | 2022-08-25 | 2024-01-19 | 拓荆科技(上海)有限公司 | 反应腔装置 |
US20240130082A1 (en) * | 2022-10-12 | 2024-04-18 | Applied Materials, Inc. | Methods and apparatus for cooling a substrate support |
CN118109804B (zh) * | 2024-04-19 | 2024-07-16 | 上海陛通半导体能源科技股份有限公司 | 背面镀膜工艺腔室及化学气相沉积设备 |
Family Cites Families (35)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5271963A (en) * | 1992-11-16 | 1993-12-21 | Materials Research Corporation | Elimination of low temperature ammonia salt in TiCl4 NH3 CVD reaction |
US5788799A (en) * | 1996-06-11 | 1998-08-04 | Applied Materials, Inc. | Apparatus and method for cleaning of semiconductor process chamber surfaces |
US6217937B1 (en) * | 1998-07-15 | 2001-04-17 | Cornell Research Foundation, Inc. | High throughput OMVPE apparatus |
US6364954B2 (en) * | 1998-12-14 | 2002-04-02 | Applied Materials, Inc. | High temperature chemical vapor deposition chamber |
US6408786B1 (en) | 1999-09-23 | 2002-06-25 | Lam Research Corporation | Semiconductor processing equipment having tiled ceramic liner |
US6635114B2 (en) * | 1999-12-17 | 2003-10-21 | Applied Material, Inc. | High temperature filter for CVD apparatus |
US6890861B1 (en) * | 2000-06-30 | 2005-05-10 | Lam Research Corporation | Semiconductor processing equipment having improved particle performance |
US6582522B2 (en) * | 2000-07-21 | 2003-06-24 | Applied Materials, Inc. | Emissivity-change-free pumping plate kit in a single wafer chamber |
US6797639B2 (en) * | 2000-11-01 | 2004-09-28 | Applied Materials Inc. | Dielectric etch chamber with expanded process window |
US6878206B2 (en) * | 2001-07-16 | 2005-04-12 | Applied Materials, Inc. | Lid assembly for a processing system to facilitate sequential deposition techniques |
US20030198754A1 (en) * | 2001-07-16 | 2003-10-23 | Ming Xi | Aluminum oxide chamber and process |
US20040027781A1 (en) * | 2002-08-12 | 2004-02-12 | Hiroji Hanawa | Low loss RF bias electrode for a plasma reactor with enhanced wafer edge RF coupling and highly efficient wafer cooling |
KR100522727B1 (ko) * | 2003-03-31 | 2005-10-20 | 주식회사 아이피에스 | 박막증착용 반응용기 |
US20050150452A1 (en) * | 2004-01-14 | 2005-07-14 | Soovo Sen | Process kit design for deposition chamber |
US20050230350A1 (en) * | 2004-02-26 | 2005-10-20 | Applied Materials, Inc. | In-situ dry clean chamber for front end of line fabrication |
US8440049B2 (en) * | 2006-05-03 | 2013-05-14 | Applied Materials, Inc. | Apparatus for etching high aspect ratio features |
US20080063798A1 (en) * | 2006-08-30 | 2008-03-13 | Kher Shreyas S | Precursors and hardware for cvd and ald |
US8444926B2 (en) * | 2007-01-30 | 2013-05-21 | Applied Materials, Inc. | Processing chamber with heated chamber liner |
JP5269335B2 (ja) * | 2007-03-30 | 2013-08-21 | 東京エレクトロン株式会社 | プラズマ処理装置 |
KR101346850B1 (ko) | 2007-05-11 | 2014-01-07 | 주성엔지니어링(주) | 기판을 균일하게 가열하는 기판처리장치 및 이를 이용한자연산화막 제거방법과 기판처리방법 |
JP2011017031A (ja) | 2007-10-12 | 2011-01-27 | Eagle Industry Co Ltd | 加熱装置 |
KR20100114037A (ko) * | 2007-12-20 | 2010-10-22 | 어플라이드 머티어리얼스, 인코포레이티드 | 향상된 가스 유동 분포를 가진 열 반응기 |
US20090194024A1 (en) * | 2008-01-31 | 2009-08-06 | Applied Materials, Inc. | Cvd apparatus |
US8291857B2 (en) * | 2008-07-03 | 2012-10-23 | Applied Materials, Inc. | Apparatuses and methods for atomic layer deposition |
US20110136346A1 (en) | 2009-12-04 | 2011-06-09 | Axcelis Technologies, Inc. | Substantially Non-Oxidizing Plasma Treatment Devices and Processes |
US8274017B2 (en) | 2009-12-18 | 2012-09-25 | Applied Materials, Inc. | Multifunctional heater/chiller pedestal for wide range wafer temperature control |
US20120009765A1 (en) * | 2010-07-12 | 2012-01-12 | Applied Materials, Inc. | Compartmentalized chamber |
CN103109357B (zh) * | 2010-10-19 | 2016-08-24 | 应用材料公司 | 用于紫外线纳米固化腔室的石英喷洒器 |
US20120244684A1 (en) * | 2011-03-24 | 2012-09-27 | Kunihiko Suzuki | Film-forming apparatus and method |
US20120270384A1 (en) * | 2011-04-22 | 2012-10-25 | Applied Materials, Inc. | Apparatus for deposition of materials on a substrate |
TW202418889A (zh) * | 2011-10-05 | 2024-05-01 | 美商應用材料股份有限公司 | 包括對稱電漿處理腔室的電漿處理設備與用於此設備的蓋組件 |
US9653267B2 (en) * | 2011-10-06 | 2017-05-16 | Applied Materials, Inc. | Temperature controlled chamber liner |
US20130105085A1 (en) | 2011-10-28 | 2013-05-02 | Applied Materials, Inc. | Plasma reactor with chamber wall temperature control |
US9388493B2 (en) * | 2013-01-08 | 2016-07-12 | Veeco Instruments Inc. | Self-cleaning shutter for CVD reactor |
US9837250B2 (en) * | 2013-08-30 | 2017-12-05 | Applied Materials, Inc. | Hot wall reactor with cooled vacuum containment |
-
2014
- 2014-07-16 US US14/332,775 patent/US9837250B2/en not_active Expired - Fee Related
- 2014-07-18 TW TW103124801A patent/TWI684672B/zh not_active IP Right Cessation
- 2014-07-18 KR KR1020167007549A patent/KR102179965B1/ko active IP Right Grant
- 2014-07-18 JP JP2016538921A patent/JP6471164B2/ja not_active Expired - Fee Related
- 2014-07-18 CN CN201480046535.0A patent/CN105493230B/zh not_active Expired - Fee Related
- 2014-07-18 SG SG11201600810TA patent/SG11201600810TA/en unknown
- 2014-07-18 WO PCT/US2014/047126 patent/WO2015030947A1/en active Application Filing
- 2014-07-18 CN CN201811141783.XA patent/CN109616396A/zh active Pending
-
2019
- 2019-01-21 JP JP2019007664A patent/JP6746730B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
WO2015030947A1 (en) | 2015-03-05 |
KR20160048124A (ko) | 2016-05-03 |
US20150059981A1 (en) | 2015-03-05 |
TW201518540A (zh) | 2015-05-16 |
JP6471164B2 (ja) | 2019-02-13 |
TWI684672B (zh) | 2020-02-11 |
JP2019068105A (ja) | 2019-04-25 |
CN105493230B (zh) | 2018-12-11 |
JP2016536797A (ja) | 2016-11-24 |
SG11201600810TA (en) | 2016-03-30 |
US9837250B2 (en) | 2017-12-05 |
CN105493230A (zh) | 2016-04-13 |
CN109616396A (zh) | 2019-04-12 |
KR102179965B1 (ko) | 2020-11-17 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP6746730B2 (ja) | 冷却された真空閉じ込め容器を備えるホットウォールリアクタ | |
TWI836110B (zh) | 溫度控制總成、及控制氣相反應器之溫度控制總成的溫度之方法 | |
US20200224309A1 (en) | Temperature-controlled flange and reactor system including same | |
JP7254762B2 (ja) | 垂直炉用のライナーおよびフランジ組立品ならびにライナーおよび垂直炉 | |
US9909206B2 (en) | Process kit having tall deposition ring and deposition ring clamp | |
US20070091535A1 (en) | Temperature controlled semiconductor processing chamber liner | |
US20090084317A1 (en) | Atomic layer deposition chamber and components | |
KR20110094021A (ko) | 처리 챔버용 밀봉 장치 | |
US20150155142A1 (en) | Methods and apparatus for in-situ cleaning of a process chamber | |
US20220282377A1 (en) | Thermally controlled chandelier showerhead | |
JP2012216744A (ja) | 気相成長装置及び気相成長方法 | |
US11697877B2 (en) | High temperature face plate for deposition application | |
TW202318593A (zh) | 用於處理腔室的加熱式蓋件 | |
JP5259804B2 (ja) | 気相成長装置及び気相成長方法 | |
TWI713657B (zh) | 用於hdp-cvd的具有擋板和噴嘴的冷卻氣體進料塊 | |
TWM464459U (zh) | 金屬有機化學氣相沉積反應器的氣體分佈裝置及反應器 | |
JP2009249651A (ja) | 気相成長装置及び気相成長方法 | |
TW202129715A (zh) | 高溫雙通道噴頭 | |
EP2628823A2 (en) | Chemical vapour deposition apparatus | |
WO2013102577A1 (en) | Heat transfer control in pecvd systems | |
US20220243328A1 (en) | Precursor source arrangement and atomic layer deposition apparatus |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20190121 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20190121 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20200225 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20200302 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20200525 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20200706 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20200805 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 6746730 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
LAPS | Cancellation because of no payment of annual fees |