JP6708857B2 - Ｘ線検査装置 - Google Patents

Ｘ線検査装置 Download PDF

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Publication number
JP6708857B2
JP6708857B2 JP2017200834A JP2017200834A JP6708857B2 JP 6708857 B2 JP6708857 B2 JP 6708857B2 JP 2017200834 A JP2017200834 A JP 2017200834A JP 2017200834 A JP2017200834 A JP 2017200834A JP 6708857 B2 JP6708857 B2 JP 6708857B2
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Japan
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ray
objects
image
inspected
images
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JP2017200834A
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English (en)
Japanese (ja)
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JP2019074415A5 (enExample
JP2019074415A (ja
Inventor
木下　修
修 木下
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JED CO., LTD
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JED CO., LTD
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Priority to JP2017200834A priority Critical patent/JP6708857B2/ja
Priority to EP18867989.8A priority patent/EP3608658A4/en
Priority to PCT/JP2018/035629 priority patent/WO2019077950A1/ja
Priority to US16/605,654 priority patent/US20200132611A1/en
Publication of JP2019074415A publication Critical patent/JP2019074415A/ja
Publication of JP2019074415A5 publication Critical patent/JP2019074415A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

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  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Theoretical Computer Science (AREA)
  • Engineering & Computer Science (AREA)
  • Radiology & Medical Imaging (AREA)
  • Pulmonology (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2017200834A 2017-10-17 2017-10-17 Ｘ線検査装置 Active JP6708857B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2017200834A JP6708857B2 (ja) 2017-10-17 2017-10-17 Ｘ線検査装置
EP18867989.8A EP3608658A4 (en) 2017-10-17 2018-09-26 X-RAY INSPECTION DEVICE
PCT/JP2018/035629 WO2019077950A1 (ja) 2017-10-17 2018-09-26 Ｘ線検査装置
US16/605,654 US20200132611A1 (en) 2017-10-17 2018-09-26 X-ray inspection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017200834A JP6708857B2 (ja) 2017-10-17 2017-10-17 Ｘ線検査装置

Publications (3)

Publication Number Publication Date
JP2019074415A JP2019074415A (ja) 2019-05-16
JP2019074415A5 JP2019074415A5 (enExample) 2019-07-04
JP6708857B2 true JP6708857B2 (ja) 2020-06-10

Family

ID=66173702

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017200834A Active JP6708857B2 (ja) 2017-10-17 2017-10-17 Ｘ線検査装置

Country Status (4)

Country Link
US (1) US20200132611A1 (enExample)
EP (1) EP3608658A4 (enExample)
JP (1) JP6708857B2 (enExample)
WO (1) WO2019077950A1 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6973536B2 (ja) * 2020-03-11 2021-12-01 オムロン株式会社 Ｘ線検査装置およびｘ線検査方法
CN112053409B (zh) * 2020-07-24 2024-05-28 重庆真测科技股份有限公司 基于双旋转台ct扫描系统的非对称数据重建方法
DE102023206858A1 (de) * 2023-07-19 2025-01-23 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung eingetragener Verein Röntgensystem und CT-System

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60256034A (ja) * 1984-06-01 1985-12-17 Toshiba Corp 産業用ｃｔスキヤナ
JPS61240145A (ja) * 1985-04-17 1986-10-25 Hitachi Medical Corp 産業用ｘ線ｃｔ装置
US7356115B2 (en) * 2002-12-04 2008-04-08 Varian Medical Systems Technology, Inc. Radiation scanning units including a movable platform
JP2004245685A (ja) * 2003-02-13 2004-09-02 Toshiba It & Control Systems Corp Ｘ線マイクロ断層撮影装置
JP4488885B2 (ja) * 2004-12-17 2010-06-23 株式会社日立製作所 Ｃｔ装置
JP4632891B2 (ja) * 2005-07-22 2011-02-16 株式会社モリタ製作所 Ｘ線ｃｔ撮影装置およびｘ線ｃｔ撮影方法
JP5011998B2 (ja) 2006-12-13 2012-08-29 株式会社島津製作所 Ｘ線ｃｔ装置
JP5045134B2 (ja) * 2007-02-06 2012-10-10 株式会社島津製作所 Ｘ線ｃｔ装置
JP5251264B2 (ja) * 2007-06-04 2013-07-31 株式会社島津製作所 Ｘ線ｃｔ装置
JPWO2009078415A1 (ja) * 2007-12-17 2011-04-28 株式会社ユニハイトシステム Ｘ線検査装置および方法
US7876875B2 (en) * 2008-04-09 2011-01-25 United Technologies Corp. Computed tomography systems and related methods involving multi-target inspection
JP5884351B2 (ja) * 2011-09-14 2016-03-15 オムロン株式会社 Ｘ線検査装置、ｘ線検査装置の制御方法、ｘ線検査装置を制御するためのプログラム、および、当該プログラムを格納したコンピュータ読み取り可能な記録媒体
JP6153105B2 (ja) * 2013-01-10 2017-06-28 東芝Ｉｔコントロールシステム株式会社 Ｃｔ装置
GB2520711B (en) * 2013-11-28 2018-06-20 Nikon Metrology Nv Calibration apparatus and method for computed tomography
CN105717145B (zh) * 2016-02-03 2019-01-01 北京航空航天大学 多联装三维锥束计算机层析成像方法及装置

Also Published As

Publication number Publication date
WO2019077950A1 (ja) 2019-04-25
JP2019074415A (ja) 2019-05-16
EP3608658A4 (en) 2021-04-07
EP3608658A1 (en) 2020-02-12
US20200132611A1 (en) 2020-04-30

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