JP6702945B2 - 電圧平均化を使用する分散型電圧ネットワーク回路ならびに関連するシステムおよび方法 - Google Patents

電圧平均化を使用する分散型電圧ネットワーク回路ならびに関連するシステムおよび方法 Download PDF

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JP6702945B2
JP6702945B2 JP2017512369A JP2017512369A JP6702945B2 JP 6702945 B2 JP6702945 B2 JP 6702945B2 JP 2017512369 A JP2017512369 A JP 2017512369A JP 2017512369 A JP2017512369 A JP 2017512369A JP 6702945 B2 JP6702945 B2 JP 6702945B2
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voltage
node
distributed
circuit
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JP2017533410A (ja
JP2017533410A5 (https=
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バート・リー・プライス
イエシュワント・ナガラジュ・コッラ
ダハヴァル・ラジェシュバイ・シャア
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クアルコム，インコーポレイテッド
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/003—Measuring mean values of current or voltage during a given time interval
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current 
    • G05F1/46—Regulating voltage or current  wherein the variable actually regulated by the final control device is DC
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
    • H10P74/27—Structural arrangements therefor

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • General Engineering & Computer Science (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Manufacturing & Machinery (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Charge And Discharge Circuits For Batteries Or The Like (AREA)
  • Control Of Electrical Variables (AREA)
JP2017512369A 2014-09-10 2015-08-20 電圧平均化を使用する分散型電圧ネットワーク回路ならびに関連するシステムおよび方法 Active JP6702945B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/482,456 US9494957B2 (en) 2014-09-10 2014-09-10 Distributed voltage network circuits employing voltage averaging, and related systems and methods
US14/482,456 2014-09-10
PCT/US2015/046067 WO2016039962A1 (en) 2014-09-10 2015-08-20 Distributed voltage network circuits employing voltage averaging, and related systems and methods

Publications (3)

Publication Number Publication Date
JP2017533410A JP2017533410A (ja) 2017-11-09
JP2017533410A5 JP2017533410A5 (https=) 2018-09-13
JP6702945B2 true JP6702945B2 (ja) 2020-06-03

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JP2017512369A Active JP6702945B2 (ja) 2014-09-10 2015-08-20 電圧平均化を使用する分散型電圧ネットワーク回路ならびに関連するシステムおよび方法

Country Status (10)

Country Link
US (1) US9494957B2 (https=)
EP (1) EP3191858B1 (https=)
JP (1) JP6702945B2 (https=)
KR (1) KR102331244B1 (https=)
CN (1) CN106662888B (https=)
BR (1) BR112017004693B1 (https=)
CA (1) CA2957035C (https=)
ES (1) ES2861265T3 (https=)
TW (1) TWI594538B (https=)
WO (1) WO2016039962A1 (https=)

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US11047946B2 (en) 2018-05-08 2021-06-29 Qualcomm Incorporated Differential current sensing with robust path, voltage offset removal and process, voltage, temperature (PVT) tolerance
US10958167B2 (en) 2018-08-08 2021-03-23 Qualcomm Incorporated Current sensing in an on-die direct current-direct current (DC-DC) converter for measuring delivered power
US11099238B2 (en) * 2019-03-27 2021-08-24 General Electric Company Distributed control modules with built-in tests and control-preserving fault responses
WO2022027403A1 (en) * 2020-08-06 2022-02-10 Yangtze Memory Technologies Co., Ltd. Multi-die peak power management for three-dimensional memory
US11625054B2 (en) * 2021-06-17 2023-04-11 Novatek Microelectronics Corp. Voltage to current converter of improved size and accuracy
TW202316122A (zh) * 2021-06-25 2023-04-16 美商Ｉｃ分析有限責任公司 用於測試來自單一測試區域之晶圓上之所有測試電路之設備及方法
JP2023043717A (ja) * 2021-09-16 2023-03-29 キオクシア株式会社 半導体装置及び半導体集積回路
US12066959B2 (en) * 2022-05-12 2024-08-20 Intel Corporation Provisioning a reference voltage based on an evaluation of a pseudo-precision resistor of an IC die
US20230398878A1 (en) * 2022-06-14 2023-12-14 Ford Global Technologies, Llc Control of gate drive resistance based on radio frequency interference
US12607658B2 (en) 2023-03-21 2026-04-21 Qualcomm Incorporated Current sensor with a time-interleaved impedance compensation scheme

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Also Published As

Publication number Publication date
US20160070277A1 (en) 2016-03-10
ES2861265T3 (es) 2021-10-06
TWI594538B (zh) 2017-08-01
BR112017004693B1 (pt) 2022-06-21
TW201618409A (zh) 2016-05-16
CA2957035A1 (en) 2016-03-17
JP2017533410A (ja) 2017-11-09
EP3191858A1 (en) 2017-07-19
US9494957B2 (en) 2016-11-15
KR102331244B1 (ko) 2021-11-24
KR20170056531A (ko) 2017-05-23
CA2957035C (en) 2022-12-13
CN106662888B (zh) 2019-02-22
CN106662888A (zh) 2017-05-10
WO2016039962A1 (en) 2016-03-17
EP3191858B1 (en) 2021-01-20
BR112017004693A2 (pt) 2017-12-05

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