CN106662888B - 使用电压平均的分布电压网络电路以及相关系统及方法 - Google Patents

使用电压平均的分布电压网络电路以及相关系统及方法 Download PDF

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Publication number
CN106662888B
CN106662888B CN201580047060.1A CN201580047060A CN106662888B CN 106662888 B CN106662888 B CN 106662888B CN 201580047060 A CN201580047060 A CN 201580047060A CN 106662888 B CN106662888 B CN 106662888B
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China
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voltage
node
distributed
circuit
source
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Chinese (zh)
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CN106662888A (zh
Inventor
伯特·李·普赖斯
耶什万特·纳加拉吉·科拉
达万·拉杰十比海·沙阿
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Qualcomm Inc
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Qualcomm Inc
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30Marginal testing, e.g. by varying supply voltage
    • G01R31/3004Current or voltage test
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/003Measuring mean values of current or voltage during a given time interval
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05FSYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10Regulating voltage or current 
    • G05F1/46Regulating voltage or current  wherein the variable actually regulated by the final control device is DC
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00Testing or measuring during manufacture or treatment of wafers, substrates or devices
    • H10P74/27Structural arrangements therefor

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • General Engineering & Computer Science (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Manufacturing & Machinery (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Charge And Discharge Circuits For Batteries Or The Like (AREA)
  • Control Of Electrical Variables (AREA)
CN201580047060.1A 2014-09-10 2015-08-20 使用电压平均的分布电压网络电路以及相关系统及方法 Active CN106662888B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/482,456 US9494957B2 (en) 2014-09-10 2014-09-10 Distributed voltage network circuits employing voltage averaging, and related systems and methods
US14/482,456 2014-09-10
PCT/US2015/046067 WO2016039962A1 (en) 2014-09-10 2015-08-20 Distributed voltage network circuits employing voltage averaging, and related systems and methods

Publications (2)

Publication Number Publication Date
CN106662888A CN106662888A (zh) 2017-05-10
CN106662888B true CN106662888B (zh) 2019-02-22

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CN201580047060.1A Active CN106662888B (zh) 2014-09-10 2015-08-20 使用电压平均的分布电压网络电路以及相关系统及方法

Country Status (10)

Country Link
US (1) US9494957B2 (https=)
EP (1) EP3191858B1 (https=)
JP (1) JP6702945B2 (https=)
KR (1) KR102331244B1 (https=)
CN (1) CN106662888B (https=)
BR (1) BR112017004693B1 (https=)
CA (1) CA2957035C (https=)
ES (1) ES2861265T3 (https=)
TW (1) TWI594538B (https=)
WO (1) WO2016039962A1 (https=)

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US10345834B2 (en) 2017-08-09 2019-07-09 Qualcomm Incorporated Sensing total current of distributed load circuits independent of current distribution using distributed voltage averaging
US11047946B2 (en) 2018-05-08 2021-06-29 Qualcomm Incorporated Differential current sensing with robust path, voltage offset removal and process, voltage, temperature (PVT) tolerance
US10958167B2 (en) 2018-08-08 2021-03-23 Qualcomm Incorporated Current sensing in an on-die direct current-direct current (DC-DC) converter for measuring delivered power
US11099238B2 (en) * 2019-03-27 2021-08-24 General Electric Company Distributed control modules with built-in tests and control-preserving fault responses
WO2022027403A1 (en) * 2020-08-06 2022-02-10 Yangtze Memory Technologies Co., Ltd. Multi-die peak power management for three-dimensional memory
US11625054B2 (en) * 2021-06-17 2023-04-11 Novatek Microelectronics Corp. Voltage to current converter of improved size and accuracy
TW202316122A (zh) * 2021-06-25 2023-04-16 美商Ic分析有限責任公司 用於測試來自單一測試區域之晶圓上之所有測試電路之設備及方法
JP2023043717A (ja) * 2021-09-16 2023-03-29 キオクシア株式会社 半導体装置及び半導体集積回路
US12066959B2 (en) * 2022-05-12 2024-08-20 Intel Corporation Provisioning a reference voltage based on an evaluation of a pseudo-precision resistor of an IC die
US20230398878A1 (en) * 2022-06-14 2023-12-14 Ford Global Technologies, Llc Control of gate drive resistance based on radio frequency interference
US12607658B2 (en) 2023-03-21 2026-04-21 Qualcomm Incorporated Current sensor with a time-interleaved impedance compensation scheme

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Also Published As

Publication number Publication date
US20160070277A1 (en) 2016-03-10
ES2861265T3 (es) 2021-10-06
TWI594538B (zh) 2017-08-01
BR112017004693B1 (pt) 2022-06-21
TW201618409A (zh) 2016-05-16
CA2957035A1 (en) 2016-03-17
JP2017533410A (ja) 2017-11-09
EP3191858A1 (en) 2017-07-19
US9494957B2 (en) 2016-11-15
KR102331244B1 (ko) 2021-11-24
KR20170056531A (ko) 2017-05-23
CA2957035C (en) 2022-12-13
CN106662888A (zh) 2017-05-10
WO2016039962A1 (en) 2016-03-17
EP3191858B1 (en) 2021-01-20
JP6702945B2 (ja) 2020-06-03
BR112017004693A2 (pt) 2017-12-05

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