JP6691775B2 - Ｘ線画像情報の画像補正方法及び装置 - Google Patents

Ｘ線画像情報の画像補正方法及び装置 Download PDF

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JP6691775B2
JP6691775B2 JP2015546110A JP2015546110A JP6691775B2 JP 6691775 B2 JP6691775 B2 JP 6691775B2 JP 2015546110 A JP2015546110 A JP 2015546110A JP 2015546110 A JP2015546110 A JP 2015546110A JP 6691775 B2 JP6691775 B2 JP 6691775B2
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JP2016506504A5 (enExample
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ハーマン，クリストフ
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Koninklijke Philips NV
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Measurement Of Radiation (AREA)
JP2015546110A 2012-12-04 2013-09-29 Ｘ線画像情報の画像補正方法及び装置 Active JP6691775B2 (ja)

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US201261733016P 2012-12-04 2012-12-04
US61/733,016 2012-12-04
PCT/IB2013/058973 WO2014087264A1 (en) 2012-12-04 2013-09-29 Method and apparatus for image correction of x-ray image information

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JP2016506504A JP2016506504A (ja) 2016-03-03
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JP6691775B2 true JP6691775B2 (ja) 2020-05-13

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US (1) US9746566B2 (enExample)
EP (1) EP2929372B1 (enExample)
JP (2) JP6691775B2 (enExample)
CN (1) CN104838288B (enExample)
BR (1) BR112015012779A2 (enExample)
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Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104812305B (zh) * 2012-12-27 2018-03-30 东芝医疗系统株式会社 X射线ct装置以及控制方法
JP6289223B2 (ja) * 2013-04-04 2018-03-07 キヤノンメディカルシステムズ株式会社 Ｘ線コンピュータ断層撮影装置
EP2871496B1 (en) 2013-11-12 2020-01-01 Samsung Electronics Co., Ltd Radiation detector and computed tomography apparatus using the same
WO2015078753A1 (en) * 2013-11-27 2015-06-04 Koninklijke Philips N.V. Detection device for detecting photons and method therefore
WO2015194512A1 (ja) * 2014-06-16 2015-12-23 株式会社東芝 フォトンカウンティング型ｘ線ｃｔ装置及びフォトンカウンティング型ｘ線診断装置
US10159450B2 (en) * 2014-10-01 2018-12-25 Toshiba Medical Systems Corporation X-ray CT apparatus including a photon-counting detector, and an image processing apparatus and an image processing method for correcting detection signals detected by the photon-counting detector
JP2016067947A (ja) * 2014-10-01 2016-05-09 株式会社東芝 Ｘ線ｃｔ装置、画像処理装置及び画像処理プログラム
EP3234651B1 (en) 2014-12-16 2019-09-11 Koninklijke Philips N.V. Baseline shift determination for a photon detector
WO2017046289A1 (en) 2015-09-18 2017-03-23 Koninklijke Philips N.V. Processing of a corrected x-ray detector signal
CN109313275B (zh) * 2016-06-07 2023-08-29 皇家飞利浦有限公司 针对辐射探测器的死区时间校准
US11493430B2 (en) * 2018-08-22 2022-11-08 Hitachi High-Tech Corporation Automatic analyzer and optical measurement method
CN110956923B (zh) * 2019-12-24 2021-05-07 上海奕瑞光电子科技股份有限公司 低温多晶硅平板探测器像素电路及平板探测方法
EP3842839A1 (en) * 2019-12-27 2021-06-30 Koninklijke Philips N.V. Compensation of polarization effects in photon counting detectors
US12161498B2 (en) * 2021-05-11 2024-12-10 Analog Devices, Inc. Baseline restoration technique for photon counting computed tomography using active reference
JP2024001425A (ja) * 2022-06-22 2024-01-10 キヤノンメディカルシステムズ株式会社 光子計数型ｘ線コンピュータ断層撮影装置、再構成処理装置、光子計数型情報取得方法、再構成処理方法、光子計数型情報取得プログラム、および再構成処理プログラム

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5506880A (en) 1994-12-16 1996-04-09 Morton International, Inc. X-ray inspection system and method
US6362482B1 (en) 1997-09-16 2002-03-26 Advanced Scientific Concepts, Inc. High data rate smart sensor technology
IL145489A0 (en) * 1999-04-26 2002-06-30 Simage Oy Self-triggered imaging device for imaging radiation
JP2001242257A (ja) * 2000-03-02 2001-09-07 Toshiba Corp 放射線測定装置
DE10106221A1 (de) 2001-02-10 2002-08-14 Philips Corp Intellectual Pty Röntgendetektor mit großem Dynamikbereich
IL151634A0 (en) * 2002-09-05 2003-04-10 Real Time Radiography Ltd Direct detection of high energy single photons
WO2004036738A2 (en) * 2002-10-16 2004-04-29 Varian Medical Systems Technologies, Inc. Method and apparatus for excess signal correction in an imager
US6822506B2 (en) 2003-04-17 2004-11-23 Concorde Microsystems, Inc. Amplitude and rise-time sensitive timing-shaping filters with built-in pulse-tail cancellation for high count-rate operation
US20060043315A1 (en) 2004-08-19 2006-03-02 Walter Cook Very large-scale integration (VLSI) circuit for measuring charge pulses
WO2006064403A2 (en) 2004-12-17 2006-06-22 Koninklijke Philips Electronics, N.V. Pulsed x-ray for continuous detector correction
CN101228437A (zh) 2005-07-22 2008-07-23 皇家飞利浦电子股份有限公司 采用多色光谱的x射线探测器成像
JP5492843B2 (ja) * 2006-09-29 2014-05-14 株式会社日立製作所 核医学診断装置
US7455454B2 (en) 2006-10-03 2008-11-25 General Electric Company X-ray detector methods and apparatus
EP2028509A1 (en) * 2007-08-09 2009-02-25 European Organisation for Nuclear Research CERN Radiation monitoring device
US20090039397A1 (en) 2007-08-09 2009-02-12 Micromedia Technology Corp. Image sensor structure
EP2399237B1 (de) * 2009-02-20 2013-08-14 Werth Messtechnik GmbH Verfahren zum messen eines objekts
WO2010143603A1 (ja) * 2009-06-11 2010-12-16 株式会社 日立メディコ 磁気共鳴イメージング装置の調整方法および超電導磁石励磁用ドック
BR112012015031A2 (pt) 2009-12-21 2018-02-27 Koninl Philips Electronics Nv aparelho e método
EP2650700A4 (en) 2010-12-09 2014-06-25 Rigaku Denki Co Ltd RADIATION DETECTOR
RU2581720C2 (ru) * 2011-01-10 2016-04-20 Конинклейке Филипс Электроникс Н.В. Устройство обнаружения для обнаружения фотонов, испускаемых источником излучения
JP6076363B2 (ja) * 2011-10-26 2017-02-08 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． オフセット決定を伴う光子検出装置、該検出装置を有する撮像装置、光子検出方法、該方法を利用した撮像方法ならびに該検出方法・撮像方法に関するコンピュータプログラム
WO2014091278A1 (en) * 2012-12-12 2014-06-19 Koninklijke Philips N.V. Adaptive persistent current compensation for photon counting detectors

Also Published As

Publication number Publication date
EP2929372B1 (en) 2020-05-27
WO2014087264A1 (en) 2014-06-12
US9746566B2 (en) 2017-08-29
BR112015012779A2 (pt) 2017-07-11
JP6814235B2 (ja) 2021-01-13
RU2015126606A (ru) 2017-01-12
JP2019058780A (ja) 2019-04-18
CN104838288A (zh) 2015-08-12
JP2016506504A (ja) 2016-03-03
EP2929372A1 (en) 2015-10-14
US20150316663A1 (en) 2015-11-05
CN104838288B (zh) 2018-05-25

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