BR112015012779A2 - método de correção de imagem das informações de imagens de raios x, aparelho para correção de imagem das informações de imagens de raios x, sistema de raios x, uso de um aparelho, meio legível por computador, e elemento de programa para correção de imagem das informações de imagens de raios x - Google Patents

método de correção de imagem das informações de imagens de raios x, aparelho para correção de imagem das informações de imagens de raios x, sistema de raios x, uso de um aparelho, meio legível por computador, e elemento de programa para correção de imagem das informações de imagens de raios x

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Publication number
BR112015012779A2
BR112015012779A2 BR112015012779A BR112015012779A BR112015012779A2 BR 112015012779 A2 BR112015012779 A2 BR 112015012779A2 BR 112015012779 A BR112015012779 A BR 112015012779A BR 112015012779 A BR112015012779 A BR 112015012779A BR 112015012779 A2 BR112015012779 A2 BR 112015012779A2
Authority
BR
Brazil
Prior art keywords
ray
image information
information
image correction
ray image
Prior art date
Application number
BR112015012779A
Other languages
English (en)
Portuguese (pt)
Inventor
Herrmann Christoph
Original Assignee
Koninklijke Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Nv filed Critical Koninklijke Philips Nv
Publication of BR112015012779A2 publication Critical patent/BR112015012779A2/pt

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Measurement Of Radiation (AREA)
BR112015012779A 2012-12-04 2013-09-29 método de correção de imagem das informações de imagens de raios x, aparelho para correção de imagem das informações de imagens de raios x, sistema de raios x, uso de um aparelho, meio legível por computador, e elemento de programa para correção de imagem das informações de imagens de raios x BR112015012779A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201261733016P 2012-12-04 2012-12-04
PCT/IB2013/058973 WO2014087264A1 (en) 2012-12-04 2013-09-29 Method and apparatus for image correction of x-ray image information

Publications (1)

Publication Number Publication Date
BR112015012779A2 true BR112015012779A2 (pt) 2017-07-11

Family

ID=49911748

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112015012779A BR112015012779A2 (pt) 2012-12-04 2013-09-29 método de correção de imagem das informações de imagens de raios x, aparelho para correção de imagem das informações de imagens de raios x, sistema de raios x, uso de um aparelho, meio legível por computador, e elemento de programa para correção de imagem das informações de imagens de raios x

Country Status (7)

Country Link
US (1) US9746566B2 (enExample)
EP (1) EP2929372B1 (enExample)
JP (2) JP6691775B2 (enExample)
CN (1) CN104838288B (enExample)
BR (1) BR112015012779A2 (enExample)
RU (1) RU2015126606A (enExample)
WO (1) WO2014087264A1 (enExample)

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JP6289223B2 (ja) * 2013-04-04 2018-03-07 キヤノンメディカルシステムズ株式会社 Ｘ線コンピュータ断層撮影装置
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EP3074791B1 (en) * 2013-11-27 2019-06-19 Koninklijke Philips N.V. Detection device for detecting photons and method therefor
WO2015194512A1 (ja) * 2014-06-16 2015-12-23 株式会社東芝 フォトンカウンティング型ｘ線ｃｔ装置及びフォトンカウンティング型ｘ線診断装置
JP2016067947A (ja) * 2014-10-01 2016-05-09 株式会社東芝 Ｘ線ｃｔ装置、画像処理装置及び画像処理プログラム
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CN107003421B (zh) 2014-12-16 2020-02-07 皇家飞利浦有限公司 用于光子探测器的基线偏移确定
EP3350623B1 (en) 2015-09-18 2020-12-16 Koninklijke Philips N.V. Processing of a corrected x-ray detector signal
WO2017211880A1 (en) * 2016-06-07 2017-12-14 Koninklijke Philips N.V. Dead-time calibration for a radiation detector
EP3842771A4 (en) * 2018-08-22 2022-05-11 Hitachi High-Tech Corporation AUTOMATIC ANALYZER AND OPTICAL MEASUREMENT PROCEDURE
CN110956923B (zh) * 2019-12-24 2021-05-07 上海奕瑞光电子科技股份有限公司 低温多晶硅平板探测器像素电路及平板探测方法
EP3842839A1 (en) * 2019-12-27 2021-06-30 Koninklijke Philips N.V. Compensation of polarization effects in photon counting detectors
US12161498B2 (en) * 2021-05-11 2024-12-10 Analog Devices, Inc. Baseline restoration technique for photon counting computed tomography using active reference
JP2024001425A (ja) * 2022-06-22 2024-01-10 キヤノンメディカルシステムズ株式会社 光子計数型ｘ線コンピュータ断層撮影装置、再構成処理装置、光子計数型情報取得方法、再構成処理方法、光子計数型情報取得プログラム、および再構成処理プログラム

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Also Published As

Publication number Publication date
US9746566B2 (en) 2017-08-29
EP2929372A1 (en) 2015-10-14
JP6691775B2 (ja) 2020-05-13
RU2015126606A (ru) 2017-01-12
WO2014087264A1 (en) 2014-06-12
US20150316663A1 (en) 2015-11-05
EP2929372B1 (en) 2020-05-27
CN104838288B (zh) 2018-05-25
JP2016506504A (ja) 2016-03-03
JP6814235B2 (ja) 2021-01-13
JP2019058780A (ja) 2019-04-18
CN104838288A (zh) 2015-08-12

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