BR112015012779A2 - método de correção de imagem das informações de imagens de raios x, aparelho para correção de imagem das informações de imagens de raios x, sistema de raios x, uso de um aparelho, meio legível por computador, e elemento de programa para correção de imagem das informações de imagens de raios x - Google Patents

método de correção de imagem das informações de imagens de raios x, aparelho para correção de imagem das informações de imagens de raios x, sistema de raios x, uso de um aparelho, meio legível por computador, e elemento de programa para correção de imagem das informações de imagens de raios x

Info

Publication number
BR112015012779A2
BR112015012779A2 BR112015012779A BR112015012779A BR112015012779A2 BR 112015012779 A2 BR112015012779 A2 BR 112015012779A2 BR 112015012779 A BR112015012779 A BR 112015012779A BR 112015012779 A BR112015012779 A BR 112015012779A BR 112015012779 A2 BR112015012779 A2 BR 112015012779A2
Authority
BR
Brazil
Prior art keywords
ray
image information
information
image correction
ray image
Prior art date
Application number
BR112015012779A
Other languages
English (en)
Portuguese (pt)
Inventor
Herrmann Christoph
Original Assignee
Koninklijke Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Nv filed Critical Koninklijke Philips Nv
Publication of BR112015012779A2 publication Critical patent/BR112015012779A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Measurement Of Radiation (AREA)
BR112015012779A 2012-12-04 2013-09-29 método de correção de imagem das informações de imagens de raios x, aparelho para correção de imagem das informações de imagens de raios x, sistema de raios x, uso de um aparelho, meio legível por computador, e elemento de programa para correção de imagem das informações de imagens de raios x BR112015012779A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201261733016P 2012-12-04 2012-12-04
PCT/IB2013/058973 WO2014087264A1 (en) 2012-12-04 2013-09-29 Method and apparatus for image correction of x-ray image information

Publications (1)

Publication Number Publication Date
BR112015012779A2 true BR112015012779A2 (pt) 2017-07-11

Family

ID=49911748

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112015012779A BR112015012779A2 (pt) 2012-12-04 2013-09-29 método de correção de imagem das informações de imagens de raios x, aparelho para correção de imagem das informações de imagens de raios x, sistema de raios x, uso de um aparelho, meio legível por computador, e elemento de programa para correção de imagem das informações de imagens de raios x

Country Status (7)

Country Link
US (1) US9746566B2 (enExample)
EP (1) EP2929372B1 (enExample)
JP (2) JP6691775B2 (enExample)
CN (1) CN104838288B (enExample)
BR (1) BR112015012779A2 (enExample)
RU (1) RU2015126606A (enExample)
WO (1) WO2014087264A1 (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014104306A1 (ja) * 2012-12-27 2014-07-03 株式会社東芝 Ｘ線ｃｔ装置及び制御方法
WO2014163187A1 (ja) * 2013-04-04 2014-10-09 株式会社 東芝 Ｘ線コンピュータ断層撮影装置
EP2871496B1 (en) * 2013-11-12 2020-01-01 Samsung Electronics Co., Ltd Radiation detector and computed tomography apparatus using the same
EP3074791B1 (en) * 2013-11-27 2019-06-19 Koninklijke Philips N.V. Detection device for detecting photons and method therefor
WO2015194512A1 (ja) * 2014-06-16 2015-12-23 株式会社東芝 フォトンカウンティング型ｘ線ｃｔ装置及びフォトンカウンティング型ｘ線診断装置
US10159450B2 (en) * 2014-10-01 2018-12-25 Toshiba Medical Systems Corporation X-ray CT apparatus including a photon-counting detector, and an image processing apparatus and an image processing method for correcting detection signals detected by the photon-counting detector
JP2016067947A (ja) * 2014-10-01 2016-05-09 株式会社東芝 Ｘ線ｃｔ装置、画像処理装置及び画像処理プログラム
RU2699307C2 (ru) 2014-12-16 2019-09-04 Конинклейке Филипс Н.В. Определение смещения базовой линии детектора фотонов
CN108291971B (zh) 2015-09-18 2022-07-29 皇家飞利浦有限公司 对经校正的x射线探测器信号的处理
US10627532B2 (en) * 2016-06-07 2020-04-21 Koninklijke Philips N.V. Dead-time calibration for a radiation detector
US11493430B2 (en) * 2018-08-22 2022-11-08 Hitachi High-Tech Corporation Automatic analyzer and optical measurement method
CN110956923B (zh) * 2019-12-24 2021-05-07 上海奕瑞光电子科技股份有限公司 低温多晶硅平板探测器像素电路及平板探测方法
EP3842839A1 (en) * 2019-12-27 2021-06-30 Koninklijke Philips N.V. Compensation of polarization effects in photon counting detectors
US12161498B2 (en) * 2021-05-11 2024-12-10 Analog Devices, Inc. Baseline restoration technique for photon counting computed tomography using active reference
JP2024001425A (ja) * 2022-06-22 2024-01-10 キヤノンメディカルシステムズ株式会社 光子計数型ｘ線コンピュータ断層撮影装置、再構成処理装置、光子計数型情報取得方法、再構成処理方法、光子計数型情報取得プログラム、および再構成処理プログラム

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5506880A (en) 1994-12-16 1996-04-09 Morton International, Inc. X-ray inspection system and method
US6362482B1 (en) 1997-09-16 2002-03-26 Advanced Scientific Concepts, Inc. High data rate smart sensor technology
JP2002543684A (ja) * 1999-04-26 2002-12-17 シマゲ オユ 放射線撮像線用自己トリガー撮像デバイス
JP2001242257A (ja) * 2000-03-02 2001-09-07 Toshiba Corp 放射線測定装置
DE10106221A1 (de) 2001-02-10 2002-08-14 Philips Corp Intellectual Pty Röntgendetektor mit großem Dynamikbereich
IL151634A0 (en) * 2002-09-05 2003-04-10 Real Time Radiography Ltd Direct detection of high energy single photons
EP1573896A4 (en) * 2002-10-16 2008-08-20 Varian Med Sys Tech Inc METHOD AND DEVICE FOR CORRECTING SIGNAL EXCESSES IN IMAGING DEVICE
US6822506B2 (en) 2003-04-17 2004-11-23 Concorde Microsystems, Inc. Amplitude and rise-time sensitive timing-shaping filters with built-in pulse-tail cancellation for high count-rate operation
US20060043315A1 (en) * 2004-08-19 2006-03-02 Walter Cook Very large-scale integration (VLSI) circuit for measuring charge pulses
US7873144B2 (en) 2004-12-17 2011-01-18 Koninklijke Philips Electronics N.V. Pulsed x-ray for continuous detector correction
EP1910810A2 (en) 2005-07-22 2008-04-16 Koninklijke Philips Electronics N.V. X-ray detector imaging with polychromatic spectra
JP5492843B2 (ja) * 2006-09-29 2014-05-14 株式会社日立製作所 核医学診断装置
US7455454B2 (en) 2006-10-03 2008-11-25 General Electric Company X-ray detector methods and apparatus
US20090039397A1 (en) 2007-08-09 2009-02-12 Micromedia Technology Corp. Image sensor structure
EP2028509A1 (en) * 2007-08-09 2009-02-25 European Organisation for Nuclear Research CERN Radiation monitoring device
CN102326182B (zh) * 2009-02-20 2016-05-18 沃思测量技术股份有限公司 借助测量系统确定工件结构和/或几何形状的方法和装置
JP5686733B2 (ja) * 2009-06-11 2015-03-18 株式会社日立メディコ 磁気共鳴イメージング装置に用いる超電導磁石の調整方法および超電導磁石励磁用ドック
WO2011077302A2 (en) * 2009-12-21 2011-06-30 Koninklijke Philips Electronics N.V. Radiation detector assembly with test circuitry
JP5576502B2 (ja) 2010-12-09 2014-08-20 株式会社リガク 放射線検出器
US9176238B2 (en) 2011-01-10 2015-11-03 Koninklijke Philips N.V. Detection device for detecting photons emitted by a radiation source
CN103890571B (zh) * 2011-10-26 2017-07-14 皇家飞利浦有限公司 具有偏移校正的用于探测光子的放射探测装置
BR112015013392A2 (pt) * 2012-12-12 2017-07-11 Koninklijke Philips Nv sistema de imagem, e método

Also Published As

Publication number Publication date
US20150316663A1 (en) 2015-11-05
WO2014087264A1 (en) 2014-06-12
CN104838288A (zh) 2015-08-12
US9746566B2 (en) 2017-08-29
JP2019058780A (ja) 2019-04-18
EP2929372A1 (en) 2015-10-14
JP2016506504A (ja) 2016-03-03
JP6814235B2 (ja) 2021-01-13
EP2929372B1 (en) 2020-05-27
JP6691775B2 (ja) 2020-05-13
RU2015126606A (ru) 2017-01-12
CN104838288B (zh) 2018-05-25

Similar Documents

Publication Publication Date Title
BR112015012779A2 (pt) método de correção de imagem das informações de imagens de raios x, aparelho para correção de imagem das informações de imagens de raios x, sistema de raios x, uso de um aparelho, meio legível por computador, e elemento de programa para correção de imagem das informações de imagens de raios x
BR112014027512A2 (pt) sistema de imagens, método, e conjunto detector sensível à radiação
CY1123497T1 (el) Συστηματα που παρεχουν μiκροσκοπικες εικονες τουλαχιστον μιας ανατομικης δομης σε μια συγκεκριμενη αναλυση
WO2012135644A3 (en) X-ray imaging system and method
BR112015028336A2 (pt) placa detectora de imageamento em silício, método, e, detector do método
JP2016506504A5 (enExample)
BR112014032123A2 (pt) aparelho de processamento de dados do detector, método de processamento de dados do detector, sistema de imagem por raios x, elemento de programa de computador para controlar um aparelho, e meio legível por computador
BR112015024598A2 (pt) Detector para detectar os traços de partículas de ionização
BR112012032380A2 (pt) método para determinar a assinatura de resposta espacial de um detector em radiografia computadorizada
BR112014011986A2 (pt) sistema e método de geração de imagem nuclear sem magneto para geração de imagem de uma região de interesse
RU2017106201A (ru) Устройство детектора рентгеновского излучения для рентгеновского излучения под наклонным углом
AR104999A1 (es) Detector de neutrones térmicos y subtérmicos de alta resolución espacial en dos dimensiones basado en sensores electrónicos ccd y cmos y un conversor que contiene gadolinio
Kawasaki Lightning imaging via VHF emission
Zink et al. Absolute Measurements of keV Electron Beams
Fuentes-Garcia et al. Development of a position sensitive detector for Rydberg atom experiments
이경세 et al. Charge-Integration-Mode Detection for Measurements of Particle Beams
Yoshida et al. CALET investigation of the origin of cosmic-ray electrons and search for dark matter
Marisaldi et al. Implications for Terrestrial Gamma-ray Flashes spectrum, flux and fine time structure at source based on the high-energy events observed by AGILE
Cruz-Ardila et al. Electronic application for saving electric power using an alternative source of energy
Aizawa et al. Development of under sodium viewer for next generation sodium-cooled fast reactor
WO2015063232A3 (de) Blendensystem für eine strahlenquelle sowie vorrichtung und verfahren zum aufnehmen eines projektionsbilds und zum bestimmen einer relativposition zwischen einer strahlenquelle und einem strahlendetektor
Kleinjan Drell-Yan Angular Distributions at the E906 SeaQuest Experiment
Lotti et al. Compton Polarization with Nustar
Johnson et al. Calibration and Operation of the Sodium Guidestar Adaptive Optics System on the Starfire Optical Range 3.5 meter Telescope
Selph SB30-09/10: Athletic Fee Increase

Legal Events

Date Code Title Description
B08F Application fees: dismissal - article 86 of industrial property law

Free format text: REFERENTE A 5A ANUIDADE.

B08K Lapse as no evidence of payment of the annual fee has been furnished to inpi (acc. art. 87)

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2481 DE 24-07-2018 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.