CN104838288B - 用于x-射线图像信息的图像校正的方法和装置 - Google Patents

用于x-射线图像信息的图像校正的方法和装置 Download PDF

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CN104838288B
CN104838288B CN201380063142.6A CN201380063142A CN104838288B CN 104838288 B CN104838288 B CN 104838288B CN 201380063142 A CN201380063142 A CN 201380063142A CN 104838288 B CN104838288 B CN 104838288B
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photocurrent
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CN104838288A (zh
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C·赫尔曼
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Koninklijke Philips NV
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Measurement Of Radiation (AREA)
CN201380063142.6A 2012-12-04 2013-09-29 用于x-射线图像信息的图像校正的方法和装置 Active CN104838288B (zh)

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US201261733016P 2012-12-04 2012-12-04
US61/733,016 2012-12-04
PCT/IB2013/058973 WO2014087264A1 (en) 2012-12-04 2013-09-29 Method and apparatus for image correction of x-ray image information

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CN104838288A CN104838288A (zh) 2015-08-12
CN104838288B true CN104838288B (zh) 2018-05-25

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US (1) US9746566B2 (enExample)
EP (1) EP2929372B1 (enExample)
JP (2) JP6691775B2 (enExample)
CN (1) CN104838288B (enExample)
BR (1) BR112015012779A2 (enExample)
RU (1) RU2015126606A (enExample)
WO (1) WO2014087264A1 (enExample)

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CN105073010B (zh) * 2013-04-04 2018-04-03 东芝医疗系统株式会社 X射线计算机断层摄影装置
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JP6615503B2 (ja) * 2014-06-16 2019-12-04 キヤノンメディカルシステムズ株式会社 フォトンカウンティング型ｘ線ｃｔ装置及びフォトンカウンティング型ｘ線診断装置
US10159450B2 (en) * 2014-10-01 2018-12-25 Toshiba Medical Systems Corporation X-ray CT apparatus including a photon-counting detector, and an image processing apparatus and an image processing method for correcting detection signals detected by the photon-counting detector
JP2016067947A (ja) * 2014-10-01 2016-05-09 株式会社東芝 Ｘ線ｃｔ装置、画像処理装置及び画像処理プログラム
US10660589B2 (en) 2014-12-16 2020-05-26 Koninklijke Philips N.V. Baseline shift determination for a photon detector
US11099279B2 (en) 2015-09-18 2021-08-24 Koninklijke Philips N.V. Processing of a corrected X-ray detector signal
US10627532B2 (en) * 2016-06-07 2020-04-21 Koninklijke Philips N.V. Dead-time calibration for a radiation detector
US11493430B2 (en) * 2018-08-22 2022-11-08 Hitachi High-Tech Corporation Automatic analyzer and optical measurement method
CN110956923B (zh) * 2019-12-24 2021-05-07 上海奕瑞光电子科技股份有限公司 低温多晶硅平板探测器像素电路及平板探测方法
EP3842839A1 (en) * 2019-12-27 2021-06-30 Koninklijke Philips N.V. Compensation of polarization effects in photon counting detectors
US12161498B2 (en) * 2021-05-11 2024-12-10 Analog Devices, Inc. Baseline restoration technique for photon counting computed tomography using active reference
JP2024001425A (ja) * 2022-06-22 2024-01-10 キヤノンメディカルシステムズ株式会社 光子計数型ｘ線コンピュータ断層撮影装置、再構成処理装置、光子計数型情報取得方法、再構成処理方法、光子計数型情報取得プログラム、および再構成処理プログラム

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Publication number Publication date
US20150316663A1 (en) 2015-11-05
JP6691775B2 (ja) 2020-05-13
EP2929372A1 (en) 2015-10-14
JP2019058780A (ja) 2019-04-18
EP2929372B1 (en) 2020-05-27
BR112015012779A2 (pt) 2017-07-11
CN104838288A (zh) 2015-08-12
JP2016506504A (ja) 2016-03-03
US9746566B2 (en) 2017-08-29
WO2014087264A1 (en) 2014-06-12
JP6814235B2 (ja) 2021-01-13
RU2015126606A (ru) 2017-01-12

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