JP6663353B2 - 極端紫外光源のための適応レーザシステム - Google Patents

極端紫外光源のための適応レーザシステム Download PDF

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Publication number
JP6663353B2
JP6663353B2 JP2016547862A JP2016547862A JP6663353B2 JP 6663353 B2 JP6663353 B2 JP 6663353B2 JP 2016547862 A JP2016547862 A JP 2016547862A JP 2016547862 A JP2016547862 A JP 2016547862A JP 6663353 B2 JP6663353 B2 JP 6663353B2
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Japan
Prior art keywords
light beam
adaptive
optical
optical amplifier
output
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JP2016547862A
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English (en)
Japanese (ja)
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JP2017516288A (ja
JP2017516288A5 (enExample
Inventor
タオ,イエジョン
ブラウン,ダニエル,ジョン,ウィリアム
シャフガンズ,アレキサンダー,アンソニー
デイビッド コーディル,マイケル
デイビッド コーディル,マイケル
ジェームス ゴリック,ダニエル
ジェームス ゴリック,ダニエル
リン サンドストロム,リチャード
リン サンドストロム,リチャード
アマダ,ヨシホ
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ASML Netherlands BV
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ASML Netherlands BV
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Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05GX-RAY TECHNIQUE
    • H05G2/00Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
    • H05G2/001Production of X-ray radiation generated from plasma
    • H05G2/008Production of X-ray radiation generated from plasma involving an energy-carrying beam in the process of plasma generation
    • H05G2/0082Production of X-ray radiation generated from plasma involving an energy-carrying beam in the process of plasma generation the energy-carrying beam being a laser beam
    • H05G2/0084Control of the laser beam
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/005Optical devices external to the laser cavity, specially adapted for lasers, e.g. for homogenisation of the beam or for manipulating laser pulses, e.g. pulse shaping
    • H01S3/0071Beam steering, e.g. whereby a mirror outside the cavity is present to change the beam direction
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/10Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
    • H01S3/10007Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating in optical amplifiers
    • H01S3/10023Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating in optical amplifiers by functional association of additional optical elements, e.g. filters, gratings, reflectors
    • H01S3/1003Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating in optical amplifiers by functional association of additional optical elements, e.g. filters, gratings, reflectors tunable optical elements, e.g. acousto-optic filters, tunable gratings
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/10Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
    • H01S3/13Stabilisation of laser output parameters, e.g. frequency or amplitude
    • H01S3/1305Feedback control systems
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/14Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range characterised by the material used as the active medium
    • H01S3/22Gases
    • H01S3/223Gases the active gas being polyatomic, i.e. containing two or more atoms
    • H01S3/2232Carbon dioxide (CO2) or monoxide [CO]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/23Arrangements of two or more lasers not provided for in groups H01S3/02 - H01S3/22, e.g. tandem arrangements of separate active media
    • H01S3/2308Amplifier arrangements, e.g. MOPA
    • H01S3/2316Cascaded amplifiers

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  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Automation & Control Theory (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • X-Ray Techniques (AREA)
  • Lasers (AREA)
JP2016547862A 2014-02-28 2015-02-24 極端紫外光源のための適応レーザシステム Active JP6663353B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/194,027 2014-02-28
US14/194,027 US9380691B2 (en) 2014-02-28 2014-02-28 Adaptive laser system for an extreme ultraviolet light source
PCT/EP2015/053763 WO2015128297A1 (en) 2014-02-28 2015-02-24 Adaptive laser system for an extreme ultraviolet light source

Publications (3)

Publication Number Publication Date
JP2017516288A JP2017516288A (ja) 2017-06-15
JP2017516288A5 JP2017516288A5 (enExample) 2018-04-05
JP6663353B2 true JP6663353B2 (ja) 2020-03-11

Family

ID=52577856

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016547862A Active JP6663353B2 (ja) 2014-02-28 2015-02-24 極端紫外光源のための適応レーザシステム

Country Status (6)

Country Link
US (1) US9380691B2 (enExample)
JP (1) JP6663353B2 (enExample)
KR (1) KR102458094B1 (enExample)
CN (1) CN106465525B (enExample)
TW (1) TWI670996B (enExample)
WO (1) WO2015128297A1 (enExample)

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* Cited by examiner, † Cited by third party
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US20170311429A1 (en) * 2016-04-25 2017-10-26 Asml Netherlands B.V. Reducing the effect of plasma on an object in an extreme ultraviolet light source
US10411435B2 (en) * 2016-06-06 2019-09-10 Raytheon Company Dual-axis adaptive optic (AO) system for high-power lasers
US9778022B1 (en) * 2016-09-14 2017-10-03 Asml Netherlands B.V. Determining moving properties of a target in an extreme ultraviolet light source
US10524345B2 (en) * 2017-04-28 2019-12-31 Taiwan Semiconductor Manufacturing Co., Ltd. Residual gain monitoring and reduction for EUV drive laser
WO2019224601A2 (en) * 2018-05-24 2019-11-28 Panasonic intellectual property Management co., Ltd Exchangeable laser resonator modules with angular adjustment
CN108982399B (zh) * 2018-07-09 2021-04-06 安徽建筑大学 一种烟道氨浓度激光在线检测系统
CN108982411B (zh) * 2018-07-09 2021-04-06 安徽建筑大学 一种检测烟道中氨气浓度的激光原位检测系统
NL2023633A (en) * 2018-09-25 2020-04-30 Asml Netherlands Bv Laser system for target metrology and alteration in an euv light source
WO2020086901A1 (en) * 2018-10-26 2020-04-30 Asml Netherlands B.V. Monitoring light emissions
WO2020197719A1 (en) * 2019-03-27 2020-10-01 Cymer, Llc Pressure-controlled spectral feature adjuster
WO2020242540A1 (en) 2019-05-30 2020-12-03 University Of Virginia Patent Foundation Low power receiver and related circuits
JP7329422B2 (ja) 2019-11-18 2023-08-18 ギガフォトン株式会社 ビームデリバリシステム、焦点距離選定方法及び電子デバイスの製造方法
KR20220166280A (ko) 2020-04-09 2022-12-16 에이에스엠엘 네델란즈 비.브이. 방사선 소스용 시드 레이저 시스템

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DE3900467C2 (de) 1989-01-10 1995-09-07 Trumpf Lasertechnik Gmbh Vorrichtung mit einem Spiegelkopf
US7491954B2 (en) * 2006-10-13 2009-02-17 Cymer, Inc. Drive laser delivery systems for EUV light source
US6880942B2 (en) 2002-06-20 2005-04-19 Nikon Corporation Adaptive optic with discrete actuators for continuous deformation of a deformable mirror system
JP5833806B2 (ja) 2008-09-19 2015-12-16 ギガフォトン株式会社 極端紫外光源装置、極端紫外光源装置用レーザ光源装置及び極端紫外光源装置用レーザ光源の調整方法
JP5587578B2 (ja) 2008-09-26 2014-09-10 ギガフォトン株式会社 極端紫外光源装置およびパルスレーザ装置
JP5368261B2 (ja) 2008-11-06 2013-12-18 ギガフォトン株式会社 極端紫外光源装置、極端紫外光源装置の制御方法
US8283643B2 (en) 2008-11-24 2012-10-09 Cymer, Inc. Systems and methods for drive laser beam delivery in an EUV light source
JP5946612B2 (ja) 2010-10-08 2016-07-06 ギガフォトン株式会社 ミラー、ミラー装置、レーザ装置および極端紫外光生成装置
US8810902B2 (en) 2010-12-29 2014-08-19 Asml Netherlands B.V. Multi-pass optical apparatus
JP5816440B2 (ja) * 2011-02-23 2015-11-18 ギガフォトン株式会社 光学装置、レーザ装置および極端紫外光生成装置
JP2013201388A (ja) * 2012-03-26 2013-10-03 Gigaphoton Inc レーザシステム及び極端紫外光生成システム
US8811440B2 (en) * 2012-09-07 2014-08-19 Asml Netherlands B.V. System and method for seed laser mode stabilization
CN103560387A (zh) * 2013-11-14 2014-02-05 中国电子科技集团公司第十一研究所 一种双程吸收分光匹配激光放大器及其放大方法

Also Published As

Publication number Publication date
JP2017516288A (ja) 2017-06-15
CN106465525A (zh) 2017-02-22
WO2015128297A1 (en) 2015-09-03
US9380691B2 (en) 2016-06-28
TW201536112A (zh) 2015-09-16
KR102458094B1 (ko) 2022-10-21
KR20160125962A (ko) 2016-11-01
TWI670996B (zh) 2019-09-01
CN106465525B (zh) 2019-01-22
US20150250045A1 (en) 2015-09-03

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