JP6609174B2 - 顕微鏡システムおよびその制御方法 - Google Patents

顕微鏡システムおよびその制御方法 Download PDF

Info

Publication number
JP6609174B2
JP6609174B2 JP2015241641A JP2015241641A JP6609174B2 JP 6609174 B2 JP6609174 B2 JP 6609174B2 JP 2015241641 A JP2015241641 A JP 2015241641A JP 2015241641 A JP2015241641 A JP 2015241641A JP 6609174 B2 JP6609174 B2 JP 6609174B2
Authority
JP
Japan
Prior art keywords
stage
axis
slide
mark
origin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2015241641A
Other languages
English (en)
Japanese (ja)
Other versions
JP2017107104A5 (enExample
JP2017107104A (ja
Inventor
亨宇 坂元
明典 橋口
しのぶ 増田
継英 坂田
島田　　勉
浩武 安藤
和彦 加藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2015241641A priority Critical patent/JP6609174B2/ja
Priority to EP16815979.6A priority patent/EP3387479B1/en
Priority to PCT/JP2016/086337 priority patent/WO2017099111A1/en
Priority to US15/780,302 priority patent/US10928620B2/en
Publication of JP2017107104A publication Critical patent/JP2017107104A/ja
Publication of JP2017107104A5 publication Critical patent/JP2017107104A5/ja
Application granted granted Critical
Publication of JP6609174B2 publication Critical patent/JP6609174B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/26—Stages; Adjusting means therefor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/241—Devices for focusing
    • G02B21/244—Devices for focusing using image analysis techniques
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/34—Microscope slides, e.g. mounting specimens on microscope slides
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microscoopes, Condenser (AREA)
JP2015241641A 2015-12-10 2015-12-10 顕微鏡システムおよびその制御方法 Active JP6609174B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2015241641A JP6609174B2 (ja) 2015-12-10 2015-12-10 顕微鏡システムおよびその制御方法
EP16815979.6A EP3387479B1 (en) 2015-12-10 2016-12-07 Microscope system and method of controlling the same
PCT/JP2016/086337 WO2017099111A1 (en) 2015-12-10 2016-12-07 Microscope system and method of controlling the same
US15/780,302 US10928620B2 (en) 2015-12-10 2016-12-07 Microscope system and method of controlling the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015241641A JP6609174B2 (ja) 2015-12-10 2015-12-10 顕微鏡システムおよびその制御方法

Publications (3)

Publication Number Publication Date
JP2017107104A JP2017107104A (ja) 2017-06-15
JP2017107104A5 JP2017107104A5 (enExample) 2019-01-31
JP6609174B2 true JP6609174B2 (ja) 2019-11-20

Family

ID=57589110

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015241641A Active JP6609174B2 (ja) 2015-12-10 2015-12-10 顕微鏡システムおよびその制御方法

Country Status (4)

Country Link
US (1) US10928620B2 (enExample)
EP (1) EP3387479B1 (enExample)
JP (1) JP6609174B2 (enExample)
WO (1) WO2017099111A1 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10613308B2 (en) * 2016-11-30 2020-04-07 Yuefeng YIN Method and microscope for measuring and calculating heights on curved surface of microscope slide
EP3467563A1 (de) * 2017-10-06 2019-04-10 Siemens Healthcare GmbH Mikroskopiervorrichtung
CN111624758A (zh) * 2020-06-04 2020-09-04 广州浩康生物科技有限公司 一种用于纳米材料转移的复合荧光显微系统
DE102021204033B3 (de) * 2021-04-22 2022-06-15 Carl Zeiss Meditec Ag Verfahren zum Betreiben eines Operationsmikroskops und Operationsmikroskop
WO2023049047A1 (en) 2021-09-27 2023-03-30 Beckman Coulter, Inc. Adjustable mounting apparatus
WO2023111200A1 (en) * 2021-12-16 2023-06-22 Enaiblers Ab Systems and methods of compensating for backlash in an imaging system
DE102022200820A1 (de) * 2022-01-25 2023-07-27 Carl Zeiss Meditec Ag Verfahren zum Betreiben eines medizinischen Mikroskops und medizinische Mikroskopanordnung
JP7784347B2 (ja) * 2022-04-25 2025-12-11 株式会社Ｓｃｒｅｅｎホールディングス 対物レンズユニットおよび顕微鏡
WO2024081638A1 (en) * 2022-10-10 2024-04-18 Bionano Genomics, Inc. Motion platform control
JP2024064354A (ja) * 2022-10-28 2024-05-14 株式会社キーエンス 拡大観察装置、拡大観察方法、拡大観察プログラムおよび記録媒体

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4627009A (en) * 1983-05-24 1986-12-02 Nanometrics Inc. Microscope stage assembly and control system
JP2601834B2 (ja) * 1987-08-26 1997-04-16 株式会社東芝 テーブル装置
EP0841594A3 (en) * 1996-11-07 1999-08-25 Nikon Corporation Mark for position detection, mark detecting method and apparatus, and exposure system
US6673315B2 (en) * 2001-06-29 2004-01-06 Biomachines, Inc. Method and apparatus for accessing a site on a biological substrate
US6924929B2 (en) * 2002-03-29 2005-08-02 National Institute Of Radiological Sciences Microscope apparatus
US20030223111A1 (en) * 2002-05-31 2003-12-04 Mcnc Sample analysis device having a eucentric goniometer and associated method
EP1804107B1 (en) 2004-09-22 2018-10-24 Nikon Corporation Microscope system and image processing method
JP2007024927A (ja) * 2005-07-12 2007-02-01 Olympus Corp 顕微鏡画像撮影装置
JP5064864B2 (ja) 2007-04-02 2012-10-31 キヤノン株式会社 光偏向装置、画像形成装置、及び光偏向装置の駆動方法
DE102007036815B4 (de) * 2007-08-03 2010-03-04 Vistec Semiconductor Systems Gmbh Verfahren zur Bestimmung des durch die Substrattopologie und eine Koordinaten-Messmaschine bedingten systematischen Fehlers bei der Vermesung von Positionen von Kanten von Strukturen eines Substrats
JP2010101959A (ja) * 2008-10-21 2010-05-06 Olympus Corp 顕微鏡装置
JP5581851B2 (ja) * 2009-12-25 2014-09-03 ソニー株式会社 ステージ制御装置、ステージ制御方法、ステージ制御プログラム及び顕微鏡
JP2011145468A (ja) * 2010-01-14 2011-07-28 Olympus Corp 顕微鏡
US8175452B1 (en) * 2010-10-26 2012-05-08 Complete Genomics, Inc. Method and system for imaging high density biochemical arrays with sub-pixel alignment
WO2013084345A1 (ja) * 2011-12-09 2013-06-13 キヤノン株式会社 画像取得装置および画像取得装置の調整方法
WO2013138911A1 (en) * 2012-03-23 2013-09-26 Huron Technologies International Inc. Slide scanner with dynamic focus and specimen tilt and method of operation
JP5684214B2 (ja) 2012-10-17 2015-03-11 京楽産業．株式会社 遊技機
JP6027875B2 (ja) * 2012-12-07 2016-11-16 オリンパス株式会社 撮像装置及び顕微鏡システム
JP6312505B2 (ja) 2014-04-08 2018-04-18 キヤノン株式会社 光学式エンコーダおよびこれを備えた装置
JP6478605B2 (ja) * 2014-12-10 2019-03-06 キヤノン株式会社 顕微鏡システムおよびその制御方法
JP6562626B2 (ja) * 2014-12-10 2019-08-21 キヤノン株式会社 顕微鏡システム
EP3615916A4 (en) * 2017-04-24 2020-12-30 Technologies International Inc. Huron SCANNING MICROSCOPE FOR 3D IMAGING USING MSIA

Also Published As

Publication number Publication date
JP2017107104A (ja) 2017-06-15
EP3387479A1 (en) 2018-10-17
US10928620B2 (en) 2021-02-23
WO2017099111A1 (en) 2017-06-15
EP3387479B1 (en) 2022-04-13
US20180364469A1 (en) 2018-12-20

Similar Documents

Publication Publication Date Title
JP6643072B2 (ja) 顕微鏡システムおよびその制御方法
JP6609174B2 (ja) 顕微鏡システムおよびその制御方法
JP6659133B2 (ja) スライドおよびスライドとカバーガラスのセット、並びに顕微鏡システム
JP6643071B2 (ja) 顕微鏡システム
US10732397B2 (en) Microscope system, control method thereof, and program
US10634897B2 (en) Microscope system and control method thereof
US10527836B2 (en) Microscope system, control method, and program
JP6560490B2 (ja) 顕微鏡システム
JP6562625B2 (ja) スライドおよび当該スライドを用いる顕微鏡システム
JP6562624B2 (ja) 顕微鏡システムのためのアダプタ、及び当該アダプタを有する顕微鏡システム

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20181210

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20181210

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20190911

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20190927

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20191025

R151 Written notification of patent or utility model registration

Ref document number: 6609174

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R151