JP6450809B1 - 電子ビーム表面改質装置 - Google Patents
電子ビーム表面改質装置 Download PDFInfo
- Publication number
- JP6450809B1 JP6450809B1 JP2017126558A JP2017126558A JP6450809B1 JP 6450809 B1 JP6450809 B1 JP 6450809B1 JP 2017126558 A JP2017126558 A JP 2017126558A JP 2017126558 A JP2017126558 A JP 2017126558A JP 6450809 B1 JP6450809 B1 JP 6450809B1
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- electron beam
- cathode electrode
- irradiated
- irradiation hole
- irradiation
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- 238000010894 electron beam technology Methods 0.000 title abstract description 70
- 230000004048 modification Effects 0.000 title description 35
- 238000012986 modification Methods 0.000 title description 35
- 229910052751 metal Inorganic materials 0.000 claims abstract description 24
- 239000002184 metal Substances 0.000 claims abstract description 24
- 239000000758 substrate Substances 0.000 claims description 3
- 230000001678 irradiating effect Effects 0.000 abstract description 7
- 230000005611 electricity Effects 0.000 abstract 1
- 239000007789 gas Substances 0.000 description 16
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 10
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 5
- 229910052786 argon Inorganic materials 0.000 description 5
- 229910001873 dinitrogen Inorganic materials 0.000 description 5
- 238000000746 purification Methods 0.000 description 5
- 239000000463 material Substances 0.000 description 4
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 3
- 230000002093 peripheral effect Effects 0.000 description 3
- 239000010936 titanium Substances 0.000 description 3
- 229910052719 titanium Inorganic materials 0.000 description 3
- 230000007423 decrease Effects 0.000 description 2
- 239000005433 ionosphere Substances 0.000 description 2
- 238000007789 sealing Methods 0.000 description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000003028 elevating effect Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 239000011796 hollow space material Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 229910052743 krypton Inorganic materials 0.000 description 1
- DNNSSWSSYDEUBZ-UHFFFAOYSA-N krypton atom Chemical compound [Kr] DNNSSWSSYDEUBZ-UHFFFAOYSA-N 0.000 description 1
- 239000000696 magnetic material Substances 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 229910052754 neon Inorganic materials 0.000 description 1
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 238000010926 purge Methods 0.000 description 1
- 229910052704 radon Inorganic materials 0.000 description 1
- SYUHGPGVQRZVTB-UHFFFAOYSA-N radon atom Chemical compound [Rn] SYUHGPGVQRZVTB-UHFFFAOYSA-N 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 239000004071 soot Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/30—Electron or ion beam tubes for processing objects
- H01J2237/31—Processing objects on a macro-scale
- H01J2237/316—Changing physical properties
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Physical Or Chemical Processes And Apparatus (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Electron Sources, Ion Sources (AREA)
Abstract
【解決手段】真空チャンバ1の中に照射穴7Aが形成されている被照射体7が設置される。カソード電極5Eを照射穴7Aの側面に対向配置する。カソード電極5Eは、照射穴7Aの少なくとも側面に対向する基体50Aの面の全面にわたって多数の金属突起50Gを有する。カソード電5Eと照射穴7Aの側面との間に導電性メッシュ5Gを配設する。導電性メッシュ5Gは、被照射体7と部分的に接触して被照射体7と同電位にされる。
【選択図】図1
Description
1C 密閉空間
2 移動装置
3 真空装置
4 稀ガス発生装置
5 電子ビーム発生装置
5A カソード電極
5B アノード電極
5C コレクタ
5D ソレノイド
5E カソード電極
5F グランドライン
5G 導電性メッシュ
5H 電子ビーム発生用電源装置
5J プラズマ発生用電源装置
5K スイッチ
6 浄化装置
7 被照射体
7A 照射穴
40 テーブル
50A 基体
50B 金属突起
Claims (1)
- 真空チャンバの中に設置された被照射体に形成されている照射穴の少なくとも側面に対向する基体の面の全面にわたって多数の金属突起を有するカソード電極と、少なくとも前記カソード電極と前記照射穴の側面との間に配設され前記被照射体と部分的に接触して前記被照射体と同電位にされた導電性メッシュと、を備える電子ビーム表面改質装置。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017126558A JP6450809B1 (ja) | 2017-06-28 | 2017-06-28 | 電子ビーム表面改質装置 |
US16/000,898 US10460907B2 (en) | 2017-06-28 | 2018-06-06 | Electron beam surface modification apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017126558A JP6450809B1 (ja) | 2017-06-28 | 2017-06-28 | 電子ビーム表面改質装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP6450809B1 true JP6450809B1 (ja) | 2019-01-09 |
JP2019009089A JP2019009089A (ja) | 2019-01-17 |
Family
ID=64738895
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2017126558A Expired - Fee Related JP6450809B1 (ja) | 2017-06-28 | 2017-06-28 | 電子ビーム表面改質装置 |
Country Status (2)
Country | Link |
---|---|
US (1) | US10460907B2 (ja) |
JP (1) | JP6450809B1 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6744694B1 (ja) * | 2019-12-03 | 2020-08-19 | 株式会社ソディック | 表面改質装置および表面改質方法 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3890503A (en) * | 1968-11-29 | 1975-06-17 | Hewlett Packard Co | Stimulated emission light source pumped by electron beam of field emission initiated vacuum arc |
US3921022A (en) * | 1974-09-03 | 1975-11-18 | Rca Corp | Field emitting device and method of making same |
JPS5525039B2 (ja) | 1975-01-29 | 1980-07-03 | ||
US5013902A (en) * | 1989-08-18 | 1991-05-07 | Allard Edward F | Microdischarge image converter |
JPH0480377A (ja) * | 1990-07-19 | 1992-03-13 | Nissin Electric Co Ltd | 表面処理装置 |
JPH0518646U (ja) * | 1991-08-15 | 1993-03-09 | 日新ハイボルテージ株式会社 | 電子線照射装置 |
US5635791A (en) * | 1995-08-24 | 1997-06-03 | Texas Instruments Incorporated | Field emission device with circular microtip array |
US5903804A (en) * | 1996-09-30 | 1999-05-11 | Science Applications International Corporation | Printer and/or scanner and/or copier using a field emission array |
JP2003123623A (ja) * | 2001-10-19 | 2003-04-25 | Noritake Itron Corp | 電子放出源用カーボンナノチューブおよびその製造方法 |
JP2004111293A (ja) * | 2002-09-20 | 2004-04-08 | Japan Science & Technology Corp | 光放射素子 |
US7012268B2 (en) * | 2003-05-21 | 2006-03-14 | Asm Japan K.K. | Gas-shield electron-beam gun for thin-film curing application |
JP2005076061A (ja) * | 2003-08-29 | 2005-03-24 | Sodick Co Ltd | 金属部材の表面改質加工方法及び表面改質加工装置 |
DE112005002127T5 (de) * | 2004-09-03 | 2007-10-04 | Sumitomo Electric Industries, Ltd. | Leuchtstoff, Verfahren zur Herstellung desselben und lichtemittierende Vorrichtung unter Verwendung desselben |
JP2006344387A (ja) * | 2005-06-07 | 2006-12-21 | Sodick Co Ltd | 電子ビーム表面改質方法及び装置 |
JP5187876B2 (ja) * | 2006-10-26 | 2013-04-24 | 株式会社ソディック | 電子ビーム照射表面改質装置 |
US7568479B2 (en) * | 2007-12-21 | 2009-08-04 | Mario Rabinowitz | Fresnel solar concentrator with internal-swivel and suspended swivel mirrors |
JP2010100904A (ja) * | 2008-10-24 | 2010-05-06 | Sodick Co Ltd | 表面改質装置および表面改質方法 |
-
2017
- 2017-06-28 JP JP2017126558A patent/JP6450809B1/ja not_active Expired - Fee Related
-
2018
- 2018-06-06 US US16/000,898 patent/US10460907B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US20190006148A1 (en) | 2019-01-03 |
JP2019009089A (ja) | 2019-01-17 |
US10460907B2 (en) | 2019-10-29 |
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