JP6389354B2 - トータル・ネットワークの特性測定方法及び装置 - Google Patents

トータル・ネットワークの特性測定方法及び装置 Download PDF

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Publication number
JP6389354B2
JP6389354B2 JP2013174835A JP2013174835A JP6389354B2 JP 6389354 B2 JP6389354 B2 JP 6389354B2 JP 2013174835 A JP2013174835 A JP 2013174835A JP 2013174835 A JP2013174835 A JP 2013174835A JP 6389354 B2 JP6389354 B2 JP 6389354B2
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Japan
Prior art keywords
network
adapter
extended
total
characteristic
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Expired - Fee Related
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JP2013174835A
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Japanese (ja)
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JP2014044205A (ja
Inventor
ラウディ・ジェイ・ダブラヴァ
ジョシア・エイ・バートレット
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Tektronix Inc
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Tektronix Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G01R31/3191—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Data Exchanges In Wide-Area Networks (AREA)
JP2013174835A 2012-08-24 2013-08-26 トータル・ネットワークの特性測定方法及び装置 Expired - Fee Related JP6389354B2 (ja)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US201261693229P 2012-08-24 2012-08-24
US61/693,229 2012-08-24
US13/773,253 2013-02-21
US13/773,253 US9581675B2 (en) 2012-08-24 2013-02-21 Virtual model adapter removal and substitution technique for cascaded networks

Publications (2)

Publication Number Publication Date
JP2014044205A JP2014044205A (ja) 2014-03-13
JP6389354B2 true JP6389354B2 (ja) 2018-09-12

Family

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Application Number Title Priority Date Filing Date
JP2013174835A Expired - Fee Related JP6389354B2 (ja) 2012-08-24 2013-08-26 トータル・ネットワークの特性測定方法及び装置

Country Status (5)

Country Link
US (1) US9581675B2 (de)
EP (1) EP2700971A3 (de)
JP (1) JP6389354B2 (de)
CN (1) CN103634174A (de)
RU (1) RU2639670C2 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104270209B (zh) * 2014-10-14 2016-11-23 大唐移动通信设备有限公司 基于不同校准平面的rru驻波比的检测方法和装置
US12078656B2 (en) * 2020-09-11 2024-09-03 National Technology & Engineering Solutions Of Sandia, Llc Two-terminator RF adapter for background/environment noise measurement

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6188968B1 (en) * 1998-05-18 2001-02-13 Agilent Technologies Inc. Removing effects of adapters present during vector network analyzer calibration
US6941377B1 (en) * 1999-12-31 2005-09-06 Intel Corporation Method and apparatus for secondary use of devices with encryption
US6665628B2 (en) * 2002-01-15 2003-12-16 Anritsu Company Methods for embedding and de-embedding balanced networks
US6650123B2 (en) 2002-01-15 2003-11-18 Anritsu Company Methods for determining characteristics of interface devices used with vector network analyzers
US7181531B2 (en) * 2002-04-30 2007-02-20 Microsoft Corporation Method to synchronize and upload an offloaded network stack connection with a network stack
US6785625B1 (en) 2002-05-14 2004-08-31 Ncr Corporation Characterizing multi-port cascaded networks
JP2005526250A (ja) * 2002-05-16 2005-09-02 コーニンクレッカ　フィリップス　エレクトロニクス　エヌ　ヴィ 較正及びデエンベッディングのための方法、デエンベッディングのためのデバイスセット、並びにベクトルネットワークアナライザ
US7019535B2 (en) * 2002-09-16 2006-03-28 Agilent Technologies, Inc. Method and system for calibrating a measurement device path and for measuring a device under test in the calibrated measurement device path
US7107170B2 (en) * 2003-02-18 2006-09-12 Agilent Technologies, Inc. Multiport network analyzer calibration employing reciprocity of a device
US6823276B2 (en) 2003-04-04 2004-11-23 Agilent Technologies, Inc. System and method for determining measurement errors of a testing device
US7034548B2 (en) * 2003-04-11 2006-04-25 Agilent Technologies, Inc. Balanced device characterization including test system calibration
US20050185769A1 (en) * 2004-02-25 2005-08-25 Pickerd John J. Calibration method and apparatus
JP2006317156A (ja) * 2005-05-10 2006-11-24 Matsushita Electric Ind Co Ltd ベクトルネットワークアナライザ、ベクトルネットワークアナライザの校正方法、計算機及び標準器基板
JP2007010522A (ja) * 2005-06-30 2007-01-18 Matsushita Electric Ind Co Ltd スルー標準器基板及びライン標準器基板
BRPI0615752A2 (pt) * 2005-09-12 2011-05-24 Microsoft Corp provisão de aplicação consistente ciente de travessia de parede corta-fogo
US7589536B2 (en) * 2007-01-05 2009-09-15 Apple Inc. Systems and methods for determining the configuration of electronic connections
JP2008014781A (ja) * 2006-07-05 2008-01-24 Agilent Technol Inc ネットワーク・アナライザの校正方法、および、ネットワーク・アナライザ
US7627028B1 (en) * 2008-10-18 2009-12-01 Sun Microsystems, Inc. Multi-port S-parameter and T-parameter conversion
EP2363719A1 (de) * 2010-02-12 2011-09-07 ATE Systems, Inc Verfahren und Vorrichtung zur Kalibrierung eines Prüfsystems zum Messen eines Prüflings
US8661118B2 (en) * 2010-03-08 2014-02-25 Microsoft Corporation Detection of end-to-end transport quality

Also Published As

Publication number Publication date
JP2014044205A (ja) 2014-03-13
CN103634174A (zh) 2014-03-12
EP2700971A2 (de) 2014-02-26
RU2013139444A (ru) 2015-02-27
RU2639670C2 (ru) 2017-12-21
US20140058693A1 (en) 2014-02-27
US9581675B2 (en) 2017-02-28
EP2700971A3 (de) 2018-01-17

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