JP6325650B2 - 光検出器画素アレイを有する放射線検出装置、pet撮像システム、光フォトン加算方法、及び光フォトン加算方法のステップを実行するためのコンピュータプログラム - Google Patents
光検出器画素アレイを有する放射線検出装置、pet撮像システム、光フォトン加算方法、及び光フォトン加算方法のステップを実行するためのコンピュータプログラム Download PDFInfo
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- JP6325650B2 JP6325650B2 JP2016509357A JP2016509357A JP6325650B2 JP 6325650 B2 JP6325650 B2 JP 6325650B2 JP 2016509357 A JP2016509357 A JP 2016509357A JP 2016509357 A JP2016509357 A JP 2016509357A JP 6325650 B2 JP6325650 B2 JP 6325650B2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20182—Modular detectors, e.g. tiled scintillators or tiled photodiodes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20183—Arrangements for preventing or correcting crosstalk, e.g. optical or electrical arrangements for correcting crosstalk
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20184—Detector read-out circuitry, e.g. for clearing of traps, compensating for traps or compensating for direct hits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20185—Coupling means between the photodiode and the scintillator, e.g. optical couplings using adhesives with wavelength-shifting fibres
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/208—Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/248—Silicon photomultipliers [SiPM], e.g. an avalanche photodiode [APD] array on a common Si substrate
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
- H04N25/772—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters
- H04N25/773—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters comprising photon counting circuits, e.g. single photon detection [SPD] or single photon avalanche diodes [SPAD]
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- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Molecular Biology (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Signal Processing (AREA)
- Multimedia (AREA)
- Nuclear Medicine (AREA)
- Measurement Of Radiation (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP13165097 | 2013-04-24 | ||
| EP13165097.0 | 2013-04-24 | ||
| PCT/EP2014/056633 WO2014173644A1 (en) | 2013-04-24 | 2014-04-03 | Detection of radiation quanta using an optical detector pixel array and pixel cell trigger state sensing circuits |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2016522890A JP2016522890A (ja) | 2016-08-04 |
| JP2016522890A5 JP2016522890A5 (enExample) | 2017-06-08 |
| JP6325650B2 true JP6325650B2 (ja) | 2018-05-16 |
Family
ID=48193107
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016509357A Active JP6325650B2 (ja) | 2013-04-24 | 2014-04-03 | 光検出器画素アレイを有する放射線検出装置、pet撮像システム、光フォトン加算方法、及び光フォトン加算方法のステップを実行するためのコンピュータプログラム |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9677931B2 (enExample) |
| EP (1) | EP2989487B1 (enExample) |
| JP (1) | JP6325650B2 (enExample) |
| CN (1) | CN105143921B (enExample) |
| WO (1) | WO2014173644A1 (enExample) |
Families Citing this family (50)
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| GB201322940D0 (en) | 2013-12-23 | 2014-02-12 | Johnson Matthey Plc | Radiation detection apparatus and method |
| US10527740B2 (en) * | 2014-04-03 | 2020-01-07 | Siemens Medical Solutions Usa, Inc. | Silicon photomultiplier based TOF-PET detector |
| US9927537B2 (en) * | 2014-12-15 | 2018-03-27 | General Electric Company | Systems and methods for positron emission tomography signal isolation |
| JP6738823B2 (ja) * | 2015-03-04 | 2020-08-12 | ラピスカン システムズ、インコーポレイテッド | マルチエネルギ検出器 |
| CA2990466C (en) | 2015-07-08 | 2023-07-11 | The Commonwealth Of Australia | Spad array structures and methods of operation |
| CA3022417C (en) | 2016-04-26 | 2022-10-18 | Illinois Institute Of Technology | Apparatus and method for enhanced early photon detection in optical projection tomography |
| US10594920B2 (en) * | 2016-06-15 | 2020-03-17 | Stmicroelectronics, Inc. | Glass detection with time of flight sensor |
| CN106125127B (zh) * | 2016-06-18 | 2018-12-04 | 武汉京邦科技有限公司 | 一种硅光电倍增器的时间标记方法及其微元阵列编码系统 |
| CN106338757A (zh) * | 2016-09-07 | 2017-01-18 | 武汉京邦科技有限公司 | 一种基于数字化时间标记的太空望远镜 |
| US11047996B2 (en) | 2016-12-27 | 2021-06-29 | Shimadzu Corporation | Photodetector |
| US10613172B2 (en) * | 2017-06-22 | 2020-04-07 | General Electric Company | Readout electronics architecture with improved timing resolution |
| EP3419168B1 (en) * | 2017-06-23 | 2020-12-02 | ams AG | Avalanche diode arrangement and method for controlling an avalanche diode arrangement |
| WO2019000389A1 (en) | 2017-06-30 | 2019-01-03 | Shanghai United Imaging Healthcare Co., Ltd. | SYSTEM AND METHOD FOR POSITRON EMISSION TOMOGRAPHY |
| WO2019019197A1 (en) * | 2017-07-28 | 2019-01-31 | Shenzhen United Imaging Healthcare Co., Ltd. | DETECTION DEVICE FOR POSITRON EMISSION TOMOGRAPHY |
| EP3451655B1 (en) * | 2017-08-31 | 2020-10-21 | Canon Kabushiki Kaisha | Solid-state image sensor and image capture apparatus |
| US10794758B2 (en) * | 2017-09-29 | 2020-10-06 | General Electric Company | System and method for verifying the integrity of a radiation detector |
| CN111226138B (zh) * | 2017-10-26 | 2023-11-07 | 深圳帧观德芯科技有限公司 | 能够进行噪声操控的辐射检测器 |
| US10545224B2 (en) | 2017-12-06 | 2020-01-28 | Samsung Electronics Co., Ltd. | Time-resolving sensor using SPAD + PPD or capacitors in pixel for range measurement |
| EP3743738A4 (en) * | 2018-01-24 | 2021-07-28 | Shenzhen Xpectvision Technology Co., Ltd. | BAND PIXEL DETECTOR |
| US10254163B1 (en) * | 2018-03-15 | 2019-04-09 | Kromek Group, PLC | Interaction characteristics from a plurality of pixels |
| JP2019158806A (ja) * | 2018-03-16 | 2019-09-19 | ソニーセミコンダクタソリューションズ株式会社 | 受光装置及び測距装置 |
| FR3079310B1 (fr) * | 2018-03-23 | 2020-04-17 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Dispositif de mesure de rayonnements alpha et/ou beta provenant d'une surface solide |
| JP7171213B2 (ja) * | 2018-04-02 | 2022-11-15 | キヤノン株式会社 | 光電変換装置及び撮像システム |
| EP3591440A1 (en) | 2018-07-04 | 2020-01-08 | ETH Zurich | Detection device and method for detecting sensor signals in a grid of sensor elements |
| CN112601985A (zh) * | 2018-09-07 | 2021-04-02 | 深圳帧观德芯科技有限公司 | 一种具有在不同模式下操作的子像素的辐射检测器 |
| EP3847481B1 (en) * | 2018-09-07 | 2023-11-29 | Shenzhen Xpectvision Technology Co., Ltd. | A radiation detector |
| WO2020052987A1 (en) * | 2018-09-10 | 2020-03-19 | Koninklijke Philips N.V. | Dual-sensor subpixel radiation detector |
| KR20210093306A (ko) * | 2018-11-20 | 2021-07-27 | 센스 포토닉스, 인크. | 공간적으로 분포된 스트로빙을 위한 방법들 및 시스템들 |
| CN113748356A (zh) * | 2019-01-18 | 2021-12-03 | 感觉光子公司 | 数字像素及其操作方法 |
| CN113544478A (zh) * | 2019-03-07 | 2021-10-22 | ams传感器德国有限公司 | 低电流检测 |
| CN110044479B (zh) * | 2019-03-11 | 2020-07-31 | 西安电子科技大学 | 一种基于无时钟电流舵dac结构的硅光电倍增管 |
| CN110226943B (zh) * | 2019-07-05 | 2023-08-15 | 上海联影医疗科技股份有限公司 | 光子到达探测器的参数计算方法、装置和计算机设备 |
| JP2021050949A (ja) * | 2019-09-24 | 2021-04-01 | ソニーセミコンダクタソリューションズ株式会社 | 固体撮像素子、および、電子機器 |
| CN110632641B (zh) * | 2019-09-26 | 2024-07-09 | 南昌华亮光电有限责任公司 | 一种双读出pet探测器正电子成像方法与系统 |
| CN111103614B (zh) * | 2020-01-02 | 2024-12-24 | 苏州瑞派宁科技有限公司 | 信号采样电路、探测装置及成像系统 |
| AU2021213185B2 (en) * | 2020-01-29 | 2025-08-28 | Doseoptics, Llc | Imaging system and methods of high resolution cherenkov dose images |
| US12004887B2 (en) * | 2020-01-31 | 2024-06-11 | Canon Medical Systems Corporation | Radiation diagnosis device with a first detector detecting Cherenkov light and a second detector detecting energy information of radiation |
| CN110926623B (zh) * | 2020-02-10 | 2020-05-19 | 南京邮电大学 | 一种高动态范围的时间-幅度转换电路及其测量方法 |
| KR20210150765A (ko) * | 2020-06-04 | 2021-12-13 | 에스케이하이닉스 주식회사 | 이미지 센싱 장치 및 이를 포함하는 촬영 장치 |
| US12255217B2 (en) * | 2020-07-17 | 2025-03-18 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor device, semiconductor image sensor, and method of manufacturing the same |
| IT202100006728A1 (it) | 2021-03-19 | 2022-09-19 | Milano Politecnico | Sistema e metodo per la rivelazione, localizzazione e segnalazione di eventi di singolo fotone e di coincidenza temporale di almeno due fotoni |
| CN113109856A (zh) * | 2021-04-06 | 2021-07-13 | 明峰医疗系统股份有限公司 | 基于时分复用技术的ct探测器动态采样方法、系统及计算机可读存储介质 |
| CN113340441A (zh) * | 2021-07-09 | 2021-09-03 | 中国科学技术大学 | 发光检测系统 |
| CN114114210B (zh) * | 2021-11-25 | 2022-08-26 | 武汉市聚芯微电子有限责任公司 | 时间戳数据读写电路以及测距系统 |
| CN116088025B (zh) * | 2023-02-27 | 2025-08-08 | 西南科技大学 | 一种海洋放射性自适应探测系统与方法 |
| CN118282506B (zh) * | 2024-04-08 | 2024-11-08 | 中国科学院空间应用工程与技术中心 | 一种用于光电探测阵列的时间延迟校准方法和通信装置 |
| CN119382705B (zh) * | 2024-12-24 | 2025-05-09 | 合肥锐世数字科技有限公司 | 信号数字化方法、装置、计算机存储介质以及数字pet系统 |
| CN119363117B (zh) * | 2024-12-24 | 2025-05-09 | 合肥锐世数字科技有限公司 | 信号数字化方法、装置、计算机存储介质以及数字pet系统 |
| CN119363116B (zh) * | 2024-12-24 | 2025-05-09 | 合肥锐世数字科技有限公司 | 信号数字化方法、装置、计算机存储介质以及数字pet系统 |
| CN119644394A (zh) * | 2024-12-31 | 2025-03-18 | 清华大学 | 辐射敏感探测器及辐射检查设备 |
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| DE59102128D1 (de) | 1991-09-11 | 1994-08-11 | Siemens Ag | Verfahren zur schnellen Ortung mit dem Maximum Likelihood-Estimator bei einer Gamma-Kamera. |
| US6243441B1 (en) * | 1999-07-13 | 2001-06-05 | Edge Medical Devices | Active matrix detector for X-ray imaging |
| GB0201260D0 (en) | 2002-01-21 | 2002-03-06 | Europ Org For Nuclear Research | A sensing and imaging device |
| DE10206173B4 (de) | 2002-02-14 | 2006-08-31 | Bruker Daltonik Gmbh | Hochauflösende Detektion für Flugzeitmassenspektrometer |
| JP2006284346A (ja) * | 2005-03-31 | 2006-10-19 | Shimadzu Corp | 放射線断層撮影装置 |
| JP5345383B2 (ja) * | 2005-04-22 | 2013-11-20 | コーニンクレッカ フィリップス エヌ ヴェ | 検出器画素、放射線検出器および方法、陽電子放出断層撮影システム、撮像検出器およびその較正方法、検出器セルの無効化方法 |
| US7187316B1 (en) | 2006-02-06 | 2007-03-06 | Brookhaven Science Associates, Llc | Method and apparatus for clockless analog-to-digital conversion and peak detection |
| US8598536B2 (en) * | 2006-10-04 | 2013-12-03 | CERN—European Organization for Nuclear Research | Apparatus and method for medical imaging |
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| JP4825116B2 (ja) * | 2006-11-22 | 2011-11-30 | 浜松ホトニクス株式会社 | 固体撮像装置及び撮像方法 |
| FR2912588B1 (fr) * | 2007-02-13 | 2009-04-10 | Commissariat Energie Atomique | Detecteur de rayonnement x ou gamma |
| CN101978289B (zh) * | 2008-03-19 | 2014-07-30 | 皇家飞利浦电子股份有限公司 | 单光子辐射探测器 |
| US8716643B2 (en) | 2010-09-06 | 2014-05-06 | King Abdulaziz City Science And Technology | Single photon counting image sensor and method |
| US8859944B2 (en) * | 2010-09-07 | 2014-10-14 | King Abdulaziz City Science And Technology | Coordinated in-pixel light detection method and apparatus |
| IT1402264B1 (it) * | 2010-09-16 | 2013-08-28 | St Microelectronics Srl | Array fotorilevatore multi-pixel di fotodiodi a valanga geiger-mode |
| EP2469294A1 (en) | 2010-12-23 | 2012-06-27 | André Borowski | 2D/3D real-time imager and corresponding imaging methods |
| US8294110B2 (en) * | 2011-03-11 | 2012-10-23 | Kabushiki Kaisha Toshiba | Method for improved correction of SiPM non-linearity in multiplexed radiation detectors |
| IL212289A (en) | 2011-04-13 | 2016-08-31 | Semi-Conductor Devices - An Elbit Systems - Rafael Partnership | Detector pixel signal readout circuit and an imaging method thereof |
| EP2739958B1 (en) * | 2011-08-05 | 2016-01-20 | Pulsetor, LLC | Electron detector including one or more intimately-coupled scintillator-photomultiplier combinations, and electron microscope employing same |
| CN102538988B (zh) | 2012-02-08 | 2014-05-07 | 南京邮电大学 | 一种单光子雪崩二极管成像器件的淬灭与读出电路 |
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2014
- 2014-04-03 JP JP2016509357A patent/JP6325650B2/ja active Active
- 2014-04-03 WO PCT/EP2014/056633 patent/WO2014173644A1/en not_active Ceased
- 2014-04-03 CN CN201480023147.0A patent/CN105143921B/zh active Active
- 2014-04-03 EP EP14717431.2A patent/EP2989487B1/en active Active
- 2014-04-03 US US14/784,993 patent/US9677931B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN105143921A (zh) | 2015-12-09 |
| CN105143921B (zh) | 2018-10-23 |
| US9677931B2 (en) | 2017-06-13 |
| EP2989487B1 (en) | 2019-04-03 |
| JP2016522890A (ja) | 2016-08-04 |
| EP2989487A1 (en) | 2016-03-02 |
| WO2014173644A1 (en) | 2014-10-30 |
| US20160084703A1 (en) | 2016-03-24 |
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