JP6285547B2 - 光ビームの偏光状態を調節するためのデバイスの位相シフトのドリフトを補償するためのデバイス - Google Patents

光ビームの偏光状態を調節するためのデバイスの位相シフトのドリフトを補償するためのデバイス Download PDF

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JP6285547B2
JP6285547B2 JP2016524862A JP2016524862A JP6285547B2 JP 6285547 B2 JP6285547 B2 JP 6285547B2 JP 2016524862 A JP2016524862 A JP 2016524862A JP 2016524862 A JP2016524862 A JP 2016524862A JP 6285547 B2 JP6285547 B2 JP 6285547B2
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birefringent element
birefringent
odd number
optical assembly
mirrors
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JP2016533496A (ja
JP2016533496A5 (enExample
Inventor
ザラット ジハード
ザラット ジハード
トルジンスキ マルク
トルジンスキ マルク
ラルマン アレク
ラルマン アレク
アンリッシュ クリスチャン
アンリッシュ クリスチャン
Original Assignee
ユニベルシテ ドゥ ストラスブール
ユニベルシテ ドゥ ストラスブール
サントル ナシオナル ドゥ ラ ルシェルシェサイアンティフィク（セエヌエールエス）
サントル ナシオナル ドゥ ラ ルシェルシェサイアンティフィク（セエヌエールエス）
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/23—Bi-refringence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/0025—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/28—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising
    • G02B27/286—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising for controlling or changing the state of polarisation, e.g. transforming one polarisation state into another
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/30—Polarising elements
    • G02B5/3016—Polarising elements involving passive liquid crystal elements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/30—Polarising elements
    • G02B5/3083—Birefringent or phase retarding elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00—Measuring polarisation of light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0636—Reflectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/068—Optics, miscellaneous
    • G01N2201/0683—Brewster plate; polarisation controlling elements

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Polarising Elements (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
JP2016524862A 2013-07-10 2014-06-20 光ビームの偏光状態を調節するためのデバイスの位相シフトのドリフトを補償するためのデバイス Expired - Fee Related JP6285547B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR1356803A FR3008497B1 (fr) 2013-07-10 2013-07-10 Dispositif pour compenser la derive d'un dephasage d'un modulateur d'etat de polarisation d'un faisceau lumineux
FR1356803 2013-07-10
PCT/FR2014/051539 WO2015004358A1 (fr) 2013-07-10 2014-06-20 Dispositif pour compenser la dérive d'un déphasage d'un modulateur d'état de polarisation d'un faisceau lumineux

Publications (3)

Publication Number Publication Date
JP2016533496A JP2016533496A (ja) 2016-10-27
JP2016533496A5 JP2016533496A5 (enExample) 2017-07-06
JP6285547B2 true JP6285547B2 (ja) 2018-02-28

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JP2016524862A Expired - Fee Related JP6285547B2 (ja) 2013-07-10 2014-06-20 光ビームの偏光状態を調節するためのデバイスの位相シフトのドリフトを補償するためのデバイス

Country Status (8)

Country Link
US (1) US10156514B2 (enExample)
EP (1) EP3019841B1 (enExample)
JP (1) JP6285547B2 (enExample)
CN (1) CN105593652A (enExample)
AU (1) AU2014289101B2 (enExample)
CA (1) CA2914364C (enExample)
FR (1) FR3008497B1 (enExample)
WO (1) WO2015004358A1 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12013819B2 (en) * 2014-01-14 2024-06-18 Zixcorp Systems, Inc. Asynchronous method for provisioning a service using file distribution technology
FR3046850B1 (fr) 2016-01-15 2018-01-26 Universite De Strasbourg Guide optique ameliore et systeme optique comportant un tel guide optique
US9857512B1 (en) * 2016-06-30 2018-01-02 Keysight Technologies Inc. Systems for passive optical correction of polarization leakages
CN108318458B (zh) * 2017-01-16 2020-10-09 北京航空航天大学 一种适用于不同天气条件下的室外典型地物pBRDF的测量方法

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2256736C3 (de) * 1972-11-18 1979-01-25 Ibm Deutschland Gmbh, 7000 Stuttgart Meßanordnung zur automatischen Prüfung der Oberflächenbeschaffenheit und Ebenheit einer Werkstückoberfläche
JP2614365B2 (ja) * 1991-01-14 1997-05-28 日本電信電話株式会社 偏波無依存導波型光デバイス
US5658490A (en) * 1995-04-07 1997-08-19 Board Of Regents Of The University Of Colorado Liquid crystal achromatic compound retarder
US6380997B1 (en) * 1995-04-07 2002-04-30 Colorlink, Inc. Achromatic polarization inverters for displaying inverse frames in DC balanced liquid crystal displays
US6711311B2 (en) * 2000-04-20 2004-03-23 Jds Uniphase Inc. Polarization beam splitter or combiner
US6765635B1 (en) * 2000-12-28 2004-07-20 Coadna Photonics, Inc. Apparatus and method for achromatic liquid crystal electro-optic modulation
JP2002269797A (ja) * 2001-03-07 2002-09-20 Sony Corp 光ピックアップ及び波長板
US6795184B1 (en) * 2001-04-06 2004-09-21 J.A. Woollam Co., Inc Odd bounce image rotation system in ellipsometer systems
EP1411333B1 (en) * 2002-10-15 2006-03-08 Centre National De La Recherche Scientifique (Cnrs) A liquid crystal based polarimetric system, a process for its calibration, and a polarimetric measurement process
US7444040B2 (en) * 2004-01-23 2008-10-28 Tdk Corporation Magneto-optical component
JP4480653B2 (ja) * 2005-09-27 2010-06-16 株式会社アタゴ 偏光状態測定装置、円二色性測定装置及びその方法
WO2008084707A1 (ja) * 2007-01-10 2008-07-17 Nippon Telegraph And Telephone Corporation 導波路型光干渉回路
CN101216616A (zh) * 2008-01-09 2008-07-09 南京航空航天大学 高热稳定性电光调制器
US8125641B2 (en) * 2009-03-27 2012-02-28 N&K Technology, Inc. Method and apparatus for phase-compensated sensitivity-enhanced spectroscopy (PCSES)
TWI457550B (zh) * 2012-03-16 2014-10-21 Nat Univ Tsing Hua 量化材料未知應力與殘餘應力之裝置及其方法
US9435964B2 (en) * 2014-02-26 2016-09-06 TeraDiode, Inc. Systems and methods for laser systems with variable beam parameter product
US9310560B2 (en) * 2014-02-26 2016-04-12 TeraDiode, Inc. Systems and methods for multiple-beam laser arrangements with variable beam parameter product

Also Published As

Publication number Publication date
US10156514B2 (en) 2018-12-18
AU2014289101A8 (en) 2016-02-11
JP2016533496A (ja) 2016-10-27
FR3008497B1 (fr) 2015-08-07
CA2914364A1 (fr) 2015-01-15
EP3019841A1 (fr) 2016-05-18
EP3019841B1 (fr) 2017-07-12
US20160139033A1 (en) 2016-05-19
CN105593652A (zh) 2016-05-18
CA2914364C (fr) 2021-06-15
AU2014289101B2 (en) 2018-01-18
WO2015004358A1 (fr) 2015-01-15
AU2014289101A1 (en) 2016-01-21
FR3008497A1 (fr) 2015-01-16

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