CA2914364C - Dispositif pour compenser la derive d'un dephasage d'un modulateur d'etat de polarisation d'un faisceau lumineux - Google Patents

Dispositif pour compenser la derive d'un dephasage d'un modulateur d'etat de polarisation d'un faisceau lumineux Download PDF

Info

Publication number
CA2914364C
CA2914364C CA2914364A CA2914364A CA2914364C CA 2914364 C CA2914364 C CA 2914364C CA 2914364 A CA2914364 A CA 2914364A CA 2914364 A CA2914364 A CA 2914364A CA 2914364 C CA2914364 C CA 2914364C
Authority
CA
Canada
Prior art keywords
light beam
odd number
drift
compensating
modulating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CA2914364A
Other languages
English (en)
French (fr)
Other versions
CA2914364A1 (fr
Inventor
Jihad ZALLAT
Marc TORZYNSKI
Alex Lallement
Christian Heinrich
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National de la Recherche Scientifique CNRS
Universite de Strasbourg
Original Assignee
Centre National de la Recherche Scientifique CNRS
Universite de Strasbourg
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National de la Recherche Scientifique CNRS, Universite de Strasbourg filed Critical Centre National de la Recherche Scientifique CNRS
Publication of CA2914364A1 publication Critical patent/CA2914364A1/fr
Application granted granted Critical
Publication of CA2914364C publication Critical patent/CA2914364C/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21Polarisation-affecting properties
    • G01N21/23Bi-refringence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21Polarisation-affecting properties
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/0025Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/28Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising
    • G02B27/286Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising for controlling or changing the state of polarisation, e.g. transforming one polarisation state into another
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/30Polarising elements
    • G02B5/3016Polarising elements involving passive liquid crystal elements
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/30Polarising elements
    • G02B5/3083Birefringent or phase retarding elements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00Measuring polarisation of light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/063Illuminating optical parts
    • G01N2201/0636Reflectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/068Optics, miscellaneous
    • G01N2201/0683Brewster plate; polarisation controlling elements

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Polarising Elements (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
CA2914364A 2013-07-10 2014-06-20 Dispositif pour compenser la derive d'un dephasage d'un modulateur d'etat de polarisation d'un faisceau lumineux Expired - Fee Related CA2914364C (fr)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR1356803A FR3008497B1 (fr) 2013-07-10 2013-07-10 Dispositif pour compenser la derive d'un dephasage d'un modulateur d'etat de polarisation d'un faisceau lumineux
FR1356803 2013-07-10
PCT/FR2014/051539 WO2015004358A1 (fr) 2013-07-10 2014-06-20 Dispositif pour compenser la dérive d'un déphasage d'un modulateur d'état de polarisation d'un faisceau lumineux

Publications (2)

Publication Number Publication Date
CA2914364A1 CA2914364A1 (fr) 2015-01-15
CA2914364C true CA2914364C (fr) 2021-06-15

Family

ID=49151212

Family Applications (1)

Application Number Title Priority Date Filing Date
CA2914364A Expired - Fee Related CA2914364C (fr) 2013-07-10 2014-06-20 Dispositif pour compenser la derive d'un dephasage d'un modulateur d'etat de polarisation d'un faisceau lumineux

Country Status (8)

Country Link
US (1) US10156514B2 (enExample)
EP (1) EP3019841B1 (enExample)
JP (1) JP6285547B2 (enExample)
CN (1) CN105593652A (enExample)
AU (1) AU2014289101B2 (enExample)
CA (1) CA2914364C (enExample)
FR (1) FR3008497B1 (enExample)
WO (1) WO2015004358A1 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12013819B2 (en) * 2014-01-14 2024-06-18 Zixcorp Systems, Inc. Asynchronous method for provisioning a service using file distribution technology
FR3046850B1 (fr) 2016-01-15 2018-01-26 Universite De Strasbourg Guide optique ameliore et systeme optique comportant un tel guide optique
US9857512B1 (en) * 2016-06-30 2018-01-02 Keysight Technologies Inc. Systems for passive optical correction of polarization leakages
CN108318458B (zh) * 2017-01-16 2020-10-09 北京航空航天大学 一种适用于不同天气条件下的室外典型地物pBRDF的测量方法

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2256736C3 (de) * 1972-11-18 1979-01-25 Ibm Deutschland Gmbh, 7000 Stuttgart Meßanordnung zur automatischen Prüfung der Oberflächenbeschaffenheit und Ebenheit einer Werkstückoberfläche
JP2614365B2 (ja) * 1991-01-14 1997-05-28 日本電信電話株式会社 偏波無依存導波型光デバイス
US5658490A (en) * 1995-04-07 1997-08-19 Board Of Regents Of The University Of Colorado Liquid crystal achromatic compound retarder
US6380997B1 (en) * 1995-04-07 2002-04-30 Colorlink, Inc. Achromatic polarization inverters for displaying inverse frames in DC balanced liquid crystal displays
US6711311B2 (en) * 2000-04-20 2004-03-23 Jds Uniphase Inc. Polarization beam splitter or combiner
US6765635B1 (en) * 2000-12-28 2004-07-20 Coadna Photonics, Inc. Apparatus and method for achromatic liquid crystal electro-optic modulation
JP2002269797A (ja) * 2001-03-07 2002-09-20 Sony Corp 光ピックアップ及び波長板
US6795184B1 (en) * 2001-04-06 2004-09-21 J.A. Woollam Co., Inc Odd bounce image rotation system in ellipsometer systems
EP1411333B1 (en) * 2002-10-15 2006-03-08 Centre National De La Recherche Scientifique (Cnrs) A liquid crystal based polarimetric system, a process for its calibration, and a polarimetric measurement process
US7444040B2 (en) * 2004-01-23 2008-10-28 Tdk Corporation Magneto-optical component
JP4480653B2 (ja) * 2005-09-27 2010-06-16 株式会社アタゴ 偏光状態測定装置、円二色性測定装置及びその方法
WO2008084707A1 (ja) * 2007-01-10 2008-07-17 Nippon Telegraph And Telephone Corporation 導波路型光干渉回路
CN101216616A (zh) * 2008-01-09 2008-07-09 南京航空航天大学 高热稳定性电光调制器
US8125641B2 (en) * 2009-03-27 2012-02-28 N&K Technology, Inc. Method and apparatus for phase-compensated sensitivity-enhanced spectroscopy (PCSES)
TWI457550B (zh) * 2012-03-16 2014-10-21 Nat Univ Tsing Hua 量化材料未知應力與殘餘應力之裝置及其方法
US9435964B2 (en) * 2014-02-26 2016-09-06 TeraDiode, Inc. Systems and methods for laser systems with variable beam parameter product
US9310560B2 (en) * 2014-02-26 2016-04-12 TeraDiode, Inc. Systems and methods for multiple-beam laser arrangements with variable beam parameter product

Also Published As

Publication number Publication date
US10156514B2 (en) 2018-12-18
AU2014289101A8 (en) 2016-02-11
JP2016533496A (ja) 2016-10-27
FR3008497B1 (fr) 2015-08-07
CA2914364A1 (fr) 2015-01-15
EP3019841A1 (fr) 2016-05-18
EP3019841B1 (fr) 2017-07-12
US20160139033A1 (en) 2016-05-19
CN105593652A (zh) 2016-05-18
AU2014289101B2 (en) 2018-01-18
WO2015004358A1 (fr) 2015-01-15
AU2014289101A1 (en) 2016-01-21
JP6285547B2 (ja) 2018-02-28
FR3008497A1 (fr) 2015-01-16

Similar Documents

Publication Publication Date Title
WO2018071870A3 (en) High performance visible wavelength meta-axicons for generating bessel beams
CA2914364C (fr) Dispositif pour compenser la derive d'un dephasage d'un modulateur d'etat de polarisation d'un faisceau lumineux
ATE542107T1 (de) Selbstmischende lasermessvorrichtung
JP2012168362A5 (enExample)
CN106289527B (zh) 一种基于偏振干涉的高光谱成像装置及其成像方法
CN107884079B (zh) 单发次超短激光脉冲宽度测量装置及测量方法
CN103063315B (zh) 基于啁啾脉冲特性的单次信噪比测量方法和装置
EP2108921A1 (fr) Dispositif de contrôle de la qualité de surface
WO2009120728A3 (en) Interferometric tracking device
TW200813411A (en) Combination ellipsometry and optical stress generation and detection
EP2506051A3 (en) Optical modulator
US9945656B2 (en) Multi-function spectroscopic device
CN105841814B (zh) 一种太赫兹多脉冲瞬态时域光谱仪
Atalar et al. Time-of-flight imaging based on resonant photoelastic modulation
JP2016533496A5 (enExample)
CN207487831U (zh) 单发次超短激光脉冲宽度测量装置
US10337928B2 (en) Autocorrelation measurement device
JP2007033317A5 (enExample)
JP2015137980A (ja) 観察装置
RU2010126811A (ru) Инфракрасный амплитудно-фазовый плазменный спектрометр
CN204346910U (zh) 一种高速多幅太赫兹时域光谱成像仪
EP0911645B1 (fr) Dispositif optique à modulation de polarisation pour la mesure de distance et/ou de vitesse d'objet
Hu et al. Analysis of continuous and pulsed laser ranging systems based on electro-optical modulation
CN105157858A (zh) 一种瞬态光栅衍射法紫外单次自相关仪
WO2006103667A3 (en) Electro-optical and all-optical beam steering, self deflection and electro-optic routing

Legal Events

Date Code Title Description
EEER Examination request

Effective date: 20190515

MKLA Lapsed

Effective date: 20220620