CA2914364C - Dispositif pour compenser la derive d'un dephasage d'un modulateur d'etat de polarisation d'un faisceau lumineux - Google Patents
Dispositif pour compenser la derive d'un dephasage d'un modulateur d'etat de polarisation d'un faisceau lumineux Download PDFInfo
- Publication number
- CA2914364C CA2914364C CA2914364A CA2914364A CA2914364C CA 2914364 C CA2914364 C CA 2914364C CA 2914364 A CA2914364 A CA 2914364A CA 2914364 A CA2914364 A CA 2914364A CA 2914364 C CA2914364 C CA 2914364C
- Authority
- CA
- Canada
- Prior art keywords
- light beam
- odd number
- drift
- compensating
- modulating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
- G01N21/23—Bi-refringence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/0025—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/28—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising
- G02B27/286—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising for controlling or changing the state of polarisation, e.g. transforming one polarisation state into another
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/30—Polarising elements
- G02B5/3016—Polarising elements involving passive liquid crystal elements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/30—Polarising elements
- G02B5/3083—Birefringent or phase retarding elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J4/00—Measuring polarisation of light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/063—Illuminating optical parts
- G01N2201/0636—Reflectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/068—Optics, miscellaneous
- G01N2201/0683—Brewster plate; polarisation controlling elements
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Immunology (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- Health & Medical Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Polarising Elements (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Optical Radar Systems And Details Thereof (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR1356803A FR3008497B1 (fr) | 2013-07-10 | 2013-07-10 | Dispositif pour compenser la derive d'un dephasage d'un modulateur d'etat de polarisation d'un faisceau lumineux |
| FR1356803 | 2013-07-10 | ||
| PCT/FR2014/051539 WO2015004358A1 (fr) | 2013-07-10 | 2014-06-20 | Dispositif pour compenser la dérive d'un déphasage d'un modulateur d'état de polarisation d'un faisceau lumineux |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CA2914364A1 CA2914364A1 (fr) | 2015-01-15 |
| CA2914364C true CA2914364C (fr) | 2021-06-15 |
Family
ID=49151212
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA2914364A Expired - Fee Related CA2914364C (fr) | 2013-07-10 | 2014-06-20 | Dispositif pour compenser la derive d'un dephasage d'un modulateur d'etat de polarisation d'un faisceau lumineux |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US10156514B2 (enExample) |
| EP (1) | EP3019841B1 (enExample) |
| JP (1) | JP6285547B2 (enExample) |
| CN (1) | CN105593652A (enExample) |
| AU (1) | AU2014289101B2 (enExample) |
| CA (1) | CA2914364C (enExample) |
| FR (1) | FR3008497B1 (enExample) |
| WO (1) | WO2015004358A1 (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12013819B2 (en) * | 2014-01-14 | 2024-06-18 | Zixcorp Systems, Inc. | Asynchronous method for provisioning a service using file distribution technology |
| FR3046850B1 (fr) | 2016-01-15 | 2018-01-26 | Universite De Strasbourg | Guide optique ameliore et systeme optique comportant un tel guide optique |
| US9857512B1 (en) * | 2016-06-30 | 2018-01-02 | Keysight Technologies Inc. | Systems for passive optical correction of polarization leakages |
| CN108318458B (zh) * | 2017-01-16 | 2020-10-09 | 北京航空航天大学 | 一种适用于不同天气条件下的室外典型地物pBRDF的测量方法 |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2256736C3 (de) * | 1972-11-18 | 1979-01-25 | Ibm Deutschland Gmbh, 7000 Stuttgart | Meßanordnung zur automatischen Prüfung der Oberflächenbeschaffenheit und Ebenheit einer Werkstückoberfläche |
| JP2614365B2 (ja) * | 1991-01-14 | 1997-05-28 | 日本電信電話株式会社 | 偏波無依存導波型光デバイス |
| US5658490A (en) * | 1995-04-07 | 1997-08-19 | Board Of Regents Of The University Of Colorado | Liquid crystal achromatic compound retarder |
| US6380997B1 (en) * | 1995-04-07 | 2002-04-30 | Colorlink, Inc. | Achromatic polarization inverters for displaying inverse frames in DC balanced liquid crystal displays |
| US6711311B2 (en) * | 2000-04-20 | 2004-03-23 | Jds Uniphase Inc. | Polarization beam splitter or combiner |
| US6765635B1 (en) * | 2000-12-28 | 2004-07-20 | Coadna Photonics, Inc. | Apparatus and method for achromatic liquid crystal electro-optic modulation |
| JP2002269797A (ja) * | 2001-03-07 | 2002-09-20 | Sony Corp | 光ピックアップ及び波長板 |
| US6795184B1 (en) * | 2001-04-06 | 2004-09-21 | J.A. Woollam Co., Inc | Odd bounce image rotation system in ellipsometer systems |
| EP1411333B1 (en) * | 2002-10-15 | 2006-03-08 | Centre National De La Recherche Scientifique (Cnrs) | A liquid crystal based polarimetric system, a process for its calibration, and a polarimetric measurement process |
| US7444040B2 (en) * | 2004-01-23 | 2008-10-28 | Tdk Corporation | Magneto-optical component |
| JP4480653B2 (ja) * | 2005-09-27 | 2010-06-16 | 株式会社アタゴ | 偏光状態測定装置、円二色性測定装置及びその方法 |
| WO2008084707A1 (ja) * | 2007-01-10 | 2008-07-17 | Nippon Telegraph And Telephone Corporation | 導波路型光干渉回路 |
| CN101216616A (zh) * | 2008-01-09 | 2008-07-09 | 南京航空航天大学 | 高热稳定性电光调制器 |
| US8125641B2 (en) * | 2009-03-27 | 2012-02-28 | N&K Technology, Inc. | Method and apparatus for phase-compensated sensitivity-enhanced spectroscopy (PCSES) |
| TWI457550B (zh) * | 2012-03-16 | 2014-10-21 | Nat Univ Tsing Hua | 量化材料未知應力與殘餘應力之裝置及其方法 |
| US9435964B2 (en) * | 2014-02-26 | 2016-09-06 | TeraDiode, Inc. | Systems and methods for laser systems with variable beam parameter product |
| US9310560B2 (en) * | 2014-02-26 | 2016-04-12 | TeraDiode, Inc. | Systems and methods for multiple-beam laser arrangements with variable beam parameter product |
-
2013
- 2013-07-10 FR FR1356803A patent/FR3008497B1/fr active Active
-
2014
- 2014-06-20 AU AU2014289101A patent/AU2014289101B2/en not_active Ceased
- 2014-06-20 WO PCT/FR2014/051539 patent/WO2015004358A1/fr not_active Ceased
- 2014-06-20 JP JP2016524862A patent/JP6285547B2/ja not_active Expired - Fee Related
- 2014-06-20 CA CA2914364A patent/CA2914364C/fr not_active Expired - Fee Related
- 2014-06-20 US US14/899,966 patent/US10156514B2/en not_active Expired - Fee Related
- 2014-06-20 CN CN201480038234.3A patent/CN105593652A/zh active Pending
- 2014-06-20 EP EP14749880.2A patent/EP3019841B1/fr active Active
Also Published As
| Publication number | Publication date |
|---|---|
| US10156514B2 (en) | 2018-12-18 |
| AU2014289101A8 (en) | 2016-02-11 |
| JP2016533496A (ja) | 2016-10-27 |
| FR3008497B1 (fr) | 2015-08-07 |
| CA2914364A1 (fr) | 2015-01-15 |
| EP3019841A1 (fr) | 2016-05-18 |
| EP3019841B1 (fr) | 2017-07-12 |
| US20160139033A1 (en) | 2016-05-19 |
| CN105593652A (zh) | 2016-05-18 |
| AU2014289101B2 (en) | 2018-01-18 |
| WO2015004358A1 (fr) | 2015-01-15 |
| AU2014289101A1 (en) | 2016-01-21 |
| JP6285547B2 (ja) | 2018-02-28 |
| FR3008497A1 (fr) | 2015-01-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| WO2018071870A3 (en) | High performance visible wavelength meta-axicons for generating bessel beams | |
| CA2914364C (fr) | Dispositif pour compenser la derive d'un dephasage d'un modulateur d'etat de polarisation d'un faisceau lumineux | |
| ATE542107T1 (de) | Selbstmischende lasermessvorrichtung | |
| JP2012168362A5 (enExample) | ||
| CN106289527B (zh) | 一种基于偏振干涉的高光谱成像装置及其成像方法 | |
| CN107884079B (zh) | 单发次超短激光脉冲宽度测量装置及测量方法 | |
| CN103063315B (zh) | 基于啁啾脉冲特性的单次信噪比测量方法和装置 | |
| EP2108921A1 (fr) | Dispositif de contrôle de la qualité de surface | |
| WO2009120728A3 (en) | Interferometric tracking device | |
| TW200813411A (en) | Combination ellipsometry and optical stress generation and detection | |
| EP2506051A3 (en) | Optical modulator | |
| US9945656B2 (en) | Multi-function spectroscopic device | |
| CN105841814B (zh) | 一种太赫兹多脉冲瞬态时域光谱仪 | |
| Atalar et al. | Time-of-flight imaging based on resonant photoelastic modulation | |
| JP2016533496A5 (enExample) | ||
| CN207487831U (zh) | 单发次超短激光脉冲宽度测量装置 | |
| US10337928B2 (en) | Autocorrelation measurement device | |
| JP2007033317A5 (enExample) | ||
| JP2015137980A (ja) | 観察装置 | |
| RU2010126811A (ru) | Инфракрасный амплитудно-фазовый плазменный спектрометр | |
| CN204346910U (zh) | 一种高速多幅太赫兹时域光谱成像仪 | |
| EP0911645B1 (fr) | Dispositif optique à modulation de polarisation pour la mesure de distance et/ou de vitesse d'objet | |
| Hu et al. | Analysis of continuous and pulsed laser ranging systems based on electro-optical modulation | |
| CN105157858A (zh) | 一种瞬态光栅衍射法紫外单次自相关仪 | |
| WO2006103667A3 (en) | Electro-optical and all-optical beam steering, self deflection and electro-optic routing |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EEER | Examination request |
Effective date: 20190515 |
|
| MKLA | Lapsed |
Effective date: 20220620 |