JP6251683B2 - 放射線検出装置、放射線検出方法、画像化システム - Google Patents

放射線検出装置、放射線検出方法、画像化システム Download PDF

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JP6251683B2
JP6251683B2 JP2014540610A JP2014540610A JP6251683B2 JP 6251683 B2 JP6251683 B2 JP 6251683B2 JP 2014540610 A JP2014540610 A JP 2014540610A JP 2014540610 A JP2014540610 A JP 2014540610A JP 6251683 B2 JP6251683 B2 JP 6251683B2
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JP2015504513A (ja
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ユルゲン エンゲル，クラウス
ユルゲン エンゲル，クラウス
ヘルマン，クリストフ
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Koninklijke Philips NV
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/241—Electrode arrangements, e.g. continuous or parallel strips or the like
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/191—Photoconductor image sensors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/803—Pixels having integrated switching, control, storage or amplification elements

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Light Receiving Elements (AREA)
  • Solid State Image Pick-Up Elements (AREA)
JP2014540610A 2011-11-09 2012-11-07 放射線検出装置、放射線検出方法、画像化システム Expired - Fee Related JP6251683B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161557480P 2011-11-09 2011-11-09
US61/557,480 2011-11-09
PCT/IB2012/056231 WO2013068944A1 (en) 2011-11-09 2012-11-07 Radiation-sensitive detector device with charge-rejecting segment gaps

Publications (2)

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JP2015504513A JP2015504513A (ja) 2015-02-12
JP6251683B2 true JP6251683B2 (ja) 2017-12-20

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JP2014540610A Expired - Fee Related JP6251683B2 (ja) 2011-11-09 2012-11-07 放射線検出装置、放射線検出方法、画像化システム

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Country Link
US (1) US9069088B2 (enExample)
EP (1) EP2748638B1 (enExample)
JP (1) JP6251683B2 (enExample)
CN (1) CN103917897B (enExample)
BR (1) BR112014010873A8 (enExample)
IN (1) IN2014CN03496A (enExample)
RU (1) RU2605523C2 (enExample)
WO (1) WO2013068944A1 (enExample)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102013202630B4 (de) * 2013-02-19 2017-07-06 Siemens Healthcare Gmbh Strahlungsdetektor und medizinisches Diagnosesystem
US10497737B2 (en) * 2013-05-30 2019-12-03 Caeleste Cvba Enhanced dynamic range imaging
DE102014204042A1 (de) * 2014-03-05 2015-09-10 Siemens Aktiengesellschaft Verfahren zur Ansteuerung eines Röntgendetektors und zugehörige Steuereinheit
CN106662661B (zh) * 2014-10-31 2019-06-25 皇家飞利浦有限公司 用于探测辐射信号的传感器设备和成像系统
CN106796302B (zh) * 2014-12-05 2018-11-13 皇家飞利浦有限公司 用于倾斜角度x射线辐射的x射线探测器设备
WO2016096622A1 (en) * 2014-12-17 2016-06-23 Koninklijke Philips N.V. Detector and method for detecting ionizing radiation
CN108369285B (zh) 2015-12-02 2022-04-26 深圳帧观德芯科技有限公司 半导体x射线检测器的封装方法
DE102016221481B4 (de) 2016-11-02 2021-09-16 Siemens Healthcare Gmbh Strahlungsdetektor mit einer Zwischenschicht
US10156645B2 (en) * 2016-12-23 2018-12-18 General Electric Company Systems and methods for sub-pixel location determination at sidewalls and corners of detectors
EP3404447B1 (de) * 2017-05-17 2019-08-14 Siemens Healthcare GmbH Röntgendetektor aufweisend eine lichtquelle am trägerelement
WO2020235124A1 (ja) * 2019-05-17 2020-11-26 Ｊｘ金属株式会社 半導体ウエハ、放射線検出素子、放射線検出器、及び化合物半導体単結晶基板の製造方法
JP7250919B2 (ja) * 2019-05-17 2023-04-03 Ｊｘ金属株式会社 半導体ウエハ、放射線検出素子、放射線検出器、及び化合物半導体単結晶基板の製造方法
JP7423423B2 (ja) * 2020-05-28 2024-01-29 株式会社日立製作所 半導体検出器およびその製造方法
US11835666B1 (en) * 2020-07-31 2023-12-05 Redlen Technologies, Inc. Photon counting computed tomography detector with improved count rate stability and method of operating same

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0679162U (ja) * 1993-04-22 1994-11-04 ジーイー横河メディカルシステム株式会社 半導体ｘ線検出器
US5677539A (en) 1995-10-13 1997-10-14 Digirad Semiconductor radiation detector with enhanced charge collection
US6175120B1 (en) 1998-05-08 2001-01-16 The Regents Of The University Of Michigan High-resolution ionization detector and array of such detectors
US6034373A (en) * 1997-12-11 2000-03-07 Imrad Imaging Systems Ltd. Semiconductor radiation detector with reduced surface effects
JP4091334B2 (ja) * 2001-05-11 2008-05-28 富士フイルム株式会社 画像記録方法および装置並びに画像記録媒体
JP3900992B2 (ja) 2002-04-02 2007-04-04 株式会社日立製作所 放射線検出器及び放射線検査装置
CN1230693C (zh) * 2002-11-26 2005-12-07 张亚美 小面积像素电极直接平板x－线探测器
WO2005008286A2 (en) 2003-07-12 2005-01-27 Radiation Watch Limited Ionising radiation detector
CA2567466C (en) * 2004-05-21 2012-05-01 Craig M. Whitehouse Rf surfaces and rf ion guides
CN101006362A (zh) * 2004-08-13 2007-07-25 皇家飞利浦电子股份有限公司 固态辐射探测器封装技术
US7453068B2 (en) 2005-07-06 2008-11-18 Ge Medical Systems Israel, Ltd. Method and apparatus of detecting ionizing radiation
WO2008054862A2 (en) * 2006-04-21 2008-05-08 Ii-Vi Incorporated Radiation detector with co-planar grid structure
WO2008059425A2 (en) * 2006-11-17 2008-05-22 Koninklijke Philips Electronics N.V. Radiation detector with multiple electrodes on a sensitive layer
EP2097771A2 (en) * 2006-12-22 2009-09-09 Koninklijke Philips Electronics N.V. Energy-resolving detection system and imaging system
US7955992B2 (en) 2008-08-08 2011-06-07 Redlen Technologies, Inc. Method of passivating and encapsulating CdTe and CZT segmented detectors
WO2010073189A1 (en) * 2008-12-22 2010-07-01 Koninklijke Philips Electronics N.V. Radiation detector with improved charge collection and minimized leakage currents
JP2012114166A (ja) * 2010-11-22 2012-06-14 Canon Inc 検出装置及び放射線検出システム

Also Published As

Publication number Publication date
BR112014010873A8 (pt) 2017-06-20
BR112014010873A2 (pt) 2017-06-13
IN2014CN03496A (enExample) 2015-10-16
CN103917897A (zh) 2014-07-09
EP2748638A1 (en) 2014-07-02
RU2605523C2 (ru) 2016-12-20
EP2748638B1 (en) 2019-09-18
WO2013068944A1 (en) 2013-05-16
US20140284489A1 (en) 2014-09-25
RU2014123326A (ru) 2015-12-20
CN103917897B (zh) 2016-08-17
US9069088B2 (en) 2015-06-30
JP2015504513A (ja) 2015-02-12

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