JP6233824B1 - 画像検査装置、生産システム、画像検査方法、プログラム及び記憶媒体 - Google Patents
画像検査装置、生産システム、画像検査方法、プログラム及び記憶媒体 Download PDFInfo
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- JP6233824B1 JP6233824B1 JP2017085745A JP2017085745A JP6233824B1 JP 6233824 B1 JP6233824 B1 JP 6233824B1 JP 2017085745 A JP2017085745 A JP 2017085745A JP 2017085745 A JP2017085745 A JP 2017085745A JP 6233824 B1 JP6233824 B1 JP 6233824B1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Analysis (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2017085745A JP6233824B1 (ja) | 2017-04-25 | 2017-04-25 | 画像検査装置、生産システム、画像検査方法、プログラム及び記憶媒体 |
| PCT/JP2018/016374 WO2018198991A1 (ja) | 2017-04-25 | 2018-04-20 | 画像検査装置、生産システム、画像検査方法、プログラム及び記憶媒体 |
| CN201880002545.2A CN109564173B (zh) | 2017-04-25 | 2018-04-20 | 图像检查装置、生产系统、图像检查方法及存储介质 |
| TW107113978A TWI664422B (zh) | 2017-04-25 | 2018-04-25 | 圖像檢查裝置、生產系統、圖像檢查方法、圖像檢查用程式及記憶媒體 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2017085745A JP6233824B1 (ja) | 2017-04-25 | 2017-04-25 | 画像検査装置、生産システム、画像検査方法、プログラム及び記憶媒体 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP6233824B1 true JP6233824B1 (ja) | 2017-11-22 |
| JP2018185177A JP2018185177A (ja) | 2018-11-22 |
Family
ID=60417521
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2017085745A Active JP6233824B1 (ja) | 2017-04-25 | 2017-04-25 | 画像検査装置、生産システム、画像検査方法、プログラム及び記憶媒体 |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP6233824B1 (zh) |
| CN (1) | CN109564173B (zh) |
| TW (1) | TWI664422B (zh) |
| WO (1) | WO2018198991A1 (zh) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109885921B (zh) * | 2019-02-14 | 2022-03-11 | 上海望友信息科技有限公司 | 基于三维元器件库转贴装数据的方法、系统、介质及设备 |
| JP7181157B2 (ja) * | 2019-06-14 | 2022-11-30 | ヤマハ発動機株式会社 | 検査装置及びそれを備えた塗布装置 |
| JP6788759B1 (ja) * | 2020-02-12 | 2020-11-25 | Dmg森精機株式会社 | 情報処理装置及び情報処理システム |
| JP7409988B2 (ja) * | 2020-07-29 | 2024-01-09 | 株式会社ニューフレアテクノロジー | パターン検査装置及び輪郭線同士のアライメント量取得方法 |
| CN114723671B (zh) * | 2022-03-10 | 2022-09-06 | 深圳灿维科技有限公司 | 一种图像预处理方法、装置、计算机设备及存储介质 |
Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04290186A (ja) * | 1991-03-19 | 1992-10-14 | Eastman Kodak Japan Kk | 画像処理方法 |
| JPH08122267A (ja) * | 1994-10-25 | 1996-05-17 | Mitsubishi Electric Corp | マーク認識装置およびマーク認識方法 |
| US20020154810A1 (en) * | 2001-02-13 | 2002-10-24 | Orbotech Ltd. | Multiple optical input inspection system |
| US20030083850A1 (en) * | 2001-10-26 | 2003-05-01 | Schmidt Darren R. | Locating regions in a target image using color matching, luminance pattern matching and hue plane pattern matching |
| JP2004251781A (ja) * | 2003-02-20 | 2004-09-09 | Tani Electronics Corp | 画像認識による不良検査方法 |
| US20060045325A1 (en) * | 2004-08-31 | 2006-03-02 | Semiconductor Insights Inc. | Method of design analysis of existing integrated circuits |
| JP2011149892A (ja) * | 2010-01-25 | 2011-08-04 | Yamaha Motor Co Ltd | 検査装置および検査方法 |
| JP2012221043A (ja) * | 2011-04-05 | 2012-11-12 | Hitachi Kokusai Electric Inc | 画像処理方法および監視装置 |
| JP2013234976A (ja) * | 2012-05-11 | 2013-11-21 | Hioki Ee Corp | 外観検査装置及び外観検査方法 |
| JP2014055914A (ja) * | 2012-09-14 | 2014-03-27 | Keyence Corp | 外観検査装置、外観検査法およびプログラム |
| US20160131598A1 (en) * | 2013-06-14 | 2016-05-12 | Robert Bosch Gmbh | Detection system for detecting a soldered joint |
| US20160275671A1 (en) * | 2015-03-16 | 2016-09-22 | Kla-Tencor Corporation | Systems and Methods for Enhancing Inspection Sensitivity of an Inspection Tool |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SE519694C2 (sv) * | 2000-04-28 | 2003-04-01 | Precise Biometrics Ab | Kontroll av fingeravtryck |
| CN100472205C (zh) * | 2005-02-21 | 2009-03-25 | 欧姆龙株式会社 | 基板检查方法和装置、及其检查逻辑设定方法和装置 |
| JP4787673B2 (ja) * | 2005-05-19 | 2011-10-05 | 株式会社Ｎｇｒ | パターン検査装置および方法 |
| JP4772839B2 (ja) * | 2008-08-13 | 2011-09-14 | 株式会社エヌ・ティ・ティ・ドコモ | 画像識別方法および撮像装置 |
| JP5254270B2 (ja) * | 2010-04-09 | 2013-08-07 | 株式会社ニューフレアテクノロジー | 検査方法および検査装置 |
| CN103106663B (zh) * | 2013-02-19 | 2015-12-09 | 公安部第三研究所 | 计算机系统中基于图像处理实现sim卡缺陷检测的方法 |
| JP5994698B2 (ja) * | 2013-03-22 | 2016-09-21 | 富士ゼロックス株式会社 | 画像検査システム、画像検査装置、プログラム、および、画像データ出力方法 |
-
2017
- 2017-04-25 JP JP2017085745A patent/JP6233824B1/ja active Active
-
2018
- 2018-04-20 CN CN201880002545.2A patent/CN109564173B/zh active Active
- 2018-04-20 WO PCT/JP2018/016374 patent/WO2018198991A1/ja active Application Filing
- 2018-04-25 TW TW107113978A patent/TWI664422B/zh not_active IP Right Cessation
Patent Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04290186A (ja) * | 1991-03-19 | 1992-10-14 | Eastman Kodak Japan Kk | 画像処理方法 |
| JPH08122267A (ja) * | 1994-10-25 | 1996-05-17 | Mitsubishi Electric Corp | マーク認識装置およびマーク認識方法 |
| US20020154810A1 (en) * | 2001-02-13 | 2002-10-24 | Orbotech Ltd. | Multiple optical input inspection system |
| US20030083850A1 (en) * | 2001-10-26 | 2003-05-01 | Schmidt Darren R. | Locating regions in a target image using color matching, luminance pattern matching and hue plane pattern matching |
| JP2004251781A (ja) * | 2003-02-20 | 2004-09-09 | Tani Electronics Corp | 画像認識による不良検査方法 |
| US20060045325A1 (en) * | 2004-08-31 | 2006-03-02 | Semiconductor Insights Inc. | Method of design analysis of existing integrated circuits |
| JP2011149892A (ja) * | 2010-01-25 | 2011-08-04 | Yamaha Motor Co Ltd | 検査装置および検査方法 |
| JP2012221043A (ja) * | 2011-04-05 | 2012-11-12 | Hitachi Kokusai Electric Inc | 画像処理方法および監視装置 |
| JP2013234976A (ja) * | 2012-05-11 | 2013-11-21 | Hioki Ee Corp | 外観検査装置及び外観検査方法 |
| JP2014055914A (ja) * | 2012-09-14 | 2014-03-27 | Keyence Corp | 外観検査装置、外観検査法およびプログラム |
| US20160131598A1 (en) * | 2013-06-14 | 2016-05-12 | Robert Bosch Gmbh | Detection system for detecting a soldered joint |
| US20160275671A1 (en) * | 2015-03-16 | 2016-09-22 | Kla-Tencor Corporation | Systems and Methods for Enhancing Inspection Sensitivity of an Inspection Tool |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201907153A (zh) | 2019-02-16 |
| CN109564173A (zh) | 2019-04-02 |
| TWI664422B (zh) | 2019-07-01 |
| CN109564173B (zh) | 2020-06-05 |
| JP2018185177A (ja) | 2018-11-22 |
| WO2018198991A1 (ja) | 2018-11-01 |
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