JP6173457B2 - 微分位相コントラスト撮像における複数オーダの位相調整のためのソース格子対位相格子距離の位置合わせ - Google Patents

微分位相コントラスト撮像における複数オーダの位相調整のためのソース格子対位相格子距離の位置合わせ Download PDF

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JP6173457B2
JP6173457B2 JP2015527994A JP2015527994A JP6173457B2 JP 6173457 B2 JP6173457 B2 JP 6173457B2 JP 2015527994 A JP2015527994 A JP 2015527994A JP 2015527994 A JP2015527994 A JP 2015527994A JP 6173457 B2 JP6173457 B2 JP 6173457B2
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grating
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source
detector
phase
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JP2015529510A (ja
JP2015529510A5 (enExample
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ゲルハルト メルテンス
ゲルハルト メルテンス
ハイナー デア
ハイナー デア
トーマス デトレフ イステル
トーマス デトレフ イステル
エワルド レッスル
エワルド レッスル
ステーベンダール ウド バン
ステーベンダール ウド バン
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Koninklijke Philips NV
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    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/58—Testing, adjusting or calibrating thereof
    • A61B6/587—Alignment of source unit to detector unit
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/58—Testing, adjusting or calibrating thereof
    • A61B6/588—Setting distance between source unit and detector unit
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/58—Testing, adjusting or calibrating thereof
    • A61B6/589—Setting distance between source unit and patient
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20075—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring interferences of X-rays, e.g. Borrmann effect
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/58—Testing, adjusting or calibrating thereof
    • A61B6/582—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/643—Specific applications or type of materials object on conveyor

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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Medical Informatics (AREA)
  • Engineering & Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Biomedical Technology (AREA)
  • Optics & Photonics (AREA)
  • Veterinary Medicine (AREA)
  • Public Health (AREA)
  • Animal Behavior & Ethology (AREA)
  • Biophysics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Surgery (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Molecular Biology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2015527994A 2012-08-20 2013-08-20 微分位相コントラスト撮像における複数オーダの位相調整のためのソース格子対位相格子距離の位置合わせ Active JP6173457B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201261684869P 2012-08-20 2012-08-20
US61/684,869 2012-08-20
PCT/IB2013/056748 WO2014030115A1 (en) 2012-08-20 2013-08-20 Aligning source-grating-to-phase-grating distance for multiple order phase tuning in differential phase contrast imaging

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JP2015529510A JP2015529510A (ja) 2015-10-08
JP2015529510A5 JP2015529510A5 (enExample) 2017-07-06
JP6173457B2 true JP6173457B2 (ja) 2017-08-02

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US (1) US9717470B2 (enExample)
EP (1) EP2884899B1 (enExample)
JP (1) JP6173457B2 (enExample)
CN (1) CN104582573B (enExample)
BR (1) BR112015003425A2 (enExample)
RU (1) RU2631183C2 (enExample)
WO (1) WO2014030115A1 (enExample)

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US10420521B2 (en) 2014-08-05 2019-09-24 Koninklijke Philips N.V. Grating device for an X-ray imaging device
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JP6581713B2 (ja) * 2015-07-21 2019-09-25 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 位相コントラスト及び／又は暗視野撮像のためのｘ線検出器、該ｘ線検出器を有する干渉計、ｘ線撮像システム、位相コントラストｘ線撮像及び／又は暗視野ｘ線撮像を行う方法、コンピュータプログラム、コンピュータ読取可能な媒体
CN109478440A (zh) * 2016-06-08 2019-03-15 皇家飞利浦有限公司 用于相位衬度成像和/或暗场成像的分析格栅
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EP3459461A1 (en) * 2017-09-25 2019-03-27 Koninklijke Philips N.V. X-ray imaging reference scan
CN107748341B (zh) * 2017-10-23 2024-08-13 中国科学院苏州生物医学工程技术研究所 高衬度低剂量相位衬度ct成像装置
JP6743983B2 (ja) 2017-10-31 2020-08-19 株式会社島津製作所 Ｘ線位相差撮像システム
JP6813107B2 (ja) * 2017-12-06 2021-01-13 株式会社島津製作所 Ｘ線位相差撮像システム
JP7021676B2 (ja) * 2017-12-22 2022-02-17 株式会社島津製作所 Ｘ線位相差撮像システム
CN108469443A (zh) * 2018-04-18 2018-08-31 北京航空航天大学 基于二维错位吸收光栅的x射线光栅差分相位衬度成像方法及装置
JP6881682B2 (ja) * 2018-05-16 2021-06-02 株式会社島津製作所 Ｘ線イメージング装置
WO2020039654A1 (ja) * 2018-08-22 2020-02-27 株式会社島津製作所 Ｘ線位相イメージング装置
JP7111166B2 (ja) * 2018-08-22 2022-08-02 株式会社島津製作所 Ｘ線位相イメージング装置
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Publication number Publication date
CN104582573B (zh) 2018-09-28
US9717470B2 (en) 2017-08-01
US20150216499A1 (en) 2015-08-06
BR112015003425A2 (pt) 2017-07-04
JP2015529510A (ja) 2015-10-08
WO2014030115A1 (en) 2014-02-27
EP2884899B1 (en) 2017-04-26
RU2631183C2 (ru) 2017-09-19
EP2884899A1 (en) 2015-06-24
RU2015109738A (ru) 2016-10-10
CN104582573A (zh) 2015-04-29

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