CN104582573B - 在微分相位对比成像中对齐源光栅到相位光栅距离以用于多阶相位调谐 - Google Patents

在微分相位对比成像中对齐源光栅到相位光栅距离以用于多阶相位调谐 Download PDF

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CN104582573B
CN104582573B CN201380043436.2A CN201380043436A CN104582573B CN 104582573 B CN104582573 B CN 104582573B CN 201380043436 A CN201380043436 A CN 201380043436A CN 104582573 B CN104582573 B CN 104582573B
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grating
ray
source
detector
phase contrast
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CN104582573A (zh
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G·马滕斯
H·德尔
T·D·伊斯特尔
E·勒斯尔
U·范斯特文达勒
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Koninklijke Philips NV
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    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/58—Testing, adjusting or calibrating thereof
    • A61B6/587—Alignment of source unit to detector unit
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/58—Testing, adjusting or calibrating thereof
    • A61B6/588—Setting distance between source unit and detector unit
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/58—Testing, adjusting or calibrating thereof
    • A61B6/589—Setting distance between source unit and patient
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20075—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring interferences of X-rays, e.g. Borrmann effect
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/58—Testing, adjusting or calibrating thereof
    • A61B6/582—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/643—Specific applications or type of materials object on conveyor

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  • Life Sciences & Earth Sciences (AREA)
  • Medical Informatics (AREA)
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  • Optics & Photonics (AREA)
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  • Animal Behavior & Ethology (AREA)
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  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Molecular Biology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN201380043436.2A 2012-08-20 2013-08-20 在微分相位对比成像中对齐源光栅到相位光栅距离以用于多阶相位调谐 Active CN104582573B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201261684869P 2012-08-20 2012-08-20
US61/684,869 2012-08-20
PCT/IB2013/056748 WO2014030115A1 (en) 2012-08-20 2013-08-20 Aligning source-grating-to-phase-grating distance for multiple order phase tuning in differential phase contrast imaging

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CN104582573A CN104582573A (zh) 2015-04-29
CN104582573B true CN104582573B (zh) 2018-09-28

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US (1) US9717470B2 (enExample)
EP (1) EP2884899B1 (enExample)
JP (1) JP6173457B2 (enExample)
CN (1) CN104582573B (enExample)
BR (1) BR112015003425A2 (enExample)
RU (1) RU2631183C2 (enExample)
WO (1) WO2014030115A1 (enExample)

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JP6683118B2 (ja) * 2016-12-20 2020-04-15 株式会社島津製作所 Ｘ線位相撮影装置
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EP3459461A1 (en) * 2017-09-25 2019-03-27 Koninklijke Philips N.V. X-ray imaging reference scan
CN107748341B (zh) * 2017-10-23 2024-08-13 中国科学院苏州生物医学工程技术研究所 高衬度低剂量相位衬度ct成像装置
JP6743983B2 (ja) 2017-10-31 2020-08-19 株式会社島津製作所 Ｘ線位相差撮像システム
JP6813107B2 (ja) * 2017-12-06 2021-01-13 株式会社島津製作所 Ｘ線位相差撮像システム
JP7021676B2 (ja) * 2017-12-22 2022-02-17 株式会社島津製作所 Ｘ線位相差撮像システム
CN108469443A (zh) * 2018-04-18 2018-08-31 北京航空航天大学 基于二维错位吸收光栅的x射线光栅差分相位衬度成像方法及装置
JP6881682B2 (ja) * 2018-05-16 2021-06-02 株式会社島津製作所 Ｘ線イメージング装置
WO2020039654A1 (ja) * 2018-08-22 2020-02-27 株式会社島津製作所 Ｘ線位相イメージング装置
JP7111166B2 (ja) * 2018-08-22 2022-08-02 株式会社島津製作所 Ｘ線位相イメージング装置
WO2020054151A1 (ja) * 2018-09-11 2020-03-19 株式会社島津製作所 Ｘ線位相イメージング装置
CN109273131B (zh) * 2018-10-31 2024-07-02 同方威视技术股份有限公司 准直器组件和射线检测设备
CN111721786B (zh) * 2019-03-22 2023-05-26 中国科学院深圳先进技术研究院 一种x射线干涉仪及成像系统
JP7200816B2 (ja) * 2019-04-22 2023-01-10 株式会社島津製作所 Ｘ線位相イメージング装置およびｘ線位相コントラスト画像生成方法
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US9717470B2 (en) 2017-08-01
US20150216499A1 (en) 2015-08-06
BR112015003425A2 (pt) 2017-07-04
JP2015529510A (ja) 2015-10-08
WO2014030115A1 (en) 2014-02-27
EP2884899B1 (en) 2017-04-26
RU2631183C2 (ru) 2017-09-19
EP2884899A1 (en) 2015-06-24
JP6173457B2 (ja) 2017-08-02
RU2015109738A (ru) 2016-10-10
CN104582573A (zh) 2015-04-29

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