RU2631183C2 - Юстировка расстояния от решетки источника до фазовой решетки для фазовой настройки в несколько порядков при дифференциальной фазово-контрастной визуализации - Google Patents

Юстировка расстояния от решетки источника до фазовой решетки для фазовой настройки в несколько порядков при дифференциальной фазово-контрастной визуализации Download PDF

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RU2631183C2
RU2631183C2 RU2015109738A RU2015109738A RU2631183C2 RU 2631183 C2 RU2631183 C2 RU 2631183C2 RU 2015109738 A RU2015109738 A RU 2015109738A RU 2015109738 A RU2015109738 A RU 2015109738A RU 2631183 C2 RU2631183 C2 RU 2631183C2
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grating
ray
source
lattice
detector
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Герхард МАРТЕНС
Хайнер ДЕРР
Томас Детлеф ИСТЕЛЬ
Эвальд РЕССЛЬ
СТЕВЕНДАЛ Удо ВАН
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Конинклейке Филипс Н.В.
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    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/58—Testing, adjusting or calibrating thereof
    • A61B6/587—Alignment of source unit to detector unit
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/58—Testing, adjusting or calibrating thereof
    • A61B6/588—Setting distance between source unit and detector unit
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/58—Testing, adjusting or calibrating thereof
    • A61B6/589—Setting distance between source unit and patient
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20075—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring interferences of X-rays, e.g. Borrmann effect
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/58—Testing, adjusting or calibrating thereof
    • A61B6/582—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/643—Specific applications or type of materials object on conveyor

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  • Life Sciences & Earth Sciences (AREA)
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  • Engineering & Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
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  • Radiology & Medical Imaging (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
RU2015109738A 2012-08-20 2013-08-20 Юстировка расстояния от решетки источника до фазовой решетки для фазовой настройки в несколько порядков при дифференциальной фазово-контрастной визуализации RU2631183C2 (ru)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201261684869P 2012-08-20 2012-08-20
US61/684,869 2012-08-20
PCT/IB2013/056748 WO2014030115A1 (en) 2012-08-20 2013-08-20 Aligning source-grating-to-phase-grating distance for multiple order phase tuning in differential phase contrast imaging

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RU2015109738A RU2015109738A (ru) 2016-10-10
RU2631183C2 true RU2631183C2 (ru) 2017-09-19

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US (1) US9717470B2 (enExample)
EP (1) EP2884899B1 (enExample)
JP (1) JP6173457B2 (enExample)
CN (1) CN104582573B (enExample)
BR (1) BR112015003425A2 (enExample)
RU (1) RU2631183C2 (enExample)
WO (1) WO2014030115A1 (enExample)

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US10578563B2 (en) 2012-12-21 2020-03-03 Carestream Health, Inc. Phase contrast imaging computed tomography scanner
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US10096098B2 (en) 2013-12-30 2018-10-09 Carestream Health, Inc. Phase retrieval from differential phase contrast imaging
US9907524B2 (en) 2012-12-21 2018-03-06 Carestream Health, Inc. Material decomposition technique using x-ray phase contrast imaging system
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JP6581713B2 (ja) * 2015-07-21 2019-09-25 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 位相コントラスト及び／又は暗視野撮像のためのｘ線検出器、該ｘ線検出器を有する干渉計、ｘ線撮像システム、位相コントラストｘ線撮像及び／又は暗視野ｘ線撮像を行う方法、コンピュータプログラム、コンピュータ読取可能な媒体
CN109478440A (zh) * 2016-06-08 2019-03-15 皇家飞利浦有限公司 用于相位衬度成像和/或暗场成像的分析格栅
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JP6683118B2 (ja) * 2016-12-20 2020-04-15 株式会社島津製作所 Ｘ線位相撮影装置
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EP3459461A1 (en) * 2017-09-25 2019-03-27 Koninklijke Philips N.V. X-ray imaging reference scan
CN107748341B (zh) * 2017-10-23 2024-08-13 中国科学院苏州生物医学工程技术研究所 高衬度低剂量相位衬度ct成像装置
JP6743983B2 (ja) 2017-10-31 2020-08-19 株式会社島津製作所 Ｘ線位相差撮像システム
JP6813107B2 (ja) * 2017-12-06 2021-01-13 株式会社島津製作所 Ｘ線位相差撮像システム
JP7021676B2 (ja) * 2017-12-22 2022-02-17 株式会社島津製作所 Ｘ線位相差撮像システム
CN108469443A (zh) * 2018-04-18 2018-08-31 北京航空航天大学 基于二维错位吸收光栅的x射线光栅差分相位衬度成像方法及装置
JP6881682B2 (ja) * 2018-05-16 2021-06-02 株式会社島津製作所 Ｘ線イメージング装置
WO2020039654A1 (ja) * 2018-08-22 2020-02-27 株式会社島津製作所 Ｘ線位相イメージング装置
JP7111166B2 (ja) * 2018-08-22 2022-08-02 株式会社島津製作所 Ｘ線位相イメージング装置
WO2020054151A1 (ja) * 2018-09-11 2020-03-19 株式会社島津製作所 Ｘ線位相イメージング装置
CN109273131B (zh) * 2018-10-31 2024-07-02 同方威视技术股份有限公司 准直器组件和射线检测设备
CN111721786B (zh) * 2019-03-22 2023-05-26 中国科学院深圳先进技术研究院 一种x射线干涉仪及成像系统
JP7200816B2 (ja) * 2019-04-22 2023-01-10 株式会社島津製作所 Ｘ線位相イメージング装置およびｘ線位相コントラスト画像生成方法
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CN104582573B (zh) 2018-09-28
US9717470B2 (en) 2017-08-01
US20150216499A1 (en) 2015-08-06
BR112015003425A2 (pt) 2017-07-04
JP2015529510A (ja) 2015-10-08
WO2014030115A1 (en) 2014-02-27
EP2884899B1 (en) 2017-04-26
EP2884899A1 (en) 2015-06-24
JP6173457B2 (ja) 2017-08-02
RU2015109738A (ru) 2016-10-10
CN104582573A (zh) 2015-04-29

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