JP6126627B2 - ミラー配置、特にマイクロリソグラフィ投影露光装置で使用するミラー配置 - Google Patents
ミラー配置、特にマイクロリソグラフィ投影露光装置で使用するミラー配置 Download PDFInfo
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- JP6126627B2 JP6126627B2 JP2014552605A JP2014552605A JP6126627B2 JP 6126627 B2 JP6126627 B2 JP 6126627B2 JP 2014552605 A JP2014552605 A JP 2014552605A JP 2014552605 A JP2014552605 A JP 2014552605A JP 6126627 B2 JP6126627 B2 JP 6126627B2
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- mirror arrangement
- mirror
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- flexures
- projection exposure
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- 238000005286 illumination Methods 0.000 claims description 12
- 230000003287 optical effect Effects 0.000 claims description 12
- 238000001816 cooling Methods 0.000 claims description 11
- 238000003466 welding Methods 0.000 claims description 9
- 210000001747 pupil Anatomy 0.000 claims description 8
- 238000005304 joining Methods 0.000 claims description 7
- 239000000463 material Substances 0.000 claims description 5
- 229910010293 ceramic material Inorganic materials 0.000 claims description 4
- 238000001393 microlithography Methods 0.000 claims description 3
- 238000001900 extreme ultraviolet lithography Methods 0.000 claims description 2
- 229910000679 solder Inorganic materials 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000007769 metal material Substances 0.000 description 2
- 238000001259 photo etching Methods 0.000 description 2
- 238000005476 soldering Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910000881 Cu alloy Inorganic materials 0.000 description 1
- 238000004581 coalescence Methods 0.000 description 1
- 239000012809 cooling fluid Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
- G02B26/0825—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a flexible sheet or membrane, e.g. for varying the focus
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/702—Reflective illumination, i.e. reflective optical elements other than folding mirrors, e.g. extreme ultraviolet [EUV] illumination systems
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
- G02B26/0833—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
- G02B7/18—Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors
- G02B7/182—Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors for mirrors
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70075—Homogenization of illumination intensity in the mask plane by using an integrator, e.g. fly's eye lens, facet mirror or glass rod, by using a diffusing optical element or by beam deflection
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70808—Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
- G03F7/70825—Mounting of individual elements, e.g. mounts, holders or supports
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Mounting And Adjusting Of Optical Elements (AREA)
Description
本願は、2012年1月19日付けで出願された独国特許出願第10 2012 200 736.9号及び2012年1月19日付けで出願された米国特許出願第61/588,226号の優先権を主張する。これらの出願の内容は参照により本明細書に援用される。
-複数の個々のミラーと、
-複数のフレキシャであって、前記個々のミラーの各々が、前記フレキシャの1つにより少なくとも1つの傾斜軸回りに傾斜可能な該複数のフレキシャと
を備え、
-前記フレキシャが共通部品に合体されているミラー配置。
Claims (15)
- ミラー配置、特にマイクロリソグラフィ投影露光装置で使用するミラー配置であって、
複数の個々のミラー(101, 102, 103, 104,…)と、
複数のフレキシャ(151, 152, 153, 154,…)であって、前記個々のミラー(101, 102, 103, 104,…)の各々が、前記フレキシャの1つにより少なくとも1つの傾斜軸回りに傾斜可能な該複数のフレキシャと
を備え、
前記フレキシャ(151, 152, 153, 154,…)が共通部品に合体され、
前記個々のミラー(101, 102, 103, 104,…)は着脱自在に前記共通部品に接合され、さらに
前記個々のミラー(101, 102, 103, 104,…)は、該個々のミラー(101, 102, 103, 104,…)を作動するために要求される追加の機械的機能性を持たない純粋な光学部品であるミラー配置。 - 請求項1に記載のミラー配置であって、ファセットミラー、特にマイクロリソグラフィ投影露光装置の照明装置の瞳ファセットミラーであることを特徴とするミラー配置。
- 請求項1又は2に記載のミラー配置であって、この着脱自在な接合はクランプ接合により実施されていることを特徴とするミラー配置。
- 請求項1〜3の何れか一項に記載のミラー配置であって、前記フレキシャ(151, 152, 153, 154,…)は板ばね式フレキシャの態様で実施されていることを特徴とするミラー配置。
- 請求項4に記載のミラー配置であって、前記板ばね式フレキシャは、前記共通部品を形成するフレキシャプレート(150)の態様で実施されていることを特徴とするミラー配置。
- 請求項1〜5の何れか一項に記載のミラー配置であって、前記共通部品は領域的及び固定的にキャリア(110)に接合されていることを特徴とするミラー配置。
- 請求項6に記載のミラー配置であって、この領域的接合はハンダ接合又は溶接接合により実施されていることを特徴とするミラー配置。
- 請求項6又は7に記載のミラー配置であって、前記キャリア(110)は該ミラー配置を冷却するための冷却装置の構成部品であることを特徴とするミラー配置。
- 請求項1〜8の何れか一項に記載のミラー配置であって、各々の前記フレキシャ(151, 152, 153, 154,…)は、各々に割り当てられた個々のミラー(101, 102, 103, 104,…)を2つの回転自由度(Rx, Ry)で作動可能であることを特徴とするミラー配置。
- 請求項1〜9の何れか一項に記載のミラー配置であって、各々の前記フレキシャ(151, 152, 153, 154,…)は、各々に割り当てられた個々のミラー(101, 102, 103, 104,…)を1つの並進自由度(z)で作動可能であることを特徴とするミラー配置。
- 請求項1〜10の何れか一項に記載のミラー配置であって、前記個々のミラー(101, 102, 103, 104,…)及び前記共通部品は、互いに異なる材料から製造されていることを特徴とするミラー配置。
- 請求項1〜11の何れか一項に記載のミラー配置であって、前記個々のミラー(101, 102, 103, 104,…)はセラミック材料から製造されていることを特徴とするミラー配置。
- 請求項1〜12の何れか一項に記載のミラー配置であって、ファセットミラー、特に照明装置の瞳ファセットミラーであることを特徴とするミラー配置。
- マイクロリソグラフィ投影露光装置の光学系であって、前記光学系は請求項1〜13の何れか一項に記載のミラー配置を有することを特徴とする光学系。
- マイクロリソグラフィ投影露光装置、特にEUVリソグラフィ用のマイクロリソグラフィ投影露光装置であって、請求項14に記載の光学系を有することを特徴とするマイクロリソグラフィ投影露光装置。
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201261588226P | 2012-01-19 | 2012-01-19 | |
DE102012200736A DE102012200736A1 (de) | 2012-01-19 | 2012-01-19 | Spiegelanordnung, insbesondere zum Einsatz in einer mikrolithographischen Projektionsbelichtungsanlage |
US61/588,226 | 2012-01-19 | ||
DE102012200736.9 | 2012-01-19 | ||
PCT/EP2013/050721 WO2013107762A1 (en) | 2012-01-19 | 2013-01-16 | Mirror arrangement, in particular for use in a microlithographic projection exposure apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2015505642A JP2015505642A (ja) | 2015-02-23 |
JP6126627B2 true JP6126627B2 (ja) | 2017-05-10 |
Family
ID=48742336
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2014552605A Active JP6126627B2 (ja) | 2012-01-19 | 2013-01-16 | ミラー配置、特にマイクロリソグラフィ投影露光装置で使用するミラー配置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US20140293255A1 (ja) |
EP (1) | EP2805204B1 (ja) |
JP (1) | JP6126627B2 (ja) |
KR (1) | KR102049618B1 (ja) |
DE (1) | DE102012200736A1 (ja) |
WO (1) | WO2013107762A1 (ja) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102014219770A1 (de) | 2014-09-30 | 2016-03-31 | Carl Zeiss Smt Gmbh | Spiegelanordnung, insbesondere für eine mikrolithographische Projektionsbelichtungsanlage, sowie Verfahren zur Ableitung eines Wärmestromes aus dem Bereich einer Spiegelanordnung |
DE102016217735A1 (de) * | 2016-09-16 | 2018-03-22 | Carl Zeiss Smt Gmbh | Komponente für eine Spiegelanordnung für die EUV-Lithographie |
DE102018123328B4 (de) | 2018-09-21 | 2022-09-08 | Carl Zeiss Smt Gmbh | Baugruppe eines optischen Systems, insbesondere in einer mikrolithographischen Projektionsbelichtungsanlage, sowie Verfahren zum Betreiben eines solchen optischen Systems |
Family Cites Families (22)
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US4202605A (en) * | 1979-04-05 | 1980-05-13 | Rockwell International Corporation | Active segmented mirror |
DE19504568A1 (de) * | 1995-02-11 | 1996-08-14 | Zeiss Carl Fa | Kippspiegelanordnung |
DE19739879A1 (de) * | 1996-09-19 | 1998-03-26 | Zeiss Carl Fa | Kippvorrichtung |
US6431714B1 (en) * | 2000-10-10 | 2002-08-13 | Nippon Telegraph And Telephone Corporation | Micro-mirror apparatus and production method therefor |
JP3724432B2 (ja) * | 2001-04-19 | 2005-12-07 | 株式会社ニコン | 薄膜弾性構造体及びその製造方法並びにこれを用いたミラーデバイス及び光スイッチ |
US7090362B2 (en) * | 2001-11-09 | 2006-08-15 | Carl Zeiss Smt Ag | Facet mirror having a number of mirror facets |
EP1472562B1 (de) * | 2002-02-09 | 2010-04-14 | Carl Zeiss SMT AG | Facettenspiegel mit mehreren spiegelfacetten |
JP4025990B2 (ja) * | 2002-09-26 | 2007-12-26 | セイコーエプソン株式会社 | ミラーデバイス、光スイッチ、電子機器およびミラーデバイス駆動方法 |
US8115986B2 (en) * | 2004-08-14 | 2012-02-14 | Silicon Quest Kabushiki-Kaisha | Mirror device comprising drive electrode equipped with stopper function |
US7136214B2 (en) * | 2004-11-12 | 2006-11-14 | Asml Holding N.V. | Active faceted mirror system for lithography |
US7355677B2 (en) * | 2004-12-09 | 2008-04-08 | Asml Netherlands B.V. | System and method for an improved illumination system in a lithographic apparatus |
US7548302B2 (en) * | 2005-03-29 | 2009-06-16 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7643196B2 (en) * | 2005-12-16 | 2010-01-05 | The Charles Stark Draper Laboratory, Inc. | Systems, methods and devices for actuating a moveable miniature platform |
US7528933B2 (en) * | 2006-04-06 | 2009-05-05 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method utilizing a MEMS mirror with large deflection using a non-linear spring arrangement |
US7697115B2 (en) * | 2006-06-23 | 2010-04-13 | Asml Holding N.V. | Resonant scanning mirror |
DE102008009600A1 (de) | 2008-02-15 | 2009-08-20 | Carl Zeiss Smt Ag | Facettenspiegel zum Einsatz in einer Projektionsbelichtungsanlage für die Mikro-Lithographie |
DE102009000099A1 (de) * | 2009-01-09 | 2010-07-22 | Carl Zeiss Smt Ag | Mikrospiegelarray mit Doppelbiegebalken Anordnung und elektronischer Aktorik |
DE102008049556B4 (de) * | 2008-09-30 | 2011-07-07 | Carl Zeiss SMT GmbH, 73447 | Mikrolithographische Projektionsbelichtungsanlage |
KR101769157B1 (ko) * | 2008-10-20 | 2017-08-17 | 칼 짜이스 에스엠테 게엠베하 | 방사선 빔 안내를 위한 광학 모듈 |
DE102009014701A1 (de) * | 2009-03-27 | 2010-09-30 | Carl Zeiss Smt Ag | Optische Baugruppe |
US8128246B1 (en) * | 2009-07-22 | 2012-03-06 | Exelis, Inc. | Fast steering mirror |
DE102010025222A1 (de) * | 2010-06-23 | 2011-12-29 | Carl Zeiss Smt Gmbh | Steuerbare Spiegelanordnung, optisches System mit einer steuerbaren Spiegelanordnung und Verfahren zur Ansteuerung einer steuerbaren Spiegelanordnung |
-
2012
- 2012-01-19 DE DE102012200736A patent/DE102012200736A1/de not_active Ceased
-
2013
- 2013-01-16 WO PCT/EP2013/050721 patent/WO2013107762A1/en active Application Filing
- 2013-01-16 EP EP13705402.9A patent/EP2805204B1/en active Active
- 2013-01-16 JP JP2014552605A patent/JP6126627B2/ja active Active
- 2013-01-16 KR KR1020147019741A patent/KR102049618B1/ko active IP Right Grant
-
2014
- 2014-06-13 US US14/303,734 patent/US20140293255A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
KR102049618B1 (ko) | 2019-11-28 |
JP2015505642A (ja) | 2015-02-23 |
US20140293255A1 (en) | 2014-10-02 |
EP2805204A1 (en) | 2014-11-26 |
KR20140123047A (ko) | 2014-10-21 |
EP2805204B1 (en) | 2019-09-11 |
DE102012200736A1 (de) | 2013-07-25 |
WO2013107762A1 (en) | 2013-07-25 |
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R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |