JP6057303B2 - Electronic component process processing apparatus, process processing method, and process processing program - Google Patents

Electronic component process processing apparatus, process processing method, and process processing program Download PDF

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JP6057303B2
JP6057303B2 JP2014115846A JP2014115846A JP6057303B2 JP 6057303 B2 JP6057303 B2 JP 6057303B2 JP 2014115846 A JP2014115846 A JP 2014115846A JP 2014115846 A JP2014115846 A JP 2014115846A JP 6057303 B2 JP6057303 B2 JP 6057303B2
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和彦 井浦
和彦 井浦
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Ueno Seiki Co Ltd
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Description

本発明は、例えば、半導体素子などの電子部品の搬送過程において、工程処理を行うための工程処理装置及び工程処理方法並びに工程処理用プログラムに関する。   The present invention relates to a process processing apparatus, a process processing method, and a process processing program for performing process processing, for example, in the process of transporting an electronic component such as a semiconductor element.

半導体素子は、前工程と呼ばれるプロセスで、Siウェハ上に多数作成された後、後工程と呼ばれるプロセスにて個片に分離され、電気特性試験、特性分類、マーキング、外観検査等の工程を経た後、テープ、コンテナチューブなどに梱包されて出荷される。   A number of semiconductor elements are produced on a Si wafer in a process called a pre-process, and then separated into individual pieces in a process called a post-process, and then subjected to steps such as electrical property testing, property classification, marking, and appearance inspection. After that, they are packed in a tape or container tube and shipped.

このような半導体素子は、個片に分離された後の工程において、保持機構に保持されて搬送機構により搬送され、搬送経路に沿って設けられた各工程処理部において、各種の処理を施される。搬送機構による搬送方法としては、直線搬送、ターンテーブル搬送等が用いられるが、いずれの場合でも、保持機構を所定の工程順に従って進行させるステップと、各工程処理部において半導体素子の処理開始から終了まで保持機構を停止させるステップを繰り返す、いわゆる間欠搬送が用いられることが多い。   Such a semiconductor element is held by a holding mechanism and transported by a transport mechanism in a process after being separated into individual pieces, and various processes are performed in each process processing unit provided along the transport path. The As the transfer method by the transfer mechanism, linear transfer, turntable transfer, etc. are used. In any case, the step of moving the holding mechanism according to a predetermined process order and the end of the process of the semiconductor element in each process processing unit In many cases, so-called intermittent conveyance is used in which the step of stopping the holding mechanism is repeated.

ところで、上記のような間欠搬送による工程処理には、長い処理時間への対応、高速化が困難となるという問題がある。まず、1搬送サイクル時間=搬送時間+搬送停止時間であり、停止時間>最大工程処理時間+受け渡し時間である。ここで、最大工程処理時間を70ms、停止時間中の受け渡し時間を20msとすると、停止時間の下限は90msとなる。そして、搬送時間を30msとすると、1搬送サイクル時間の下限は120msとなり、これ以上の高速化は困難である。   By the way, the process processing by intermittent conveyance as described above has a problem that it is difficult to cope with a long processing time and to increase the speed. First, 1 transport cycle time = transport time + transport stop time, and stop time> maximum process processing time + delivery time. Here, if the maximum process processing time is 70 ms and the delivery time during the stop time is 20 ms, the lower limit of the stop time is 90 ms. If the transport time is 30 ms, the lower limit of one transport cycle time is 120 ms, and it is difficult to increase the speed further.

このように、高速化が困難となる理由としては、以下のものが挙げられる。
(1)機構上の制約から、搬送、停止を搬送機構全体で同時に行う必要がある。このため、最大工程処理時間で停止時間を決めざるを得ず、搬送停止時間を律速する。
(2)搬送の高速化で生産性を向上させてきたが、限界に達しつつある。
(3)例えば、複雑なテストサイクルが要求される電気特性検査のように、長い処理が必要な工程が含まれる場合には、最大処理時間が長くなり、1搬送サイクル時間はさらに長くなる。
As described above, the reasons why it is difficult to increase the speed include the following.
(1) Due to mechanical limitations, it is necessary to simultaneously carry and stop the entire carrying mechanism. For this reason, the stop time must be determined by the maximum process processing time, and the transport stop time is limited.
(2) Although productivity has been improved by speeding up the transfer, it is reaching its limit.
(3) For example, when a process that requires a long process is included, such as an electrical characteristic inspection that requires a complicated test cycle, the maximum processing time becomes longer and the one transport cycle time becomes longer.

これに対処するため、特許文献1に開示されたような工程処理装置が提案されている。これは、複数の半導体素子を並行して搬送しながら、工程処理も並列で行う装置であり、搬送も工程処理も並列で行うために、全体としての生産性が高まるというものである。また、搬送経路上に同一工程の処理機構を複数配置し、並列して工程処理を行う方法、すなわち、搬送=1個毎、工程処理=並列で行う方法も考えられる。   In order to cope with this, a process processing apparatus as disclosed in Patent Document 1 has been proposed. This is an apparatus for carrying out process processing in parallel while carrying a plurality of semiconductor elements in parallel, and carrying out and carrying out process processing in parallel increases productivity as a whole. Also, a method of arranging a plurality of processing mechanisms for the same process on the transport path and performing process processing in parallel, that is, a method of performing transport = one by one and process processing = parallel, can be considered.

また、特許文献2には、以下のような工程処理技術が開示されている。この工程処理技術は、工程処理部に処理機構を複数設け、半導体素子を保持機構から処理機構の一つに受け渡した後、受け渡し場所とは別の場所に移動させて、工程処理を行う。これにより、半導体素子の保持機構から処理機構への受け渡しと、処理機構から保持機構への受け渡しとを、別のサイクルで行うことができる。このような従来技術によれば、処理機構の移動時間を、搬送機構の搬送時間よりも短くできるので、同じサイクルタイムであっても、従来より工程処理時間を長くすることが可能となる。   Patent Document 2 discloses the following process technology. In this process processing technique, a plurality of processing mechanisms are provided in a process processing unit, and after transferring a semiconductor element from a holding mechanism to one of the processing mechanisms, the process is performed by moving the semiconductor element to a place different from the delivery place. Thereby, the delivery from the holding mechanism of the semiconductor element to the processing mechanism and the delivery from the processing mechanism to the holding mechanism can be performed in different cycles. According to such a conventional technique, since the moving time of the processing mechanism can be made shorter than the conveying time of the conveying mechanism, it is possible to make the process processing time longer than in the prior art even with the same cycle time.

さらに、特許文献3には、複数の処理機構と保持機構を、電子部品の搬送方向に複数設けて、いずれかの保持機構から処理機構へ電子部品を渡し、他のいずれかの保持機構が処理機構から電子部品を受け取る工程処理装置が提案されている。かかる装置においては、処理機構の数を増やすことにより、処理機構による工程処理時間を長く確保することができる。   Further, in Patent Document 3, a plurality of processing mechanisms and holding mechanisms are provided in the electronic component transport direction, and the electronic component is transferred from one holding mechanism to the processing mechanism, and any other holding mechanism performs processing. A process processing apparatus that receives an electronic component from a mechanism has been proposed. In such an apparatus, by increasing the number of processing mechanisms, it is possible to secure a long process time for the processing mechanisms.

例えば、特許文献3の図9に示す例では、3つの処理機構を備え、隣接する保持機構の3つのうち1つが電子部品を保持した状態で搬送し、9回の停止回数のうち1回の割り合いで電子部品の受け渡し及び受け取りを行うことができる。図10に示す例では、4つの処理機構を備え、隣接する保持機構の4つのうち2つが電子部品を保持した状態で搬送し、4回の停止回数のうち1回の割り合いで、電子部品の受け渡し及び受け取りを行うことができる。
特開平5−229509号公報 国際公開WO02/065824号公報 国際公開WO05/015630号公報
For example, in the example shown in FIG. 9 of Patent Document 3, three processing mechanisms are provided, and one of three adjacent holding mechanisms is transported in a state of holding an electronic component, and is one out of nine stop times. Electronic parts can be delivered and received in proportion. In the example shown in FIG. 10, four processing mechanisms are provided, two of the four holding mechanisms adjacent to each other are transported in a state in which the electronic component is held, and the electronic component is divided by one out of four stop times. Can be delivered and received.
JP-A-5-229509 International Publication WO02 / 0665824 International Publication WO05 / 015630

しかしながら、上記のような従来技術には、以下のような問題があった。すなわち、特許文献1に開示されたように並列処理を行う技術では、処理時間が短くて済む工程であっても、工程処理の長い工程と同数の処理機構を配置しなくてはならず、無駄が生じて装置のコストを増加させることになる。また、かかる並列処理のための高コスト化とともに、並列搬送のために搬送機構が複雑化し、装置稼働の信頼性の低下を招く可能性もある。そして、搬送機構の慣性質量増大による駆動力増加、ランニングコスト増大につながる。   However, the prior art as described above has the following problems. That is, in the technology for performing parallel processing as disclosed in Patent Document 1, even in a process that requires a short processing time, the same number of processing mechanisms as in a process with a long process must be arranged, which is wasteful. Will increase the cost of the device. In addition to the increase in cost for such parallel processing, the transport mechanism may be complicated for parallel transport, leading to a decrease in reliability of apparatus operation. And it leads to an increase in driving force and an increase in running cost due to an increase in inertial mass of the transport mechanism.

次に、特許文献2に開示された発明では、上記のような工程処理機構の複雑化、装置稼働信頼性の低下、高コスト化という問題があるとともに、処理機構を工程処理部内で移動させるため、処理条件の不安定化、電気特性測定時のインピーダンス変動による高周波特性測定の精度低下を招くとともに、処理機構の移動時間の分だけ工程処理時間が短くなる。さらに、工程処理機構が大型化すると、搬送経路に沿って複数の工程処理機構を並べることができず、生産性をさらに向上させることが困難となる。   Next, in the invention disclosed in Patent Document 2, there is a problem that the process processing mechanism is complicated as described above, the apparatus operation reliability is lowered, and the cost is increased, and the processing mechanism is moved in the process processing unit. In addition, the processing conditions become unstable and the accuracy of high-frequency characteristic measurement is reduced due to impedance fluctuations during electrical characteristic measurement, and the process processing time is shortened by the movement time of the processing mechanism. Further, when the process processing mechanism is enlarged, a plurality of process processing mechanisms cannot be arranged along the transport path, and it becomes difficult to further improve productivity.

さらに、特許文献3に開示された発明では、図9の例の場合、保持機構の3つのうちの1つが電子部品を保持した状態で搬送することになる。また、図10の例の場合でも、保持機構の2つのうちの1つが電子部品を保持した状態で搬送することになる。このため、これらの例では、電子部品を保持せずに空いている保持機構が多くなり、搬送効率が良くない。   Further, in the invention disclosed in Patent Document 3, in the case of the example of FIG. 9, one of the three holding mechanisms carries the electronic component while being held. Also in the example of FIG. 10, one of the two holding mechanisms carries the electronic component in a held state. For this reason, in these examples, the holding | maintenance mechanisms which are vacant without holding an electronic component increase, and conveyance efficiency is not good.

本発明は、以上のような従来技術の問題点を解決するために提案されたものであり、その目的は、追加機構が少なく低コストで、工程処理時間を長く確保することができるとともに、電子部品の搬送効率及び処理効率に優れた電子部品の工程処理装置及び工程処理方法並びに工程処理用プログラムを提供することにある。   The present invention has been proposed in order to solve the above-described problems of the prior art, and its purpose is to reduce the number of additional mechanisms and to reduce the cost, and to ensure a long process time, An object of the present invention is to provide a process processing apparatus, a process processing method, and a process processing program for an electronic component that are excellent in parts conveyance efficiency and processing efficiency.

上記の目的を達成するため、本発明の電子部品の工程処理装置は、電子部品を保持する保持機構を複数備え、前記保持機構を進行及び停止させるサイクルを繰り返しながら搬送経路上の各停止位置に前記電子部品を搬送する搬送部と、電子部品に工程処理を施す処理機構を備え、前記停止位置に対応する位置に前記処理機構が配置された処理部と、前記保持機構を個別に昇降させる駆動機構と、を備え、前記処理部は、複数の同種の処理機構及び前記同種の処理機構以外の処理機構を備え、前記駆動機構は、全ての同種の処理機構に電子部品を同時に圧着して設置し、かつ、当該同種の処理機構による工程処理中も押圧し、電子部品の処理が終了した後、全ての同種の処理機構から電子部品を同時に解放し、前記同種の処理機構以外の処理機構は、前記同種の処理機構の搬送停止時間内に処理を行い、前記駆動機構は、前記同種の処理機構に対応する位置の保持機構と、前記同種の処理機構以外の処理機構に対応する位置の保持機構とを、異なる動作パターンで昇降させるものであり、前記同種の処理機構に対する各保持機構の上昇開始以前に、前記同種の処理機構以外の処理機構に対する保持機構の上昇を開始すること、を特徴とする。 In order to achieve the above object, the electronic component process processing apparatus of the present invention includes a plurality of holding mechanisms for holding electronic components, and repeats a cycle for advancing and stopping the holding mechanisms at each stop position on the conveyance path. A transport unit that transports the electronic component, a processing mechanism that performs a process on the electronic component, a processing unit in which the processing mechanism is arranged at a position corresponding to the stop position, and a drive that moves the holding mechanism up and down individually And the processing unit includes a plurality of processing mechanisms other than the same processing mechanism and the processing mechanism other than the same processing mechanism, and the drive mechanism is installed by simultaneously crimping electronic components to all the same processing mechanisms. In addition, after the processing of the electronic component is finished by pressing during the process processing by the same type of processing mechanism, the electronic components are simultaneously released from all the same type of processing mechanisms, and the processing machines other than the same type of processing mechanism Performs processing to the transport stop time of the same type of processing mechanism, wherein the drive mechanism includes a holding mechanism at a position corresponding to the processing mechanism of the same type, the position corresponding to the processing mechanism other than the processing mechanisms of the same type The holding mechanism is moved up and down in different operation patterns, and before the raising of each holding mechanism with respect to the same type of processing mechanism is started, the raising of the holding mechanism with respect to a processing mechanism other than the same type of processing mechanism is started. Features.

本発明の電子部品の工程処理方法は、電子部品を保持する複数の保持機構が、進行及び停止するサイクルを繰り返しながら電子部品を搬送し、前記保持機構を個別に昇降させ、処理部の処理機構が電子部品に工程処理を施す電子部品の工程処理方法において、前記処理部は、複数の同種の処理機構及び前記同種の処理機構以外の処理機構を備え、同種の処理機構に対応する位置に来た保持機構は、全ての同種の処理機構に電子部品を同時に圧着して設置し、かつ、当該同種の処理機構による工程処理中も押圧し、電子部品の処理が終了した後、全ての同種の処理機構から電子部品を同時に解放し、前記同種の処理機構以外の処理機構は、前記同種の処理機構の搬送停止時間内に処理を行い、前記同種の処理機構に対応する位置の保持機構と、前記同種の処理機構以外の処理機構に対応する位置の保持機構とを、異なる動作パターンで昇降させる制御であって、前記同種の処理機構に対する各保持機構の上昇開始以前に、前記同種の処理機構以外の処理機構に対する保持機構の上昇を開始すること、を特徴とする。 According to the electronic component process processing method of the present invention, the plurality of holding mechanisms for holding the electronic components convey the electronic components while repeating the cycle of advancement and stop, and individually raise and lower the holding mechanisms, thereby processing the processing mechanism of the processing unit. In the electronic component process processing method for performing an electronic component process, the processing unit includes a plurality of similar processing mechanisms and a processing mechanism other than the same processing mechanism, and comes to a position corresponding to the same processing mechanism. The holding mechanism is installed by pressing and bonding electronic parts to all the same type of processing mechanisms at the same time, and pressing during the process processing by the same type of processing mechanism. released from the processing mechanism of electronic parts simultaneously processing mechanism other than the processing mechanisms of the same type, it performs the processing to the transfer stopping time of the same type of processing mechanism, and the position of the holding mechanism corresponding to the processing mechanism of the same kind, The position of the holding mechanism corresponding to the serial processing mechanism other than the processing mechanisms of the same type, a control for elevating at different operating patterns, to increase before the start of each holding mechanism for processing mechanism of the same type, the same type of processing mechanism The raising of the holding mechanism with respect to other processing mechanisms is started .

本発明の電子部品の工程処理用プログラムは、電子部品を保持する複数の保持機構に、進行及び停止するサイクルを繰り返しながら電子部品を搬送させる制御と、前記保持機構を個別に昇降させる制御と、処理部の処理機構に電子部品の工程処理をさせる制御とを、コンピュータに行わせる電子部品の工程処理用プログラムにおいて、前記処理部は、複数の同種の処理機構及び前記同種の処理機構以外の処理機構を備え、同種の処理機構に対応する位置に来た保持機構に、全ての同種の処理機構に電子部品を同時に圧着して設置させ、かつ、当該同種の処理機構による工程処理中も押圧させる制御と、電子部品の処理が終了した後、全ての同種の処理機構から電子部品を同時に解放させる制御と、前記同種の処理機構の搬送停止時間内に前記同種の処理機構以外の処理機構の処理を行う制御と、前記同種の処理機構に対応する位置の保持機構と、前記同種の処理機構以外の処理機構に対応する位置の保持機構とを、異なる動作パターンで昇降させる制御であって、前記同種の処理機構に対する各保持機構の上昇開始以前に、前記同種の処理機構以外の処理機構に対する保持機構の上昇を開始する制御と、をコンピュータに行わせることを特徴とする。 The electronic component process processing program of the present invention includes a control for transporting an electronic component to a plurality of holding mechanisms for holding the electronic component while repeating a cycle of proceeding and stopping, and a control for individually raising and lowering the holding mechanism, In the electronic component process processing program for causing the computer to perform control of causing the processing mechanism of the processing unit to process the electronic component, the processing unit includes a plurality of processing mechanisms other than the same processing mechanism. A holding mechanism provided with a mechanism and located at a position corresponding to the same type of processing mechanism is configured to press and install electronic components simultaneously on all the same type of processing mechanisms and to be pressed even during process processing by the same type of processing mechanism. control and, after the processing of the electronic component is completed, a control to release all of the same type of processing mechanism electronic components from the same time, the inside conveyance stop time of the same type of processing mechanism A control for performing processing of a processing mechanism other than a processing mechanism of a kind, a holding mechanism at a position corresponding to the processing mechanism of the same type, and a holding mechanism at a position corresponding to a processing mechanism other than the processing mechanism of the same type are operated differently. A control for moving up and down by a pattern, and causing a computer to perform control to start raising of a holding mechanism for a processing mechanism other than the same type of processing mechanism before starting to raise each holding mechanism for the same type of processing mechanism. It is characterized by.

また、電子部品の工程処理装置、電子部品の工程処理方法、又は電子部品の工程処理用プログラムの発明は、次の構成を備えるようにしても良い。
(1)前記電子部品は、半導体素子であり、前記同種の処理機構は、前記半導体素子に対し、電圧、電流、又は周波数の測定処理を行うものであること。
(2)複数の前記保持機構は連続して電子部品を保持するように設定されていること。
The invention of the electronic component process processing apparatus, the electronic component process processing method, or the electronic component process processing program may comprise the following configuration.
(1) The electronic component is a semiconductor element, and the processing mechanism of the same kind performs a measurement process of voltage, current, or frequency on the semiconductor element.
(2) The plurality of holding mechanisms are set so as to hold the electronic component continuously.

本発明によれば、追加機構が少なく低コストで、工程処理時間を長く確保することができるとともに、電子部品の搬送効率及び処理効率に優れた電子部品の工程処理装置及び工程処理方法並びに工程処理用プログラムを提供することができる。   ADVANTAGE OF THE INVENTION According to this invention, while being able to ensure long process processing time with few additional mechanisms and low cost, the electronic component process processing apparatus, the process processing method, and the process processing which were excellent in the conveyance efficiency and processing efficiency of an electronic component Program can be provided.

本発明の一実施形態を示す構成図である。It is a block diagram which shows one Embodiment of this invention. 図1の実施形態による電子部品の搬送手順を示す工程図(1)〜(4)である。It is process drawing (1)-(4) which shows the conveyance procedure of the electronic component by embodiment of FIG. 図1の実施形態による電子部品の搬送及び検査手順を示す工程図(5)〜(8)である。It is process drawing (5)-(8) which shows the conveyance and inspection procedure of the electronic component by embodiment of FIG. 図1の実施形態による電子部品の搬送及び検査手順を示す工程図(9)〜(12)である。It is process drawing (9)-(12) which shows the conveyance and inspection procedure of the electronic component by embodiment of FIG. 図1の実施形態による電子部品の搬送及び検査手順を示す工程図(13)〜(16)である。It is process drawing (13)-(16) which shows the conveyance and inspection procedure of the electronic component by embodiment of FIG. 図3〜5の工程図に対応するタイムチャートである。It is a time chart corresponding to the process drawing of FIGS. 図1の実施形態における処理手順を示すフローチャートである。It is a flowchart which shows the process sequence in embodiment of FIG.

[実施形態の構成]
本発明の実施形態を、図面を参照して説明する。すなわち、本実施形態は、図1に示すように、搬送部100、処理部200を備えている。搬送部100は、ターンテーブルTに等間隔で、例えば18個配設された吸着ノズル110を有している。吸着ノズル110は、図示しない真空源に接続され、この切替に応じて電子部品Sを一つずつ吸着及び解放する保持機構である。この吸着ノズル110は、図示しない駆動機構によって昇降可能に設けられ、処理部200に対して下降したときに、電子部品Sを処理部200に押し付けた状態で処理を行わせ、上昇したときに電子部品Sを処理部200から解放するように構成されている。
[Configuration of the embodiment]
Embodiments of the present invention will be described with reference to the drawings. That is, the present embodiment includes a transport unit 100 and a processing unit 200 as shown in FIG. The transport unit 100 includes, for example, 18 suction nozzles 110 arranged on the turntable T at regular intervals. The suction nozzle 110 is connected to a vacuum source (not shown), and is a holding mechanism that sucks and releases the electronic components S one by one in accordance with this switching. The suction nozzle 110 is provided so as to be movable up and down by a driving mechanism (not shown). When the suction nozzle 110 is lowered with respect to the processing unit 200, the electronic component S is pressed against the processing unit 200 and processed. The component S is configured to be released from the processing unit 200.

さらに、吸着ノズル110は、図示しない駆動機構によってターンテーブルTが間欠回転することにより、後述する処理機構1A〜4Aに対応する間隔で、図2〜図5に示す左から右の方向に前進した後、一時停止するという搬送サイクルを繰り返しながら、吸着された電子部品Sを搬送するように構成されている。なお、吸着ノズル110を移動させる機構は、ターンテーブルTでなくてもよく、例えば、直線搬送させるものや曲線搬送させるもの等、公知のあらゆる技術を適用できる。   Further, the suction nozzle 110 advances from the left to the right shown in FIGS. 2 to 5 at intervals corresponding to the processing mechanisms 1A to 4A described later by intermittently rotating the turntable T by a driving mechanism (not shown). Thereafter, the sucked electronic component S is transported while repeating a transport cycle of temporarily stopping. Note that the mechanism for moving the suction nozzle 110 does not have to be the turntable T, and for example, any known technique such as a straight-line conveyance or a curved-line conveyance can be applied.

処理部200は、搬送ラインにおける吸着ノズル110の下部に配設された4台の処理機構1A,2A,3A,4Aによって構成されている。各処理機構1A〜4Aは、電子部品(デバイス)Sの電気的テストを行う。つまり、各処理機構1A〜4Aは、デバイスの電極に接触して、デバイスの電圧、電流、抵抗又は周波数等の電気特性を測定するテストステーションである。これらの処理機構1A〜4Aは、各吸着ノズル110の停止位置に対応する位置に設置され、この位置においてテストコンタクト工程を構成する。   The processing unit 200 includes four processing mechanisms 1A, 2A, 3A, and 4A disposed below the suction nozzle 110 in the transport line. Each processing mechanism 1A to 4A performs an electrical test of the electronic component (device) S. In other words, each of the processing mechanisms 1A to 4A is a test station that measures electrical characteristics such as voltage, current, resistance, or frequency of the device by contacting the electrode of the device. These processing mechanisms 1 </ b> A to 4 </ b> A are installed at positions corresponding to the stop positions of the respective suction nozzles 110, and constitute a test contact process at this position.

さらに、ターンテーブルTにおける処理部200の上流の停止ポジションに対応する位置には、電子部品Sを各吸着ノズル110に供給するための供給装置300、電子部品Sの極性を判別するための極性判別装置400、極性判別に従って電子部品Sを反転させる反転装置500が配設されている。各装置は、ターンテーブルTに対して離間して水平配置されており、下降した吸着ノズル110に保持された電子部品Sに対して所定の処理を行うことができる。   Further, a supply device 300 for supplying the electronic component S to each suction nozzle 110 and a polarity determination for determining the polarity of the electronic component S at a position corresponding to the stop position upstream of the processing unit 200 in the turntable T. A device 400 and a reversing device 500 for reversing the electronic component S in accordance with polarity determination are arranged. Each device is horizontally disposed apart from the turntable T, and can perform a predetermined process on the electronic component S held by the lowered suction nozzle 110.

上記の供給装置300は、ボールフィーダ310並びにリニアフィーダ320から整列搬送されてくる電子部品Sを、エスケープから吸着ノズル110に受け渡すエスケープ工程を構成する。極性判別装置400は、電子部品Sの極性を判別する極性判別工程を構成する。反転装置500は、極性判別に基づいて、電子部品Sの極性を入れ替えるように回転させる左右反転工程を構成する。   The supply device 300 constitutes an escape process in which the electronic components S aligned and conveyed from the ball feeder 310 and the linear feeder 320 are delivered from the escape to the suction nozzle 110. The polarity discriminating apparatus 400 constitutes a polarity discriminating step for discriminating the polarity of the electronic component S. The reversing device 500 constitutes a left / right reversing process in which the polarity of the electronic component S is rotated based on polarity determination.

なお、これらの各装置は、処理機構1A〜4A以外の装置の例示に過ぎず、どのような装置を配置するか、その配置位置をどの停止ポジションとするか、処理部200の上流とするか下流とするか等は自由である。例えば、マーキング装置、外観検査装置、テーピング装置、不良品除去装置等、種々の装置を適用可能であり、これらを所望の箇所に配置することができる。   Each of these devices is merely an example of a device other than the processing mechanisms 1A to 4A. Which device is to be arranged, which stop position is to be placed, or whether it is upstream of the processing unit 200. Whether it is downstream or the like is free. For example, various devices such as a marking device, an appearance inspection device, a taping device, and a defective product removal device can be applied, and these can be arranged at a desired location.

上記のターンテーブルTの駆動機構、吸着ノズル110を昇降させる駆動機構、吸着ノズル110の真空源、処理部200の処理機構1A〜4A、供給装置300、極性判別装置400及び反転装置500等は、以下に説明する手順で作動するように、所定のプログラムによって動作するコンピュータ若しくは専用の回路から成る制御装置によって制御される。   The drive mechanism of the turntable T, the drive mechanism that raises and lowers the suction nozzle 110, the vacuum source of the suction nozzle 110, the processing mechanisms 1A to 4A of the processing unit 200, the supply device 300, the polarity determination device 400, the reversing device 500, etc. It is controlled by a control device comprising a computer or a dedicated circuit that operates according to a predetermined program so as to operate according to the procedure described below.

[実施形態の作用]
以上のような構成を有する本実施形態の動作を、図2〜図5の工程図、図6のタイムチャート、図7のフローチャートを参照して説明する。なお、ターンテーブルTは搬送時には1ポジションずつ移動するが、図3(7)、図5(14)に示すテストコンタクト工程では、テストに必要な時間停止する。また、図6における(5)〜(16)は、図3〜図5の(5)〜(16)に対応する。
[Operation of the embodiment]
The operation of the present embodiment having the above configuration will be described with reference to the process diagrams of FIGS. 2 to 5, the time chart of FIG. 6, and the flowchart of FIG. Note that the turntable T moves by one position at the time of conveyance, but in the test contact process shown in FIGS. 3 (7) and 5 (14), it is stopped for a time required for the test. Further, (5) to (16) in FIG. 6 correspond to (5) to (16) in FIGS.

まず、図2及び図6(b)に示すように、供給装置300によって供給される電子部品Sは、吸着ノズル110に一つずつ連続して吸着される(図2〜図5では、先頭の電子部品Sから順に0,1,2,3の連続番号を付している)。そして、吸着ノズル110は、ターンテーブルTが1ポジションずつ回転と停止を繰り返す間欠回転をすることにより、電子部品Sを搬送する。この過程で、図6(c)(d)に示すように、1ポジション毎に、極性判別装置400による極性判別、反転装置500によって極性を揃える反転処理が行われる。   First, as shown in FIG. 2 and FIG. 6B, the electronic components S supplied by the supply device 300 are successively sucked one by one by the suction nozzle 110 (in FIGS. The serial numbers 0, 1, 2, and 3 are assigned in order from the electronic component S). And the suction nozzle 110 conveys the electronic component S by carrying out the intermittent rotation which the turntable T repeats rotation and a stop for every position. In this process, as shown in FIGS. 6C and 6D, for each position, polarity determination by the polarity determination device 400 and reversal processing for aligning the polarity by the reversing device 500 are performed.

図2(1)〜(4)に示すように、吸着ノズル110が進行と停止を繰り返すことにより電子部品Sが搬送される過程で(ステップ01,02)、図3(5)に示すように、電子部品Sを吸着した4つの吸着ノズル110が、処理機構1A,2A,3A,4A上まで来て停止すると(ステップ03)、図3(6)に示すように、下降して電子部品Sを処理機構1A,2A,3A,4Aに圧着する(ステップ04)。すると、図3(7)に示すように、処理機構1A,2A,3A,4A上に電子部品Sが搭載され、電子部品Sの検査が開始される(ステップ05)。   As shown in FIGS. 2 (1) to (4), in the process in which the electronic component S is conveyed by the suction nozzle 110 being repeatedly moved and stopped (steps 01 and 02), as shown in FIG. 3 (5). When the four suction nozzles 110 that have sucked the electronic component S come to the processing mechanisms 1A, 2A, 3A, and 4A and stop (step 03), the electronic component S is lowered as shown in FIG. Are pressure-bonded to the processing mechanisms 1A, 2A, 3A, 4A (step 04). Then, as shown in FIG. 3 (7), the electronic component S is mounted on the processing mechanisms 1A, 2A, 3A, and 4A, and the inspection of the electronic component S is started (step 05).

次に、コンピュータが、記憶手段にあらかじめ設定された所定の検査時間の経過を検出すると(ステップ06)、図3(8)に示すように、4つの吸着ノズル110が上昇するので、処理の終了した電子部品Sが処理機構1A,2A,3A,4Aから解放される(ステップ07)。   Next, when the computer detects the elapse of a predetermined inspection time preset in the storage means (step 06), the four suction nozzles 110 are raised as shown in FIG. The electronic component S thus released is released from the processing mechanisms 1A, 2A, 3A, and 4A (step 07).

さらに、図4(9)〜(12)に示すように、再び吸着ノズル110の進行と停止が行われる(ステップ01,02)。そして、図5(13)に示すように、次の電子部品Sを吸着した4つの吸着ノズル110が、処理機構1A,2A,3A,4A上まで来て停止すると(ステップ03)、図5(14)に示すように、下降して電子部品Sを処理機構1A,2A,3A,4Aに圧着する(ステップ04)。すると、図5(15)に示すように、処理機構1A,2A,3A,4A上に電子部品Sが搭載され、電子部品Sの検査が開始される(ステップ05)。   Further, as shown in FIGS. 4 (9) to (12), the suction nozzle 110 is again advanced and stopped (steps 01 and 02). Then, as shown in FIG. 5 (13), when the four suction nozzles 110 that have picked up the next electronic component S come over the processing mechanisms 1A, 2A, 3A, and 4A (step 03), FIG. 14), the electronic component S is lowered and pressed against the processing mechanisms 1A, 2A, 3A, 4A (step 04). Then, as shown in FIG. 5 (15), the electronic component S is mounted on the processing mechanisms 1A, 2A, 3A, and 4A, and the inspection of the electronic component S is started (step 05).

次に、コンピュータが、記憶手段にあらかじめ設定された所定の検査時間の経過を検出すると(ステップ06)、図5(16)に示すように、4つの吸着ノズル110が上昇するので、処理の終了した電子部品Sが処理機構1A,2A,3A,4Aから解放される(ステップ07)。以上のように検査がなされた後、吸着ノズル110によって一つずつ連続して吸着された電子部品Sは、次工程へと順次搬送されていく。   Next, when the computer detects the elapse of a predetermined inspection time preset in the storage means (step 06), the four suction nozzles 110 are raised as shown in FIG. The electronic component S thus released is released from the processing mechanisms 1A, 2A, 3A, and 4A (step 07). After the inspection is performed as described above, the electronic components S continuously sucked one by one by the suction nozzle 110 are sequentially transported to the next process.

[実施形態の効果]
以上のような本実施形態によれば、吸着ノズル110が、4つの処理機構1A〜4Aにおいて同時に検査を行い、空送りを4ポジション分行う作業を繰り返すことにより、電子部品Sを1個ずつ検査する場合に比べて、電子部品Sの1個あたりの平均処理時間が短くなり、処理効率が向上する。したがって、比較的長い検査時間を要する電子部品Sであっても、高生産性を達成できる。
[Effect of the embodiment]
According to the present embodiment as described above, the suction nozzle 110 inspects the electronic components S one by one by repeating the inspection of the four processing mechanisms 1A to 4A at the same time and performing the idle feeding for four positions. Compared to the case, the average processing time per electronic component S is shortened, and the processing efficiency is improved. Therefore, even with the electronic component S that requires a relatively long inspection time, high productivity can be achieved.

また、進行及び停止サイクルの単位時間及び検査のための停止時間に、他の短い処理を行うことができる。これは、図6(b)〜(d)に示すように、1搬送サイクル時間における1回の停止時間と検査のための停止時間において、エスケープ工程、極性判別工程、左右反転工程を行っていることからも明らかである。従って、短時間で処理が完了する工程の処理機構を増やす必要がなく、装置コストの増加、装置稼働の信頼性の低下を最小限にとどめることができる。   Also, other short processes can be performed in the unit time of the advance and stop cycles and the stop time for inspection. As shown in FIGS. 6B to 6D, an escape process, a polarity determination process, and a left / right reversal process are performed in one stop time and one inspection stop time in one transport cycle time. It is clear from that. Therefore, it is not necessary to increase the number of processing mechanisms for completing the process in a short time, and an increase in apparatus cost and a decrease in reliability of apparatus operation can be minimized.

また、本実施形態によれば、搬送部100に手を加えずに、従来の工程処理装置の保持機構(吸着ノズル110等)の停止位置に、処理部200の処理機構を追加し、制御プログラム若しくはソフトウェアを変更するのみで実現できる。このため、従来装置、特に搬送部100や保持機構の設計を大幅に変更する必要がない。そして、従来装置と装置構成上の互換性が高く、従来装置から本実施形態への改造等が容易である。例えば、処理部200による処理時間は、ターンテーブルTの停止時間を変えることによって容易に調整できる。   Further, according to the present embodiment, the processing mechanism of the processing unit 200 is added to the stop position of the holding mechanism (such as the suction nozzle 110) of the conventional process processing apparatus without changing the transport unit 100, and the control program Or it can be realized only by changing the software. For this reason, it is not necessary to change the design of the conventional apparatus, in particular, the transport unit 100 and the holding mechanism. Further, the compatibility of the conventional apparatus with the apparatus configuration is high, and the modification from the conventional apparatus to the present embodiment is easy. For example, the processing time by the processing unit 200 can be easily adjusted by changing the stop time of the turntable T.

また、必要に応じて従来装置の形態で装置を稼動させることも容易である。さらに、設計の変更点が少なくて済むため、部品、ユニットの互換性を保つことができ、実績のある部品、ユニットの使用による装置稼働の信頼性の向上、装置コストの低下が可能となる。   It is also easy to operate the apparatus in the form of a conventional apparatus as required. Furthermore, since there are few design changes, the compatibility of components and units can be maintained, and the reliability of device operation can be improved and the device cost can be reduced by using proven components and units.

さらに、本実施形態では、全ての吸着ノズル110に連続して電子部品Sを吸着している状態で、処理機構1A〜4Aに電子部品Sを供給し、処理の終了した電子部品Sを次工程へと搬送させることができるので、特許文献3のように吸着ノズル110に電子部品Sを間欠的に吸着させて搬送させる場合に比べて、使用する吸着ノズル110の無駄がなく、搬送効率が向上し、次工程での処理もし易くなる。   Furthermore, in this embodiment, the electronic component S is supplied to the processing mechanisms 1A to 4A in a state in which the electronic component S is continuously sucked by all the suction nozzles 110, and the processed electronic component S is changed to the next process. Therefore, the suction nozzle 110 to be used is not wasted and transport efficiency is improved as compared with the case where the electronic component S is intermittently sucked and transported to the suction nozzle 110 as in Patent Document 3. In addition, it becomes easy to process in the next step.

[他の実施形態]
本発明は、上記のような実施形態に限定されるものではなく、各部材の具体的構造、配置、大きさ、形状、数、材質、種類等は適宜変更可能である。すなわち、処理機構は複数台あればよく、上記の実施形態よりも少なくても多くてもよい。また、吸着ノズルの個数も、ターンテーブルの停止ポジション数も上記の実施形態に例示されたものには限定されない。処理機構上への電子部品の設置方法については、上記のように下降する吸着ノズルによって処理機構上に押え付ける方法であっても、吸着ノズルから解放して処理機構上に載置する方法であってもよい。
[Other Embodiments]
The present invention is not limited to the embodiment described above, and the specific structure, arrangement, size, shape, number, material, type, and the like of each member can be changed as appropriate. That is, there may be a plurality of processing mechanisms, and there may be fewer or more than the above embodiment. Further, the number of suction nozzles and the number of stop positions of the turntable are not limited to those exemplified in the above embodiment. Regarding the method of installing the electronic component on the processing mechanism, even if it is a method of pressing on the processing mechanism by the suction nozzle that descends as described above, it is a method of releasing from the suction nozzle and placing it on the processing mechanism. May be.

また、保持機構は吸着ノズルには限定されず、例えば、機械的保持、静電吸着、ベルヌーイチャックなど、既知のいかなる方法を用いてもよい。駆動機構による保持機構の移動制御方式、移動経路(直線か曲線かを問わない)についても、特定のものには限定されない。移動タイミングの制御は、上記の実施形態のように行うこともできるし、機械的に実現することもできる。検査すべき電子部品を吸着した保持機構が処理機構上に来たかどうかは、単純には移動したポジション数をカウントすることによって判断することができるが、センサ等によって検出して判断してもよい。   Further, the holding mechanism is not limited to the suction nozzle, and any known method such as mechanical holding, electrostatic chucking, Bernoulli chuck, or the like may be used. The movement control method of the holding mechanism by the drive mechanism and the movement path (whether linear or curved) are not limited to specific ones. The control of the movement timing can be performed as in the above embodiment, or can be realized mechanically. Whether the holding mechanism that has attracted the electronic component to be inspected has come on the processing mechanism can be determined simply by counting the number of moved positions, but may be determined by detecting it with a sensor or the like. .

また、処理部が行う処理は、電気的な特性を測定するものには限定されず、電子部品に対する所定の処理を行うものが広く含まれる。さらに、本発明の処理対象は、半導体素子が代表的であるが、これに限らず、公知のあらゆる素子、部材、電子・電気部品、機械部品等に適用可能である。   Further, the processing performed by the processing unit is not limited to measuring electrical characteristics, and widely includes processing for performing predetermined processing on electronic components. Furthermore, the processing target of the present invention is typically a semiconductor element, but is not limited thereto, and can be applied to all known elements, members, electronic / electrical parts, mechanical parts, and the like.

また、本発明の電子部品の工程処理装置は、電子部品を保持する保持機構を備え、前記保持機構を進行及び停止させるサイクルを繰り返しながら電子部品を搬送する搬送部と、電子部品に工程処理を施す処理機構を備えた処理部とを有する電子部品の工程処理装置において、前記保持機構及び前記処理機構は、電子部品の搬送方向に複数設けられ、複数の処理機構に対応する位置に来た保持機構が、全ての処理機構に対して電子部品を同時に設置し、電子部品の処理が終了した後、全ての処理機構から電子部品を同時に解放するように設定されていても良い。   In addition, the electronic component process processing apparatus of the present invention includes a holding mechanism for holding the electronic component, and transports the electronic component while repeating a cycle for advancing and stopping the holding mechanism, and performs processing on the electronic component. In an electronic component process processing apparatus having a processing unit having a processing mechanism to be applied, a plurality of the holding mechanisms and the processing mechanisms are provided in a conveyance direction of the electronic component and are held at positions corresponding to the plurality of processing mechanisms. The mechanism may be set to simultaneously release the electronic components from all the processing mechanisms after the electronic components are installed simultaneously for all the processing mechanisms and the processing of the electronic components is completed.

また、本発明の電子部品の工程処理方法は、電子部品を保持する保持機構が、進行及び停止するサイクルを繰り返しながら電子部品を搬送し、処理機構が電子部品に工程処理を施す電子部品の工程処理方法において、前記保持機構及び前記処理機構は、電子部品の搬送方向に複数設けられ、複数の処理機構に対応する位置に来た保持機構が、全ての処理機構に対して電子部品を同時に設置し、電子部品の処理が終了した後、全ての処理機構から電子部品を同時に解放しても良い。   In addition, the electronic component process processing method of the present invention is an electronic component process in which the holding mechanism for holding the electronic component conveys the electronic component while repeating a cycle of progressing and stopping, and the processing mechanism processes the electronic component. In the processing method, a plurality of the holding mechanisms and the processing mechanisms are provided in the conveying direction of the electronic component, and the holding mechanism that comes to a position corresponding to the plurality of processing mechanisms simultaneously installs the electronic components for all the processing mechanisms. Then, after the processing of the electronic component is completed, the electronic component may be released simultaneously from all the processing mechanisms.

また、本発明の電子部品の工程処理用プログラムは、電子部品を保持する保持機構に、進行及び停止するサイクルを繰り返しながら電子部品を搬送させる制御と、処理機構に電子部品の工程処理をさせる制御とを、コンピュータに行わせる電子部品の工程処理用プログラムにおいて、前記保持機構及び前記処理機構は、電子部品の搬送方向に複数設けられ、複数の処理機構に対応する位置に来た保持機構に、全ての処理機構に対して電子部品を同時に設置させる制御と、電子部品の処理が終了した後、全ての処理機構から電子部品を同時に解放させる制御と、をコンピュータに行わせても良い。   In addition, the electronic component process processing program according to the present invention includes a control for causing the holding mechanism for holding the electronic component to convey the electronic component while repeating a cycle of advancement and stop, and a control for causing the processing mechanism to process the electronic component. In the electronic component process processing program to be executed by the computer, a plurality of the holding mechanisms and the processing mechanisms are provided in the conveying direction of the electronic components, and the holding mechanism comes to a position corresponding to the plurality of processing mechanisms. The computer may perform control for simultaneously installing electronic components for all processing mechanisms and control for simultaneously releasing electronic components from all processing mechanisms after the processing of the electronic components is completed.

以上のような発明では、複数の処理機構において同時に複数の電子部品の処理を行うことにより、電子部品を1個ずつ処理する場合に比べて、電子部品の1個あたりの平均処理時間が短くなり、処理効率が向上する。したがって、比較的長い処理時間を要する電子部品であっても、高生産性を達成できる。また、進行及び停止サイクルの単位時間及び処理機構による処理時間には、他の短い処理を済ませることができる。   In the invention as described above, by processing a plurality of electronic components simultaneously in a plurality of processing mechanisms, the average processing time per electronic component is shortened as compared with the case of processing each electronic component one by one. , Processing efficiency is improved. Therefore, high productivity can be achieved even for an electronic component that requires a relatively long processing time. In addition, other short processes can be completed in the unit time of the progress and stop cycles and the processing time by the processing mechanism.

また、電子部品の工程処理装置、電子部品の工程処理方法、又は電子部品の工程処理用プログラムの発明は、複数の前記保持機構は連続して電子部品を保持するように設定されていても良い。これにより、電子部品を保持する保持機構が連続しているので、使用する保持機構の無駄がなく、搬送効率が向上し、次工程での処理もし易くなる。   Moreover, in the invention of the electronic component process processing apparatus, the electronic component process processing method, or the electronic component process processing program, the plurality of holding mechanisms may be set so as to hold the electronic components continuously. . Thereby, since the holding mechanism for holding the electronic component is continuous, the holding mechanism to be used is not wasted, the conveyance efficiency is improved, and the processing in the next process is easy.

100…搬送部
110…吸着ノズル
200…処理部
300…供給装置
310…ボールフィーダ
320…リニアフィーダ
400…極性判別装置
500…反転装置
1A,2A,3A,4A…処理機構
DESCRIPTION OF SYMBOLS 100 ... Conveyance part 110 ... Adsorption nozzle 200 ... Processing part 300 ... Supply apparatus 310 ... Ball feeder 320 ... Linear feeder 400 ... Polarity discrimination apparatus 500 ... Inversion apparatus 1A, 2A, 3A, 4A ... Processing mechanism

Claims (9)

電子部品を保持する保持機構を複数備え、前記保持機構を進行及び停止させるサイクルを繰り返しながら搬送経路上の各停止位置に前記電子部品を搬送する搬送部と、
電子部品に工程処理を施す処理機構を備え、前記停止位置に対応する位置に前記処理機構が配置された処理部と、
前記保持機構を個別に昇降させる駆動機構と、
を備え、
前記処理部は、複数の同種の処理機構及び前記同種の処理機構以外の処理機構を備え、
前記駆動機構は、全ての同種の処理機構に電子部品を同時に圧着して設置し、かつ、当該同種の処理機構による工程処理中も押圧し、電子部品の処理が終了した後、全ての同種の処理機構から電子部品を同時に解放し、
前記同種の処理機構以外の処理機構は、前記同種の処理機構の搬送停止時間内に処理を行い、
前記駆動機構は、前記同種の処理機構に対応する位置の保持機構と、前記同種の処理機構以外の処理機構に対応する位置の保持機構とを、異なる動作パターンで昇降させるものであり、前記同種の処理機構に対する各保持機構の上昇開始以前に、前記同種の処理機構以外の処理機構に対する保持機構の上昇を開始すること、
を特徴とする電子部品の工程処理装置。
A plurality of holding mechanisms for holding electronic components, a transport unit that transports the electronic components to each stop position on a transport path while repeating a cycle for advancing and stopping the holding mechanism,
A processing unit that performs processing on the electronic component, and a processing unit in which the processing mechanism is disposed at a position corresponding to the stop position;
A drive mechanism that individually raises and lowers the holding mechanism;
With
The processing unit includes a plurality of processing mechanisms other than the same processing mechanism and the same processing mechanism.
The drive mechanism is installed by pressing and bonding electronic components to all the same type of processing mechanisms at the same time, and pressing during the process processing by the same type of processing mechanism, and after the processing of the electronic components is completed, Release electronic components from the processing mechanism at the same time,
A processing mechanism other than the same type of processing mechanism performs processing within the conveyance stop time of the same type of processing mechanism,
The drive mechanism includes a holding mechanism at a position corresponding to the processing mechanism of the same type, the position of the holding mechanism corresponding to the processing mechanism other than the processing mechanisms of the same kind, which raises and lowers at different operating patterns, the same type Starting the raising of the holding mechanism for the processing mechanisms other than the same type of processing mechanism before starting the raising of each holding mechanism for the processing mechanism of
An electronic component process processing apparatus characterized by the above.
前記電子部品は、半導体素子であり、
前記同種の処理機構は、前記半導体素子に対し、電圧、電流、又は周波数の測定処理を行うものであること、
を特徴とする請求項1記載の電子部品の工程処理装置。
The electronic component is a semiconductor element,
The same type of processing mechanism performs a measurement process of voltage, current, or frequency on the semiconductor element,
The electronic component process processing apparatus according to claim 1.
複数の前記保持機構は連続して電子部品を保持するように設定されていること、
を特徴とする請求項1又は2に記載の電子部品の工程処理装置。
A plurality of the holding mechanisms are set so as to hold the electronic component continuously;
The process processing apparatus for an electronic component according to claim 1, wherein
電子部品を保持する複数の保持機構が、進行及び停止するサイクルを繰り返しながら電子部品を搬送し、前記保持機構を個別に昇降させ、処理部の処理機構が電子部品に工程処理を施す電子部品の工程処理方法において、
前記処理部は、複数の同種の処理機構及び前記同種の処理機構以外の処理機構を備え、
同種の処理機構に対応する位置に来た保持機構は、全ての同種の処理機構に電子部品を同時に圧着して設置し、かつ、当該同種の処理機構による工程処理中も押圧し、電子部品の処理が終了した後、全ての同種の処理機構から電子部品を同時に解放し、
前記同種の処理機構以外の処理機構は、前記同種の処理機構の搬送停止時間内に処理を行い、
前記同種の処理機構に対応する位置の保持機構と、前記同種の処理機構以外の処理機構に対応する位置の保持機構とを、異なる動作パターンで昇降させる制御であって、前記同種の処理機構に対する各保持機構の上昇開始以前に、前記同種の処理機構以外の処理機構に対する保持機構の上昇を開始すること、
を特徴とする電子部品の工程処理方法。
A plurality of holding mechanisms for holding the electronic components convey the electronic components while repeating a cycle of progressing and stopping, individually raising and lowering the holding mechanisms, and the processing mechanism of the processing unit performs processing on the electronic components. In the process processing method,
The processing unit includes a plurality of processing mechanisms other than the same processing mechanism and the same processing mechanism.
The holding mechanism that has come to a position corresponding to the same type of processing mechanism is installed by pressing and bonding electronic components to all the same type of processing mechanisms at the same time, and is also pressed during process processing by the same type of processing mechanism. After processing is completed, electronic components are released simultaneously from all similar processing mechanisms,
A processing mechanism other than the same type of processing mechanism performs processing within the conveyance stop time of the same type of processing mechanism,
Control for raising and lowering a holding mechanism at a position corresponding to the processing mechanism of the same type and a holding mechanism at a position corresponding to a processing mechanism other than the processing mechanism of the same type with different operation patterns, with respect to the processing mechanism of the same type Before starting the raising of each holding mechanism, starting the raising of the holding mechanism with respect to a processing mechanism other than the same type of processing mechanism ;
An electronic component process processing method characterized by the above.
前記電子部品は、半導体素子であり、
前記同種の処理機構は、前記半導体素子に対し、電圧、電流、又は周波数の測定処理を行うこと、
を特徴とする請求項4記載の電子部品の工程処理方法。
The electronic component is a semiconductor element,
The same type of processing mechanism performs a voltage, current, or frequency measurement process on the semiconductor element,
The method of processing a process for an electronic component according to claim 4.
複数の前記保持機構は連続して電子部品を保持すること、
を特徴とする請求項4又は5に記載の電子部品の工程処理方法。
A plurality of the holding mechanisms continuously hold electronic components;
The process processing method of the electronic component of Claim 4 or 5 characterized by these.
電子部品を保持する複数の保持機構に、進行及び停止するサイクルを繰り返しながら電子部品を搬送させる制御と、前記保持機構を個別に昇降させる制御と、処理部の処理機構に電子部品の工程処理をさせる制御とを、コンピュータに行わせる電子部品の工程処理用プログラムにおいて、
前記処理部は、複数の同種の処理機構及び前記同種の処理機構以外の処理機構を備え、
同種の処理機構に対応する位置に来た保持機構に、
全ての同種の処理機構に電子部品を同時に圧着して設置させ、かつ、当該同種の処理機構による工程処理中も押圧させる制御と、
電子部品の処理が終了した後、全ての同種の処理機構から電子部品を同時に解放させる制御と、
前記同種の処理機構の搬送停止時間内に前記同種の処理機構以外の処理機構の処理を行う制御と、
前記同種の処理機構に対応する位置の保持機構と、前記同種の処理機構以外の処理機構に対応する位置の保持機構とを、異なる動作パターンで昇降させる制御であって、前記同種の処理機構に対する各保持機構の上昇開始以前に、前記同種の処理機構以外の処理機構に対する保持機構の上昇を開始する制御と、
をコンピュータに行わせることを特徴とする電子部品の工程処理用プログラム。
Control that conveys electronic components to a plurality of holding mechanisms that hold electronic components while repeating a cycle of advancement and stop, control that raises and lowers the holding mechanisms individually, and processing processing of electronic components in the processing mechanism of the processing unit In a program for electronic component process processing to be performed by a computer,
The processing unit includes a plurality of processing mechanisms other than the same processing mechanism and the same processing mechanism.
To the holding mechanism that came to the position corresponding to the same type of processing mechanism,
Control that electronic parts are simultaneously crimped and installed in all the same type of processing mechanisms, and pressed during process processing by the same type of processing mechanisms, and
After the processing of electronic parts is finished, control to release the electronic parts from all the same type of processing mechanism at the same time,
Control for processing a processing mechanism other than the same type of processing mechanism within the conveyance stop time of the same type of processing mechanism;
Control for raising and lowering a holding mechanism at a position corresponding to the processing mechanism of the same type and a holding mechanism at a position corresponding to a processing mechanism other than the processing mechanism of the same type with different operation patterns, with respect to the processing mechanism of the same type Before starting the raising of each holding mechanism, a control for starting the raising of the holding mechanism with respect to a processing mechanism other than the same type of processing mechanism ;
A process processing program for electronic parts, characterized by causing a computer to perform the above.
前記電子部品は、半導体素子であり、
前記同種の処理機構に、前記半導体素子に対し、電圧、電流、又は周波数の測定処理を行わせる制御を、コンピュータに行わせること、
を特徴とする請求項7記載の電子部品の工程処理用プログラム。
The electronic component is a semiconductor element,
Causing the computer to perform control to cause the semiconductor processing element to perform voltage, current, or frequency measurement processing on the semiconductor element;
The electronic component process processing program according to claim 7.
複数の前記保持機構に連続して電子部品を保持させる制御を、コンピュータに行わせること、
を特徴とする請求項7又は8に記載の電子部品の工程処理用プログラム。
Causing a computer to perform control for continuously holding electronic components by the plurality of holding mechanisms;
The electronic component process processing program according to claim 7 or 8,
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