JP6044385B2 - タンデム型質量分析装置 - Google Patents

タンデム型質量分析装置 Download PDF

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Publication number
JP6044385B2
JP6044385B2 JP2013035707A JP2013035707A JP6044385B2 JP 6044385 B2 JP6044385 B2 JP 6044385B2 JP 2013035707 A JP2013035707 A JP 2013035707A JP 2013035707 A JP2013035707 A JP 2013035707A JP 6044385 B2 JP6044385 B2 JP 6044385B2
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ions
ion
mass
cleavage
unit
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Japanese (ja)
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JP2014165053A (ja
JP2014165053A5 (enExample
Inventor
大輔 奥村
大輔 奥村
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Shimadzu Corp
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Shimadzu Corp
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Priority to JP2013035707A priority Critical patent/JP6044385B2/ja
Priority to US14/188,247 priority patent/US8866074B2/en
Priority to CN201410067755.3A priority patent/CN104007163B/zh
Publication of JP2014165053A publication Critical patent/JP2014165053A/ja
Publication of JP2014165053A5 publication Critical patent/JP2014165053A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H01J49/005—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by collision with gas, e.g. by introducing gas or by accelerating ions with an electric field
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0031—Step by step routines describing the use of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2013035707A 2013-02-26 2013-02-26 タンデム型質量分析装置 Expired - Fee Related JP6044385B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2013035707A JP6044385B2 (ja) 2013-02-26 2013-02-26 タンデム型質量分析装置
US14/188,247 US8866074B2 (en) 2013-02-26 2014-02-24 Tandem mass spectrometer and mass spectrometric method
CN201410067755.3A CN104007163B (zh) 2013-02-26 2014-02-26 串联质谱仪和质谱法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013035707A JP6044385B2 (ja) 2013-02-26 2013-02-26 タンデム型質量分析装置

Publications (3)

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JP2014165053A JP2014165053A (ja) 2014-09-08
JP2014165053A5 JP2014165053A5 (enExample) 2015-07-09
JP6044385B2 true JP6044385B2 (ja) 2016-12-14

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JP2013035707A Expired - Fee Related JP6044385B2 (ja) 2013-02-26 2013-02-26 タンデム型質量分析装置

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US (1) US8866074B2 (enExample)
JP (1) JP6044385B2 (enExample)
CN (1) CN104007163B (enExample)

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CN107923872B (zh) * 2015-07-28 2020-07-07 株式会社岛津制作所 串联型质谱分析装置
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CN106169411B (zh) * 2016-07-13 2018-03-27 中国计量科学研究院 新型串并联质谱装置系统及其参数调节方法和使用方法
WO2018138814A1 (ja) 2017-01-25 2018-08-02 株式会社島津製作所 飛行時間型質量分析装置
CN108878253B (zh) 2017-05-15 2020-06-23 株式会社岛津制作所 质谱数据采集方法
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CN110082422B (zh) * 2018-07-18 2021-11-12 东华理工大学 一种测定电喷雾电离和电喷雾萃取电离所获一价正离子内能差异的方法
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US11562896B2 (en) 2018-12-03 2023-01-24 The Trustees Of Indiana University Apparatus and method for simultaneously analyzing multiple ions with an electrostatic linear ion trap
WO2020219527A1 (en) 2019-04-23 2020-10-29 The Trustees Of Indiana University Identification of sample subspecies based on particle charge behavior under structural change-inducing sample conditions
WO2020240506A1 (en) 2019-05-31 2020-12-03 Dh Technologies Development Pte. Ltd. Method for real time encoding of scanning swath data and probabilistic framework for precursor inference
KR102872760B1 (ko) 2019-09-25 2025-10-16 더 트러스티즈 오브 인디애나 유니버시티 펄스 모드 전하 검출 질량 분석을 위한 장치 및 방법
CN114728237A (zh) 2019-10-10 2022-07-08 印地安纳大学理事会 用于识别、选择和纯化粒子的系统和方法
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CN113948365B (zh) * 2020-07-15 2025-02-07 宁波大学 一种复合式质谱仪
CN113406182B (zh) * 2021-06-30 2024-10-11 昆山禾信质谱技术有限公司 串联质谱设备和质谱检测系统
CN116344323A (zh) * 2021-12-17 2023-06-27 昆山禾信质谱技术有限公司 串级质谱系统及质谱设备

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CN102169791B (zh) * 2010-02-05 2015-11-25 岛津分析技术研发（上海）有限公司 一种串级质谱分析装置及质谱分析方法
JP5408107B2 (ja) * 2010-11-10 2014-02-05 株式会社島津製作所 Ｍｓ／ｍｓ型質量分析装置及び同装置用プログラム

Also Published As

Publication number Publication date
US20140239170A1 (en) 2014-08-28
US8866074B2 (en) 2014-10-21
JP2014165053A (ja) 2014-09-08
CN104007163A (zh) 2014-08-27
CN104007163B (zh) 2016-09-28

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