JP6014685B2 - 電気導体の製造方法 - Google Patents
電気導体の製造方法 Download PDFInfo
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- JP6014685B2 JP6014685B2 JP2014556563A JP2014556563A JP6014685B2 JP 6014685 B2 JP6014685 B2 JP 6014685B2 JP 2014556563 A JP2014556563 A JP 2014556563A JP 2014556563 A JP2014556563 A JP 2014556563A JP 6014685 B2 JP6014685 B2 JP 6014685B2
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- 239000004020 conductor Substances 0.000 title claims description 61
- 238000004519 manufacturing process Methods 0.000 title claims description 26
- 239000010410 layer Substances 0.000 claims description 283
- 239000000758 substrate Substances 0.000 claims description 175
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 155
- 229910021389 graphene Inorganic materials 0.000 claims description 152
- 230000004888 barrier function Effects 0.000 claims description 93
- 239000002344 surface layer Substances 0.000 claims description 65
- 238000000034 method Methods 0.000 claims description 32
- 238000000151 deposition Methods 0.000 claims description 31
- 238000005260 corrosion Methods 0.000 claims description 19
- 230000007797 corrosion Effects 0.000 claims description 19
- 238000005229 chemical vapour deposition Methods 0.000 claims description 15
- 150000002736 metal compounds Chemical class 0.000 claims description 11
- 239000011148 porous material Substances 0.000 claims description 9
- 239000002243 precursor Substances 0.000 claims description 8
- 150000002894 organic compounds Chemical class 0.000 claims description 6
- 230000002401 inhibitory effect Effects 0.000 claims 7
- 229910052751 metal Inorganic materials 0.000 description 18
- 239000002184 metal Substances 0.000 description 18
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 12
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 11
- 229910052802 copper Inorganic materials 0.000 description 11
- 239000010949 copper Substances 0.000 description 11
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 9
- 229910052737 gold Inorganic materials 0.000 description 9
- 239000010931 gold Substances 0.000 description 9
- 239000003054 catalyst Substances 0.000 description 7
- 238000009792 diffusion process Methods 0.000 description 7
- 229910052759 nickel Inorganic materials 0.000 description 7
- 239000007789 gas Substances 0.000 description 6
- 150000002739 metals Chemical class 0.000 description 6
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 6
- 238000007747 plating Methods 0.000 description 5
- 230000001737 promoting effect Effects 0.000 description 5
- 230000003068 static effect Effects 0.000 description 5
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 4
- 238000005137 deposition process Methods 0.000 description 4
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 4
- 229910000881 Cu alloy Inorganic materials 0.000 description 3
- 230000008021 deposition Effects 0.000 description 3
- 229910000990 Ni alloy Inorganic materials 0.000 description 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 2
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 2
- 229910052799 carbon Inorganic materials 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 229910017052 cobalt Inorganic materials 0.000 description 2
- 239000010941 cobalt Substances 0.000 description 2
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 2
- 239000004744 fabric Substances 0.000 description 2
- 229910052763 palladium Inorganic materials 0.000 description 2
- 229910052697 platinum Inorganic materials 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- 229910052718 tin Inorganic materials 0.000 description 2
- 229910000838 Al alloy Inorganic materials 0.000 description 1
- 229910000851 Alloy steel Inorganic materials 0.000 description 1
- 229910001128 Sn alloy Inorganic materials 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 239000010953 base metal Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000001627 detrimental effect Effects 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 239000003112 inhibitor Substances 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 125000004430 oxygen atom Chemical group O* 0.000 description 1
- 239000011253 protective coating Substances 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 239000011135 tin Substances 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76841—Barrier, adhesion or liner layers
- H01L21/7685—Barrier, adhesion or liner layers the layer covering a conductive structure
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/02—Pretreatment of the material to be coated
- C23C16/0272—Deposition of sub-layers, e.g. to promote the adhesion of the main coating
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/26—Deposition of carbon only
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/532—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body characterised by the materials
- H01L23/53204—Conductive materials
- H01L23/53209—Conductive materials based on metals, e.g. alloys, metal silicides
- H01L23/53228—Conductive materials based on metals, e.g. alloys, metal silicides the principal metal being copper
- H01L23/53238—Additional layers associated with copper layers, e.g. adhesion, barrier, cladding layers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
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- Microelectronics & Electronic Packaging (AREA)
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- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
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Description
Claims (7)
- 電気導体(106)の製造方法であって、
基板層(102)を供する工程;
前記基板層に導電性を有する表面層(104)を堆積させる工程;及び
前記基板層にグラフェン層(130又は150)を堆積させる工程
を含み、
前記グラフェン層が腐食抑制層であり、
表面層(104)を堆積させる前に、基板層(102)に直接グラフェン層(152)を堆積させる、製造方法。 - 電気導体(106)の製造方法であって、
基板層(102)を供する工程;
前記基板層に導電性を有する表面層(104)を堆積させる工程;及び
前記基板層にグラフェン層(130又は150)を堆積させる工程
を含み、
前記グラフェン層が腐食抑制層であり、
表面層(104)は、基板層(102)に堆積させる際において孔(120)を有しており、
基板層に表面層を堆積させた後、基板層上の前記孔内にグラフェン層(132)を堆積させる、製造方法。 - 電気導体(106)の製造方法であって、
基板層(102)を供する工程;
前記基板層に導電性を有する表面層(104)を堆積させる工程;及び
前記基板層にグラフェン層(130又は150)を堆積させる工程
を含み、
前記グラフェン層が腐食抑制層であり、
基板層(102)は、ベース基板層(106)及び該ベース基板層に堆積させたバリア基板層(108)を有して成り、
バリア基板層に表面層(104)を堆積させ、
バリア基板層に表面層を堆積させる前に、バリア基板層に直接グラフェン層(152)を堆積させる、製造方法。 - 電気導体(106)の製造方法であって、
基板層(102)を供する工程;
前記基板層に導電性を有する表面層(104)を堆積させる工程;及び
前記基板層にグラフェン層(130又は150)を堆積させる工程
を含み、
前記グラフェン層が腐食抑制層であり、
基板層(102)は、ベース基板層(106)及び該ベース基板層に堆積させたバリア基板層(108)を有して成り、
バリア基板層に表面層(104)を堆積させ、ベース基板層にバリア基板層を堆積させる前に、ベース基板層に直接グラフェン層(150)を堆積させる、製造方法。 - 電気導体(106)の製造方法であって、
基板層(102)を供する工程;
前記基板層に導電性を有する表面層(104)を堆積させる工程;及び
前記基板層にグラフェン層(130又は150)を堆積させる工程
を含み、
前記グラフェン層が腐食抑制層であり、
基板層(102)は、ベース基板層(106)及び該ベース基板層に堆積させたバリア基板層(108)を有して成り、
バリア基板層に表面層(104)を堆積させ、バリア基板層に表面層を堆積させた後に、バリア基板層及びベース基板層の少なくとも一方に直接グラフェン層(142)を堆積させる、製造方法。 - 電気導体(106)の製造方法であって、
基板層(102)を供する工程;
前記基板層に導電性を有する表面層(104)を堆積させる工程;及び
前記基板層にグラフェン層(130又は150)を堆積させる工程
を含み、
前記グラフェン層が腐食抑制層であり、
基板層(102)は、ベース基板層(106)及び該ベース基板層に堆積させたバリア基板層(108)を有して成り、
バリア基板層に表面層(104)を堆積させ、表面層及びバリア基板層によりスタックアップが形成され、スタックアップの層間の界面のいずれか又は全てにグラフェン層(150,152,154)を堆積させる、製造方法。 - 電気導体(106)の製造方法であって、
基板層(102)を供する工程;
前記基板層に導電性を有する表面層(104)を堆積させる工程;及び
前記基板層にグラフェン層(130又は150)を堆積させる工程
を含み、
前記グラフェン層が腐食抑制層であり、
前記グラフェン層(140)を堆積させる工程は、基板層(102)を有して成る金属化合物上にグラフェンを容易に成長させるように有機化合物前駆体及び十分な温度の熱を用いる化学蒸着法を用いて電気導体(100)を処理することにより、表面層(104)の孔(120)内にグラフェン・プラグ(142)を堆積させる工程を含む、製造方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/372,155 | 2012-02-13 | ||
US13/372,155 US9112002B2 (en) | 2012-02-13 | 2012-02-13 | Electrical conductors and methods of manufacturing electrical conductors |
PCT/US2013/022885 WO2013122724A1 (en) | 2012-02-13 | 2013-01-24 | Method of manufacturing electrical conductors |
Publications (2)
Publication Number | Publication Date |
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JP2015515082A JP2015515082A (ja) | 2015-05-21 |
JP6014685B2 true JP6014685B2 (ja) | 2016-10-25 |
Family
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JP2014556563A Active JP6014685B2 (ja) | 2012-02-13 | 2013-01-24 | 電気導体の製造方法 |
Country Status (5)
Country | Link |
---|---|
US (1) | US9112002B2 (ja) |
EP (1) | EP2815427B1 (ja) |
JP (1) | JP6014685B2 (ja) |
TW (1) | TWI634566B (ja) |
WO (1) | WO2013122724A1 (ja) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
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DE102014005339B4 (de) * | 2014-01-28 | 2022-06-09 | Wolfgang B. Thörner | Verfahren zur Herstellung eines Kontaktelements |
US9504158B2 (en) | 2014-04-22 | 2016-11-22 | Facebook, Inc. | Metal-free monolithic epitaxial graphene-on-diamond PWB |
US10036765B2 (en) * | 2015-07-10 | 2018-07-31 | Honeywell International Inc. | Reducing hysteresis effects in an accelerometer |
US10763165B2 (en) | 2017-04-18 | 2020-09-01 | Taiwan Semiconductor Manufacturing Company, Ltd. | Conductive powder formation method, device for forming conductive powder, and method of forming semiconductor device |
TWI626775B (zh) * | 2017-08-22 | 2018-06-11 | 研能科技股份有限公司 | 致動器 |
Family Cites Families (10)
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US20030211724A1 (en) * | 2002-05-10 | 2003-11-13 | Texas Instruments Incorporated | Providing electrical conductivity between an active region and a conductive layer in a semiconductor device using carbon nanotubes |
US20040182600A1 (en) * | 2003-03-20 | 2004-09-23 | Fujitsu Limited | Method for growing carbon nanotubes, and electronic device having structure of ohmic connection to carbon element cylindrical structure body and production method thereof |
WO2010091397A2 (en) | 2009-02-09 | 2010-08-12 | Board Of Regents, The University Of Texas System | Protective carbon coatings |
JP5395542B2 (ja) | 2009-07-13 | 2014-01-22 | 株式会社東芝 | 半導体装置 |
US8344295B2 (en) * | 2009-10-14 | 2013-01-01 | Korea University Research And Business Foundation | Nanosoldering heating element |
WO2011074987A1 (en) | 2009-12-17 | 2011-06-23 | Universitetssenteret På Kjeller | Field effect transistor structure |
US9305571B2 (en) | 2009-12-23 | 2016-04-05 | HGST Netherlands B.V. | Magnetic devices and magnetic media with graphene overcoat |
JP4967034B2 (ja) | 2010-01-27 | 2012-07-04 | 株式会社日立製作所 | グラフェン膜と金属電極とが電気的接合した回路装置 |
CN102859032B (zh) * | 2010-02-26 | 2015-01-14 | 独立行政法人产业技术总合研究所 | 碳膜叠层体 |
JP2012025004A (ja) * | 2010-07-22 | 2012-02-09 | Seiko Epson Corp | グラフェンシート付き基材及びグラフェンシートの製造方法 |
-
2012
- 2012-02-13 US US13/372,155 patent/US9112002B2/en active Active
-
2013
- 2013-01-24 EP EP13706105.7A patent/EP2815427B1/en active Active
- 2013-01-24 JP JP2014556563A patent/JP6014685B2/ja active Active
- 2013-01-24 WO PCT/US2013/022885 patent/WO2013122724A1/en active Application Filing
- 2013-01-31 TW TW102103657A patent/TWI634566B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
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TW201346938A (zh) | 2013-11-16 |
US20130206461A1 (en) | 2013-08-15 |
WO2013122724A1 (en) | 2013-08-22 |
EP2815427A1 (en) | 2014-12-24 |
EP2815427B1 (en) | 2020-05-06 |
US9112002B2 (en) | 2015-08-18 |
JP2015515082A (ja) | 2015-05-21 |
TWI634566B (zh) | 2018-09-01 |
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