JP5999516B2 - 放射線撮影装置 - Google Patents

放射線撮影装置 Download PDF

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Publication number
JP5999516B2
JP5999516B2 JP2013527745A JP2013527745A JP5999516B2 JP 5999516 B2 JP5999516 B2 JP 5999516B2 JP 2013527745 A JP2013527745 A JP 2013527745A JP 2013527745 A JP2013527745 A JP 2013527745A JP 5999516 B2 JP5999516 B2 JP 5999516B2
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Japan
Prior art keywords
trajectory
drive
circular
radiation
circular orbit
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Expired - Fee Related
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JP2013527745A
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English (en)
Japanese (ja)
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JPWO2013021413A1 (ja
Inventor
雄介 田川
雄介 田川
功裕 上野
功裕 上野
博志 大原
博志 大原
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Shimadzu Corp
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Shimadzu Corp
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    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/02Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
    • A61B6/03Computed tomography [CT]
    • A61B6/032Transmission computed tomography [CT]
    • A61B6/035Mechanical aspects of CT
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/44Constructional features of apparatus for radiation diagnosis
    • A61B6/4429Constructional features of apparatus for radiation diagnosis related to the mounting of source units and detector units
    • A61B6/4452Constructional features of apparatus for radiation diagnosis related to the mounting of source units and detector units the source unit and the detector unit being able to move relative to each other
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/44Constructional features of apparatus for radiation diagnosis
    • A61B6/4476Constructional features of apparatus for radiation diagnosis related to motor-assisted motion of the source unit
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/309Accessories, mechanical or electrical features support of sample holder
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/33Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/40Imaging
    • G01N2223/419Imaging computed tomograph

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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Medical Informatics (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Surgery (AREA)
  • Veterinary Medicine (AREA)
  • Public Health (AREA)
  • Animal Behavior & Ethology (AREA)
  • Molecular Biology (AREA)
  • Biophysics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Biomedical Technology (AREA)
  • Optics & Photonics (AREA)
  • Theoretical Computer Science (AREA)
  • Pulmonology (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP2013527745A 2011-08-05 2011-08-05 放射線撮影装置 Expired - Fee Related JP5999516B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2011/004476 WO2013021413A1 (fr) 2011-08-05 2011-08-05 Dispositif de radiographie

Publications (2)

Publication Number Publication Date
JPWO2013021413A1 JPWO2013021413A1 (ja) 2015-03-05
JP5999516B2 true JP5999516B2 (ja) 2016-09-28

Family

ID=47667967

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013527745A Expired - Fee Related JP5999516B2 (ja) 2011-08-05 2011-08-05 放射線撮影装置

Country Status (4)

Country Link
JP (1) JP5999516B2 (fr)
CN (1) CN103733053B (fr)
TW (1) TWI480022B (fr)
WO (1) WO2013021413A1 (fr)

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3891285B2 (ja) * 2002-11-01 2007-03-14 株式会社島津製作所 X線透視装置
US7099432B2 (en) * 2003-08-27 2006-08-29 Matsushita Electric Industrial Co., Ltd. X-ray inspection apparatus and X-ray inspection method
JP4386812B2 (ja) * 2003-08-27 2009-12-16 パナソニック株式会社 X線検査装置
JP2006158027A (ja) * 2004-11-26 2006-06-15 Hanshin Electric Co Ltd 家庭内電力システム
CN101578513B (zh) * 2006-12-01 2011-07-20 株式会社岛津制作所 X射线透视装置
WO2009078415A1 (fr) * 2007-12-17 2009-06-25 Uni-Hite System Corporation Appareil d'examen aux rayons x et procédé
US20110255660A1 (en) * 2008-12-22 2011-10-20 Omron Corporation X-ray inspection method and x-ray inspection apparatus

Also Published As

Publication number Publication date
WO2013021413A1 (fr) 2013-02-14
TWI480022B (zh) 2015-04-11
CN103733053A (zh) 2014-04-16
JPWO2013021413A1 (ja) 2015-03-05
TW201306803A (zh) 2013-02-16
CN103733053B (zh) 2016-08-17

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