JP5955032B2 - イオン化方法、質量分析方法、抽出方法及び精製方法 - Google Patents

イオン化方法、質量分析方法、抽出方法及び精製方法 Download PDF

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JP5955032B2
JP5955032B2 JP2012045920A JP2012045920A JP5955032B2 JP 5955032 B2 JP5955032 B2 JP 5955032B2 JP 2012045920 A JP2012045920 A JP 2012045920A JP 2012045920 A JP2012045920 A JP 2012045920A JP 5955032 B2 JP5955032 B2 JP 5955032B2
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Prior art keywords
probe
liquid
substrate
ionization
substance
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Japanese (ja)
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JP2013181840A (ja
JP2013181840A5 (enExample
Inventor
大塚　洋一
洋一 大塚
隆一 荒川
隆一 荒川
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Canon Inc
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Canon Inc
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Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2012045920A priority Critical patent/JP5955032B2/ja
Priority to PCT/JP2013/001252 priority patent/WO2013128939A1/ja
Priority to EP13754423.5A priority patent/EP2822022B1/en
Priority to CN201380020208.3A priority patent/CN104285275B/zh
Priority to US13/973,305 priority patent/US9287099B2/en
Publication of JP2013181840A publication Critical patent/JP2013181840A/ja
Publication of JP2013181840A5 publication Critical patent/JP2013181840A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/0454—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for vaporising using mechanical energy, e.g. by ultrasonic vibrations
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01D—SEPARATION
    • B01D59/00—Separation of different isotopes of the same chemical element
    • B01D59/44—Separation by mass spectrography
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
    • G01N30/724—Nebulising, aerosol formation or ionisation
    • G01N30/7266—Nebulising, aerosol formation or ionisation by electric field, e.g. electrospray
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J27/00—Ion beam tubes
    • H01J27/02—Ion sources; Ion guns
    • H01J27/08—Ion sources; Ion guns using arc discharge
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/168—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission field ionisation, e.g. corona discharge

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Combustion & Propulsion (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2012045920A 2012-03-01 2012-03-01 イオン化方法、質量分析方法、抽出方法及び精製方法 Active JP5955032B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2012045920A JP5955032B2 (ja) 2012-03-01 2012-03-01 イオン化方法、質量分析方法、抽出方法及び精製方法
PCT/JP2013/001252 WO2013128939A1 (ja) 2012-03-01 2013-02-28 イオン化方法、質量分析方法、抽出方法及び精製方法
EP13754423.5A EP2822022B1 (en) 2012-03-01 2013-02-28 Ionization method, mass spectrometry method, extraction method, and purification method
CN201380020208.3A CN104285275B (zh) 2012-03-01 2013-02-28 离子化方法、质谱分析方法、提取方法和提纯方法
US13/973,305 US9287099B2 (en) 2012-03-01 2013-08-22 Ionization method, mass spectrometry method, extraction method, and purification method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012045920A JP5955032B2 (ja) 2012-03-01 2012-03-01 イオン化方法、質量分析方法、抽出方法及び精製方法

Publications (3)

Publication Number Publication Date
JP2013181840A JP2013181840A (ja) 2013-09-12
JP2013181840A5 JP2013181840A5 (enExample) 2015-04-09
JP5955032B2 true JP5955032B2 (ja) 2016-07-20

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JP2012045920A Active JP5955032B2 (ja) 2012-03-01 2012-03-01 イオン化方法、質量分析方法、抽出方法及び精製方法

Country Status (5)

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US (1) US9287099B2 (enExample)
EP (1) EP2822022B1 (enExample)
JP (1) JP5955032B2 (enExample)
CN (1) CN104285275B (enExample)
WO (1) WO2013128939A1 (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5955033B2 (ja) * 2012-03-01 2016-07-20 キヤノン株式会社 イオン化方法、質量分析方法、抽出方法及び精製方法
WO2014179417A1 (en) * 2013-05-01 2014-11-06 Ut-Battelle, Llc Afm fluid delivery/liquid extraction surface sampling/electrostatic spray cantilever probe
US9230787B2 (en) 2013-08-02 2016-01-05 Canon Kabushiki Kaisha Ionization apparatus, mass spectrometer including ionization apparatus, and image forming system
JP6339883B2 (ja) 2013-08-02 2018-06-06 キヤノン株式会社 イオン化装置、それを有する質量分析装置及び画像作成システム
JP2015032463A (ja) * 2013-08-02 2015-02-16 キヤノン株式会社 質量分析装置、質量分析方法および画像化システム
US10000789B2 (en) * 2014-06-17 2018-06-19 The Board Of Regents Of The University Of Oklahoma Cellular probe device, system and analysis method
JP2016028228A (ja) * 2014-07-09 2016-02-25 キヤノン株式会社 イオン化装置、およびこれを有する質量分析装置、画像生成システム、画像表示システム、イオン化方法
US9390901B2 (en) * 2014-10-31 2016-07-12 Ut-Battelle, Llc System and method for liquid extraction electrospray-assisted sample transfer to solution for chemical analysis
JP2016128788A (ja) * 2015-01-09 2016-07-14 キヤノン株式会社 プローブ変位計測装置、およびそれを有するイオン化装置、質量分析装置、情報取得システム
EP3496859B1 (en) 2016-09-02 2024-01-10 Board of Regents, The University of Texas System Collection probe and methods for the use thereof
CN109964121B (zh) * 2016-11-18 2022-04-26 株式会社岛津制作所 离子化方法和离子化装置、以及成像分析方法和成像分析装置
WO2021092401A1 (en) * 2019-11-08 2021-05-14 Abilene Christian University Identifying and quantifying components in a high-melting-point liquid
US12467831B2 (en) 2022-11-18 2025-11-11 Georgia Tech Research Corporation Molten salt sampling system and methods of use thereof
US12480860B2 (en) 2022-12-07 2025-11-25 Abilene Christian University In-situ corrosion monitoring device and methods of use thereof
US12444514B2 (en) 2023-08-07 2025-10-14 Abilene Christian University Calibration of power monitors in molten salt reactors

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10112279A (ja) * 1996-10-07 1998-04-28 Hamamatsu Photonics Kk イオン化分析装置
JPH09306417A (ja) * 1996-05-21 1997-11-28 Hamamatsu Photonics Kk イオン化分析装置
US5945678A (en) * 1996-05-21 1999-08-31 Hamamatsu Photonics K.K. Ionizing analysis apparatus
JP5057318B2 (ja) * 1999-12-30 2012-10-24 アドビオン インコーポレイテッド 多重電気噴霧装置、システム、および方法
US6566653B1 (en) * 2002-01-23 2003-05-20 International Business Machines Corporation Investigation device and method
JP4167593B2 (ja) 2002-01-31 2008-10-15 株式会社日立ハイテクノロジーズ エレクトロスプレイイオン化質量分析装置及びその方法
EP2017610B1 (en) * 2006-04-28 2014-10-01 University of Yamanashi Ionizing method and device by electrospray
CN101464427B (zh) * 2007-12-21 2012-07-25 清华大学 敞开式喷雾场解吸离子化方法及离子化装置
JP5955033B2 (ja) 2012-03-01 2016-07-20 キヤノン株式会社 イオン化方法、質量分析方法、抽出方法及び精製方法

Also Published As

Publication number Publication date
JP2013181840A (ja) 2013-09-12
CN104285275A (zh) 2015-01-14
US20130341279A1 (en) 2013-12-26
CN104285275B (zh) 2017-04-05
EP2822022A1 (en) 2015-01-07
EP2822022A4 (en) 2015-10-07
US9287099B2 (en) 2016-03-15
WO2013128939A1 (ja) 2013-09-06
EP2822022B1 (en) 2020-07-08

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