JP5912217B2 - 半導体発光素子 - Google Patents

半導体発光素子 Download PDF

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Publication number
JP5912217B2
JP5912217B2 JP2009297727A JP2009297727A JP5912217B2 JP 5912217 B2 JP5912217 B2 JP 5912217B2 JP 2009297727 A JP2009297727 A JP 2009297727A JP 2009297727 A JP2009297727 A JP 2009297727A JP 5912217 B2 JP5912217 B2 JP 5912217B2
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barrier
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JP2009297727A
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Japanese (ja)
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JP2010157735A5 (enExample
JP2010157735A (ja
Inventor
チン ミン−タ
チン ミン−タ
ファン クオ−フェン
ファン クオ−フェン
シェン ピン−フェイ
シェン ピン−フェイ
ワン チン−ジェン
ワン チン−ジェン
チャン シー−パン
チャン シー−パン
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Epistar Corp
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Epistar Corp
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/30Structure or shape of the active region; Materials used for the active region
    • H01S5/34Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
    • H01S5/343Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00Nanooptics, e.g. quantum optics or photonic crystals
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80Constructional details
    • H10H20/81Bodies
    • H10H20/811Bodies having quantum effect structures or superlattices, e.g. tunnel junctions
    • H10H20/812Bodies having quantum effect structures or superlattices, e.g. tunnel junctions within the light-emitting regions, e.g. having quantum confinement structures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/02Structural details or components not essential to laser action
    • H01S5/0206Substrates, e.g. growth, shape, material, removal or bonding
    • H01S5/0215Bonding to the substrate
    • H01S5/0216Bonding to the substrate using an intermediate compound, e.g. a glue or solder
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/02Structural details or components not essential to laser action
    • H01S5/0206Substrates, e.g. growth, shape, material, removal or bonding
    • H01S5/0217Removal of the substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/30Structure or shape of the active region; Materials used for the active region
    • H01S5/305Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure
    • H01S5/3086Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure doping of the active layer
    • H01S5/309Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure doping of the active layer doping of barrier layers that confine charge carriers in the laser structure, e.g. the barriers in a quantum well structure
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/30Structure or shape of the active region; Materials used for the active region
    • H01S5/34Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
    • H01S5/3407Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers characterised by special barrier layers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80Constructional details
    • H10H20/81Bodies
    • H10H20/822Materials of the light-emitting regions
    • H10H20/824Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP

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  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biophysics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Led Devices (AREA)
JP2009297727A 2008-12-31 2009-12-28 半導体発光素子 Active JP5912217B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/347,392 US7953134B2 (en) 2008-12-31 2008-12-31 Semiconductor light-emitting device
US12/347,392 2008-12-31

Publications (3)

Publication Number Publication Date
JP2010157735A JP2010157735A (ja) 2010-07-15
JP2010157735A5 JP2010157735A5 (enExample) 2012-12-27
JP5912217B2 true JP5912217B2 (ja) 2016-04-27

Family

ID=42284922

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009297727A Active JP5912217B2 (ja) 2008-12-31 2009-12-28 半導体発光素子

Country Status (4)

Country Link
US (1) US7953134B2 (enExample)
JP (1) JP5912217B2 (enExample)
CN (1) CN101771120B (enExample)
TW (1) TWI403002B (enExample)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102157647A (zh) * 2011-05-03 2011-08-17 映瑞光电科技(上海)有限公司 一种氮化物led结构及其制备方法
US8941215B2 (en) 2012-09-24 2015-01-27 LuxVue Technology Corporation Micro device stabilization post
US8835940B2 (en) 2012-09-24 2014-09-16 LuxVue Technology Corporation Micro device stabilization post
ES2952036T3 (es) 2013-06-12 2023-10-26 Rohinni Inc Teclado de retroiluminación con fuentes generadoras de luz depositadas
US9035279B2 (en) 2013-07-08 2015-05-19 LuxVue Technology Corporation Micro device with stabilization post
US9087764B2 (en) 2013-07-26 2015-07-21 LuxVue Technology Corporation Adhesive wafer bonding with controlled thickness variation
US9153548B2 (en) 2013-09-16 2015-10-06 Lux Vue Technology Corporation Adhesive wafer bonding with sacrificial spacers for controlled thickness variation
US9450147B2 (en) 2013-12-27 2016-09-20 Apple Inc. LED with internally confined current injection area
US9583466B2 (en) 2013-12-27 2017-02-28 Apple Inc. Etch removal of current distribution layer for LED current confinement
DE102015109793A1 (de) * 2015-06-18 2016-12-22 Osram Opto Semiconductors Gmbh Optoelektronisches Halbleiterbauteil
CN108770368B (zh) 2016-01-15 2022-04-12 罗茵尼公司 透过设备上的罩盖进行背光照明的设备和方法
US10693038B2 (en) * 2017-11-22 2020-06-23 Epistar Corporation Semiconductor device
US11158995B2 (en) 2018-06-01 2021-10-26 Visual Photonics Epitaxy Co., Ltd. Laser diode with defect blocking layer
DE102019106521A1 (de) 2019-03-14 2020-09-17 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung Aufwachsstruktur für ein Strahlung emittierendes Halbleiterbauelement und Strahlung emittierendes Halbleiterbauelement
US20230016028A1 (en) * 2021-07-12 2023-01-19 Tianjin Sanan Optoelectronics Co., Ltd. Semiconductor light-emitting component and light-emitting device
DE102021132164A1 (de) 2021-12-07 2023-06-07 Osram Opto Semiconductors Gmbh Laserdiodenbauelement und verfahren zur herstellung zumindest eines laserdiodenbauelements

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA1279394C (en) 1985-07-26 1991-01-22 Naoki Chinone Multiple quantum well type semiconductor laser
DE8710738U1 (de) * 1986-06-07 1987-12-10 Mitsuba Electric Mfg. Co., Ltd., Kiryu, Gumma Pulsierungsschutzelement für eine Pumpe
JP2785167B2 (ja) * 1992-06-29 1998-08-13 国際電信電話株式会社 多重量子井戸構造および多重量子井戸構造を用いた半導体素子
JPH11186665A (ja) * 1997-12-25 1999-07-09 Sony Corp 半導体発光素子
US6803596B2 (en) 1999-12-27 2004-10-12 Sanyo Electric Co., Ltd. Light emitting device
JP2002314126A (ja) * 2001-04-10 2002-10-25 Toshiba Corp InGaAlP系光半導体素子及びその製造方法
CA2464083C (en) * 2001-10-26 2011-08-02 Ammono Sp. Z O.O. Substrate for epitaxy
JP2003332694A (ja) * 2002-05-17 2003-11-21 Mitsubishi Electric Corp 半導体レーザ
US7271418B2 (en) * 2004-09-24 2007-09-18 National Central University Semiconductor apparatus for white light generation and amplification
JP2007042751A (ja) * 2005-08-01 2007-02-15 Hitachi Cable Ltd 半導体発光素子
TWI282636B (en) 2005-12-29 2007-06-11 Epistar Corp Semiconductor light-emitting device and manufacturing method thereof
CN101000940A (zh) * 2006-01-09 2007-07-18 晶元光电股份有限公司 半导体发光元件及其制造方法
CN101290957B (zh) * 2007-04-16 2010-10-13 晶元光电股份有限公司 发光元件

Also Published As

Publication number Publication date
CN101771120A (zh) 2010-07-07
CN101771120B (zh) 2012-07-25
US20100166033A1 (en) 2010-07-01
TWI403002B (zh) 2013-07-21
JP2010157735A (ja) 2010-07-15
US7953134B2 (en) 2011-05-31
TW201029236A (en) 2010-08-01

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