JP5903930B2 - 基板搬送装置及び当該基板搬送装置を用いた半導体製造装置 - Google Patents
基板搬送装置及び当該基板搬送装置を用いた半導体製造装置 Download PDFInfo
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- JP5903930B2 JP5903930B2 JP2012040458A JP2012040458A JP5903930B2 JP 5903930 B2 JP5903930 B2 JP 5903930B2 JP 2012040458 A JP2012040458 A JP 2012040458A JP 2012040458 A JP2012040458 A JP 2012040458A JP 5903930 B2 JP5903930 B2 JP 5903930B2
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- 239000000758 substrate Substances 0.000 title claims description 166
- 238000012546 transfer Methods 0.000 title claims description 52
- 238000004519 manufacturing process Methods 0.000 title claims description 11
- 239000004065 semiconductor Substances 0.000 title claims description 11
- 238000005468 ion implantation Methods 0.000 description 24
- 238000012856 packing Methods 0.000 description 17
- 239000000428 dust Substances 0.000 description 12
- 230000003749 cleanliness Effects 0.000 description 8
- 238000010586 diagram Methods 0.000 description 7
- 238000010884 ion-beam technique Methods 0.000 description 6
- 238000007789 sealing Methods 0.000 description 6
- 238000012423 maintenance Methods 0.000 description 5
- 238000003825 pressing Methods 0.000 description 5
- 238000005452 bending Methods 0.000 description 4
- 238000005192 partition Methods 0.000 description 3
- 230000002093 peripheral effect Effects 0.000 description 3
- 239000004809 Teflon Substances 0.000 description 2
- 229920006362 Teflon® Polymers 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 230000006837 decompression Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000002542 deteriorative effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000007738 vacuum evaporation Methods 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67724—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations by means of a cart or a vehicule
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67772—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving removal of lid, door, cover
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67775—Docking arrangements
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Physical Vapour Deposition (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012040458A JP5903930B2 (ja) | 2012-02-27 | 2012-02-27 | 基板搬送装置及び当該基板搬送装置を用いた半導体製造装置 |
CN201210425485.XA CN103295943B (zh) | 2012-02-27 | 2012-10-30 | 基板输送装置和使用该基板输送装置的半导体制造装置 |
KR1020120132278A KR101401279B1 (ko) | 2012-02-27 | 2012-11-21 | 기판반송장치 및 당해 기판반송장치를 이용한 반도체 제조장치 |
TW101148332A TWI492327B (zh) | 2012-02-27 | 2012-12-19 | A substrate transfer device, and a semiconductor manufacturing apparatus using the substrate transfer device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012040458A JP5903930B2 (ja) | 2012-02-27 | 2012-02-27 | 基板搬送装置及び当該基板搬送装置を用いた半導体製造装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2013175670A JP2013175670A (ja) | 2013-09-05 |
JP5903930B2 true JP5903930B2 (ja) | 2016-04-13 |
Family
ID=49096605
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012040458A Active JP5903930B2 (ja) | 2012-02-27 | 2012-02-27 | 基板搬送装置及び当該基板搬送装置を用いた半導体製造装置 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP5903930B2 (ko) |
KR (1) | KR101401279B1 (ko) |
CN (1) | CN103295943B (ko) |
TW (1) | TWI492327B (ko) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104597715B (zh) * | 2013-10-30 | 2016-04-13 | 沈阳芯源微电子设备有限公司 | 光刻机对接接口模块的可抽拉式水平调节装置 |
CN104593744A (zh) * | 2013-11-01 | 2015-05-06 | 韦学运 | 一种等离子体处理盾构刀具的自动化设备 |
CN105702599B (zh) * | 2014-11-27 | 2018-07-06 | 北京北方华创微电子装备有限公司 | 反应腔室的上盖结构和反应腔室 |
TW201741483A (zh) * | 2016-02-25 | 2017-12-01 | 愛發科股份有限公司 | 真空裝置 |
CN110144564A (zh) * | 2019-06-27 | 2019-08-20 | 浙江工业大学 | 一种适用于磁控溅射仪的靶与基之间间距自动调节装置 |
CN111232658B (zh) * | 2020-01-14 | 2021-07-30 | 黄桂婷 | 一种吸附效果好的工作可靠的码垛机 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08288361A (ja) * | 1995-04-13 | 1996-11-01 | Nissin Electric Co Ltd | 真空処理装置 |
JPH1096074A (ja) * | 1996-09-19 | 1998-04-14 | Nissin Electric Co Ltd | 基板処理装置 |
JP3798309B2 (ja) * | 2001-12-13 | 2006-07-19 | 株式会社浅野研究所 | 熱成形装置および熱成形方法 |
JP3982402B2 (ja) * | 2002-02-28 | 2007-09-26 | 東京エレクトロン株式会社 | 処理装置及び処理方法 |
KR100631822B1 (ko) * | 2004-09-14 | 2006-10-09 | 한국표준과학연구원 | 플라즈마 공정챔버의 기판냉각장치 및 방법 |
JP4736564B2 (ja) * | 2005-06-23 | 2011-07-27 | 東京エレクトロン株式会社 | 載置台装置の取付構造及び処理装置 |
WO2010019430A2 (en) * | 2008-08-12 | 2010-02-18 | Applied Materials, Inc. | Electrostatic chuck assembly |
JP2010135536A (ja) * | 2008-12-04 | 2010-06-17 | Tokyo Electron Ltd | ロードロック装置および真空処理システム |
JP2011018799A (ja) * | 2009-07-09 | 2011-01-27 | Toyo Mach & Metal Co Ltd | イオンドーピング装置 |
TWI395633B (zh) * | 2010-04-23 | 2013-05-11 | 私立中原大學 | 肘節式定位平台 |
-
2012
- 2012-02-27 JP JP2012040458A patent/JP5903930B2/ja active Active
- 2012-10-30 CN CN201210425485.XA patent/CN103295943B/zh active Active
- 2012-11-21 KR KR1020120132278A patent/KR101401279B1/ko active IP Right Grant
- 2012-12-19 TW TW101148332A patent/TWI492327B/zh active
Also Published As
Publication number | Publication date |
---|---|
KR101401279B1 (ko) | 2014-05-30 |
CN103295943B (zh) | 2016-03-30 |
CN103295943A (zh) | 2013-09-11 |
JP2013175670A (ja) | 2013-09-05 |
TW201336011A (zh) | 2013-09-01 |
TWI492327B (zh) | 2015-07-11 |
KR20130098125A (ko) | 2013-09-04 |
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