JP5871904B2 - アブレシブエッチングおよびカッティングのためのフォトレジスト膜および方法 - Google Patents
アブレシブエッチングおよびカッティングのためのフォトレジスト膜および方法 Download PDFInfo
- Publication number
- JP5871904B2 JP5871904B2 JP2013505060A JP2013505060A JP5871904B2 JP 5871904 B2 JP5871904 B2 JP 5871904B2 JP 2013505060 A JP2013505060 A JP 2013505060A JP 2013505060 A JP2013505060 A JP 2013505060A JP 5871904 B2 JP5871904 B2 JP 5871904B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- film
- photoresist
- less
- photopolymer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 229920002120 photoresistant polymer Polymers 0.000 title claims description 150
- 238000000034 method Methods 0.000 title claims description 23
- 238000005530 etching Methods 0.000 title description 18
- 238000005520 cutting process Methods 0.000 title description 5
- 239000000758 substrate Substances 0.000 claims description 93
- 239000012528 membrane Substances 0.000 claims description 49
- 239000005038 ethylene vinyl acetate Substances 0.000 claims description 46
- 229920001200 poly(ethylene-vinyl acetate) Polymers 0.000 claims description 44
- 229920002689 polyvinyl acetate Polymers 0.000 claims description 40
- 239000011118 polyvinyl acetate Substances 0.000 claims description 40
- 239000000463 material Substances 0.000 claims description 35
- 239000000853 adhesive Substances 0.000 claims description 25
- 230000001070 adhesive effect Effects 0.000 claims description 25
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 24
- 239000004372 Polyvinyl alcohol Substances 0.000 claims description 20
- 229920002451 polyvinyl alcohol Polymers 0.000 claims description 20
- 238000005270 abrasive blasting Methods 0.000 claims description 12
- 238000001035 drying Methods 0.000 claims description 10
- 238000010438 heat treatment Methods 0.000 claims description 8
- 230000001678 irradiating effect Effects 0.000 claims description 5
- 239000007864 aqueous solution Substances 0.000 claims description 4
- 239000010408 film Substances 0.000 description 173
- 239000010410 layer Substances 0.000 description 42
- 239000000203 mixture Substances 0.000 description 34
- DQXBYHZEEUGOBF-UHFFFAOYSA-N but-3-enoic acid;ethene Chemical compound C=C.OC(=O)CC=C DQXBYHZEEUGOBF-UHFFFAOYSA-N 0.000 description 18
- 238000009472 formulation Methods 0.000 description 17
- 230000000052 comparative effect Effects 0.000 description 15
- 239000012790 adhesive layer Substances 0.000 description 13
- 238000003475 lamination Methods 0.000 description 12
- 238000005422 blasting Methods 0.000 description 11
- 239000003082 abrasive agent Substances 0.000 description 7
- 230000015572 biosynthetic process Effects 0.000 description 6
- 239000003960 organic solvent Substances 0.000 description 6
- 239000004014 plasticizer Substances 0.000 description 6
- 239000002904 solvent Substances 0.000 description 6
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 4
- 239000004820 Pressure-sensitive adhesive Substances 0.000 description 4
- 239000010409 thin film Substances 0.000 description 4
- 238000009281 ultraviolet germicidal irradiation Methods 0.000 description 4
- 239000000654 additive Substances 0.000 description 3
- 239000002313 adhesive film Substances 0.000 description 3
- 238000007654 immersion Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000000206 photolithography Methods 0.000 description 3
- 239000000049 pigment Substances 0.000 description 3
- 229920005989 resin Polymers 0.000 description 3
- 239000011347 resin Substances 0.000 description 3
- YVXDRFYHWWPSOA-BQYQJAHWSA-N 1-methyl-4-[(e)-2-phenylethenyl]pyridin-1-ium Chemical compound C1=C[N+](C)=CC=C1\C=C\C1=CC=CC=C1 YVXDRFYHWWPSOA-BQYQJAHWSA-N 0.000 description 2
- 239000003513 alkali Substances 0.000 description 2
- 229920006378 biaxially oriented polypropylene Polymers 0.000 description 2
- 239000011127 biaxially oriented polypropylene Substances 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 2
- 239000000969 carrier Substances 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 229920001577 copolymer Polymers 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 229920001903 high density polyethylene Polymers 0.000 description 2
- 239000004700 high-density polyethylene Substances 0.000 description 2
- 229920001684 low density polyethylene Polymers 0.000 description 2
- 239000004702 low-density polyethylene Substances 0.000 description 2
- 230000000873 masking effect Effects 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229920000642 polymer Polymers 0.000 description 2
- 229920005597 polymer membrane Polymers 0.000 description 2
- 239000004094 surface-active agent Substances 0.000 description 2
- 229920000049 Carbon (fiber) Polymers 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000002679 ablation Methods 0.000 description 1
- 239000011324 bead Substances 0.000 description 1
- 239000001055 blue pigment Substances 0.000 description 1
- 239000004917 carbon fiber Substances 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 239000005001 laminate film Substances 0.000 description 1
- 239000002346 layers by function Substances 0.000 description 1
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 239000001054 red pigment Substances 0.000 description 1
- 239000004576 sand Substances 0.000 description 1
- 238000005201 scrubbing Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 238000002791 soaking Methods 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
- G03F7/0388—Macromolecular compounds which are rendered insoluble or differentially wettable with ethylenic or acetylenic bands in the side chains of the photopolymer
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24C—ABRASIVE OR RELATED BLASTING WITH PARTICULATE MATERIAL
- B24C1/00—Methods for use of abrasive blasting for producing particular effects; Use of auxiliary equipment in connection with such methods
- B24C1/04—Methods for use of abrasive blasting for producing particular effects; Use of auxiliary equipment in connection with such methods for treating only selected parts of a surface, e.g. for carving stone or glass
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/12—Production of screen printing forms or similar printing forms, e.g. stencils
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/40—Treatment after imagewise removal, e.g. baking
- G03F7/405—Treatment with inorganic or organometallic reagents after imagewise removal
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
- H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Mechanical Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Organic Chemistry (AREA)
- Materials For Photolithography (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Manufacture Of Macromolecular Shaped Articles (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US32319210P | 2010-04-12 | 2010-04-12 | |
| US61/323,192 | 2010-04-12 | ||
| PCT/US2011/032154 WO2011130300A1 (en) | 2010-04-12 | 2011-04-12 | Photoresist film and methods for abrasive etching and cutting |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2013523477A JP2013523477A (ja) | 2013-06-17 |
| JP2013523477A5 JP2013523477A5 (enExample) | 2014-05-29 |
| JP5871904B2 true JP5871904B2 (ja) | 2016-03-01 |
Family
ID=44224319
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013505060A Active JP5871904B2 (ja) | 2010-04-12 | 2011-04-12 | アブレシブエッチングおよびカッティングのためのフォトレジスト膜および方法 |
Country Status (5)
| Country | Link |
|---|---|
| EP (1) | EP2558908B1 (enExample) |
| JP (1) | JP5871904B2 (enExample) |
| KR (1) | KR101846588B1 (enExample) |
| SG (1) | SG184460A1 (enExample) |
| WO (1) | WO2011130300A1 (enExample) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9132526B2 (en) | 2011-03-07 | 2015-09-15 | Entegris, Inc. | Chemical mechanical planarization conditioner |
| CN106463379B (zh) | 2014-03-21 | 2019-08-06 | 恩特格里斯公司 | 具有细长切割边缘的化学机械平坦化垫调节器 |
| US11342256B2 (en) | 2019-01-24 | 2022-05-24 | Applied Materials, Inc. | Method of fine redistribution interconnect formation for advanced packaging applications |
| IT201900006740A1 (it) * | 2019-05-10 | 2020-11-10 | Applied Materials Inc | Procedimenti di strutturazione di substrati |
| IT201900006736A1 (it) | 2019-05-10 | 2020-11-10 | Applied Materials Inc | Procedimenti di fabbricazione di package |
| US11931855B2 (en) | 2019-06-17 | 2024-03-19 | Applied Materials, Inc. | Planarization methods for packaging substrates |
| US11862546B2 (en) | 2019-11-27 | 2024-01-02 | Applied Materials, Inc. | Package core assembly and fabrication methods |
| US11257790B2 (en) | 2020-03-10 | 2022-02-22 | Applied Materials, Inc. | High connectivity device stacking |
| US11454884B2 (en) | 2020-04-15 | 2022-09-27 | Applied Materials, Inc. | Fluoropolymer stamp fabrication method |
| US11400545B2 (en) | 2020-05-11 | 2022-08-02 | Applied Materials, Inc. | Laser ablation for package fabrication |
| US11232951B1 (en) | 2020-07-14 | 2022-01-25 | Applied Materials, Inc. | Method and apparatus for laser drilling blind vias |
| US11676832B2 (en) | 2020-07-24 | 2023-06-13 | Applied Materials, Inc. | Laser ablation system for package fabrication |
| US11521937B2 (en) | 2020-11-16 | 2022-12-06 | Applied Materials, Inc. | Package structures with built-in EMI shielding |
| US11404318B2 (en) | 2020-11-20 | 2022-08-02 | Applied Materials, Inc. | Methods of forming through-silicon vias in substrates for advanced packaging |
| US11705365B2 (en) | 2021-05-18 | 2023-07-18 | Applied Materials, Inc. | Methods of micro-via formation for advanced packaging |
| US12183684B2 (en) | 2021-10-26 | 2024-12-31 | Applied Materials, Inc. | Semiconductor device packaging methods |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2510511B2 (ja) * | 1986-04-24 | 1996-06-26 | 工業技術院長 | スクリ−ン印刷版用感光性樹脂組成物 |
| JP2631495B2 (ja) * | 1988-03-10 | 1997-07-16 | 工業技術院長 | スクリーン印刷版の製造法 |
| ATE196200T1 (de) * | 1990-10-22 | 2000-09-15 | Aicello Chemical Co | Gravierverfahren mit bildmaske und lichtempfindlicher laminatfilm für besagte bildmaske |
| US5989689A (en) * | 1991-12-11 | 1999-11-23 | The Chromaline Corporation | Sandblast mask laminate with blastable pressure sensitive adhesive |
| US5415971A (en) * | 1993-04-02 | 1995-05-16 | The Chromaline Corporation | Photoresist laminate including photoimageable adhesive layer |
| US6140006A (en) * | 1998-06-15 | 2000-10-31 | The Chromaline Corporation | Integral membrane layer formed from a photosensitive layer in an imageable photoresist laminate |
-
2011
- 2011-04-12 WO PCT/US2011/032154 patent/WO2011130300A1/en not_active Ceased
- 2011-04-12 SG SG2012074076A patent/SG184460A1/en unknown
- 2011-04-12 JP JP2013505060A patent/JP5871904B2/ja active Active
- 2011-04-12 KR KR1020127029459A patent/KR101846588B1/ko active Active
- 2011-04-12 EP EP11718182.6A patent/EP2558908B1/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| EP2558908A1 (en) | 2013-02-20 |
| JP2013523477A (ja) | 2013-06-17 |
| KR101846588B1 (ko) | 2018-04-06 |
| SG184460A1 (en) | 2012-11-29 |
| EP2558908B1 (en) | 2015-06-03 |
| KR20130103316A (ko) | 2013-09-23 |
| WO2011130300A1 (en) | 2011-10-20 |
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