JP5850614B2 - 半導体ウェハダイシング方法 - Google Patents
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Description
本発明に係る半導体ウェハダイダイシング方法は、単一チップ端当りについて、第1輻射エネルギ経路と第2輻射エネルギ経路とを用い、第1輻射エネルギ経路を形成する第1エッジ位置における分断精度よりも第2輻射エネルギ経路を形成する第2エッジ位置における分断精度が精細である。
本発明に係る半導体ウェハダイダイシング方法は、第1輻射エネルギ経路と第2輻射エネルギ経路との間の境目部分に、ウェハの製造に役立つ形状的な特徴が設けられる。
1)使用する縦切断線102の幅をプロセス制御上の必要に応じ随意に定めることができる。それでいて、必要な長さになるよう精度よく、またチップ同士を精度よく並べるのに差し支える不要なエッジ凹凸を発生させることなく、個々のチップを切り出すことができる。即ち、本方法によれば、不要なエッジ凹凸の発生を抑え又は防ぐことができる;
2)輻射エネルギのビーム幅154がどうであれ、その(シリコン)ウェハ上で隣り合っている個々のチップの端部例えば尖り150を、その深さを問わず、対応する理想位置に精度よく配することができる;
3)チップ端理想位置132,140等に対する輻射エネルギのビーム位置を厚み124の違いに応じて調整し、厚み124の違いによるビーム拡がりの違いに対処することができる。これは、図5に示す如く輻射エネルギのビームを1回供給するだけの輻射エネルギ供給動作では、隣接チップへの浸透が生じるため実現できないことの一つである;
4)単一チップ端当たりの輻射エネルギ供給回数を複数回にし、初回は粗く、次いで精細に分断することができる。即ち、余分な素材の大半を粗な分断で除去し、精細な分断で精細なエッジを形成することができる。
Claims (4)
- ウェハ後面を切削して基準スロットを形成するステップと、
基準スロットに対し位置決めしつつウェハ後面を切削して後面スロットを形成するステップと、
基準スロットを基準に第1チップ端理想位置を定めるステップと、
後面スロットに連なるよう第1チップ端理想位置に対し輻射エネルギのエッジ位置を合わせ、ウェハ内にその輻射エネルギを供給することで、その供給経路沿いにウェハの結晶構造を変化させて第1群の改質域を発生させるステップと、
基準スロットを基準に第2チップ端理想位置を定めるステップと、
後面スロットに連なるよう第2チップ端理想位置に対し輻射エネルギのエッジ位置を合わせ、ウェハ内にその輻射エネルギを供給することで、その供給経路沿いにウェハの結晶構造を変化させて第2群の改質域を発生させるステップと、
第1群及び第2群改質域の並びを境にウェハを分断するステップと、
を有し、第1群の改質域を発生させる際の輻射エネルギ供給経路と、第2群の改質域を発生させる際の輻射エネルギ供給経路と、の間隔が、後面スロットの幅より小さい半導体ウェハダイシング方法。 - 第1チップ端理想位置に対する第1エッジ位置の位置合わせと、
第2チップ端理想位置に対する第2エッジ位置の位置合わせと、
を、ウェハの厚みに応じて調整する、請求項1に記載の半導体ウェハダイシング方法。 - 単一チップ端当りについて、第1輻射エネルギ経路と第2輻射エネルギ経路とを用い、
第1輻射エネルギ経路を形成する第1エッジ位置における分断精度よりも第2輻射エネルギ経路を形成する第2エッジ位置における分断精度が精細である、請求項1に記載の半導体ウェハダイシング方法。 - 第1輻射エネルギ経路と第2輻射エネルギ経路との間の境目部分に、ウェハの製造に役立つ形状的な特徴が設けられる、請求項1に記載の半導体ウェハダイシング方法。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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US12/646,590 | 2009-12-23 | ||
US12/646,590 US8129258B2 (en) | 2009-12-23 | 2009-12-23 | Method for dicing a semiconductor wafer, a chip diced from a semiconductor wafer, and an array of chips diced from a semiconductor wafer |
Publications (2)
Publication Number | Publication Date |
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JP2011135075A JP2011135075A (ja) | 2011-07-07 |
JP5850614B2 true JP5850614B2 (ja) | 2016-02-03 |
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Application Number | Title | Priority Date | Filing Date |
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JP2010281107A Expired - Fee Related JP5850614B2 (ja) | 2009-12-23 | 2010-12-17 | 半導体ウェハダイシング方法 |
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Country | Link |
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US (1) | US8129258B2 (ja) |
JP (1) | JP5850614B2 (ja) |
CN (1) | CN102157447B (ja) |
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US20110147898A1 (en) | 2011-06-23 |
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